A method and device for measuring the inclination of the sagittal height surface of an optical lens
By obtaining the height and width ratio of the lens, and using the surface top height difference value of the velocity probe to calculate the slope, the accuracy problem of the angle detection of the vector height slope of the optical lens is solved, and the assembly stability and yield are improved.
Patent Information
- Application Number
- CN202310013216.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2023-01-05
- Publication Date
- 2024-12-17
- Estimated Expiration
- 2043-01-05
AI Technical Summary
During the optical lens processing, it is difficult to achieve high accuracy in the detection of the inclination of the velocity surface, which affects the assembly yield. Moreover, due to the narrow width of the velocity surface, the measurement position is difficult to find, and there is a problem of inaccurate measurement.
By obtaining the ratio of the height and width of the lens to be tested, the surface top height difference obtained by the two different bearing positions is used to calculate the surface slope of the lens, providing a simple operation, accurate measurement and high accuracy. method.
The measurement accuracy of the high-plane slope of the optical lens is improved, the assembly stability is enhanced, and the yield of lens processing is improved.
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Figure CN116105979B_ABST
Abstract
Description
Technical Field
[0001] The embodiments of the present invention relate to the technical field of optical lenses, and in particular to a method and a device for measuring the inclination of the sagittal height surface of an optical lens. Background Art
[0002] In the assembly of modern optical lenses, due to the increasingly higher requirements for yield and assembly stability, a sagitta surface is often processed on the optical surface of a lens during lens processing. During assembly, this sagitta surface is used to contact and support the spacer ring to ensure the stability of the air gap. This requires that the sagitta surface has very high flatness and high perpendicularity to the optical axis, generally required to be within 5um. The processing of this sagitta surface is entirely guaranteed by the grindstone during centering and edge grinding. Due to the grindstone processing technology, the sagitta surface inclination may sometimes exceed 5um, affecting the assembly yield. At this time, it is very necessary to detect the inclination of the sagitta surface. Due to the narrow width of the sagitta surface, it is difficult to find the measurement position during detection, resulting in inaccurate measurement and measurement difficulties. Summary of the invention
[0003] The present invention provides a method and device for measuring the inclination of the sagittal height surface of an optical lens. Compared with the existing measurement methods, the measurement direction has the advantages of simple operation, accurate measurement and high precision.
[0004] In a first aspect, an embodiment of the present invention provides a method for measuring the inclination of a sagittal height surface of an optical lens, comprising:
[0005] Obtain the height of the sagittal plane of the lens to be tested;
[0006] Obtaining the width of the sagittal height surface of the lens to be tested;
[0007] The sagittal plane slope of the lens is determined according to the ratio of the height to the width.
[0008] Optionally, the height of the sagittal plane of the lens to be tested is obtained, including:
[0009] Obtain the value of the first surface top height of the lens to be tested on the supporting platform surface of the first sagittal height inspection fixture;
[0010] Obtain the second surface top height value of the lens to be tested on the supporting platform surface of the second sagittal height inspection fixture;
[0011] The height of the sagittal height surface of the lens to be tested is determined according to the difference between the first surface top height value and the second surface top height value.
[0012] Optionally, obtaining the width of the sagittal height surface of the lens to be tested includes:
[0013] Obtaining a first inner diameter of a supporting platform surface of a first sagittal height inspection fixture;
[0014] Obtaining a second inner diameter of the supporting platform surface of the second sagittal height inspection fixture;
[0015] The width of the sagittal plane of the lens to be tested is determined according to the difference between the first inner diameter and the second inner diameter.
[0016] Optionally, before obtaining the value of the first surface top height of the lens to be tested on the supporting platform surface of the first sagittal height inspection fixture, the measuring method further includes:
[0017] Clean the supporting platform surface of the first sagittal height inspection fixture.
[0018] Optionally, before obtaining the second surface top height value of the lens to be tested on the supporting platform surface of the second sagittal height inspection fixture, the measuring method further includes:
[0019] Clean the supporting platform surface of the second sagittal height inspection fixture.
[0020] Optionally, obtaining the first surface top height value of the lens to be tested on the supporting platform surface of the first sagittal height inspection fixture includes:
[0021] A digital altimeter is used to measure the top height of the first surface of the lens to be tested on the supporting platform surface of the first sagittal height inspection fixture.
[0022] Optionally, before using a digital altimeter to measure the first surface top height value of the lens to be tested on the supporting platform surface of the first sagittal height inspection fixture, the measuring method further comprises:
[0023] The digital altimeter arranged on the supporting platform surface of the first sagittal height gauge is calibrated to zero.
[0024] Optionally, obtaining the second surface top height value of the lens to be tested on the supporting platform surface of the second sagittal height inspection fixture includes:
[0025] A digital altimeter is used to measure the top height of the second surface of the lens to be tested on the supporting platform surface of the second sagittal height inspection fixture.
[0026] Optionally, before obtaining the second surface top height value of the lens to be tested on the supporting platform surface of the second sagittal height inspection fixture, the measuring method further includes:
[0027] The digital altimeter set on the supporting platform surface of the second sagittal height gauge is calibrated to zero.
[0028] In a second aspect, an embodiment of the present invention further provides a device for measuring the sag surface slope of a lens, the device comprising:
[0029] A height acquisition module is used to obtain the height of the sagittal height surface of the lens to be tested;
[0030] A width acquisition module, used to acquire the width of the sagittal height surface of the lens to be tested;
[0031] A calculation module is used to obtain the inclination of the lens sagittal surface according to the ratio of the height to the width.
[0032] In summary, the present application provides a method for measuring the inclination of the sagittal plane of an optical lens, which first obtains the height of the sagittal plane of the lens to be measured and the width of the sagittal plane of the lens to be measured, and then determines the inclination of the sagittal plane of the lens according to the ratio of the height to the width. This measurement method relies on two sagittal gauges with different supporting positions to obtain different surface top heights, and the difference in the surface top heights and the difference in the supporting positions of the sagittal gauges with two different supporting positions can be used to obtain the inclination of the sagittal plane of the lens to be measured. Compared with the existing measurement methods, this measurement direction has the advantages of simple operation, accurate measurement, and high precision. BRIEF DESCRIPTION OF THE DRAWINGS
[0033] Figure 1 is a schematic cross-sectional view of a lens to be tested provided by an embodiment of the present invention;
[0034] Figure 2 It is a schematic diagram of a method for measuring the sag surface slope of a lens provided in the present application;
[0035] Figure 3 yes Figure 2 A schematic diagram of the sag surface slope of a lens to be tested is provided;
[0036] Figure 4 is a cross-sectional schematic diagram of a sagittal height inspection tool provided by an embodiment of the present invention;
[0037] Figure 5 is a schematic diagram of another method for measuring the sag surface slope of a lens provided by the present application;
[0038] Figure 6 It is a schematic diagram of measurement data of the sagittal height surface slope of a lens to be tested provided by an embodiment of the present invention;
[0039] Figure 7 yes Figure 6 A schematic diagram of a method for calculating the sag surface slope of a lens to be tested is provided;
[0040] Figure 8 The invention discloses a checking tool and a marble table with a digital display height gauge. DETAILED DESCRIPTION
[0041] The present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It is to be understood that the specific embodiments described herein are only used to explain the present invention, rather than to limit the present invention. It should also be noted that, for ease of description, only parts related to the present invention, rather than all structures, are shown in the accompanying drawings.
[0042] Figure 1is a schematic cross-sectional view of a lens to be tested provided by an embodiment of the present invention, Figure 2 is a schematic diagram of a method for measuring the sag surface slope of a lens provided in this application, Figure 3 yes Figure 2 A schematic diagram of the sag surface slope of a lens to be tested is provided. Among them, Figure 1 1 is the lens sagittal surface, i.e., the surface whose slope is to be measured in the embodiment of the present application, which is a non-optical surface with a 400# sand surface. Figure 1 The middle 2 is the chamfered surface where the lens sagittal surface contacts the outer diameter surface 6, which is a non-optical surface with a 400# sand surface. Figure 1 The middle 3 is the arc chamfered surface of the lens, which is a non-optical surface with 400# sand surface. Figure 1 The 4th one in the middle is the first optical surface, which faces downwards during the sagittal height test. Figure 1 5 is the second optical surface, and the highest point of this surface is recorded during non-sagittal surface detection, and 6 is the outer diameter surface. Figure 1-Figure 3 As shown, a method for measuring the inclination of the sag surface of an optical lens provided by an embodiment of the present invention includes:
[0043] S101, obtaining the height of the sagittal height plane of the lens to be tested.
[0044] S102, obtaining the width of the sagittal plane of the lens to be tested.
[0045] S103, determining the sagittal plane slope of the lens according to the ratio of the height to the width.
[0046] Combination Figure 4 As shown, the height Δh of the lens sagittal plane 1 along the Y direction in the figure is detected by a length measuring tool, and the length ΔL of the lens sagittal plane 1 along the X direction in the figure is detected by a length measuring tool. According to the ratio of Δh / ΔL, the inclination θ=Δh / ΔL of the lens sagittal plane is obtained, thereby improving the detection accuracy of the mirror sagittal plane and improving the assembly yield of the optical lens.
[0047] Figure 4 is a cross-sectional schematic diagram of a sagittal height gauge provided by an embodiment of the present invention, a feasible implementation method, combined with Figure 4 As shown, the present application adopts a sagittal height inspection tool, which includes a base and a support column located at the center of the base, supporting a supporting platform surface extending from one side away from the base, and the supporting platform surface includes two fixed bosses, and the two fixed bosses enclose a containing space, combined with Figure 1 As shown, the lens sagittal surface 1, chamfered surface 2, lens arc chamfered surface 3, first optical surface 4, and outer diameter surface 6 of the lens to be tested are located in the accommodating space, wherein D corresponds to the outer diameter of the lens. is the inner diameter of the supporting surface, which corresponds to the inner diameter of the supporting surface of the first sagittal height gauge A in the embodiment of the present application Inner diameter of the bearing surface of the first sagittal height gauge B
[0048] Figure 5 is a schematic diagram of another method for measuring the sag surface slope of a lens provided in the present application, Figure 6 is a schematic diagram of measurement data of the sagittal height surface slope of a lens to be tested provided by an embodiment of the present invention, Figure 7 yes Figure 6 A schematic diagram of a method for calculating the sag surface slope of a lens to be tested is provided. Figure 8 The present invention provides a test fixture and a marble table with a digital height gauge. Figure 1-Figure 8 As shown, another method for measuring the sag surface slope of an optical lens provided by an embodiment of the present invention includes:
[0049] S201, obtaining a value of a first surface top height of a lens to be tested on a supporting platform surface of a first sagittal height inspection fixture.
[0050] S202, obtaining the value of the second surface top height of the lens to be tested on the supporting platform surface of the second sagittal height inspection fixture.
[0051] S203, determining the height of the sagittal height surface of the lens to be tested according to the difference between the first surface top height value and the second surface top height value.
[0052] Specific, combined Figure 1-Figure 8 As shown, the lens to be tested is placed in the accommodation space of the first sagittal height tester A, and a digital display altimeter is used to measure the first surface top height value S of the lens to be tested on the supporting platform surface of the first sagittal height tester A. A Place the lens to be tested in the accommodation space of the second sagittal height gauge B, and use a digital altimeter to measure the second surface top height value S of the lens to be tested on the supporting platform surface of the second sagittal height gauge B. B , for the first surface height value S A and the second surface height value S B Find the difference S A -S B , obtain the height Δh of the sagittal height surface of the lens to be tested.
[0053] Among them, the first surface top height value S A It refers to the distance between the end of the lens sagittal height surface 1 away from the chamfered surface 2 and the highest point of the second optical surface 5 along the Y direction in the figure. B It refers to the distance between the end of the lens sagittal height surface 1 close to the chamfered surface 2 and the highest point of the second optical surface 5 along the Y direction in the figure.
[0054] S204 , obtaining a first inner diameter of the supporting platform surface of the first sagittal height inspection fixture.
[0055] S205 , obtaining a second inner diameter of the supporting platform surface of the second sagittal height inspection fixture.
[0056] S206: Determine the width of the sagittal plane of the lens to be tested according to the difference between the first inner diameter and the second inner diameter.
[0057] Specific, combined Figure 1-Figure 8 As shown, according to the first inner diameter of the first sagittal height gauge supporting the platform surface and the second inner diameter of the supporting platform surface of the second sagittal height gauge half of the difference, that is / 2, determine the distance between the end of the lens sagittal plane 1 away from the chamfered surface 2 and the end of the lens sagittal plane 1 close to the chamfered surface 2 along the X direction in the figure, that is, the width ΔL of the sagittal plane of the lens to be measured.
[0058] S207, determining the sagittal plane slope of the lens according to the ratio of the height to the width.
[0059] Specific, combined Figure 6 and Figure 7 As shown, the height Δh and width ΔL of the sagittal plane of the lens to be tested obtained in the above embodiment are substituted into the calculation formula of the sagittal plane slope θ of the lens, and the sagittal plane slope θ of the lens can be obtained.
[0060] Among them, the calculation formula of the slope θ of the sagittal height surface is as follows:
[0061]
[0062] Optionally, before step S201, the measuring method further includes:
[0063] Clean the supporting platform surface of the first sagittal height inspection fixture.
[0064] Specifically, use wiping paper to wipe the supporting platform surface of the first sagittal height inspection fixture to ensure that there is no dust or dirt.
[0065] Optionally, before step S202, the measuring method further includes:
[0066] Clean the supporting platform surface of the second sagittal height inspection fixture.
[0067] Specifically, use wiping paper to wipe the supporting platform surface of the second sagittal height inspection fixture to ensure that there is no dust or dirt.
[0068] Optionally, before step S201, the measuring method further includes:
[0069] The digital altimeter arranged on the supporting platform surface of the first sagittal height gauge is calibrated to zero.
[0070] Combination Figure 8 As shown, the first sagittal height gauge A is placed on the digital display altimeter, and its needle is calibrated to zero on the supporting platform surface of the first sagittal height gauge A.
[0071] Optionally, before step S202, the measuring method further includes:
[0072] The digital display altimeter arranged on the supporting platform surface of the second sagittal height measuring fixture is calibrated to zero.
[0073] Combination Figure 8 As shown, the second sagittal height gauge A is placed on the digital display altimeter, and its needle is calibrated to zero on the supporting platform surface of the second sagittal height gauge B.
[0074] In summary, the method for measuring the sagittal surface inclination of a lens provided in the embodiment of the present application relies on two sagittal gauges with different supporting positions to obtain different surface top heights. The difference in surface top heights and the difference in supporting positions of the sagittal gauges with two different supporting positions can be used to obtain the sagittal surface inclination of the lens to be measured. Compared with the existing measurement methods, this measurement direction has the advantages of simple operation, accurate measurement and high precision.
[0075] Based on the same inventive concept, the embodiment of the present application also provides a lens sag surface slope measuring device, which can execute a lens sag surface slope measuring method provided by any embodiment of the present invention, and has the corresponding functional modules and beneficial effects of executing a lens sag surface slope measuring method. For technical details not described in detail in this embodiment, please refer to a lens sag surface slope measuring method provided by any embodiment of the present invention. The measuring device includes:
[0076] A height acquisition module is used to obtain the height of the sagittal height surface of the lens to be tested;
[0077] A width acquisition module, used to acquire the width of the sagittal height surface of the lens to be tested;
[0078] A calculation module is used to obtain the inclination of the lens sagittal surface according to the ratio of the height to the width.
[0079] Note that the above are only preferred embodiments of the present invention and the technical principles used. Those skilled in the art will understand that the present invention is not limited to the specific embodiments described herein, and that various obvious changes, readjustments, combinations and substitutions can be made by those skilled in the art without departing from the scope of protection of the present invention. Therefore, although the present invention has been described in more detail through the above embodiments, the present invention is not limited to the above embodiments, and may include more other equivalent embodiments without departing from the concept of the present invention, and the scope of the present invention is determined by the scope of the appended claims.
Claims
1. A method for measuring the sag surface slope of an optical lens, characterized in that: include: Get the height of the sagittal plane of the lens to be tested, including: Obtain the value of the first surface top height of the lens to be tested on the supporting platform surface of the first sagittal height inspection fixture; Obtain the second surface top height value of the lens to be tested on the supporting platform surface of the second sagittal height inspection fixture; Determine the height of the sagittal height surface of the lens to be tested according to the difference between the first surface top height value and the second surface top height value; Obtaining the width of the sagittal plane of the lens to be tested, comprising: Obtaining a first inner diameter of a supporting platform surface of a first sagittal height inspection fixture; Obtaining a second inner diameter of the supporting platform surface of the second sagittal height inspection fixture; Determining the width of the sagittal height plane of the lens to be tested according to the difference between the first inner diameter and the second inner diameter; The sagittal plane slope of the lens is determined according to the ratio of the height to the width.
2. The measuring method according to claim 1, characterized in that: Before obtaining the value of the first surface top height of the lens to be tested on the supporting platform surface of the first sagittal height inspection fixture, the measuring method further includes: Clean the supporting platform surface of the first sagittal height inspection fixture.
3. The measuring method according to claim 1, characterized in that: Before obtaining the value of the second surface top height of the lens to be tested on the supporting platform surface of the second sagittal height inspection fixture, the measuring method further includes: Clean the supporting platform surface of the second sagittal height inspection fixture.
4. The measuring method according to claim 1, characterized in that: Obtain the first surface top height value of the lens to be tested on the supporting platform surface of the first sagittal height inspection fixture, including: A digital altimeter is used to measure the top height of the first surface of the lens to be tested on the supporting platform surface of the first sagittal height inspection fixture.
5. The measuring method according to claim 4, characterized in that: Before using a digital altimeter to measure the first surface top height value of the lens to be tested on the supporting platform surface of the first sagittal height inspection fixture, the measuring method further includes: The digital altimeter arranged on the supporting platform surface of the first sagittal height gauge is calibrated to zero.
6. The measuring method according to claim 1, characterized in that: Obtain the second surface top height value of the lens to be tested on the supporting platform surface of the second sagittal height inspection fixture, including: A digital altimeter is used to measure the top height of the second surface of the lens to be tested on the supporting platform surface of the second sagittal height inspection fixture.
7. The measuring method according to claim 6, characterized in that: Before obtaining the value of the second surface top height of the lens to be tested on the supporting platform surface of the second sagittal height inspection fixture, the measuring method further includes: The digital altimeter set on the supporting platform surface of the second sagittal height gauge is calibrated to zero.
8. A device for measuring the sag surface slope of a lens, characterized in that: include: The height acquisition module is used to obtain the height of the sagittal height surface of the lens to be tested, including: Obtain the value of the first surface top height of the lens to be tested on the supporting platform surface of the first sagittal height inspection fixture; Obtain the second surface top height value of the lens to be tested on the supporting platform surface of the second sagittal height inspection fixture; Determine the height of the sagittal height surface of the lens to be tested according to the difference between the first surface top height value and the second surface top height value; The width acquisition module is used to acquire the width of the sagittal height surface of the lens to be tested, including: Obtaining a first inner diameter of a supporting platform surface of a first sagittal height inspection fixture; Obtaining a second inner diameter of the supporting platform surface of the second sagittal height inspection fixture; Determining the width of the sagittal height plane of the lens to be tested according to the difference between the first inner diameter and the second inner diameter; A calculation module is used to obtain the inclination of the lens sagittal surface according to the ratio of the height to the width.
