Method, device and equipment for determining power consumption optimization scheme

A technology for optimizing schemes and determining methods, which is applied in the direction of measuring devices, instruments, and electronic circuit testing, etc., and can solve problems such as high hardware overhead of integrated circuits, and achieve the effect of reducing hardware circuits and saving hardware overhead

Active Publication Date: 2021-05-18
LOONGSON TECH CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, due to the need to increase the hardware circuit in each scanning unit, the hardware overhead of the integrated circuit is relatively large

Method used

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  • Method, device and equipment for determining power consumption optimization scheme
  • Method, device and equipment for determining power consumption optimization scheme
  • Method, device and equipment for determining power consumption optimization scheme

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Embodiment Construction

[0079]In order to make the objects, technical solutions, and advantages of the present invention more clearly, the technical solutions in the embodiments of the present invention will be described in contemplation in the embodiments of the present invention, and will be described, and the embodiments described herein will be described. It is a part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, there are all other embodiments obtained without making creative labor without making creative labor premises.

[0080]In order to facilitate the appreciation of the present application, the function path between each scanning unit in the scan chain is first introduced.

[0081]figure 1 A structural diagram of a function path between the scanning units provided by the embodiment of the present invention. Seefigure 1 Multiple scanning units are included in the scan chain, respectively, respectively, SC0, SC1, SC2, SC3, SC4 ...

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Abstract

Embodiments of the present invention provide a method, device, and device for determining a power consumption optimization scheme. The method includes: obtaining fan-out gate information of each scanning unit in the scan chain, where the fan-out gate information includes the number of types of control values ​​corresponding to the scanning unit, and The number of fan-out doors corresponding to each control value, the control value includes the first state and the second state; according to the number of types of control values ​​corresponding to each scanning unit, and the number of fan-out doors corresponding to each control value, determine each The weight value of the scanning unit: according to the weight value of each scanning unit, at least one target scanning unit and an optimization scheme corresponding to each target scanning unit are determined in the scan chain, wherein the target scanning unit is a scanning unit that requires additional hardware circuits. It is used to save the hardware overhead of the integrated circuit brought about by reducing the power consumption of the test shift.

Description

Technical field[0001]Embodiments of the present invention relate to the field of integrated circuits, and more particularly to a power consumption optimization scheme determination method, apparatus, and equipment.Background technique[0002]Currently, integrated circuits are typically implemented in the form of a scan chain in order to implement the testability of integrated circuits. A plurality of scanning units are included in the scan chain, each with a function output and a test output.[0003]In the test scan shift mode, the function output of the scan unit is not followed. In the prior art, in order to reduce the power consumption of the integrated circuit in the test mode, the hardware circuit (for example, or non-door, etc.) can be added to each of the scanning cells, so that in the test mode, the function output of each scanning unit is constant. The constant (constant is the first state 0 or constant 2), the flip of the scanning unit is reduced, and the power consumption of ...

Claims

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Application Information

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Patent Type & AuthorityPatents(China)
IPC IPC(8): G01R31/317
CPCG01R31/31721
Inventor许超陈华军卢新元
OwnerLOONGSON TECH CORP