Method, system, device and computer-readable storage medium for hardware testing

Abstract

The invention discloses a hardware testing method. The hardware testing method comprises the steps that the actual signal quality obtained when hardware is tested in a preset PVT scene is obtained; according to the actual signal quality, a simulation tool is optimally set, and an optimal simulation tool is obtained; the optimal simulation tool is utilized to simulate a limit PVT scene so as to conduct simulation testing on the hardware, and the limit simulation signal quality is obtained; the limit simulation signal quality is used as the limit value of the actual signal quality. In the method, the simulation tool is optimally set according to the actual signal quality in the preset PVT scene, the optimal simulation tool is utilized to simulate the limit PVT scene to conduct the simulationtesting on the hardware, the method that a limit PVT scene is built to conduct hardware signal quality testing is replaced so that the testing samples required in the hardware testing process can bereduced, and no limit scenes need to be built. The invention further provides a hardware testing system and device and a computer readable storage medium. The hardware testing system and device and the computer readable storage medium have the above advantages.

Description

technical field [0001] The present application relates to the field of hardware testing, in particular to a hardware testing method, system, device and computer-readable storage medium. Background technique [0002] With the advent of the big data era, customers have higher and higher requirements for storage product performance and stable system operation. The reliability of the hardware system design is the basis of the reliability of the entire system. The improvement of the reliability of the hardware design can effectively reduce the difficulty of running the software fault-tolerant mechanism and significantly improve the efficiency of code operation. The main factor affecting the reliability of hardware design is the change of Process Voltage Temperature corner (PVT corner). Signal quality testing, however, would require a very large number of test samples. At the same time, the construction of extreme scenes is limited by various material resources, and it is diffic...

AI Technical Summary

Problems solved by technology

The main factor affecting the reliability of hardware design is the change of Process Voltage Temperature corner (PVT corner). Signal quality testing, however, would require a very large number of test samples

At the same time, the construction of extreme scenes is limited by various material resources, and it is difficult to achieve full coverage of extreme scenes

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