Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A test data analysis method and system

A technology for testing data and analysis methods, applied in the field of data analysis, to achieve maximum flexibility and convenience, improve efficiency, and perform efficient analysis

Inactive Publication Date: 2018-12-07
UNIVERSAL SCIENTIFIC INDUSTRIAL (SHANGHAI) CO LTD
View PDF4 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This is unacceptable for some data analysis related to SSD shipments

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A test data analysis method and system
  • A test data analysis method and system
  • A test data analysis method and system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0032] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the specific implementation manners of the present invention will be described below with reference to the accompanying drawings. Obviously, the accompanying drawings in the following description are only some embodiments of the present invention, and those skilled in the art can obtain other accompanying drawings based on these drawings and obtain other implementations.

[0033] In order to make the drawing concise, each drawing only schematically shows the parts related to the present invention, and they do not represent the actual structure of the product. In addition, to make the drawings concise and easy to understand, in some drawings, only one of the components having the same structure or function is schematically shown, or only one of them is marked. Herein, "a" not only means "only one", but also means "more than one".

[0034] In the pro...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a test data analysis method, including the steps of obtaining the test log information of a machine to be tested; importing the acquired test log information into a relationaldatabase according to preset conditions; deriving test data information conforming to a preset field from the relational database; creating a data report from the exported test data information that conforms to the preset fields and analyzing a status of the test bench or product. The purpose of the invention is to provide a test data analysis method and system, wherein the obtained original testlog is converted into corresponding format and imported into a relational database, and according to the requirements of data analysis, the corresponding data is extracted from the database and the given results are analyzed, thereby greatly improving the efficiency of data analysis.

Description

technical field [0001] The invention relates to the field of data analysis, in particular to a test data analysis method and system. Background technique [0002] At present, the qualified inspection of ex-factory machines is an important guarantee for the operation of enterprises. For example, the solid state disk (SolidState Disk, SSD) production test process has multiple functional test sites, and each site generates test log files for each SSD. How to Efficient analysis of these data is very important for SSD quality inspection assurance and test improvement. At the same time, the data extraction and analysis of Nand in the test log needs to be based on a large amount of data. [0003] The traditional data collection work is to collect qualified test log files according to the data collection requirements, and then use specific data analysis tools to complete the data analysis. From collecting test log files to analyzing the results, the results need to be given on a d...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/30
Inventor 宋国军曹海涛张子威陈莉朱德生汪强刘颖
Owner UNIVERSAL SCIENTIFIC INDUSTRIAL (SHANGHAI) CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com