37 results about "Test vector generation" patented technology

The invention relates to a storage test vector generation method and device, equipment and a storage medium, and is applied to the field of semiconductor testing, and the method comprises the steps: obtaining a chip manual and a chip test plan of a to-be-tested chip, and generating a chip description file according to the chip manual and the chip test plan; carrying out abstract processing according to the chip description file, and generating a chip abstract model; converting test logic in a test algorithm into a test sequence according to the chip abstract model; and obtaining a target file format requirement of a target ATE equipment platform, and converting the test sequence according to the target file format requirement to generate a storage test vector. The method has the technical effects that the reusability of cross-platform use of the test vector is improved, the test development efficiency is improved, and the time is saved.

A first set of features may be extracted from a first integrated circuit (IC) design. A trained machine learning (ML) model may predict a set of ranked test-case configurations for the first IC design based on the first set of features. A test-case configuration may correspond to a count of scan chain input and output ports and a scan chain length value.

The invention discloses an automatic test vector generation method and system based on backtracking path optimization, and the method comprises the steps: inputting the feature information of each logic gate of a to-be-tested circuit into a trained neural network model, and predicting the state of each logic gate, including success and failure; and performing automatic test vector generation by adopting an ATPG algorithm according to the state of the logic gate, selecting the logic gate to add into a backtracking path for the logic gate with a successful label in the backtracking process, and skipping the logic gate for the logic gate with a failed label. According to the method, backtracking path generation is assisted according to the prediction result, more efficient test vector generation of the ATPG tool is facilitated, and the test time and the backtracking frequency are reduced.

The invention provides a test vector generation method and device in circuit design, and the method comprises the steps: obtaining a scanning chain group in the circuit design, the scanning chain group comprises N scanning chains, and each scanning chain in the N scanning chains comprises at least one register; value constraint is carried out on at least one register of each scanning chain in the N scanning chains according to a preset code pattern, the value constraint is used for limiting the value of the at least one register to be 0 or 1, the length of continuous 0 or the length of continuous 1 in the preset code pattern does not exceed Q, and Q is larger than or equal to 1; and according to the register subjected to value constraint, solving to obtain a test vector corresponding to the scan chain group. The method provided by the invention can realize high-precision diagnosis.

The invention discloses a processing method and device and electronic equipment, and the processing method comprises the steps: generating an initial test vector supported by test equipment according to the test equipment and a test case for a to-be-tested chip; based on the initial test vector, performing simulation verification on the to-be-tested chip, and based on a simulation verification result, adjusting the initial test vector until the simulation verification is passed, and forming a target test vector; and generating a test program of the test equipment based on the target test vector.

This disclosure provides a chip testing system, method, and apparatus. The system includes: an instruction sequence module for generating corresponding test instruction sequence identifiers based on a test instruction set; a test vector generation module for configuring a mode based on rate mode configuration information to determine the target number of channels; and generating a test vector for each channel based on the test instruction sequence identifier; and a test signal output module for performing signal conversion processing on the test vectors to generate a target test signal to complete the chip testing.

The present invention relates to the field of circuit security technology and proposes a security assessment method and system for a logic-locked encryption circuit, comprising: extracting key bits, logic gates, and logic cone sets in the logic-locked encryption circuit; searching for logically blockable key bits in the key bits; obtaining an X-state fill object in an automatic test vector generation algorithm based on the logically blockable key bits; traversing the logic cone set, generating a first test vector for the key bits in the logic cone based on the automatic test vector generation algorithm to obtain an ideal response; assuming a stuck-at fault for the current key bit, regenerating a second test vector based on the automatic test vector generation algorithm to obtain an actual response; comparing the actual response with the ideal response to obtain an inferable key; and calculating the proportion of inferable key bits in the key bits and comparing it with a preset threshold to obtain a security assessment result. The present invention significantly improves the efficiency of security assessment of logic-locked circuits.

The invention provides an in-speed test design method beneficial to time sequence optimization. The in-speed test design method comprises the following steps: S1, a chip design stage, a comprehensive stage and a test vector generation stage: a buffer is arranged in a netlist; s2, a back-end design stage: no buffer exists in a netlist output by a back end; s3, manually modifying the netlist, and adding a buffer; s4, a form verification stage: comparing that the functions of the netlist are the same before and after the addition of the buffer; s5, a test vector generation stage: inputting a netlist containing a buffer; and S6, a simulation verification stage, wherein no buffer exists in the verified netlist. By using the method, the chip can reach faster frequency; the balance of the clock network can be ensured, the structure of the clock network can be simplified, the possibility of errors is reduced, and the process is simpler; the clock path is inserted into an inverter to optimize the time sequence, and the power consumption is lower than that of an inserted buffer; the size of the chip can be reduced by deleting unnecessary buffers, and the production cost is saved; and the correctness is ensured.

The invention relates to a standard cell library test chip and test method, and a computer readable storage medium, the chip comprising: a standard cell set module comprising at least one standard cell in a standard cell library, each standard cell in the standard cell set module being classified according to a preset rule; the test vector generation module is connected with the standard unit collection module and is used for generating a test vector corresponding to each type of standard units according to the preset rule; and the output module is connected with the standard unit collection module and is used for outputting results obtained by the standard units according to the corresponding test vectors input by the input ends of the standard units. According to the invention, the redundancy of the test vectors and the increase of operand caused by the input of redundant test vectors by the sequential logic standard unit can be avoided, and the data storage requirements in the standard cell library test chip are reduced.

The present invention relates to the field of chip testing technology, and in particular to a memory output interface functional path testing method, electronic device, and medium. The method comprises: step S1, obtaining a target output interface functional path in a functional output circuit connected to a memory output interface, and generating a target output interface functional path list; step S2, an automatic test vector generation tool selecting at least one target output interface functional path from the target output interface functional path list, and automatically generating a test vector; step S3, inputting the generated test vector into a memory through an MBIST input circuit; and step S4, creating a conversion at the output interface through the selected target output interface functional path, capturing target output data, and comparing the target output data with a preset value. If they are consistent, the test passes; otherwise, the test fails. The present invention improves the memory output interface test performance and increases the chip operating frequency.

The embodiment of the invention discloses a test vector generation method and device and electronic equipment, and relates to the technical field of data processing, and the method comprises the steps: obtaining a standard test interface language STIL file and a configuration file required by a to-be-tested chip scanning SCAN test; testing information in the STIL file is extracted, and configuration information in the configuration file is extracted; carrying out formatting processing on the test information based on the configuration information so as to enable the test information to accord with an SCAN standard test protocol; and converting the formatted test information to generate a test vector. Therefore, conversion from the STIL file to the test vector file can be realized without participation of an EDA simulation tool, and the efficiency of test vector development is greatly improved. Furthermore, by configuring data, the finally output test vector is simplified, and the occupation of storage resources and the debugging difficulty are reduced.

The invention discloses an MCU burning test vector generation method based on protocol conversion, and relates to the field of integrated circuit testing. According to the method, the standard FLM file representing the Flash programming algorithm of the target chip and the Intel HEX file containing the user firmware are deeply analyzed, and the standard PAT test vector script meeting the requirements of the target ATE platform is automatically generated in combination with strict following of SWD protocol rules. According to the process, seamless conversion from a firmware file to an executable test vector is realized, and an internal mechanism covers cooperative processing stages of parameter configuration and file import, key information analysis and standardization, SWD protocol operation sequence generation, final PAT vector script synthesis output and the like; manual intervention and tedious format conversion links in a traditional scheme are effectively eliminated.

The present invention discloses a method and system for automatic test vector generation based on a decision tree. The method first extracts node feature data of a circuit under test, and then uses a trained decision tree model to obtain the backtracking confidence level for each logic gate. The backtracking confidence level is the predicted probability value of the decision tree model for the successful propagation of a fault by the logic gate in the backtracking path. Finally, the logic gates with high backtracking confidence levels are selected as nodes to be added to the backtracking path, and test vectors are generated according to the backtracking path. The present invention can effectively reduce the number of test vectors, reduce the time complexity of fault detection, and solve the problems of high backtracking frequency, large resource consumption, and interference from noise data in traditional methods.

The embodiment of the invention discloses a test vector generation method and device and computing equipment, and the method comprises the steps: obtaining conversion information, the conversion information comprises pin information, at least one piece of test service information and a conversion rule, each piece of test service information comprises fixed test data and configurable test data, performing parameter value configuration on each piece of first target configurable test data to obtain each piece of first configuration test data, determining first target test service information corresponding to each piece of first configuration test data in the conversion information, converting each piece of first configuration test data by using a conversion rule to obtain a first target test vector, and sending the first target test vector to a server; and executing the first target test vector to test and obtain a first test result. Therefore, when the test vector is generated, only the configurable test data needs to be set, and all test information required by testing does not need to be edited in the test vector template, so that a large amount of manpower is saved, and the accuracy and efficiency of the test vector are improved.

The invention provides a photovoltaic model parameter identification method and system based on a differential evolution algorithm, and relates to the technical field of optimization control. The method specifically comprises the following steps: establishing a photovoltaic model, and determining unknown parameters to be identified in the photovoltaic model; taking unknown parameters to be identified in the photovoltaic model as individuals, performing individual optimization by adopting a double-strategy collaborative deployment framework combining a probability-based test vector generation strategy and a parameter adaptive scheme, and updating stagnant individuals by utilizing a gradient descent strategy in the optimization process to obtain optimal individuals; and taking the parameter value corresponding to the optimal individual as the optimal parameter identified in the photovoltaic model. According to the method, a probability-based test vector generation strategy and a parameter adaptive method are combined, and a differential evolution algorithm is improved by combining a diversity improvement strategy, so that the optimization problem of accurate identification of parameters in a photovoltaic model is solved.

The invention provides a test point collaborative iterative optimization method for testability design based on logic deep optimization, and belongs to the field of integrated circuit digital chip scan chain testing. The invention provides a test point optimization design method for solving the problem that the test coverage rate is too low when a circuit carries out automatic test vector generation. The core method comprises the following steps: screening an initial test point set from an original circuit through a Tesent tool, converting output test point information into a constraint file compatible with a DFTC tool, and dynamically adjusting a scan chain insertion strategy; and performing logic depth value traversal on the inserted test points, evaluating the test values of the inserted test points, and iteratively and optimally inserting the test points with low logic depth values and high signal activeness so as to optimize the test coverage rate. The method is mainly applied to testability design of a digital chip, test point selection and scan chain insertion are collaboratively optimized through an EDA tool, the test coverage rate is improved through test point logic depth, and hardware overhead is reduced.

The present disclosure provides an integrated chip for autonomous testing and redundancy repair of interconnection paths between core particles, comprising: at least one core particle, each core particle having a set of interconnection ports for interconnection between core particles and a port selection module, the interconnection ports including a switching interface, an interconnection port and a standby interconnection port; the port selection module is used for connecting the interconnection port with an internal logic circuit signal port according to a selection signal; the at least one self-testing and self-repairing module is used for autonomously completing testing of interconnection paths among the core particles under the action of the switching signal and generating a selection signal according to a test result; the self-test and self-repair module comprises a control circuit, a port selection signal generation module, a test vector generation module, a test vector comparison module, a core particle exchange module and a storage module.

The test vector generation method provided by the invention comprises the following steps: acquiring a chip function test instruction, and analyzing task content and task input parameters contained in the function test instruction; selecting a corresponding instruction template based on the task content, calling the instruction template, assigning an instruction register value, and obtaining a TDI data sequence and TDO data according to a corresponding address parameter and write / read data in task input parameters; the instruction template is created based on a jtag protocol, an ADI protocol and a data transmission protocol of a chip test circuit, and the instruction template is associated with a jtag test driving function; calling the jtag test driving function according to the instruction register value, the TDI sequence and the TDO data, and outputting the content of the function test instruction as the combination of the TDI data, the TCK signal, the TMS signal and the TDO signal at different moments. The invention further provides a test vector generation system and a computer readable storage medium.

The invention provides an image sensor test method and system. The method comprises the following steps: constructing a test vector generation model; generating a test vector by using the test vector generation model; testing the image sensor by using the test vector to obtain a test result; feeding back a test result to the test vector generation model to dynamically adjust and generate a new test vector; and testing the image sensor by using the new test vector to obtain a final test result. The test vector is automatically generated by constructing the test vector generation model, and the generated test vector is dynamically adjusted according to the test result, so that the corresponding test vector can be generated according to the real-time test requirement and the test result, the generation efficiency of the test vector is improved, the coverage rate of test defects is also improved, and the test efficiency is improved. Therefore, the test efficiency of the image sensor is effectively improved, the test cost is reduced, and the problem of low test efficiency of the existing image sensor is solved.

The application discloses a kind of electric power electronic virtual controller automatic evolution closed loop verification method, device and equipment, method includes: entity identification generates standardization test intent data;Enhanced prompt is constructed by searching knowledge base based on intent data;V-ECU code and test scene script are generated by inputting enhanced prompt into field fine-tuning large language model;V-ECU code and test scene script are executed multidimensional static constraint check, and are compiled into V-ECU image;V-ECU image is connected with digital power grid model and is accessed HIL and is carried out closed loop simulation test, obtains test response data;According to test response data, fitness function is constructed, and test vector is evolved by genetic variation algorithm iteration, and standardization verification report is generated.The application can solve the technical problems that the reuse rate of existing HIL simulation test is low and the cost is high, the coverage is limited to the definition boundary, and does not have the generation ability of virtual controller.

The invention discloses a test vector generation device and an aging test system, and relates to the technical field of circuits, the test vector generation device comprises a plurality of sequence generators, a multiplexer and a control circuit; the control circuit is used for respectively sending test sequence generation signals to the plurality of sequence generators under the condition that a to-be-tested chip where the test vector generation device is located is connected with the aging test bench; the sequence generators are used for respectively generating candidate test sequences under the condition that the test sequence generation signals are received, each sequence generator generates one candidate test sequence, and the candidate test sequences generated by the sequence generators are different; the multiplexer is used for selecting a target test sequence from the plurality of candidate test sequences, and the target test sequence is used for carrying out aging test on the to-be-tested chip. Compared with the prior art, the method does not need a test board to provide a test vector for the to-be-tested chip, increases the flexibility of the aging test, and improves the user experience.

The invention relates to the technical field of circuits, and discloses a grid distributed ICG control method, structure, device, equipment and medium, and the method comprises the steps: generating a pre-scanning netlist, dividing an original chip layout into grid regions, and obtaining a corresponding ICG list; cLUs are obtained, a CLU scanning chain is generated according to each CLU, and a target scanning netlist is generated according to the CLU scanning chains; and allocating the CLU to the grid area according to the target scanning netlist, and controlling each ICG through the CLU. According to the mode, the chip is physically divided into the multiple grid areas, the independent CLU is deployed for each grid for control, refined and regionalized on-demand starting of the ICG unit is achieved, each CLU serves as an independent control point capable of being configured by the scan chain, and the ICG unit can be started according to needs. A direct and flexible control channel is provided for an automatic test vector generation tool, and the test coverage rate of a chip is improved.

The present application relates to a test vector generation device and method, belonging to the technical field of integrated circuit testing. Among them, a test vector generation device includes: a functional model module, a test pattern algorithm module, a test vector description module, a test vector calculation module, and a vector data output module. The functional model module is used to establish a test functional model according to the interface information obtained from the memory to be tested; the test pattern algorithm module is used to provide test pattern calculation logic; the test vector description module is used to provide vector data information of a storage address and provide pin definitions; the test vector calculation module is used to calculate test vector data of each storage address of the memory to be tested; the vector data output module is used to output test vector data. This device can conveniently and quickly generate test vector data applied to memory function testing, solves the technical problem of the long time in the test vector generation process, and improves the test efficiency of the memory.

The embodiment of the invention provides a method, equipment and device for automatic test vector generation, a medium and a program product, and relates to the field of chip design tools. The method includes constructing an implication graph based on a process of performing reasoning on a circuit design using an automatic test vector generation algorithm, the implication graph indicating a plurality of results resulting from a plurality of decisions during the reasoning process. The method further includes determining at least one unique implication point in the implication graph based on determining that the plurality of results meet a conflict condition. The method further includes determining a cause of an unmeasurable fault of the circuit design by analyzing the at least one unique implication. In this way, by constructing the implication graph based on the inference process of the circuit design and determining the at least one unique implication point causing the conflict from the implication graph, the reason of the untestable fault in the circuit design can be more efficiently located, and a designer can be assisted in rapidly iteratively testing the circuit design to improve the coverage rate and promote the yield climbing.

The invention provides an on-chip test clock controller and an on-chip test clock control method, in an RTL design stage, a controllable first register and a controllable second register are arranged in the on-chip test clock controller, and in a scanning test stage, the on-chip test clock controller is connected with the first register and the second register. The automatic test vector generation tool can control the first clock gating device and the second clock gating device to be turned on or turned off by controlling the first register and the second register to output an enable signal or a disable signal; the first clock signal can be controlled to only pass through one time sequence path, the problem that time sequence convergence is difficult due to the fact that time sequence deviation between different time sequence paths is too large is solved, complex optimization depending on later physical design is avoided, the design period is remarkably shortened, and tool resource occupation and labor cost are reduced.

The application discloses a test vector generation device and an aging test system, and relates to the technical field of circuits. The test vector generation device comprises a plurality of sequence generators, a multiplexer and a control circuit. The control circuit is configured to send test sequence generation signals to the plurality of sequence generators respectively under the condition that a chip to be tested where the test vector generation device is located is connected with an aging test platform. The sequence generators are configured to generate candidate test sequences respectively under the condition that the test sequence generation signals are received. Each sequence generator generates one candidate test sequence, and the candidate test sequences generated by each sequence generator are different. The multiplexer is configured to select a target test sequence from the plurality of candidate test sequences. The target test sequence is used for aging test of the chip to be tested. Compared with the prior art, the application does not need the test platform to provide test vectors to the chip to be tested, increases the flexibility of the aging test, and improves user experience.

The present application provides a method, apparatus, device, and medium for the testability of integrated circuits and test point insertion, which are applied to the field of integrated circuit testability design. First, it is judged the type of violation setting existing on the path (such as one or more combinations among "-from", "-through", and "-to"), and then according to different timing violation settings, different test point insertion strategies are adopted: for the "-from" and "-through" settings, test points are inserted after the last path that is not "-to", so as to use the test points to prevent the propagation of the X state backward; while for the "-to" setting, the relevant circuit nodes are masked (hidden or shielded) to control the X state from affecting subsequent tests. After inserting the test points, the derivation difficulty, running time, and the number of vectors of automatic test vector generation can be significantly reduced, and at the same time, the test coverage rate can be improved, having wide applicability and operability.

The present invention provides a method and system for reordering an effective critical area parameter vector set, including: obtaining a circuit description language of an integrated circuit under test, and using a test vector generation tool (ATPG) to generate a test vector set for the integrated circuit under test; injecting a fault into the analog circuit of the integrated circuit under test, obtaining and determining whether the integrated circuit under test has a fault based on the test response value currently in the analog circuit; referring to the structural diagram of the integrated circuit under test, processing the total critical area coverage of transistors contained in different unit circuits relative to the area of the unit circuit, counting the number of times each test vector in the test vector set hits a fault, processing the resultant value to obtain a test characteristic value, sorting and processing the test vectors according to the test characteristic value, and reordering the test vector set for testing the integrated circuit under test. The present invention solves the technical problems of high integrated circuit testing cost, low testing efficiency, and low testing accuracy.

The invention discloses a template-driven test vector generation method, which belongs to the technical field of integrated circuit testing and comprises the following steps: S1, acquiring a standard interface protocol of an integrated circuit to be processed; s2, based on a standard interface protocol, generating a standard interface test vector parameterization template; and S3, generating a comprehensive test vector by using the standard interface test vector parameterization template. According to the method, the generation of the test vector is more standard and consistent, the same design can be repeatedly used in different projects through parameterized design, only parameters need to be adjusted, and the repeatability of the test vector is greatly improved.

The present invention belongs to the technical field of testability design of very large-scale integrated circuits, discloses a TSV test diagnosis circuit and method based on BIST, provides a hardware circuit architecture for TSV test and diagnosis, comprises a test access port controller, a test data register, a test vector generator, a shift register, a double edge trigger, a TSV test controller and an improved loading chip packaging register, a capture chip packaging register, wherein the test access port controller is responsible for configuring the test path, the test mode and the test enable signal, the test enable is synchronized by the double edge trigger and activates the TSV test controller, controls the chip packaging register improved based on the lossless compression structure to perform the test, and realizes efficient fault detection and diagnosis of different fault types. The present invention effectively reduces the test time through the collaboration of test vector generation and response compression, and provides an innovative solution for efficient and reliable TSV test and diagnosis.