Test system for intelligently diagnosing faults of high-integration digital signal processing system

Abstract

The invention discloses a test system for intelligently diagnosing faults of a high-integration digital signal processing system, and aims to solve the problem of low fault diagnosis capability of anexisting boundary scanning test system. According to the technical scheme, an intelligent test platform management unit operates control software, collects data of multichannel signals, generates a test sequence, allocates physical addresses to all modules, lists all the modules connected to a system backboard on a software interface, processes the multichannel data and diagnoses faults; the control software calls boundary scanning test software to generate a test vector for the tested module, applies the test vector to the chip core logic input end to form a circuit fault criterion, and sendsthe circuit fault criterion to the boundary scanning controller; the test vectors of different regions are loaded to a tested module to generate a fault injection vector, and the fault injection vector is transmitted to a fault injection controller; and the fault injection vector is loaded to the tested module to complete the fault diagnosis of the multichannel signal processing subrack platformmodule-level digital chip.

Description

technical field [0001] The invention belongs to the fields of aircraft measurement and control communication, phased array radar, and automatic testing, and specifically relates to an intelligent testing platform for a highly integrated digital signal processing system in the field of intelligent fault diagnosis. testing object [0002] technical background [0003] The highly-integrated multi-channel signal processing module utilizes system design for testability (DesignForTestability) technology and boundary scan (JTAG) technology, runs through the entire stage of system design, is an important means to improve the practical level of equipment, and plays a key role in supporting and guaranteeing. With the development of system integration and software radio theory, the requirements for high-speed sampling, signal processing, software reconfiguration ability and miniaturization are getting higher and higher. It is necessary to design a new general-purpose signal processing ...

AI Technical Summary

Problems solved by technology

[0006] In order to solve the problems that the large-scale digital integrated circuit pins are huge, the interconnection is complicated, the platform under test cannot be approached at any time, and the traditional test method cannot solve the problem of test efficiency and test accuracy, the present invention provides a test with less test time and true and accurate signals. , can improve the automation and intelligence of the test, and ensure the comprehensive, sufficient and extensible test system of the intelligent diagnosis of the fault of the highly integrated digital signal processing system to solve the problem of low reliability and low fault diagnosis ability of the existing boundary scan test system The problem of low intelligence

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