Amplifier voltage stability batch automatic test system

Abstract

The invention discloses an amplifier voltage stability batch automatic test system which comprises a high and low temperature test box and an amplifier automatic test box. A PXle case, a PXI controller, a multi-path relay switch card, a direct-current power supply and a voltage acquisition card are embedded in an automatic amplifier test box; a test board and a test tool are arranged in the high and low temperature test box; wherein the multi-path relay switch card realizes independent control of each test module and freely switches signals of each test module clamp; the PXI controller is connected by adopting an RS485 standard communication protocol, and a relay switch is triggered through high and low levels of an upper computer; the voltage acquisition card realizes synchronous high-precision acquisition of at least 30 differential synchronous channels for two voltage signals of the test module; and the PXI controller in the PXle case outputs two paths of voltage signals acquired by the voltage acquisition card to the computer to display the acquired information in real time, generate a curve graph, automatically store data and analyze the data, so that the monitoring of the voltage stability is realized. The problems that time and labor are wasted when instruments are built during manual testing, personal errors are prone to occurring in the testing process, efficiency is low and the like are well solved, use is convenient, and operation is easy.

Description

Technical Field

[0001] The invention belongs to the field of testing, and in particular relates to a batch automatic testing device for voltage stability of amplifier modules. Background Art

[0002] The amplifier automatic test system has a wide range of applications in the communications industry, and plays an important role in improving product quality consistency, reducing testing costs, and accelerating technological development. With the development of wireless communication technologies such as 5G and 6G, people have put forward higher requirements on the coverage and quality of communication signals. Therefore, communication equipment manufacturers need to conduct strict quality inspections on the equipment they produce to ensure that they can work normally in different environments and conditions.

[0003] Part of the test content in the amplifier performance test has been automated, but the signal integrity test is still a manual test. An amplifier module needs to be equipped with two multimeters to read the input voltage and output voltage respectively, and the value changes of the product within five minutes of continuous power-on at extreme temperatures need to be checked and recorded. Manual testing is not only difficult to operate, but also prone to human errors, very labor-intensive and time-consuming, and inefficient. Therefore, it is very necessary to develop an automatic batch test system for amplifier voltage stability that can improve work efficiency, save time and cost, and record accurate data. Summary of the invention

[0004] The purpose of the present invention is to provide a batch automatic test system for amplifier voltage stability, which can solve the problems of time-consuming and labor-intensive instrument construction during manual testing, easy human errors in the testing process, low efficiency, etc., and is easy to use and simple to operate. The invention is suitable for automatic testing of voltage stability in amplifier modules, and has the advantages of versatility, economy, efficiency, convenience, etc.

[0005] The technical solution of the present invention is: an amplifier voltage stability batch automatic test system, characterized in that it comprises a high and low temperature test box and an amplifier automatic test box; a PXle chassis, a PXI controller, a multi-channel relay switch card, a DC power supply, and a voltage acquisition card are embedded in the amplifier automatic test box; a test board and a test tool are arranged in the high and low temperature test box;

[0006] The multi-channel relay switch card can realize the individual control of each test module and freely switch the signal of each test module fixture; it includes 8 high-position wiring terminals, 8 low-position wiring terminals, 16 groups of 4-to-1 analog signal switching, and 3 groups of power signal switching. It adopts RS485 standard communication protocol to connect to PXI controller, and triggers relay switch through high and low levels of host computer; voltage acquisition card can realize synchronous high-precision acquisition of two voltage signals of test module, at least 30 differential synchronous channels; DC power supply supplies power to test board, and realizes independent power supply of test modules placed on the test board through voltage acquisition card and multi-channel relay switch card; the PXI controller inside PXle chassis outputs the two voltage signals collected by voltage acquisition card to computer to display the collected information in real time, generate curve chart, and automatically save the data, and analyze the data, so as to realize the monitoring of voltage stability.

[0007] Furthermore, the 4-to-1 analog signal switching includes 1-way internal self-test reference signal switching and 3-way 3-test module fixture signal switching.

[0008] Furthermore, the test tooling includes a test fixture and a test cable. The test fixture is used to fix the test module and interface lead-out, realize the signal conversion and conditioning of the module, and send the final signal to the voltage acquisition card; one end of the test cable is connected to the test board, and the other end is connected to the amplifier automatic test box through the test interface.

[0009] Furthermore, the high and low temperature test chamber is provided with a temperature control panel, a door handle and transparent glass. The ambient temperature to be tested is set through the temperature control panel, and the internal conditions of the high and low temperature test chamber can be seen through the transparent glass without opening the door. A wire outlet is provided on the side of the high and low temperature test chamber, and one end of the test cable led out from the wire outlet is connected to the test board, and the other end is connected to the test chamber.

[0010] Furthermore, a rotatable table top is fixed on the upper end of the test box, and a computer display screen is placed on the rotatable table top.

[0011] Furthermore, a 3*5 array of test fixtures is provided on the test board to test 15 modules at a time.

[0012] Furthermore, a locking brake wheel is provided at the bottom of the test box, which can freely move the test position and has a position locking function.

[0013] The present invention has the following beneficial effects:

[0014] 1. The present invention can not only reduce labor costs and avoid manual errors, but also improve the accuracy and reliability of the test. In addition, a more comprehensive performance test can be performed on other indicators of the amplifier, which can realize early detection of problems in the production process, thereby saving time and cost. It can also provide research institutions and universities with tools for researching and developing communication technologies, allowing researchers to conduct experiments and analysis faster, thereby accelerating the development of technology.

[0015] 2. The present invention meets the demand for batch automatic testing of amplifier voltage stability, replaces the traditional manual test environment construction, parameter setting, data recording and other processes, has a simple test method, and does not require human intervention in the automatic mode;

[0016] 3. The present invention meets the batch product delivery schedule, has a large number of tested modules, a long test time, and a large amount of voltage step test data, which improves the test efficiency by 400% compared with traditional tests, and has accurate data reading and a stable system;

[0017] 4. The present invention is extensible. Theoretically, by designing a fixture for the same type of module, writing a new sub-item test program and assigning test parameters to it, it can be expanded to other modules of the same type for testing. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 This is the front view of the amplifier voltage stability batch automatic test system with high and low temperature test chamber;

[0019] Figure 2 It is a multi-channel relay card design;

[0020] Figure 3 It is the test tooling composition diagram;

[0021] Figure 4 It is a software structure relationship diagram;

[0022] Figure 5 It is the operation flow chart;

[0023] Explanation of the figure numbers: 1-test cable, 2-test interface, 3-computer display, 4-rotatable table, 5-PXIe switch, 6-emergency stop button, 7-equipment main switch, 8-power indicator light, 9-PXIe chassis, 10-PDU socket strip, 11-DC power supply, 12-locking brake wheel, 13-high and low temperature test chamber outlet, 14-temperature control board, 15-test board, 16-door handle, 17-transparent glass, 18-high and low temperature test chamber, 19-test fixture. DETAILED DESCRIPTION

[0024] In order to make the purpose, technical solution and advantages of the present invention clearer, the technical solution of the present invention will be described in detail below. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other implementation methods obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0025] Combine the following Figures 1 to 5 The present invention is described in detail as follows:

[0026] An amplifier voltage stability batch automatic test system, the test system hardware mainly consists of a control unit, a power supply unit, a signal acquisition unit, a signal conditioning unit and a test unit. The control unit includes a PXle chassis 9, a PXI controller, and a multi-channel relay switch card; the power supply unit is a DC power supply 11; and the signal acquisition unit uses a voltage acquisition card.

[0027] A PXle chassis 9, a PXI controller, a multi-channel relay switch card, a DC power supply 11, and a voltage acquisition card are embedded in the amplifier automatic test box.

[0028] PXIe chassis 9 uses PXIe-2315, which has high data throughput, 5-slot PCIe Gen2 (PXIe-2315G2), high clock accuracy, low phase jitter, and low power ripple noise, making it very suitable for amplifier testing;

[0029] The PXI controller selected is PXIe-63937, which is a test system based on PXIExpress bus technology. It can meet the needs of diverse test measurements and provide maximum computer processing performance. It integrates 2 computing engines and 4 execution sequences on one processor, so that a large number of tasks can be executed independently and synchronously in a multi-tasking environment. It can also support 4 groups of 4 channels or 1 group of 8 channels plus 1 group of 16 channels. The maximum system data transmission bandwidth from CPU to PXIe backplane line is up to 16GB / s.

[0030] Considering that the number of test modules is 15 each time, the power supply of each module needs to be independently controlled. When there is only one DC power supply 11, a multi-channel relay switch card is used to control the power supply of each test module. The self-developed multi-channel relay switch card is selected to realize the power supply control function. Each test module can be controlled separately, and the signal of each test module fixture can be freely switched. The design principle is as follows Figure 2As shown, it includes 8 high-position terminals, 8 low-position terminals, 16 groups of 4-to-1 analog signal switching (1 for internal self-test reference signal switching, 3 for 3 module fixture signal switching), 3 groups of power signal switching, maximum switching time 10mS, on-resistance flatness ≤1Ω, RS485 standard communication protocol connected to PXI controller, and triggering relay switch through high and low levels of host computer. Signal voltage 8-30V optocoupler isolation compatible with NPN / PNP signal input, internal short-circuit current does not exceed 10A, can be used to cascade the next module, and external power supply current is less than 0.5A.

[0031] The power supply uses the GW Instek CPP-2323 dual-channel programmable isolated DC power supply 11 according to the device requirements. The maximum output of a single channel is 32V / 3A, and it has overload and short-circuit protection functions to ensure that the device is not damaged under abnormal conditions.

[0032] The signal acquisition unit selects the PXIe-4302 voltage acquisition card, which has 32 analog differential inputs, 24-bit ADC resolution, and an acquisition rate of 1S / s t-5kS / s. It can achieve synchronous and high-precision acquisition of at least 30 differential synchronization channels for the two voltage signals of the test module (one within ±10V, with an accuracy of 1mV; one within ±1V, with an accuracy of 0.1mV).

[0033] like Figure 3 As shown, the test fixture includes a test fixture 19 and a test cable 1. The test fixture 19 is mainly used to fix the test module and the interface lead-out, realize the signal conversion and conditioning of the test module, and send the final signal to the voltage acquisition card inside the test box. Both ends of the test cable 1 are designed with male and female aviation plugs. One end is connected to the test board 15, which is convenient for replacing the test board inside the high and low temperature test box 18. The other end is connected to the amplifier automatic test box through the test interface 2, which is convenient for external replacement of the test cable 1. Each test fixture can test 15 modules at the same time.

[0034] The test equipment software is based on the mature QT 5.12 platform and is programmed in C++. The database system uses SQLite and is modularly designed. It has functions such as user login, user management, system self-check, test parameter configuration, test process control, test data management and report generation. The structural relationship diagram is as follows: Figure 4 .

[0035] The amplifier automatic test box cabinet adopts a floor-standing 22U standard cabinet with an overall size of 1200×600×800mm (height×width×depth). The bottom is equipped with a locking brake wheel 12, which can be freely moved to the test position and has a position locking function.

[0036] The test board 15 is powered by a DC power supply 11, and the 15 modules on the test board are independently powered by a voltage acquisition card and a multi-channel relay card (self-developed) inside the test box.

[0037] The PXI controller inside the PXle chassis outputs the two voltage signals collected by the voltage acquisition card to the computer to display the collected information in real time, generate a curve chart, automatically save the data, and analyze the data, thereby realizing the monitoring of voltage stability.

[0038] The test equipment control bar includes an emergency stop button 6, a PXIe switch 5, a power indicator light 8, and a main equipment switch 7.

[0039] A temperature control panel 14, a test panel 15, a door handle 16, and a transparent glass 17 are provided on the high and low temperature test box 18. The high and low temperature test box 18 sets the ambient temperature to be tested through the temperature control panel 14, and the internal conditions of the high and low temperature test box can be seen through the transparent glass 17 without opening the door; a wire outlet 13 is provided on the side of the equipment, and a test cable 1 is led out from the wire outlet of the high and low temperature test box, one end of which is connected to the test panel 15, and the other end is connected to the test box. A 3*5 array of test fixtures is provided on the test panel 15, and 15 modules can be tested at the same time; the bottom of the test box is provided with a locking brake wheel 12 for easy movement; a rotatable table top 4 is fixed on the upper end of the test box, and a computer display screen 3 is placed on the rotatable table top 4. Figure 1 As shown, the system is powered by a standard 220V / 50Hz AC power supply, and the power consumption is less than 1kW.

[0040] During the test, the amplifier automatic test box is connected to the test board placed inside the high and low temperature test box.

[0041] The module under test is placed in the Figure 3 On the test fixture mainboard, there are 15 modules per board, which are connected to the test box through the test cable 1. After the test fixture mainboard is placed in the high and low temperature test box 18 for insulation, the 15 modules under test are energized in a cyclic scanning manner for 5 minutes. The software synchronously collects and records the two-way voltage signals of the module to generate a curve graph, and analyzes the data through the set program to realize the monitoring of voltage stability. The storage unit saves the test results, and the overall process is shown in Figure 5 .

Claims

1. A batch automatic test system for amplifier voltage stability, It is characterized in that It comprises a high and low temperature test box (13) and an amplifier automatic test box; a PXle chassis (9), a PXI controller, a multi-channel relay switch card, a DC power supply (11), and a voltage acquisition card are embedded in the amplifier automatic test box; a test board (15) and a test tool are arranged in the high and low temperature test box (13); The multi-channel relay switch card realizes the individual control of each test module and freely switches the signal of each test module fixture; it includes 8 high-position wiring terminals, 8 low-position wiring terminals, 16 groups of 4-to-1 analog signal switching, and 3 groups of power signal switching, and adopts RS485 standard communication protocol to connect to the PXI controller, and triggers the relay switch through the high and low levels of the host computer; the voltage acquisition card realizes synchronous high-precision acquisition of at least 30 differential synchronization channels for two voltage signals of the test module; the DC power supply (11) supplies power to the test board (15), and the voltage acquisition card and the multi-channel relay switch card realize independent power supply to the test modules placed on the test board; the PXI controller inside the PXle chassis outputs the two voltage signals collected by the voltage acquisition card to a computer to display the collected information in real time, generate a curve chart, and automatically save the data, and analyze the data, thereby realizing the monitoring of voltage stability.

2. The amplifier voltage stability batch automatic testing system as claimed in claim 1, It is characterized in that 4-in-1 analog signal switching includes 1-way internal self-test reference signal switching and 3-way 3-test module fixture signal switching.

3. The amplifier voltage stability batch automatic testing system as claimed in claim 2, It is characterized in that The test fixture comprises a test fixture (19) and a test cable (1); the test fixture (19) is used to fix the test module and the interface lead-out, realize the signal conversion and conditioning of the module, and send the final signal to the voltage acquisition card; one end of the test cable (1) is connected to the test board (10), and the other end is connected to the amplifier automatic test box through the test interface (2).

4. The amplifier voltage stability batch automatic testing system as claimed in claim 3, It is characterized in that The high and low temperature test box (18) is also provided with a temperature control panel (14), a door handle (16), and a transparent glass (17). The high and low temperature test box (18) sets the ambient temperature to be tested through the temperature control panel (14), and the internal conditions of the high and low temperature test box can be seen through the transparent glass (17) without opening the door. A wire outlet (13) is provided on the side of the high and low temperature test box (18), and one end of a test cable (1) is connected to the test board (15) through the wire outlet, and the other end is connected to the amplifier automatic test box.

5. The amplifier voltage stability batch automatic testing system as claimed in claim 1, It is characterized in that A rotatable table top (4) is fixed on the upper end of the amplifier automatic test box, and a computer display screen (3) is placed on the rotatable table top (4).

6. The amplifier voltage stability batch automatic testing system as claimed in claim 3, It is characterized in that A 3*5 array of test fixtures are provided on the test board (15) to test 15 modules at a time.

7. The amplifier voltage stability batch automatic testing system as claimed in claim 1, It is characterized in that A locking brake wheel (12) is provided at the bottom of the amplifier automatic test box, which can freely move the test position and has a position locking function.

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