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179 results about "Module under test" patented technology

Active optical module multi-channel automatic test system and method

The invention provides an active optical module multi-channel automatic test system and a method. optimal signals emitted by a tested optical module are monitored, and indexes of the incident light power, emission current, bias current, temperature, voltage, extinction ratio, eye diagram allowance, crossing point, OMA (optical modulation amplitude) etc. are measured and calculated; if the above indexes are all in accordance with the standard, the sensitivity of the optical module is tested, the emission optical power of the tested module is enabled to reach the sensitivity of the test standard via the adjustment of an attenuator, and error code tests are conducted; and if there is no error code, indexes of alarm value and alarm recovery etc. of the optical module are tested. According to the test system, an error detector, an optical module test board, an optical power meter, and the attenuator employed by the test system are all multi-channel devices, an optical switch and an optical splitter are combined for time-sharing multiplexing of one oscilloscope, at least 8 modules can be simultaneously tested, the utilization rate of the oscilloscope and the test efficiency of the optical module are greatly optimized, the equipment cost and the manual cost are reduced, and automatic and batch production of the optical modules is realized.
Owner:GUANGXUN SCI & TECH WUHAN

Method for establishing network chip module level function checking testing platform

ActiveCN101183406ASimple and straightforward way to buildClear structureSpecial data processing applicationsReference modelProcessor register
The invention relates to a method for constructing a verification and test platform of network chip module level functions, comprising the construction of a simulation and reference model of the tested modules, which is characterized in that: the method comprises the construction of all modules and documents; the output of an excitation generating model is connected with the inputs of the tested module and the simulation and reference model, a clock and a reset generating module are connected with the tested module and the clock and reset signal of the simulation and reference model, a register initialization module is connected with the register of the tested module and the simulation and reference model, and a CPU simulation module is connected with the CPU of the tested module; the output of the tested module is connected with the simulation and reference model, thus, the network chip module level function verification and test platform can be constructed. The invention has the advantages that the platform can be constructed easily and directly, so the time required to construct the module level function verification and test platform can be shortened greatly in the high performance network chip verification process; meanwhile, the platform constructed by the method has clear structure which is easy to be understood and has improved reliability.
Owner:苏州盛科科技有限公司

Method for establishing large-scale network chip verification platform

The invention relates to a method for establishing a large-scale network chip verification platform. The method comprises the following steps of: firstly, establishing a control text document, and then writing an initial function of a random function library, and writing a calling function of the random function library; secondly, establishing a module-level function verification platform, comprising the following steps of: generating a top-level module of the module-level function verification platform, establishing a clock generating module and a reset generating module, establishing an interface signal module, establishing a test vector generating module, establishing a register configuring module and establishing a reference model module of a tested module; and thirdly, establishing a chip-level function verification platform, comprising the following steps of: generating a top-level module of the chip-level function verification platform, multiplexing the clock generating module, the rest module, the interface signal module, the test vector generating module, the register configuring module and the reference model module of the module-level function verification platform, and establishing a CPU simulation model. The method has a strong function, high efficiency, stability and simple structure. By means of the invention, the time for setting up the network chip verification platform can be greatly shortened and the stimulation efficiency can be improved.
Owner:丁贤根

System and method for automatically testing analog module used for programmable logic controller (PLC)

The invention discloses a system and a method for automatically testing an analog module with a settable input/output (I/O) channel in a programmable logic controller (PLC). The system comprises an upper control computer, a programmable direct current signal source, a digital multimeter, a channel and voltage/current mode switching control plate and a communication interface, wherein the upper control computer sets a testing parameter, issues an instruction to realize output or measurement, receives a test result and makes judgment according to the result; the programmable direct current signal source receives the instruction and the parameter to set the output as a voltage or current mode, sets and outputs a voltage/current signal to an input channel; the digital multimeter receives the instruction to set the measurement as the voltage or current mode, measures the voltage or current signal output by an output channel and returns a measured value to a computer; the channel and voltage/current mode switching control plate switches a test channel and a voltage/current connection mode according to the instruction; and the communication interface transmits the parameter, the instruction and the test result between each device and a tested model. A computer reads the conversion value of the voltage or current measured value of the input channel through the communication interface or transmits a set numerical value to the output channel to convert the set numerical value into a voltage or a current.
Owner:SCHNEIDER ELECTRIC IND SAS

Software testing method and system

The invention provides a software testing method and system. The method comprises the following steps: performing functional partitioning on a plurality of tested modules in tested software to generate a plurality of tested module sets and generate authority information corresponding to each tested module set; receiving a control command of testing personnel by a testing proxy server; forwarding the control command to the corresponding tested module set by the testing proxy server according to the authority information of the testing personnel; after executing the control command by the tested module set, acquiring output view information related to the control command by the testing proxy server; and transmitting the output view information to the testing personnel by the testing proxy server. According to the method provided by the embodiment of the invention, on one hand, the software which cannot be opened to outsourcing and remote testing personnel for the sake of security and privacy can be tested to expand the testing range and improve the testing efficiency and quality, and on the other hand, the tested software is not required to be provided for the testing personnel such as the outsourcing personnel and the remote testing personnel, so that decompiling cannot be performed to acquire a source code and the security is high.
Owner:BAIDU ONLINE NETWORK TECH (BEIJIBG) CO LTD

Stress-test information database structure and method of use

A database architecture and method of using a database is disclosed. The database is intended for use with a product stress testing system in which a large number of different modules may be subjected to a variety of stressors including environmental stressors and functional load testing. The database also enables a wide variety of test and communication equipment to be used in an efficient manner to test and communicate with the module being tested. Generic commands may be translated to test and communication equipment specific command strings as well as module specific command strings. Data collected from these various devices by the stress testing system may also be parsed and stored in fields associated with the corresponding module being tested. The product table, result table, process table, and equipment command & communication tables are interrelated through defined data associations. These data entities and their mutual data relationships revolve around the module being subjected to the stress test. In this way the stress test results may be associated with the various products, the results may be mapped against product-specific test criteria, and generic commands may be translated to product-specific commands. A virtual oven may be used as the stress-testing system and includes a logical grouping of modules, a controller, test instruments which are all connected via a network to the database for collection of the data, control of the system, and generating displays and reports.
Owner:CIENA

Detecting device and detecting method of time sequence parameters of small package pluggable transceiver

The invention discloses a detecting device and a detecting method of time sequence parameters of a small package pluggable transceiver. The device comprises a test board, a module to be tested, a standard module, singlechips and an upper computer, wherein the test board is provided with two slots, the module to be tested is plugged in one slot, the standard module is plugged in the other slot, a transmitting terminal of the module to be tested is connected with a receiving terminal of the standard module via optical fiber, a receiving terminal of the module to be tested is connected with a transmitting terminal of the standard module via optical fiber, the singlechips are plugged in parallel on the test board, the singlechips are respectively a control-type singlechip and a bus-type singlechip, time sequence pins of the module to be tested and the standard module are respectively electrically connected with input/output ports of the control-type singlechip via the test board, the control-type singlechip is electrically connected with the bus-type singlechip via a serial bus, and the bus-type singlechip is communicated with the upper computer via a USB conversion chip and a serial conversion chip on the test board. The invention can realize the effects of automated testing, simple operation and high measurement accuracy.
Owner:WUHAN TELECOMM DEVICES

Distributed cluster performance test system, method and device

The invention provides a distributed cluster performance test system, method and device. The system comprises an upstream cluster, a tested module, a back end cluster, a network bridge, a pressure tool and a monitoring module. The network bridge is used for receiving a first pressure request sent by the upstream cluster, sending the first pressure request to the tested module, receiving a second pressure request generated by the tested module according to the first pressure request, forwarding the second pressure request to the back end cluster and storing the first pressure request and communication data packs returned by the back end cluster according to the second pressure request. The pressure tool is used for sending preset pressure to the tested module according to the first pressure request, and the tested module forwards the preset pressure to the network bridge, so that corresponding packs in the stored communication data packs are checked and are returned to tested module. The monitoring module and the tested module are placed on the same server. The monitoring module is used for monitoring performance data of the server and carrying out performance analysis according to the performance data. The network bridge is used for simulating a real cluster, performance test accuracy and test efficiency are improved, and cost is saved.
Owner:BAIDU ONLINE NETWORK TECH (BEIJIBG) CO LTD

Transmission line, and scattering parameter testing system and method

The invention relates to a transmission line, and a scattering parameter testing system and method. The transmission line comprises a first conducting line and a second conducting line which are usedfor transmitting radio frequency signals; a connecting line is arranged between the first conducting line and the second conducting line; the connecting line includes a first connecting line and a second connecting line; the first connecting line has a first end and a second end; the first connecting line is connected with the first conducting line through the first end, and the first connecting line is connected with the second connecting line through the second end; and the second connecting line is a coupling line in coupling connection with the second conducting line. The stability and theconsistency are relatively high, and an individual test can be performed to obtain scattering parameters. The coupling line of the transmission line can be externally connected with a calibration part, and the scattering parameters used for calculating a required test result can be obtained by changing electrical parameters of the calibration part, so that a "de-embedding" test is achieved; and afirst tested module with the relatively poor consistency does not need to be measured, so that the test process is simple and convenient, and the error is small.
Owner:SOUTH CHINA UNIV OF TECH +1

Central control system of automotive practical training platform

The invention belongs to a central control system of an automotive practical training platform. The central control system of the automotive practical training platform comprises tested modules of automotive assemblies, a computer control module,electrical connectors,an acquisition device, an on-off control device and an upper computer. The computer control module to execute tasks is preinstalled in the upper computer. The computer control module using a practical training software integrated development environment as a basic platform is started. The upper computer is connected with the acquisition device, the on-off control device and the tested modules of automotive assemblies through the electrical connectors, and real-time interaction is available. After execution of communicating, control and measurement tasks, test data acquired by the acquisition device in real time are converted into a format of standard protocol and are uploaded to the computer control module for processing. Therefore, learning procedure, examination procedure and assembly parts of a real automotive are integrated into the same system, so that teaching flexibility is improved, and high teaching cost is saved while teaching quality is improved greatly.
Owner:TIANJIN UNITE AUTOMOBILE ELECTRONICS CONTROL TECH SERVICE

Electromagnetic radiation test-based microwave circuit fault diagnosis device and method

The present invention provides an electromagnetic radiation test-based microwave circuit fault diagnosis device, which comprises a probe, an amplifier, a test instrument, a scanning frame, a controller, a main control computer and the like. The probe is adopted as a near-field antenna and is arranged on the scanning frame. Under the effect of the controller, the scanning frame moves along the X-axis and the Y-axis to conduct the scanning operation. Meanwhile, electromagnetic signals radiated from a to-be-measured module are coupled onto the scanning frame. After the result of the scanning operation is amplified by a low-noise amplifier, the parameter measurement is conducted. The computer analyzes the result of the parameter measurement and then plots the electromagnetic radiation intensity distribution diagram of the to-be-measured module. The electromagnetic radiation intensity distribution diagram of the to-be-measured module is compared with the electromagnetic radiation intensity distribution diagram of a performance-normalized module, so that an abnormal region can be found out. After that, a possible fault point is derived reversely on the basis of the abnormal region. According to the technical scheme of the invention, the damage of hard contact to microwave multifunctional modules and the impedance-mismatching influence can be avoided due to the adoption of the electromagnetic radiation test. Meanwhile, the occurrence of mis-operations, such as the contact with a power supply and the like, can be avoided. Therefore, the test instrument is prevented from being damaged, and the diagnosis efficiency is improved significantly.
Owner:THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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