Test form integrating method and system based on mapping configuration file and index template

A technology for configuration files and indicators, applied in word processing, special data processing applications, instruments, etc., can solve problems such as poor reusability, and achieve the effects of simple changes, improved efficiency, good scalability and reusability

Active Publication Date: 2016-09-28
THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The existing technology generally adopts the method of temporarily storing the test data in the database and comparing the index database for the integration and judgment of the test data. The data management software needs to be coded and customized, and the reusability is poor.

Method used

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  • Test form integrating method and system based on mapping configuration file and index template
  • Test form integrating method and system based on mapping configuration file and index template
  • Test form integrating method and system based on mapping configuration file and index template

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0034] The flow of this method will be described in detail below by taking the merging and determination of two index sub-tables of a component under test as an example.

[0035] Table 1 is the index 1 sub-table of the component under test. The index sub-table includes the gain measurement value and the noise figure measurement value (the gain and noise figure measurement values ​​are simultaneously measured by the noise figure analyzer), and Table 2 is the index of the component under test. 2 sub-table, the index sub-table contains the image suppression measurement value.

[0036] In the process of test report integration, the mapping configuration file is first loaded. From the mapping configuration file, it is known that the number of tested components is one, and the tested component includes two index sub-tables, and the two index sub-tables of the tested component need to be analyzed. The tables are combined, and the index sub-tables are gain, noise figure, and image rej...

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PUM

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Abstract

The invention discloses a test form integrating method and system based on a mapping configuration file and an index template; the method comprises the following steps: loading the mapping configuration file, and storing the mapping configuration file in a TXT format; analyzing the mapping configuration file so as to obtain position relations between index sub-form data of a plurality of tested assemblies and a total form template; copying sub-form data of each index of the tested assemblies into the total form template in sequence, and updating the total form template into a total form initial table; searching index data positions in the index template and a threshold formula, reading index data of corresponding positions in the total form initial table, carrying out threshold determination for the index data, and tagging in the total form initial table according to the determination result so as to obtain the total form final table. The advantages are that the mapping configuration file can analyzed to clarify the position relations between the total form and index sub form data of tested assemblies, thus providing excellent scalability and reusability; a total form searching mode can search the threshold, thus improving index data determination efficiency.

Description

technical field [0001] The invention relates to the technical field of testing, and relates to a test report integration method and system based on mapping configuration files and index templates. Background technique [0002] At present, the test report not only includes the test items, test data and test conclusions of the DUT, but also includes information such as the test environment, incentive conditions, testers, and test locations. It is another form of summary and summary of the test process and test results. Condensation is also an important original data and evidence for the quality improvement, promotion and zeroing of the research and production units of the tested parts. Therefore, in the process of automatic test system development, test report generation is an important content of test program design. System users often have more requirements for test reports, and the differences between different units are also obvious. [0003] In the development process of...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/24
CPCG06F40/174G06F40/18
Inventor 徐宝令孙运臻丁志钊季汉国段志强李鹏
Owner THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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