Estimation method for defect quantification parameter

A technology for quantifying parameters and defects, which is applied in the field of defect quantitative parameter estimation, can solve problems such as poor real-time performance and large amount of recorded data, and achieve the effects of overcoming poor real-time performance, meeting the requirements of defect detection, and reducing the amount of data

Inactive Publication Date: 2015-07-08
JIANGSU UNIV
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Problems solved by technology

[0005] The purpose of the present invention is to provide a non-isosceles triangular pulse ultrasonic echo model technology based on four parameters to solve the problem of large amount of data collection and recording and poor real-time performance in the current model-based defect pulse echo signal parameter estimation method. To reflect the quantitative parameter information such as the position, size and shape of the defect

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  • Estimation method for defect quantification parameter
  • Estimation method for defect quantification parameter
  • Estimation method for defect quantification parameter

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Embodiment Construction

[0037] The present invention will be further described below in conjunction with the accompanying drawings and specific embodiments, but the protection scope of the present invention is not limited thereto.

[0038] Analysis of the principle of the present invention: set the pulse ultrasonic echo signal of the target body (defect) as f(t), and its envelope as x(t). Divide x(t) into two signals, and the hardware circuit detects the starting point (t s ,0), end point (t e ,0) and the peak point (t p,a), where the start point and end point are determined theoretically by the point where the amplitude of the echo envelope is 0, but due to interference such as noise in practice, even if there is no echo signal, its amplitude is not is 0, so the threshold is selected to judge the starting point and the ending point. The thresholds of the starting point and the ending point can be the same or different. Generally, the threshold value is the minimum value greater than the noise leve...

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Abstract

The invention relates to an estimation method for a defect quantification parameter. The estimation method mainly aims at an inner defect of a material or a structural body. A simple method for estimating the defect parameter via an impulse ultrasonic echo is provided. The method is mainly characterized in that: the data collection amount is quite small; and the ultrasonic echo model is simple and convenient, and can be determined by a triangular model. A little of collected echo signal data is used for estimation to obtain the wave arrival time, the maximum echo peak, the echo climbing speed, the echo lowering speed, the echo width, and the echo bandwidth, which are relative to the defect quantification parameter. The estimation method can be used in the situations, such as defect detection and parameter quantification, of the field of nondestructive examination and estimation.

Description

technical field [0001] The present invention relates to a method for estimating defect quantification parameters, which is suitable for using pulsed ultrasonic signals to detect internal defects of materials or structures, establishing a defect pulse echo model based on a small number of recorded parameters, and using the model to estimate the defect position, size and A method for quantifying parameters such as shape. Background technique [0002] When pulsed ultrasonic echo signals are used to detect internal defects in materials or structures, the pulse echoes of defects contain information such as defect location, size and shape. Different kinds of defects lead to differences in their echo shapes. Estimating quantitative parameters of flaws from echoes is one of the widely researched topics in the field of nondestructive testing and evaluation. According to the data (Lu Zhenkun. Parameterized ultrasonic echo model and its parameter estimation [D]. South China Universit...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N29/04G01N29/44
Inventor 宋寿鹏邵勇华胥保文鲍丙豪
Owner JIANGSU UNIV
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