Automatic test data processing method, device and equipment and readable storage medium
A data processing device and automated testing technology, which is applied in the direction of electrical digital data processing, software testing/debugging, error detection/correction, etc., and can solve problems such as low efficiency and high code maintenance costs
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Publication Date
- 2020-12-11
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Abstract
Description
technical field
[0001] The present application relates to the fields of artificial intelligence and block chain technology, and in particular to an automated test data processing method, device, equipment and readable storage medium. Background technique
[0002] Automated testing technology is more and more widely used in the industry. At present, automated test scripts are usually written using linear scripting methods (or recording and playback methods), but automated testing scripts written using linear scripting methods (or recording and playback methods) The code reusability is very low, which leads to huge automated test scripts and poor code stability. When the system business logic is iteratively changed, the huge script code needs to be modified repeatedly, which further reduces the efficiency of automated test development and leads to code maintenance costs. too high. Contents of the invention
[0003] The main purpose of this application is to provide an autom...
Examples
Embodiment Construction
[0074] It should be understood that the specific embodiments described here are only used to explain the present application, and are not intended to limit the present application.
[0075] The embodiment of the present application provides an automated test data processing method. In the first embodiment of the automated test data processing method of the present application, refer to figure 1 , the automated test data processing method includes:
[0076] Step S10, when an automated test instruction is detected, receive a requirement document for the automated test, and extract modification parameters in the requirement document;
[0077] Step S20, obtaining the type of the modified parameter, determining the data level of the modified parameter according to the type of the modified parameter, and determining the automated test data to be modified associated with the modified parameter according to the data level of the modified parameter;
[0078] Step S30, modifying the au...