Check patentability & draft patents in minutes with Patsnap Eureka AI!

Method and device for measuring weak magnetic field strength based on electromagnetic induction transparency effect

An electromagnetic induction transparent and weak magnetic field technology, applied in the size/direction of the magnetic field, using magneto-optical equipment for magnetic field measurement, etc., can solve the problems of large measurement error and low sensitivity

Inactive Publication Date: 2017-08-11
SHANXI UNIV
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] In order to solve the technical problem of low sensitivity and large measurement error of the current magnetic measuring device, the present invention provides a method and device for measuring weak magnetic field strength based on the transparency effect of electromagnetic induction

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method and device for measuring weak magnetic field strength based on electromagnetic induction transparency effect
  • Method and device for measuring weak magnetic field strength based on electromagnetic induction transparency effect
  • Method and device for measuring weak magnetic field strength based on electromagnetic induction transparency effect

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0033] A device for measuring the strength of a weak magnetic field based on the electromagnetic induction transparency effect, comprising a detection laser 1, a first 1 / 2 glass slide 2 and a first PBS beamsplitter prism 3 sequentially located on the outgoing light path of the detection laser 1; the first PBS beam splitter The reflected optical path of the prism 3 is provided with a saturated absorption spectrum frequency stabilization device 4, and the signal output end of the saturated absorption spectrum frequency stabilization device 4 is connected with the voltage control port of the detection laser 1; The second 1 / 2 slide 5, the second PBS beam splitting prism 6, the atomic gas chamber 8 and the balance detector 9 that are filled with alkali metal atoms and have an incident window and an outgoing window on the side wall; the atomic gas chamber 8 is located at On the transmitted optical path of the second PBS dichroic prism 6; on the reflective optical path of the second P...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The present invention is a magnetic measuring device based on atomic quantum effects, which is different from the existing devices for measuring magnetic field strength. Precisely control the excitation frequency of the ultra-narrow linewidth laser, and measure the splitting of the transparent spectral signal based on electromagnetic induction under the action of a magnetic field. The strength of the magnetic field to be measured can be calculated from the width of the split. The multiple splitting of the atomic magnon level due to the Zeeman effect of the weak magnetic field is linear, so fitting the measurement results of the width of multiple splitting peaks can realize the self-calibration of the strength of the measured magnetic field. This new type of magnetometer can achieve a magnetic field intensity measurement with a sensitivity of less than 0.1T, and the measurement accuracy can be effectively improved with the further compression of the laser frequency line width. What is important is that the measured magnetic field strength of the present invention can be effectively traced to the transition frequency of atoms, and has good measurement accuracy and self-calibration characteristics.

Description

technical field [0001] The invention relates to a weak magnetic field strength measurement technology, in particular to a device and method for measuring weak magnetic field strength based on the electromagnetic induction transparency effect. Background technique [0002] Magnetic field measurement is a measurement technique for the relevant parameters of the magnetic field. The main measurement objects are: magnetic field strength, magnetic flux density, etc. There are mainly the following methods for measuring a constant magnetic field and calibrating equipment: a torque magnetometer made by using the force effect of a magnetic field, a fluxmeter, a galvanometer, and a shock method to measure the magnetic flux density and magnetic flux density of soft magnetic materials. Gate Magnetometer, Hall Effect Magnetometer and NMR Magnetometer, Rotating Coil Magnetometer, etc. The precise measurement of magnetic field strength has a wide range of applications. It has a wide range ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01R33/032
Inventor 张临杰杨文广赵建明贾锁堂
Owner SHANXI UNIV
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2025 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com