Method for detecting A<n>B<x>C<1-x> element ratio of multi-element material
A detection method and multi-element technology, which is applied in the analysis of materials, material analysis through optical means, and measurement devices, etc., can solve the problems of relatively large influence of sample information, complicated operation of XRD method, and difficulty in detecting trace equalities of mixtures, so as to achieve simple operation , the effect of high sensitivity
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[0036] The preferred embodiments of the present invention will be further described in detail below.
[0037] a kind of Mg 2 Si x sn 1-x The detection method of the element ratio of the material comprises the following steps:
[0038] Step S1, obtaining the Mg to be measured 2 Si x sn 1-x The relationship between the frequency and x of material coherent phonons, specifically including:
[0039] Step S11, detecting Mg using photoluminescence spectroscopy 2 Sn, Mg 2 Si 0.4 sn 0.6 and Mg 2 The energy bandgap width E of the three materials of Si g ;
[0040] Step S12, for Mg 2 Sn material, will be a bundle higher than Mg 2 The ultrafast pump light with the bandgap width of the Sn material is vertically incident on the surface of the material sample;
[0041] Step S13, the probe light is incident on the surface of the material to be probed at an angle of θ, and intersects the pump light at a point, and the delay time between the probe light and the pump light can be ...
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