Test probe and method for manufacturing the same

Abstract

The present invention relates to the field of testing, and specifically provides a test probe and a manufacturing method for the test probe. The test probe of the present invention comprises: a main body, the main body comprises a test end, the test end is provided with a avoidance hole, the avoidance hole has an opening formed on the test end; and an elastic member, the elastic member is fixedly connected to the main body and covers the opening, the elastic member comprises a conductive layer electrically connected to the main body, the conductive layer is arranged on the side of the elastic member opposite to the avoidance hole, so that the elastic member is suitable for abutting against the pin to transmit electrical signals and can be deformed toward the avoidance hole after being subjected to the force of the pin. The above technical solution is intended to solve the problem that the pin is easily damaged by the probe in the prior art.

Description

Technical Field

[0001] The invention relates to the field of testing, and in particular provides a testing probe and a manufacturing method for the testing probe. Background Art

[0002] A probe is a tool used to test, measure or contact electronic equipment, circuit boards or other electronic components. It can provide a temporary electrical connection to perform circuit testing, system debugging and troubleshooting on electronic components.

[0003] Figure 1 It is a schematic diagram of the probe in the prior art when detecting the corresponding pin. In the prior art, when the probe is going to detect the corresponding pin 300, the probe moves toward the pin 300, and the front end 400 of the probe first contacts the pin 300. In order to ensure the stability of the contact between the front end 400 and the pin 300, a certain pressure needs to be applied to the pin 300 after the probe contacts the pin 300. In order to prevent the pressure from damaging the pin and affecting the subsequent process, the probe in the prior art usually also includes a spring, which is compressed to absorb excess pressure to ensure that the front end can still stably contact the pin without damaging the pin. However, in actual applications, there is a risk of the spring getting stuck. When the spring gets stuck, the spring cannot absorb the excess pressure after the front end contacts the pin, which will also damage the pin and affect the subsequent process.

[0004] Therefore, this field needs a new technical solution to solve the above problems. Summary of the invention

[0005] In order to solve the problem that the probe in the prior art is easy to damage the pin, the present invention provides a test probe. The test probe of the present invention comprises: a main body, the main body comprises a test end, the test end is provided with a avoidance hole, the avoidance hole has an opening formed on the test end; and an elastic member, the elastic member is fixedly connected to the main body and covers the opening, the elastic member comprises a conductive layer electrically connected to the main body, the conductive layer is arranged on the side of the elastic member opposite to the avoidance hole, so that the elastic member is suitable for abutting against the pin to transmit an electrical signal and can be deformed toward the avoidance hole after being subjected to the force of the pin.

[0006] The test probe of the present invention comprises a main body, which provides structural stability for the test probe, and is provided with a test end suitable for facing and being able to approach an electronic component to be tested on the main body, and the test end is provided with a avoidance hole, and the avoidance hole has an opening formed on the test end. The elastic member is fixedly connected with the main body and covers the opening, so that when an external force forces the elastic member to deform toward the avoidance hole, it can be at least partially accommodated in the avoidance hole to ensure that the external force is completely balanced by the elastic force of the elastic member. The elastic member includes a conductive layer electrically connected to the main body, and the conductive layer is arranged on the side of the elastic member opposite to the avoidance hole, so that the conductive layer faces the outside of the test probe and is suitable for abutting against the corresponding pin, and forms an electrical connection with the corresponding pin to transmit an electrical signal. At the same time, in order to ensure that the test probe and the pin are stably in contact with each other, the test probe is usually pressed on the pin with a certain pressure, and accordingly, the pin applies a force opposite to the pressure to the elastic member, and the elastic member is deformed under the force, and the excess pressure is absorbed by soft contact, so as to ensure that the metal probe can still be in stable contact with the pin without damaging the pin. Compared with the solution in the prior art that absorbs pressure indirectly by spring deformation, the solution in which the elastic member itself deforms avoids the occurrence of jamming and ensures that the elastic member can always be in soft contact with the pin.

[0007] In the preferred technical solution of the above-mentioned test probe, after the elastic member is deformed, the side of the elastic member provided with the conductive layer is suitable for wrapping the pin and forming a surface contact with the pin. Through the above-mentioned setting, compared with the point contact between the probe and the pin in the prior art, the conductive layer and the pin form a surface contact, the contact area is larger, the electrical connection is more stable, and the contact resistance of the surface contact is lower, which has less impact on the test results.

[0008] In the preferred technical solution of the above-mentioned test probe, the elastic member also includes a spinning layer fixedly connected to the main body, and the spinning fibers in the spinning layer are elastic and have a diameter of micrometer level. Through the above-mentioned arrangement, the spinning layer plays a major role in deformation and rebound, and when the diameter of the spinning fibers is configured to be micrometer level, a lotus leaf effect can be formed on the spinning layer, and dirt is not easily accumulated in a large number of repeated tests, thereby ensuring the accuracy of the test results.

[0009] In the preferred technical solution of the above test probe, the spinning layer is arranged on the test end by an electrospinning process. Through the above arrangement, the electrospinning process can directly generate micron-scale spinning fibers, which are arranged on the test end by spraying.

[0010] In the preferred technical solution of the above test probe, the conductive layer is made of a metal material, and the metal material is attached to the side of the spinning layer opposite to the avoidance hole by evaporation or sputtering. Through the above arrangement, the spinning layer is used as the substrate, and the metal material is arranged on the side of the spinning layer opposite to the avoidance hole by gold plating, so that the elastic member can have both resilience and conductivity.

[0011] In the preferred technical solution of the above test probe, the test probe further includes a gland, the gland abuts against the elastic member and is fixedly connected to the main body, a through hole is formed on the gland, the through hole exposes at least part of the elastic member, so that the elastic member exposed in the through hole is suitable for abutting against the pin. The arrangement of the gland ensures that the elastic member will not fall off from the main body during a large number of test operations.

[0012] In the preferred technical solution of the above test probe, the main body is made of copper material and configured as a hollow tubular member. Through the above arrangement, the processing of the copper tube is simpler, and the hollow part can be used as an avoidance hole to accommodate the deformed elastic member.

[0013] In order to solve the problem that the probe in the prior art is easy to damage the pin, the present invention also provides a manufacturing method for a test probe. The test probe includes: a main body, the main body includes a test end, the test end is provided with a avoidance hole, and the avoidance hole has an opening formed on the test end; and an elastic member, the elastic member is fixedly connected to the main body and covers the opening, the elastic member includes a conductive layer electrically connected to the main body, the conductive layer is arranged on the side of the elastic member opposite to the avoidance hole, so that the elastic member is suitable for abutting against the pin to transmit electrical signals and can be deformed toward the avoidance hole after being subjected to the force of the pin. The manufacturing method includes the steps of: providing a conductive main body and grounding the main body; using an electrospinning device to spray spinning fibers on the test end, the spinning fibers fall on the test end to form a spinning layer, and the spinning layer covers the opening; and a conductive layer is arranged on the side of the spinning layer opposite to the avoidance hole. Through the above configuration, the manufactured test probe absorbs excess pressure by soft contact, ensuring that the metal probe can still stably contact the pin without damaging the pin. Compared with the solution in the prior art that absorbs pressure indirectly by spring deformation, the solution in which the elastic member itself deforms avoids the occurrence of jamming and ensures that the elastic member can always be in soft contact with the pin.

[0014] In a preferred technical solution of the above manufacturing method, the electrospinning device includes a nozzle for ejecting the spun fibers, and the nozzle is arranged above the test end and the distance from the test end is between 2 cm and 20 cm. Through the above configuration, the spun fibers can be stably bonded to the test end and cover the opening.

[0015] In the preferred technical solution of the above manufacturing method, the conductive layer is made of a metal material and is attached to the spinning layer by a vapor deposition or sputtering process. Through the above arrangement, the spinning layer is used as a substrate, and the metal material is arranged on the side of the spinning layer opposite to the avoidance hole by gold plating, so that the elastic member can have both resilience and conductivity.

[0016] Beneficial effects:

[0017] 1. The elastic member is fixedly connected to the main body and covers the opening, so that when the external force forces the elastic member to deform toward the avoidance hole, it can be at least partially accommodated in the avoidance hole to ensure that the external force is completely balanced by the elastic force of the elastic member. The excess pressure is absorbed by soft contact to ensure that the metal probe can still stably contact the pin without damaging the pin.

[0018] 2. The elastic member includes a conductive layer electrically connected to the main body, and the conductive layer is arranged on the side of the elastic member opposite to the avoidance hole, so that the conductive layer faces the outside of the test probe and is suitable for abutting against the corresponding pin, and can form an electrical connection with the corresponding pin to transmit electrical signals.

[0019] 3. The spinning layer plays a major role in deformation and rebound. When the diameter of the spinning fiber is configured at the micron level, a lotus leaf effect can be formed on the spinning layer. It is not easy to accumulate dirt in a large number of repeated tests, thus ensuring the accuracy of the test results. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] The preferred embodiments of the present invention are described below in conjunction with the accompanying drawings, in which:

[0021] Figure 1 It is a schematic diagram of a probe in the prior art when detecting a corresponding pin;

[0022] Figure 2 is a schematic structural diagram of an embodiment of a test probe of the present invention;

[0023] Figure 3 is a cross-sectional schematic diagram of an embodiment of the test probe of the present invention when detecting a corresponding pin;

[0024] Figure 4 is a schematic structural diagram of another embodiment of the test probe of the present invention;

[0025] Figure 5 yes Figure 4 A cross-sectional schematic diagram of an embodiment of the test probe shown;

[0026] Figure 6 It is a schematic flow chart of the manufacturing method for the test probe of the present invention.

[0027] List of reference numerals:

[0028] 100, test probe; 10, main body; 11, test end; 12, avoidance hole; 121, opening; 20, elastic member; 21, conductive layer; 22, spinning layer; 300, pin; 400, front end; 50, pressure cover; 51, through hole; 52, flange. DETAILED DESCRIPTION

[0029] The preferred embodiments of the present invention are described below with reference to the accompanying drawings. It should be understood by those skilled in the art that these embodiments are only used to explain the technical principles of the present invention and are not intended to limit the protection scope of the present invention.

[0030] It should be noted that, in the description of the present invention, the terms “first” and “second” are only used for descriptive purposes and cannot be understood as indicating or implying relative importance.

[0031] In addition, it should be noted that in the description of the present invention, unless otherwise clearly specified and limited, the terms "disposed" and "connected" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a direct connection, an indirect connection through an intermediate medium, or the internal communication of two components. For those skilled in the art, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0032] In order to solve the problem that the probe in the prior art is easy to damage the pin, the present invention provides a test probe 100. The test probe 100 of the present invention comprises: a main body 10, the main body 10 comprises a test end 11, the test end 11 is provided with a avoidance hole 12, the avoidance hole 12 has an opening 121 formed on the test end 11; and an elastic member 20, the elastic member 20 is fixedly connected to the main body 10 and covers the opening 121, the elastic member 20 comprises a conductive layer 21 electrically connected to the main body 10, the conductive layer 21 is arranged on the side of the elastic member 20 opposite to the avoidance hole 12, so that the elastic member 20 is suitable for abutting against the pin 300 to transmit an electrical signal and can be deformed toward the avoidance hole 12 after receiving the force of the pin 300.

[0033] Figure 2 FIG. 1 is a schematic diagram of the structure of an embodiment of the test probe of the present invention. Figure 2As shown, the test probe 100 of the present invention includes a main body 10 and an elastic member 20 arranged on the main body 10, the elastic member 20 is used to contact the corresponding pin 300 and the elastic member 20 is electrically connected to the main body 10, so that the elastic member 20 can transmit an electrical signal to the main body 10 after contacting the pin 300, and the main body 10 can transmit signals with other data receiving devices so as to analyze various performances of the electronic component where the pin 300 is located.

[0034] Figure 3 FIG. 1 is a cross-sectional schematic diagram of an embodiment of the test probe of the present invention when detecting a corresponding pin. Figure 2 and Figure 3 As shown, the main body 10 includes a test end 11, and when the electronic component is tested, the test end 11 is suitable for facing the electronic component to be tested. A avoidance hole 12 is provided on the test end 11, and the avoidance hole 12 has an opening 121 formed on the test end 11. In one or more embodiments, the main body 10 is configured as a tubular member, and the hollow part of the tubular member can be used as the avoidance hole 12. The inner diameter of the tubular member can be configured to be greater than or equal to the diameter of the corresponding hemispherical pin, and the outer diameter of the tubular member only needs to ensure the structural strength of the main body. Exemplarily, the size of the tubular member and the size of the pin corresponding thereto are shown in Table 1 below. Alternatively, the main body 10 can also be configured into other suitable shapes according to actual needs, such as square tubes, wedge-shaped bodies, etc. In one or more embodiments, the main body 10 is made of copper material to transmit electrical signals and provide reliable structural strength. Alternatively, the main body 10 can also be made of materials such as aluminum and nickel.

[0035] Table 1:

[0036] Example Inner diameter of tubular component / mm Outer diameter of tubular component / mm Corresponding pin diameter / mm 1 0.25 0.35 0.25 2 0.3 0.45 0.3 3 0.4 0.55 0.4

[0037] Continue reading Figure 2 and Figure 3 , the elastic member 20 covers the opening 121. When the elastic member 20 abuts against the pin 300 and is subjected to the force of the pin 300, it can be deformed toward the avoidance hole 12, so that at least part of the elastic member 20 is accommodated in the avoidance hole 12. Figure 1As shown, the front end 400 of the probe in the prior art for contacting the pin 300 is usually configured to have an angular shape, and the front end 400 and the pin 300 are in point contact. When the sharp part of the angular part is blunted, the contact resistance rises rapidly, affecting the test result of the probe. After the elastic member 20 of the present invention is deformed, its shape can be changed to a concave shape that matches the surface of the pin 300, suitable for wrapping at least a part of the pin 300, and a surface contact is formed between the elastic member 20 and the pin 300, so that the contact resistance between the elastic member 20 and the pin 300 is small and can be kept stable to ensure the accuracy of the test result. In one or more embodiments, the elastic member 20 is fixedly connected to the test end 11, and the connection method includes but is not limited to bonding, clamping, etc. Alternatively, the elastic member 20 can also be fixedly connected to other suitable positions of the main body 10 so as to be stably fixed on the main body 10. The elastic member 20 may be deformed toward the avoidance hole 12 under the action of the pin 300. When the force of the pin 300 is removed or the test probe 100 is removed from the pin 300, the elastic member 20 may return to its original state under the action of its elasticity. Figure 2 As shown, in one or more embodiments, the original state of the elastic member 20 is that the side facing outward is a plane. It is understandable that after the test probe 100 has been subjected to a large number of test operations, the elastic member 20 will lose some of its resilience to a certain extent, resulting in that after returning to the original state, the side facing outward is no longer a plane, but it does not affect its soft contact with the pin 300. Alternatively, the original state of the elastic member 20 can also be configured in other suitable forms.

[0038] Continue reading Figure 2 and Figure 3 In one or more embodiments, the elastic member 20 is configured in a sheet shape and includes a conductive layer 21 and a spinning layer 22 that are parallel to each other, wherein the conductive layer 21 faces the outside of the test probe 100, and the spinning layer 22 is located between the conductive layer 21 and the avoidance hole 12. The spinning layer 22 is composed of a plurality of spinning fibers that are interwoven and stacked. In one or more embodiments, the spinning fibers are nylon or polyurethane materials. Alternatively, the spinning fibers may also be made of other suitable polymer materials to make the spinning fibers elastic. Continue reading Figure 1, the front end 400 of the probe in the prior art is a concave shape, and dirt is easily attached to the concave place, which affects the accuracy of the test results. The diameter of the spun fiber in the present invention can be configured to be micron-level, so that the surface roughness of the spun layer 22 formed by the tightly interwoven spun fibers is also micron-level, so that a lotus leaf effect can be formed on the elastic member 20, and dirt is not easy to accumulate on the elastic member 20, thereby ensuring that the elastic member 20 always maintains good conductivity in a large number of repeated tests. Exemplarily, the diameter of the spun fiber can be configured to be between 1-100 microns. Alternatively, the spun fiber can also be configured to other suitable diameters, such as increasing the diameter of the spun fiber to ensure the reliability of the elastic member 20. In one or more embodiments, the spun layer 22 sprays the spun fiber onto the test end 11 through an electrospinning process, and the spun fiber is bonded to the test end 11. Alternatively, the spun layer 22 can also be made by other suitable methods.

[0039] Figure 4 is a schematic structural diagram of another embodiment of the test probe of the present invention; Figure 5 yes Figure 4 FIG. 1 is a cross-sectional schematic diagram of an embodiment of a test probe. Figure 4 and Figure 5 As shown, in one or more embodiments, the test probe 100 further includes a gland 50. The gland 50 abuts against the elastic member 20 so as to press and fix the elastic member 20 on the main body 10. A through hole 51 is formed on the gland 50, and the through hole 51 exposes at least a portion of the elastic member 20, so that the elastic member 20 exposed in the through hole 51 can abut against the pin 300. The edge of the gland 50 is also provided with a flange 52, and the flange 52 surrounds the test end 11 and can be riveted to the main body 10, so that the gland 50 is fixedly connected to the main body 10. Alternatively, the connection between the elastic member and the main body can also be reinforced by other suitable methods.

[0040] In one or more embodiments, the conductive layer 21 is made of a metal material. The metal material is attached to the spinning layer 22 that has been arranged on the main body 10 through an evaporation or sputtering process. Specifically, the metal material is attached to the side of the spinning layer 22 opposite to the avoidance hole 12. The metal material can be made of gold element, which has good ductility and is suitable for deforming with the spinning layer 22. In addition, the gold element has strong antioxidant, corrosion resistance and wear resistance, ensuring that the test probe 100 is not easily damaged in a large number of tests. Alternatively, the metal material can also be made of other materials with good ductility and conductivity, such as silver, nickel, etc.

[0041] In summary, the test probe 100 of the present invention, through the setting of the elastic member 20, allows the elastic member 20 to always maintain soft contact with the pin 300 while transmitting the electrical signal, thereby avoiding the situation in the prior art where the probe makes hard contact with the pin 300 when the spring fails or gets stuck, thereby causing damage to the pin 300 and affecting the subsequent process. In addition, the conductive elastic member 20 can also increase the contact area with the pin 300 through deformation, reduce the contact resistance, and ensure the accuracy of the test results.

[0042] Figure 6 1 is a flow chart of a method for manufacturing a test probe according to the present invention. The present invention also provides a method for manufacturing a test probe. The manufacturing method of the present invention is used to manufacture the test probe 100 described above. Figure 6 As shown, after the manufacturing method of the present invention starts, step S1 is first performed, that is, providing a conductive body 10 and grounding the body 10. Exemplarily, the end of the body 10 opposite to the test end 11 is grounded. Through the above-mentioned setting, the spinning fiber ejected by the electrospinning device can fall on the body 10, and the material of the conductive body 10 includes but is not limited to silver, copper, aluminum, nickel, etc.

[0043] Then, step S2 is performed, i.e., using an electrospinning device to spray spinning fibers to the test end 11, and the spinning fibers fall on the test end 11 to form a spinning layer 22 of the elastic member 20, and the spinning layer 22 covers the opening 121. In one or more embodiments, the main body 10 is configured to extend in a vertical direction, wherein the test end 11 faces upward, and the end opposite to the test end 11 faces downward and is grounded, so that the spinning fibers ejected from the nozzle of the electrospinning device can naturally fall on the test end 11. Due to the influence of factors such as spinning fiber material, nozzle diameter and voltage, when the distance between the nozzle and the test end 11 is controlled within the range of 2cm-20cm, the yield rate of the spinning layer 22 is high, and it can form a stable bond with the main body 10 while covering the opening 121.

[0044] Then, step S3 is performed, i.e., a conductive layer 21 is provided on the side of the spinning layer 22 opposite to the avoidance hole 12. In one or more embodiments, the conductive layer 21 is made of a metal material and attached to the spinning layer 22 by a vapor deposition or sputtering process. The metal material includes but is not limited to gold, silver, nickel, etc. Alternatively, the conductive layer 21 can be provided in other ways according to actual needs, such as affixing a gold foil on one side of the spinning layer 22, and fixing the gold foil and the spinning layer 22 or the main body 10 together by components such as a pressure cover 50.

[0045] So far, the technical solutions of the present invention have been described in conjunction with the preferred embodiments shown in the accompanying drawings. However, it is easy for those skilled in the art to understand that the protection scope of the present invention is obviously not limited to these specific embodiments. Without departing from the principle of the present invention, those skilled in the art can make equivalent changes or substitutions to the relevant technical features, and the technical solutions after these changes or substitutions will fall within the protection scope of the present invention.

Claims

1. A test probe, characterized in that: The test probe comprises: A main body, the main body comprising a test end, the test end being provided with a avoidance hole, the avoidance hole having an opening formed on the test end; and An elastic member, the elastic member is fixedly connected to the main body and covers the opening, the elastic member includes a conductive layer electrically connected to the main body, the conductive layer is arranged on a side of the elastic member opposite to the avoidance hole, so that the elastic member is suitable for abutting against the pin to transmit an electrical signal and can be deformed toward the avoidance hole after receiving a force from the pin; the conductive layer is attached to a side of the spinning layer opposite to the avoidance hole; The elastic member further comprises a spinning layer fixedly connected to the main body, the spinning fibers in the spinning layer are elastic and have a diameter of micrometer level, and the spinning layer is arranged on the test end through an electrospinning process; The test probe further includes a pressure cover, which abuts against the elastic member and is fixedly connected to the main body. A through hole is formed on the pressure cover, and the through hole exposes at least a portion of the elastic member, so that the elastic member exposed in the through hole is suitable for abutting against the pin.

2. The test probe according to claim 1, characterized in that: After the elastic member is deformed, the side of the elastic member provided with the conductive layer is suitable for wrapping the pin and forming surface contact with the pin.

3. The test probe according to claim 1, characterized in that: The conductive layer is made of a metal material and is attached to the side of the spinning layer opposite to the avoidance hole through an evaporation or sputtering process.

4. The test probe according to claim 1, characterized in that: The body is made of a copper material and configured as a hollow tubular member.

5. A method for manufacturing a test probe, characterized in that: The test probe comprises: a main body, the main body comprises a test end, the test end is provided with a avoidance hole, the avoidance hole has an opening formed on the test end; and an elastic member, the elastic member is fixedly connected to the main body and covers the opening, the elastic member comprises a conductive layer electrically connected to the main body, the conductive layer is arranged on a side of the elastic member opposite to the avoidance hole, and the conductive layer is attached to a side of the spinning layer opposite to the avoidance hole, so that the elastic member is suitable for abutting against the pin to transmit an electrical signal and can be deformed toward the avoidance hole after being subjected to the force of the pin. The manufacturing method comprises the steps of: Providing the conductive body, grounding the body, the body being made of copper material and configured as a hollow tubular member; Using an electrospinning device to spray spun fibers to the test end, the spun fibers fall onto the test end to form a spun layer of the elastic member, the spun layer covers the opening, the spun fibers in the spun layer are elastic and have a diameter of micrometer level, the electrospinning device comprises a nozzle for spraying the spun fibers, the nozzle is arranged above the test end and the distance from the test end is between 2 cm and 20 cm; A conductive layer is arranged on a side of the spinning layer opposite to the avoidance hole.

6. The manufacturing method according to claim 5, characterized in that: The conductive layer is made of a metal material and is attached to the spinning layer by an evaporation or sputtering process.

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