Semiconductor structure and preparation method thereof

A technology of semiconductor and gate structure, applied in semiconductor/solid-state device manufacturing, semiconductor device, semiconductor/solid-state device components, etc., can solve the problem of high parasitic capacitance, inability to penetrate the bit line contact window, and bit line contact structure word line Deeply buried active regions, etc.

Pending Publication Date: 2021-06-04
CHANGXIN MEMORY TECH INC
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  • Abstract
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  • Claims
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Problems solved by technology

[0002] The semiconductor structure usually includes a word line and a bit line contact structure. Since the word line and the bit line contact structure are too close to each other, a short circuit may occur or excessive parasitic capacitance may be generated. Therefore, in order to reduce these faults during preparation, the word line and The distance of the bit line contact structure, the bit line contact structure does not go deep into the active area and the word line is deeply buried in the active area, resulting in the bit line contact window not being able to penetrate deep into the active area

Method used

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  • Semiconductor structure and preparation method thereof
  • Semiconductor structure and preparation method thereof
  • Semiconductor structure and preparation method thereof

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Embodiment Construction

[0044] In order to facilitate the understanding of the present invention, the present invention will be described more fully below with reference to the associated drawings. A preferred embodiment of the invention is shown in the drawings. However, the present invention can be embodied in many different forms and is not limited to the embodiments described herein. Rather, these embodiments are provided so that the disclosure of the present invention will be thorough and complete.

[0045] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the technical field of the invention. The terms used herein in the description of the present invention are for the purpose of describing specific embodiments only, and are not intended to limit the present invention. As used herein, the term "and / or" includes any and all combinations of one or more of the associated listed items.

[0046] In the...

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Abstract

The invention relates to a semiconductor structure, and the structure comprises a substrate in which a plurality of active regions arranged at intervals are formed; gate structures which are arranged in parallel at intervals and located in the substrate; a bit line contact structure within the substrate; and an insulating liner layer which is positioned in the substrate and is positioned between the bit line contact structure and the gate structure so as to insulate and isolate the bit line contact structure from the gate structure. Therefore, the bit line contact structure and the gate structure are separated by the insulating liner layer, short circuit or higher parasitic capacitance is not easy to occur even if a staggered part exists between the bit line contact structure and the gate structure, so that the bit line contact structure can extend to the deep part of the active region, and the conductive structure in the gate structure can extend to the upper surface of the active region; the insulating liner layer separates the gate structure from the bit line contact structure and also separates the adjacent gate structures crossing the same active region, so that the mutual influence of the adjacent gate structures is reduced, and the risk of vulnerability of the memory is reduced.

Description

technical field [0001] The invention relates to the field of semiconductors, in particular to a semiconductor structure and a preparation method thereof. Background technique [0002] The semiconductor structure usually includes a word line and a bit line contact structure. Since the word line and the bit line contact structure are too close to each other, a short circuit may occur or excessive parasitic capacitance may be generated. Therefore, in order to reduce these faults during preparation, the word line and Due to the distance of the bit line contact structure, the bit line contact structure does not go deep into the active area and the word line is deeply buried in the active area, so that the bit line contact window cannot go deep into the active area. Contents of the invention [0003] Based on this, it is necessary to provide a semiconductor structure and a preparation method thereof to address the above problems. [0004] A semiconductor structure comprising: ...

Claims

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Application Information

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Patent Type & AuthorityApplications(China)
IPC IPC(8): H01L29/06H01L29/423H01L21/336H01L23/535
CPCH01L29/0603H01L29/42356H01L29/66477H01L23/535
Inventor吴秉桓
OwnerCHANGXIN MEMORY TECH INC