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Automatic platform testing method and system developed based on intermediate layers of instruments

An intermediate layer and instrumentation technology, applied in the field of automated platform testing methods and systems, to achieve the effect of enhancing stability

Active Publication Date: 2015-12-16
湖州帷幄知识产权运营有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The main purpose of the present invention is to solve the problem that in the prior art, when the automated test environment changes or new flow test instruments are added, the test case needs to be changed accordingly

Method used

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  • Automatic platform testing method and system developed based on intermediate layers of instruments
  • Automatic platform testing method and system developed based on intermediate layers of instruments
  • Automatic platform testing method and system developed based on intermediate layers of instruments

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Embodiment Construction

[0024] The preferred embodiments of the present invention will be described below in conjunction with the accompanying drawings of the specification. It should be understood that the preferred embodiments described here are only used to illustrate and explain the present invention, not to limit the present invention, and in the case of no conflict, the present invention The embodiments in and the features in the embodiments can be combined with each other.

[0025] Such as figure 1 As shown, it is a flowchart of method steps of an automated platform testing method based on instrument middle layer development provided by an embodiment of the present invention. The invention provides an automated platform test method based on the instrument middle layer development including the following steps:

[0026] S101: Connect the device under test to perform automated platform testing;

[0027] S102: Define the consistency interface of the middle layer to connect to the library files of diffe...

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Abstract

The invention discloses an automatic platform testing method developed based on the intermediate layers of instruments. The method comprises the following steps: connecting a device to be tested; loading a consistent intermediate layer interface for connecting to the library files of different flow testing instruments; and connecting to the flow testing instruments via the consistent intermediate layer interface so that tests can be performed without changing the library files even when a testing environment changes. According to the testing method, the consistent intermediate layer interface of the instruments is defined so that an automatic developer does not need to develop several different test libraries for different testing instruments and a user only needs to load the consistent intermediate layer interface of the instrument without considering the type of the instrument operating in the testing environment. The problem of the adjustment of the whole testing kit due to the change of the testing environment is solved and the stability of automatic platform testing is enhanced; the compatibility with the library file interfaces of the instruments of different types can be realized and the physical property operations of the different types can be shielded.

Description

Technical field [0001] The invention relates to the field of automatic meter flow testing, in particular to an automatic platform testing method and system based on the development of the meter middle layer. Background technique [0002] At present, for instrument automation testing in an automated test platform environment, the essence is to use API (Application Programming Interface) libraries provided by each instrument, such as SmartLibrary of Smartbits and IxiaAPILibrary of IXIA to develop and customize test libraries suitable for their own test platforms. The user chooses to load the test library of the corresponding instrument according to the existing automated test environment. The test cases in the test library call the methods in the test library to implement the test operation of the instrument. Because the API implementation of each type of instrument is different, the test case needs to be targeted Each set of API corresponds to its own set of test plans. When mult...

Claims

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Application Information

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IPC IPC(8): H04L12/26G06F9/44
CPCG06F8/20
Inventor 裴瑞凌
Owner 湖州帷幄知识产权运营有限公司
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