Optimized test vector generation method based on genetic algorithm and variation analysis

A technology of test vectors and genetic algorithms, which is applied in the field of test vector generation and screening, can solve the problems of identifying hardware Trojans and flooding, and achieve the effects of high test efficiency, strong purpose, and improved recognition level

Inactive Publication Date: 2018-01-16
TIANJIN UNIV
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Problems solved by technology

However, small-area hardware Trojans are easily overwhelmed by process noise, and it is difficult for us to identify the characteristics of

Method used

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  • Optimized test vector generation method based on genetic algorithm and variation analysis
  • Optimized test vector generation method based on genetic algorithm and variation analysis
  • Optimized test vector generation method based on genetic algorithm and variation analysis

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Embodiment Construction

[0030] The present invention proposes a hardware Trojan optimized test vector generation method based on genetic algorithm and mutation analysis, uses software to detect and locate program loopholes to perform mutation operations on low-activity nodes of the circuit, and uses genetic algorithm to generate test vectors in the entire test vector space Internal search can effectively activate the optimized test vectors of hardware Trojans embedded in low-activity nodes. This method searches the test vector space in parallel. The test vectors with strong purpose and directional screening at the same time are more streamlined and can activate hardware Trojans more effectively. The test efficiency is higher. This method can be used as an aid in hardware Trojan visualization and bypass signal analysis to improve the recognition level of hardware Trojans. It has certain practical significance and reference value.

[0031] The present invention is based on software testing and intellige...

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Abstract

The invention relates to the technical field of trustworthiness of integrated circuits, and provides a hardware Trojan optimized test vector generation method. The method searches test vector spaces in parallel, is strong in purposiveness and more compactor in directionally-screened test vector, can activate hardware Trojan more effectively, and has higher test efficiency; the method can assist manifesting of the hardware Trojan and analysis of bypass signals to improve a hardware Trojan recognition level, and has certain actual meaning and reference value. The invention adopts a technical scheme as follows: the hardware Trojan optimized test vector generation method based on a genetic algorithm and variation analysis screens out low-activity nodes of a circuit through analyzing characteristics of a parent circuit meshwork list, performs mutation operation on the circuit structure of the low-activity node by using a mutation thought of a software test to generate a mutant, and at lastscreens out a test vector capable of killing mutant by combing with a method of a search thought of the genetic algorithm. The method provided by the invention is mainly applied to design and manufacture occasions of the integrated circuits.

Description

technical field [0001] The invention relates to the technical field of trustworthiness of integrated circuits, in particular to a method for generating optimized test vectors based on genetic algorithms and variation analysis, specifically, to a method for generating and screening test vectors corresponding to hardware Trojans implanted in low-activity nodes. Background technique [0002] With the rapid development of electronic design automation technology and semiconductor manufacturing technology, the integrated functions of single-chip digital integrated circuit chips are becoming more and more complex, the circuit scale is getting larger and higher, and the integration is getting higher and higher, so it is widely used in modern technology. Various fields, especially sensitive fields such as financial equipment, mobile communication, transportation, government and energy. Integrated circuits play an increasingly important role in promoting social progress and economic d...

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Application Information

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IPC IPC(8): G06F17/50G06N3/12
Inventor 赵毅强刘燕江解啸天刘阿强
Owner TIANJIN UNIV
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