The invention relates to the field of
solid-state storage, in particular to a back-end
loopback test method for a
solid-state storage. According to the method, the implementation of the
loopback test interface is separated from the main
business logic of the upper layer, so that the normal
firmware operation mode can be switched to the
loopback test mode only by properly modifying the initialization step and replacing the
callback function of the related register operation of the
flash memory controller on the basis of reserving the back-end
processing flow architecture; the
reusability and compatibility of codes are improved, and the
code maintenance difficulty and cost in the subsequent
firmware development process are reduced. A round-robin
queue and a
bitmap mapping table which are realized by
software are used as containers for simulating idle, trigger and completion of register behaviors of a
flash memory controller, the time for calling the operation interfaces is fixed and predictable, and the upper limit of the computing power of a CPU (
Central Processing Unit) in an SSD (
Solid State Disk) main control
chip can be estimated, so that a relatively strong guiding effect is achieved on analysis and improvement of performance indexes such as 4K random read command
IOPS (Input / Output Operations Per Second) and the like.