Phased array probe for scanning imager
Patent Information
- Authority / Receiving Office
- CN Β· China
- Current Assignee / Owner
- INST OF ACOUSTICS CHINESE ACAD OF SCI
- Publication Date
- 2004-09-22
- Estimated Expiration
- Not applicable Β· inactive patent
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Abstract
Description
technical field
[0001] The present invention relates to a probe for scanning imaging device, in particular to a phased array probe for scanning imaging device. Background technique
[0002] The traditional phased array imaging technology uses ultrasonic longitudinal wave probes to form a probe array to electronically scan and image the detection object. Due to the existence of wave mode conversion in solids, the traditional longitudinal wave phased array technology will encounter additional interference when used in the detection of solid media. In addition, in the detection of liquid interlayer and zero-gap debonding at the bonding interface, ultrasonic longitudinal waves cannot be used to detect.
[0003] Compared with longitudinal wave, shear wave detection has its unique advantages. It can be seen from the propagation theory that the scattering and reflection characteristics of pure shear waves in complex dielectric materials such as anisotropy are relatively simple, a...