Seed crystal orientation testing tool for single crystal blade and use method of seed crystal orientation testing tool

Abstract

The invention discloses a seed crystal orientation testing tool for a single crystal blade and a use method of the seed crystal orientation testing tool. The tool comprises a base, a clamping table, a pressing plate and a compression screw, the clamping table is placed on the base; a seed crystal is placed in the clamping table; the pressing plate is positioned above the seed crystal; and the compression screw is vertically mounted on the clamping table above the pressing plate. The method comprises the following steps: loading a seed crystal into a tool to form a seed crystal clamping assembly, and carrying out electrolytic polishing on a seed crystal exposed section on the seed crystal clamping assembly; the seed crystal clamping assembly is positioned in a crystal orientation analyzer through a base, and primary dendritic crystal orientation of the end face of the seed crystal is analyzed and tested; and adjusting the placing direction of the seed crystal clamping assembly and repositioning, and analyzing and testing the secondary dendritic crystal orientation on the side surface of the seed crystal. According to the method, the requirement for batch electrolytic polishing of the seed crystals can be met, meanwhile, the requirement for batch analysis and testing of seed crystal orientation is met, the preparation efficiency of the seed crystals can be greatly improved, and therefore the requirement for the actual production schedule is better met.

Description

Technical Field

[0001] The invention belongs to the technical field of manufacturing aircraft engine parts, and in particular relates to a seed crystal orientation testing tool for a single crystal blade and a use method thereof. Background Art

[0002] The mechanical properties of nickel-based single crystal high-temperature alloys have obvious anisotropy. By controlling the primary and secondary dendrite orientations of single crystal blades, the service life of the blades can be significantly improved.

[0003] The seed crystal method can achieve precise control of the orientation of epitaxially grown grains by accurately positioning the pre-set seed crystals, thereby achieving effective control of the three-dimensional orientation of single crystals, but this process has high requirements on the initial orientation of the seed crystals.

[0004] Direct casting of seed crystals or electrospark cutting of single crystal test bars or test pieces is a common method for preparing seed crystal samples. In order to ensure the accuracy of the original orientation of the seed crystal, a crystal orientation analyzer is required to confirm the primary and secondary dendrite orientations of the seed crystal samples to meet the control requirements of the three-dimensional orientation of the single crystal blade.

[0005] However, a seed crystal sample prepared by direct seed crystal casting or electric spark cutting will have an oxide layer of a certain thickness on the surface of the seed crystal sample, which will directly affect the analysis and test of the crystal orientation.

[0006] Therefore, in order to meet the analysis and testing requirements of seed crystal orientation, mechanical grinding and polishing is usually used to remove the oxide layer on the surface of the seed crystal sample. However, the working efficiency of mechanical grinding and polishing is low and cannot meet the batch analysis and testing requirements of seed crystal orientation, which will further reduce the preparation efficiency of seed crystals and is difficult to keep up with the actual production progress requirements. Summary of the invention

[0007] In view of the problems existing in the prior art, the present invention provides a seed crystal crystal orientation testing tool for single crystal blades and a method of using the tool, which can meet the needs of batch electrolytic polishing of seed crystals, while meeting the requirements of batch analysis and testing of seed crystal orientation, and can greatly improve the preparation efficiency of seed crystals, thereby better meeting the actual production schedule requirements.

[0008] In order to achieve the above-mentioned purpose, the present invention adopts the following technical scheme: a seed crystal crystal orientation test tool for a single crystal blade, comprising a base, a clamping table, a pressure plate and a clamping screw; the clamping table is placed on the base; the clamping table is used to place the seed crystal; the pressure plate is located above the seed crystal; the clamping screw is vertically installed on the clamping table above the pressure plate.

[0009] The base adopts an L-shaped structure, and the two arms of the base are respectively recorded as the first arm and the second arm; the end surface of the first arm is set as the first reference plane, the outer surface of the first arm is set as the second reference plane, and the inner surface of the first arm is set as the third reference plane; the inner surface of the second arm is set as the fourth reference plane.

[0010] The clamping platform adopts an inverted T-shaped groove structure, and a plurality of seed crystal slots are evenly distributed on the bottom surface of the inverted T-shaped groove of the clamping platform, and one end of the seed crystal is located in the seed crystal slot.

[0011] The lower surface of the clamping table is set as a fifth reference surface, and the back surface of the clamping table is set as a sixth reference surface.

[0012] The pressing plate is located in the inverted T-shaped groove of the clamping table and directly above the seed crystal slot, and a rubber pad is fixedly mounted on the lower surface of the pressing plate.

[0013] There are two clamping screws, and each of the two clamping arms at the top of the inverted T-shaped groove of the clamping platform is equipped with a clamping screw, and the screw end of the clamping screw is directly opposite to the upper surface of the pressure plate.

[0014] A positioning block is arranged on the back of the clamping platform, and the positioning block is fixedly connected to the clamping platform by fastening screws.

[0015] The method for using the seed crystal orientation test tool for single crystal blades comprises the following steps:

[0016] Step 1: Clamping and fixing the seed crystal

[0017] First, insert the cut seed crystals into the seed crystal slots one by one, then place the pressing plate above the seed crystal slot so that the rubber pad is between the seed crystal and the pressing plate, and then tighten the two clamping screws until the pressing plate presses the seed crystal into the seed crystal slot through the rubber pad, thus forming a seed crystal clamping assembly;

[0018] Step 2: Surface treatment of seed crystal

[0019] Electrolytic polishing is performed on the end face and side face of the seed crystal outside the seed crystal slot by using an electrolytic polishing method;

[0020] Step 3: Primary dendrite orientation analysis test of seed crystal

[0021] First, the base is sent into the crystal orientation analyzer, and the base is positioned in the crystal orientation analyzer through the first reference plane and the second reference plane. Then, the seed crystal clamping assembly is sent into the crystal orientation analyzer and placed on the base, so that the clamping table and the positioning block are abutted together, the fifth reference plane of the clamping table is aligned with the third reference plane of the base, and the sixth reference plane of the clamping table is aligned with the fourth reference plane of the base. Then, the distance between the measuring head of the crystal orientation analyzer and the seed crystal is adjusted, and then the primary dendrite orientation of the end face of the seed crystal is analyzed and tested by the crystal orientation analyzer;

[0022] Step 4: Secondary dendrite orientation analysis test of seed crystal

[0023] Adjust the placement direction of the seed crystal clamping assembly on the base so that the clamping table and the positioning block are close together, the fifth reference plane of the clamping table is aligned with the fourth reference plane of the base, and the sixth reference plane of the clamping table is aligned with the third reference plane of the base. Then readjust the distance between the measuring head of the crystal orientation analyzer and the seed crystal, and then use the crystal orientation analyzer to analyze and test the secondary dendrite orientation on the side of the seed crystal.

[0024] Beneficial effects of the present invention:

[0025] The single crystal blade seed crystal orientation testing tool and use method of the present invention can meet the needs of batch electrolytic polishing of seed crystals, while meeting the requirements of batch analysis and testing of seed crystal orientation, and can greatly improve the preparation efficiency of seed crystals, thereby better meeting the actual production schedule requirements. BRIEF DESCRIPTION OF THE DRAWINGS

[0026] Figure 1 It is a structural schematic diagram of a seed crystal orientation testing tool for a single crystal blade of the present invention;

[0027] Figure 2 It is a structural schematic diagram of the seed crystal clamping assembly of the present invention;

[0028] Figure 3 It is a structural schematic diagram of the clamping table of the present invention;

[0029] Figure 4 It is a structural schematic diagram of the base of the present invention (viewing angle 1);

[0030] Figure 5 It is a structural schematic diagram of the base of the present invention (viewing angle 2);

[0031] In the figure, 1 is a base, 2 is a clamping table, 3 is a pressure plate, 4 is a clamping screw, 5 is a seed crystal, 6 is a first arm, 7 is a second arm, 8 is a first reference plane, 9 is a second reference plane, 10 is a third reference plane, 11 is a fourth reference plane, 12 is a seed crystal slot, 13 is a fifth reference plane, 14 is a sixth reference plane, 15 is a rubber pad, 16 is a positioning block, and 17 is a fastening screw. DETAILED DESCRIPTION

[0032] The present invention is further described in detail below with reference to the accompanying drawings and specific embodiments.

[0033] like Figures 1 to 5 As shown, a seed crystal orientation test tool for a single crystal blade includes a base 1, a clamping platform 2, a pressure plate 3 and a clamping screw 4; the clamping platform 2 is placed on the base 1; the clamping platform 2 is used to place the seed crystal 5; the pressure plate 3 is located above the seed crystal 5; the clamping screw 4 is vertically installed on the clamping platform 2 above the pressure plate 3.

[0034] The base 1 adopts an L-shaped structure, and the two arms of the base 1 are respectively marked as a first arm 6 and a second arm 7; the end surface of the first arm 6 is set as a first reference plane 8, the outer surface of the first arm 6 is set as a second reference plane 9, and the inner surface of the first arm 6 is set as a third reference plane 10; the inner surface of the second arm 7 is set as a fourth reference plane 11.

[0035] The clamping table 2 adopts an inverted T-shaped groove structure. A plurality of seed crystal slots 12 are evenly distributed on the bottom surface of the inverted T-shaped groove of the clamping table 2 . One end of the seed crystal 5 is located in the seed crystal slot 12 .

[0036] The lower surface of the clamping table 2 is set as a fifth reference surface 13 , and the back surface of the clamping table 2 is set as a sixth reference surface 14 .

[0037] The pressing plate 3 is located in the inverted T-shaped groove of the clamping platform 2 and is located directly above the seed crystal slot 12 . A rubber pad 15 is fixedly mounted on the lower surface of the pressing plate 3 .

[0038] There are two clamping screws 4 , and each of the two clamping arms at the top of the inverted T-shaped groove of the clamping platform 2 is equipped with a clamping screw 4 . The screw end of the clamping screw 4 is opposite to the upper surface of the pressing plate 3 .

[0039] A positioning block 16 is provided on the back of the clamping platform 2 , and the positioning block 16 is fixedly connected to the clamping platform 2 via a fastening screw 17 .

[0040] The method for using the seed crystal orientation test tool for single crystal blades comprises the following steps:

[0041] Step 1: Clamping and fixing the seed crystal 5

[0042] First, the cut seed crystals 5 are inserted into the seed crystal slots 12 one by one, and then the pressing plate 3 is placed above the seed crystal slots 12, so that the rubber pad 15 is between the seed crystal 5 and the pressing plate 3, and then the two clamping screws 4 are tightened until the pressing plate 3 presses and fixes the seed crystal 5 in the seed crystal slots 12 through the rubber pad 15, and at this time, a seed crystal 5 clamping assembly is formed;

[0043] In this embodiment, the seed crystal 5 is prepared by an electric spark cutting process, the cross-sectional shape of the cut seed crystal 5 is a square, the side length of the square is 3 mm, the length of the seed crystal 5 is 30 mm, the cross-sectional shape of the seed crystal slot 12 is adapted to the seed crystal 5, the insertion depth of the seed crystal 5 in the seed crystal slot 12 is 5 mm, and the length of the seed crystal 5 remaining outside the seed crystal slot 12 is 25 mm;

[0044] Step 2: Surface treatment of seed crystal 5

[0045] Electropolishing the end face and side face of the seed crystal 5 outside the seed crystal slot 12 by electropolishing;

[0046] In this embodiment, the voltage of electrolytic polishing is 30V, the current of electrolytic polishing is 10mA, the time of electrolytic polishing is 10s, and the electrolyte used for electrolytic polishing is a saturated sodium chloride aqueous solution. The side and end faces of the seed crystal 5 after polishing should show metallic luster to meet the subsequent analysis and test requirements of the orientation of the seed crystal 5;

[0047] Step 3: Primary dendrite orientation analysis test of seed crystal 5

[0048] First, the base 1 is sent into the crystal orientation analyzer, and the base 1 is positioned in the crystal orientation analyzer through the first reference surface 8 and the second reference surface 9. Then, the seed crystal 5 clamping assembly is sent into the crystal orientation analyzer and placed on the base 1, so that the clamping table 2 and the positioning block 16 are close together, the fifth reference surface 13 of the clamping table 2 is aligned with the third reference surface 10 of the base 1, and the sixth reference surface 14 of the clamping table 2 is aligned with the fourth reference surface 11 of the base 1. Then, the distance between the measuring head of the crystal orientation analyzer and the seed crystal 5 is adjusted, and then the primary dendrite orientation of the end face of the seed crystal 5 is analyzed and tested by the crystal orientation analyzer;

[0049] Step 4: Secondary dendrite orientation analysis test of seed crystal 5

[0050] Adjust the placement direction of the seed crystal 5 clamping assembly on the base 1, so that the clamping table 2 and the positioning block 16 are close together, the fifth reference plane 13 of the clamping table 2 is aligned with the fourth reference plane 11 of the base 1, and the sixth reference plane 14 of the clamping table 2 is aligned with the third reference plane 10 of the base 1, and then readjust the distance between the measuring head of the crystal orientation analyzer and the seed crystal 5, and then use the crystal orientation analyzer to analyze and test the secondary dendrite orientation on the side of the seed crystal 5.

[0051] The solutions in the embodiments are not intended to limit the protection scope of the present invention. All equivalent implementations or changes that do not deviate from the present invention are included in the protection scope of the present invention.

Claims

1. A seed crystal orientation test tool for a single crystal blade, characterized by: It includes a base, a clamping platform, a pressure plate and a clamping screw; the clamping platform is placed on the base; the clamping platform is used to place seed crystals; the pressure plate is located above the seed crystals; the clamping screw is vertically installed on the clamping platform above the pressure plate.

2. The single crystal blade seed crystal orientation test tool according to claim 1, characterized in that: The base adopts an L-shaped structure, and the two arms of the base are respectively recorded as the first arm and the second arm; the end surface of the first arm is set as the first reference plane, the outer surface of the first arm is set as the second reference plane, and the inner surface of the first arm is set as the third reference plane; the inner surface of the second arm is set as the fourth reference plane.

3. The single crystal blade seed crystal orientation test tool according to claim 2, characterized in that: The clamping platform adopts an inverted T-shaped groove structure, and a plurality of seed crystal slots are evenly distributed on the bottom surface of the inverted T-shaped groove of the clamping platform, and one end of the seed crystal is located in the seed crystal slot.

4. The single crystal blade seed crystal orientation test tool according to claim 3, characterized in that: The lower surface of the clamping table is set as a fifth reference surface, and the back surface of the clamping table is set as a sixth reference surface.

5. The single crystal blade seed crystal orientation test tool according to claim 4, characterized in that: The pressing plate is located in the inverted T-shaped groove of the clamping table and directly above the seed crystal slot, and a rubber pad is fixedly mounted on the lower surface of the pressing plate.

6. The single crystal blade seed crystal orientation test tool according to claim 5, characterized in that: There are two clamping screws, and each of the two clamping arms at the top of the inverted T-shaped groove of the clamping platform is equipped with a clamping screw, and the screw end of the clamping screw is directly opposite to the upper surface of the pressure plate.

7. The single crystal blade seed crystal orientation test tool according to claim 6, characterized in that: A positioning block is arranged on the back of the clamping platform, and the positioning block is fixedly connected to the clamping platform by fastening screws.

8. The method for using the seed crystal orientation testing tool for single crystal blades according to claim 7, characterized in that: The steps include: Step 1: Clamping and fixing the seed crystal First, insert the cut seed crystals into the seed crystal slots one by one, then place the pressing plate above the seed crystal slot so that the rubber pad is between the seed crystal and the pressing plate, and then tighten the two clamping screws until the pressing plate presses the seed crystal into the seed crystal slot through the rubber pad, thus forming a seed crystal clamping assembly; Step 2: Surface treatment of seed crystal Electrolytic polishing is performed on the end face and side face of the seed crystal outside the seed crystal slot by using an electrolytic polishing method; Step 3: Primary dendrite orientation analysis test of seed crystal First, the base is sent into the crystal orientation analyzer, and the base is positioned in the crystal orientation analyzer through the first reference plane and the second reference plane. Then, the seed crystal clamping assembly is sent into the crystal orientation analyzer and placed on the base, so that the clamping table and the positioning block are abutted together, the fifth reference plane of the clamping table is aligned with the third reference plane of the base, and the sixth reference plane of the clamping table is aligned with the fourth reference plane of the base. Then, the distance between the measuring head of the crystal orientation analyzer and the seed crystal is adjusted, and then the primary dendrite orientation of the end face of the seed crystal is analyzed and tested by the crystal orientation analyzer; Step 4: Secondary dendrite orientation analysis test of seed crystal Adjust the placement direction of the seed crystal clamping assembly on the base so that the clamping table and the positioning block are close together, the fifth reference plane of the clamping table is aligned with the fourth reference plane of the base, and the sixth reference plane of the clamping table is aligned with the third reference plane of the base. Then readjust the distance between the measuring head of the crystal orientation analyzer and the seed crystal, and then use the crystal orientation analyzer to analyze and test the secondary dendrite orientation on the side of the seed crystal.

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