Test method for maximum entropy rate of true random number generator

A true random number and testing method technology, applied in random number generators, instruments, electrical digital data processing, etc., can solve the problems that the maximum entropy rate of a true random number generator cannot be determined by unique testing, and the maximum entropy rate cannot be uniquely determined, etc.

Active Publication Date: 2017-10-27
FUDAN UNIV
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  • Application Information

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Problems solved by technology

[0010] In order to solve the problem that the maximum entropy rate of the above-mentioned true random number generator cannot be determined by a unique test, the present invention provides a method for testing t

Method used

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  • Test method for maximum entropy rate of true random number generator
  • Test method for maximum entropy rate of true random number generator
  • Test method for maximum entropy rate of true random number generator

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Embodiment

[0035] Embodiment: According to the steps of the present invention, the maximum entropy rate of a certain true random number generator is tested.

[0036] According to step 1 of the present invention, a total of 15 frequency point data rates are selected: F={10kHz, 20kHz, 50kHz, 100kHz, 200kHz, 500kHz, 1MHz, 2MHz, 5MHz, 10MHz, 20MHz, 50MHz, 100MHz, 250MHz, 500MHz} ; A total of five block lengths are selected: L={16, 32, 64, 128, 256}.

[0037] According to step 2 of the present invention, adopt each data rate of above-mentioned selection as sampling rate, the output data flow of true random number is sampled; For each sampling frequency point, the data length M=4Mbits=2 that test collects 22 bits.

[0038] According to step 3 of the present invention, the collected data is calculated according to relational formula 1, relational formula 2, relational formula 3 and relational formula 4, and 15*5 average information entropy and 15*5 average entropy rates are obtained.

[0039]...

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Abstract

The invention belongs to the technical field of information security and true random number generators, and particularly relates to a test method for a maximum entropy rate of a true random number generator. The test method for the maximum entropy rate of the true random number generator comprises the four steps of parameter selection, data collection, block segmentation calculation and analysis fitting. By utilizing a characteristic that an average entropy rate obtained by calculation after block segmentation of a random data stream is saturated along with the reduction of the data block length and the increment of a data rate, a relational curve of a saturation entropy rate and a data block length is subjected to linear fitting; a function value corresponding to a fitting straight line when the data block length is equal to 1 is namely the maximum entropy rate; and the problem that the maximum entropy rate in a test of the true random number generator cannot be uniquely determined can be effectively solved.

Description

technical field [0001] The invention belongs to the technical fields of information security and true random number generators, and in particular relates to a method for testing the maximum entropy rate of true random number generators. Background technique [0002] When the hardware implements a true random number generator, due to the constraints of the physical mechanism, its entropy rate has a maximum value, that is, the maximum entropy rate. When the data rate is higher than the maximum entropy rate, it will only cause the information entropy of the output data stream to drop. Therefore, the maximum entropy rate is an important performance index reflecting the random characteristics of a true random number generator, and determining the maximum entropy rate through testing is the key to the application of a true random number generator in the field of information security. [0003] Known methods for testing the maximum entropy rate of true random number generators, suc...

Claims

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Application Information

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IPC IPC(8): G06F7/58
CPCG06F7/588
Inventor 程旭曾晓洋
Owner FUDAN UNIV
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