This application discloses a method, device, terminal, and storage medium for simulating the electrical characteristics of integrated circuits. The method includes acquiring a model of the
integrated circuit to be simulated; meshing the model to obtain an
integrated circuit mesh dataset composed of multiple mesh cells; constructing corresponding charge basis functions and current basis functions based on the mesh cells; using the charge basis functions as the fusion object, progressively merging and updating the charge basis functions; simultaneously, merging and updating the current basis functions through
geometric mapping; after all fusion and updates are completed, acquiring the
integrated circuit basis function dataset; and performing electrical characteristic
simulation on the integrated circuit to be simulated based on the integrated circuit
basis function dataset. This achieves rapid updating and low-order representation of complex
coupling capacitance matrices, reducing the theoretical complexity from O(n^2) to O(n^2) of traditional back-end
order reduction methods. 3 The
time complexity is reduced to O(n), while the model accuracy and
order reduction effect are maintained, and the efficiency of
model order reduction is greatly improved.