Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Automatic test data processing method, device and equipment and readable storage medium

A data processing device and automated testing technology, which is applied in the direction of electrical digital data processing, software testing/debugging, error detection/correction, etc., and can solve problems such as low efficiency and high code maintenance costs

Pending Publication Date: 2020-12-11
CHINA PING AN PROPERTY INSURANCE CO LTD
View PDF0 Cites 4 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The main purpose of this application is to provide an automated test data processing method, device, device and readable storage medium, aiming to solve the technical problems of low efficiency of automated test development and high code maintenance cost in the prior art

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Automatic test data processing method, device and equipment and readable storage medium
  • Automatic test data processing method, device and equipment and readable storage medium
  • Automatic test data processing method, device and equipment and readable storage medium

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0074] It should be understood that the specific embodiments described here are only used to explain the present application, and are not intended to limit the present application.

[0075] The embodiment of the present application provides an automated test data processing method. In the first embodiment of the automated test data processing method of the present application, refer to figure 1 , the automated test data processing method includes:

[0076] Step S10, when an automated test instruction is detected, receive a requirement document for the automated test, and extract modification parameters in the requirement document;

[0077] Step S20, obtaining the type of the modified parameter, determining the data level of the modified parameter according to the type of the modified parameter, and determining the automated test data to be modified associated with the modified parameter according to the data level of the modified parameter;

[0078] Step S30, modifying the au...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an automatic test data processing method, device and equipment and a readable storage medium, and relates to the blockchain technology, the method comprises the following steps: when an automatic test instruction is detected, receiving a demand document of an automatic test, and extracting modification parameters from the demand document; acquiring the type of each modification parameter, determining the data hierarchy of each modification parameter according to the type of the modification parameter, and determining each piece of to-be-modified automatic test data associated with the modification parameter according to the data hierarchy of each modification parameter; and modifying the to-be-modified automatic test data to obtain to-be-combined target test data ofthe automatic test instruction, and combining the to-be-combined target test data to obtain a target automatic test case. The technical problems that in the prior art, the automatic test developmentefficiency is low, and the code maintenance cost is too high are solved.

Description

technical field [0001] The present application relates to the fields of artificial intelligence and block chain technology, and in particular to an automated test data processing method, device, equipment and readable storage medium. Background technique [0002] Automated testing technology is more and more widely used in the industry. At present, automated test scripts are usually written using linear scripting methods (or recording and playback methods), but automated testing scripts written using linear scripting methods (or recording and playback methods) The code reusability is very low, which leads to huge automated test scripts and poor code stability. When the system business logic is iteratively changed, the huge script code needs to be modified repeatedly, which further reduces the efficiency of automated test development and leads to code maintenance costs. too high. Contents of the invention [0003] The main purpose of this application is to provide an autom...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36
CPCG06F11/3684
Inventor 邓宇亮
Owner CHINA PING AN PROPERTY INSURANCE CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com