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Test vector generation method based on test object and storage medium

A technology of test objects and test vectors, which is applied in the direction of measuring electricity, measuring devices, and measuring electrical variables, etc. It can solve the problems of inconvenient online debugging of test vectors, low efficiency of test vector generation, and poor readability of test vectors, so as to improve the generation efficiency , convenient online debugging, high readability effect

Active Publication Date: 2019-12-31
GREE ELECTRIC APPLIANCES INC
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Problems solved by technology

[0004] The present disclosure provides a test vector generation method and storage medium based on test objects to solve the problems of low test vector generation efficiency, poor readability of converted test vectors, and inconvenient online debugging of test vectors existing in related technologies

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  • Test vector generation method based on test object and storage medium
  • Test vector generation method based on test object and storage medium
  • Test vector generation method based on test object and storage medium

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Embodiment Construction

[0031] In order to enable those skilled in the art to better understand the technical solutions in this specification, the technical solutions in the embodiments of the present disclosure will be clearly and completely described below in conjunction with the drawings in the embodiments of this specification. Obviously, the described The embodiments are only some of the embodiments of the present application, but not all of them. Based on the embodiments of the present disclosure, all other embodiments obtained by persons of ordinary skill in the art without creative efforts shall fall within the protection scope of the present application.

[0032] Integrated circuit testing is an important link in the manufacturing process of integrated circuits. Through the testing of integrated circuits, the accuracy and stability of the produced integrated circuits can be checked. The testing of integrated circuits usually needs to be completed by using automated testing equipment ATE, and...

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Abstract

The invention provides a test vector generation method based on a test object and a storage medium. The test vector generation method based on the test object comprises the steps of obtaining one or more test files according to the test object; processing the test file to obtain to-be-output data; and compiling the to-be-output data into data in a waveform format by using a predetermined compiler,and converting the data in the waveform format so as to generate a test vector of the test object. Based on the technical scheme of the invention, the generation efficiency of the test vector is improved, the readability of the generated test vector is high, and the online debugging of the test vector is facilitated.

Description

technical field [0001] The present disclosure relates to the technical field of integrated circuit testing, and in particular to a method for generating test vectors based on test objects and a storage medium. Background technique [0002] With the development of science and technology, the integrated circuit industry has been rapidly improved, and the quality and reliability requirements for manufacturing integrated circuit products have also been further improved. In order to ensure that integrated circuit products meet the requirements for use, it is necessary to test the integrated circuit. Taking the testing process of IC chips as an example, when using automatic test equipment (ATE, Automatic Test Equipment) to perform various tests on the device under test, it is first necessary to generate test vectors, and use the generated test vectors as excitation signals to input to the device under test In order to detect whether the device under test is qualified or not accor...

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Application Information

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IPC IPC(8): G01R31/28
CPCG01R31/2851G01R31/2894
Inventor 刘超孙阳余景亮
Owner GREE ELECTRIC APPLIANCES INC
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