Calibration equipment suitable for inside micrometer

Abstract

The invention relates to calibration equipment suitable for an inside micrometer. The calibration equipment comprises a base, an angle adjusting device is installed on the base, a guiding device is installed on the angle adjusting device, a reference adjusting device is installed at one end of the guiding device, and the inside micrometer is connected to the reference adjusting device. The guiding device is located at the detection end of the inside micrometer and provided with an auxiliary thrust assembly, and the auxiliary thrust assembly is connected with a contact adjusting device. Through the mutual cooperation of the reference adjusting device and the contact adjusting device, the inside micrometer can calibrate and detect the inner hole with any diameter, does not need to be independently adjusted after being dismantled, and can realize the independent setting of different test point positions. And the stretching bolt and the stretching nut are matched with each other, so that the main thrust block can be conveniently released and positioned, and the operation difficulty is reduced on the premise of meeting the operation precision.

Description

Technical Field

[0001] The invention relates to a calibration device, in particular to a calibration device suitable for an inside diameter micrometer. Background Art

[0002] In the existing workpiece production and processing, for some annular workpieces, it is necessary to use an internal micrometer to achieve accurate measurement of the inner diameter.

[0003] Specifically, the internal micrometer is a very accurate measuring tool for measuring the inner hole size. Before measuring, in order to make the measurement accurate, it is usually necessary to calibrate it with a practical ring gauge. In addition, the ring gauge has a very high accuracy, and the corresponding ring gauge specifications are required for the outer diameter size of the bearing (workpiece).

[0004] However, the current specifications of ring gauges are basically set at a specification gap of 10mm. For each measurement of an inner hole of a certain diameter specification, a corresponding ring gauge is required to calibrate the accuracy of the micrometer. In this way, different ring gauges are required to calibrate inner holes of different diameters. In addition, there are no corresponding ring gauges for calibration of some holes of specific diameters, and customization is required, which increases the cost of use.

[0005] In short, during the current measurement, it is necessary to select several independent ring gauges for different inner hole specifications. During use, a large number of ring gauges need to be prepared, the operation is cumbersome, and the implementation cost is high.

[0006] In view of the above-mentioned defects, the designer has actively carried out research and innovation in order to create a calibration device suitable for inside diameter micrometers to make it more valuable for industrial use. Summary of the invention

[0007] In order to solve the above technical problems, the object of the present invention is to provide a calibration device suitable for an inside micrometer.

[0008] The calibration device for an internal micrometer of the present invention comprises a base, wherein: an angle adjustment device is installed on the base, a guide device is installed on the angle adjustment device, a reference adjustment device is installed at one end of the guide device, and the internal micrometer is connected to the reference adjustment device;

[0009] The guide device is located at the detection end of the internal diameter micrometer and is installed with a secondary thrust assembly, and the secondary thrust assembly is connected to a contact adjustment device;

[0010] The guide device includes a crossbeam connected to the angle adjustment device, a main precision rack plate and a secondary precision rack plate are mirror-mounted and connected on the crossbeam, a clamping space is formed between the main precision rack plate and the secondary precision rack plate, and the contact adjustment device is installed in the clamping space;

[0011] The main precision rack plate, the auxiliary precision rack plate and the crossbeam are suspended to form a guide groove, the contact adjustment device includes a sliding block movably buckled on the upper edge of the main precision rack plate and the auxiliary precision rack plate, the sliding block is connected to the main thrust block through the adjustment component, and the main thrust block is in contact with the guide groove and the crossbeam;

[0012] Toothed positioning pointers are installed on both the left and right sides of the main thrust block, and the toothed positioning pointers are in meshing contact with the corresponding main precision rack plate and auxiliary precision rack plate.

[0013] Furthermore, in the above-mentioned calibration device suitable for inside diameter micrometers, the base is connected to a bracket by tightening bolts, and the bracket is connected to the bottom of the guide device.

[0014] Furthermore, the above-mentioned calibration equipment is suitable for inside diameter micrometers, wherein the reference adjustment device includes a fixed block connected to the side of the beam, a second precision reference block is clamped between the fixed block and the inside diameter micrometer, and the first precision reference block and the third precision reference block are clamped on both sides of the second precision reference block, respectively, and the first precision reference block and the third precision reference block are respectively connected to the main precision rack plate and the auxiliary precision rack plate.

[0015] Furthermore, in the above-mentioned calibration device suitable for an inside micrometer, the first precision reference block and the third precision reference block are both provided with contact tooth surfaces, and the inside micrometer is in contact with the contact tooth surfaces.

[0016] Furthermore, the above-mentioned calibration equipment suitable for inside diameter micrometers, wherein the front end of the fixed block is provided with a docking convex strip, the first precision reference block and the third precision reference block are provided with embedding grooves at corresponding positions, the first precision reference block and the third precision reference block are plug-connected with the fixed block, and the bottom of the first precision reference block and the third precision reference block is provided with contact grooves.

[0017] Furthermore, the above-mentioned calibration equipment is suitable for inside diameter micrometers, wherein the secondary thrust assembly includes a precision reference block in contact with the inside diameter micrometer, the precision reference block is equipped with a secondary thrust block in the direction of the contact adjustment device, the secondary thrust block is connected to an adjustment screw, and the adjustment screw is connected to the main thrust block.

[0018] Furthermore, in the above-mentioned calibration device suitable for inside diameter micrometers, the upper end of the precision reference stop is provided with a yielding inclined surface.

[0019] Furthermore, the above-mentioned calibration device is suitable for inside diameter micrometers, wherein the adjustment assembly includes a stretch bolt, the stretch bolt penetrates into the sliding block, the upper end of the stretch bolt is connected to a stretch nut, and the bottom of the stretch bolt is connected to the main thrust block.

[0020] By means of the above scheme, the present invention has at least the following advantages:

[0021] 1. Equipped with an angle adjustment device, it is convenient for users to adjust the operating angle according to current operating needs, which is convenient for operation.

[0022] 2. Through the cooperation between the reference adjustment device and the contact adjustment device, the internal micrometer can be calibrated and tested for inner holes of any diameter without the need for dismantling and independent adjustment, and different test points can be set independently.

[0023] 3. The main precision rack plate and the auxiliary precision rack plate are meshed and contacted to improve the adjustment accuracy.

[0024] 4. The use of stretching bolts and stretching nuts in cooperation with each other can realize the convenient release and positioning of the main thrust block, reducing the difficulty of operation while meeting the operating accuracy.

[0025] 5. The overall structure is simple, easy to manufacture and use, and there is no need to customize the ring gauge assembly independently. The calibration and detection of the inner hole of any diameter of the inside micrometer can be realized, which reduces the cost of use.

[0026] The above description is only an overview of the technical solution of the present invention. In order to more clearly understand the technical means of the present invention and implement it according to the contents of the specification, the following is a detailed description of the preferred embodiments of the present invention in conjunction with the accompanying drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0027] Figure 1 It is a schematic diagram of the overall structure of the calibration equipment suitable for the inside diameter micrometer.

[0028] Figure 2 This is a schematic diagram of the layout of the contact adjustment device and adjustment components. (To avoid structural obstruction, the first precision reference block and the third precision reference block are not included)

[0029] The meanings of the reference numerals in the drawings are as follows.

[0030] 1 Crossbeam 2 Fixing block

[0031] 3 First precision reference block 4 Second precision reference block

[0032] 5 Third precision reference block 6 Inside micrometer

[0033] 7 Precision reference block 8 Auxiliary precision rack plate

[0034] 9 Main precision rack plate 10 Toothed positioning pointer

[0035] 11 Bracket 12 Tighten the bolts

[0036] 13 base 14 auxiliary thrust block

[0037] 15 Adjusting screw 16 Lifting nut

[0038] 17 Lifting bolt 18 Sliding block

[0039] 19 Main thrust block DETAILED DESCRIPTION

[0040] The specific implementation of the present invention is further described in detail below in conjunction with the accompanying drawings and examples. The following examples are used to illustrate the present invention, but are not intended to limit the scope of the present invention.

[0041] like Figures 1 to 2 The calibration device suitable for the internal micrometer includes a base 13 for achieving a stable desktop placement. The difference lies in that an angle adjustment device is installed on the base 13, and a guide device is installed on the angle adjustment device. In this way, the angle of the guide device can be set according to actual needs to meet the calibration needs of different workpieces in different states. At the same time, in order to meet the calibration needs of different initial values, a reference adjustment device is installed at one end of the guide device, and the internal micrometer 6 is connected to the reference adjustment device. In addition, in order to adjust the measurement according to the actual size of the current inner hole size, the guide device is located at the detection end of the internal micrometer 6, and a secondary thrust assembly is installed, and a contact adjustment device is connected to the secondary thrust assembly.

[0042] During implementation, the guide device used in the present invention includes a crossbeam 1 connected to the angle adjustment device, and a main precision rack plate 9 and a secondary precision rack plate 8 are mirror-mounted and connected on the crossbeam 1. A clamping space is formed between the main precision rack plate 9 and the secondary precision rack plate 8, and the contact adjustment device is installed in the clamping space. In this way, the contact adjustment device has an appropriate free stroke and can be locked when it is needed later. Considering the high-precision mobile guide, the main precision rack plate 9, the secondary precision rack plate 8 and the crossbeam 1 are suspended to form a guide groove. At the same time, in order to improve the tight adjustment interval, the contact adjustment device includes a sliding block 18 that is movably buckled on the upper edge of the main precision rack plate 9 and the secondary precision rack plate 8. The sliding block 18 is connected to a main thrust block 19 through an adjustment component, and the main thrust block 19 is in contact with the guide groove and the crossbeam 1. Furthermore, in order to ensure that the main thrust block 19 can always cooperate with the guidance of the main precision rack plate 9 and the secondary precision rack plate 8 to achieve high-precision displacement in multiple measurements and moving states, toothed positioning pointers 10 are installed on both sides of the main thrust block 19, and the toothed positioning pointers 10 are in meshing contact with the corresponding main precision rack plate 9 and the secondary precision rack plate 8.

[0043] In combination with a preferred embodiment of the present invention, the base 13 is connected to the bracket 11 by tightening the bolts 12, and the bracket 11 is connected to the bottom of the guide device. In this way, the unlocking and locking switching can be realized by different tightness of the tightening bolts 12, so that the guide device connected thereto can be placed at a desired angle, and the adjustment is more convenient.

[0044] Further, in order to satisfy the internal diameter micrometer 6 with a better starting measurement spacing, different zeroing settings before measurement are realized for workpieces with different inner hole sizes, and the reference adjustment device includes a fixed block 2 connected to the side of the beam 1, and a second precision reference block 4 is clamped between the fixed block 2 and the internal diameter micrometer 6. In this way, the current inner hole starting position can be zeroed by selecting a second precision reference block 4 of different thicknesses and specifications. At the same time, in order to achieve effective limiting, the first precision reference block 3 and the third precision reference block 5 are clamped on both sides of the second precision reference block 4, and the first precision reference block 3 and the third precision reference block 5 are respectively connected to the main precision rack plate 9 and the auxiliary precision rack plate 8. Prevent the second precision reference block 4 from loosening.

[0045] In view of the actual implementation, the first precision reference block 3 and the third precision reference block 5 are both distributed with contact tooth surfaces, and the inner diameter micrometer 6 contacts the contact tooth surfaces. In this way, a certain auxiliary contact can be achieved for the inner diameter micrometer 6 to avoid displacement, without affecting the final measurement accuracy. In addition, in order to better meet the combination of the first precision reference block 3 and the third precision reference block 5, a docking convex strip is provided at the front end of the fixed block 2, and an embedding groove is provided at the corresponding position of the first precision reference block 3 and the third precision reference block 5, and the first precision reference block 3 and the third precision reference block 5 are plug-connected with the fixed block 2. Furthermore, a contact groove can be provided at the bottom of the first precision reference block 3 and the third precision reference block 5. In this way, after the docking is completed, the contact groove of the first precision reference block 3 is embedded in the upper end of the main precision rack plate 9, and the contact groove of the third precision reference block 5 is embedded in the upper end of the secondary precision rack plate 8, so as to achieve effective positioning assistance.

[0046] Further, in order to limit the measurement starting point of the inside micrometer 6, the secondary thrust assembly includes a precision reference stopper 7 in contact with the inside micrometer 6, and the precision reference stopper 7 is installed with a secondary thrust block 14 in the direction of the contact adjustment device, and the secondary thrust block 14 is connected with an adjustment screw 15, and the adjustment screw 15 is connected to the main thrust block 19. In this way, by adjusting the tightness of the screw 15, the secondary thrust block 14 has a certain floating angle, which can effectively ensure that the precision reference stopper 7 can finally move smoothly under the guidance of the main precision rack plate 9 and the secondary precision rack plate 8. At the same time, in order to achieve appropriate bottom clearance during the measurement of certain barrel-shaped workpieces, a clearance slope can be set at the upper end of the precision reference stopper 7. In this way, it can be avoided that it presses against the side of the measuring port of the barrel-shaped workpiece without affecting the calibration.

[0047] Furthermore, the adjustment assembly used in the present invention includes a tension bolt 17 , which penetrates into the sliding block 18 , the upper end of the tension bolt 17 is connected to the tension nut 16 , and the bottom of the tension bolt 17 is connected to the main thrust block 19 .

[0048] The working principle of the present invention is as follows:

[0049] Considering the convenience of subsequent calibration and positioning, the first precision reference block 3 and the third precision reference block 5 may be preferentially docked and connected with the fixed block 2. Afterwards, the second precision reference block 4 is inserted, and the diameter of the inner micrometer 6 to be calibrated is adjusted by its width.

[0050] By moving the lifting nut 16, the precision reference stopper 7 is moved between the main precision rack plate 9 and the auxiliary precision rack plate 8. In this way, the actual position of the precision reference stopper 7 can be used to achieve coarse adjustment of the internal diameter micrometer 6 when detecting different inner hole diameters as needed.

[0051] After the rough adjustment is completed, tighten the lifting nut 16 to achieve the positioning of the inner diameter micrometer 6 to be calibrated. During this period, since the toothed positioning pointer 10 is in meshing contact with the corresponding main precision rack plate 9 and the auxiliary precision rack plate 8, accurate positioning under a smaller unit length can be achieved to meet the effective fine-tuning needs.

[0052] It can be seen from the above textual description and the accompanying drawings that the present invention has the following advantages:

[0053] 1. Equipped with an angle adjustment device, it is convenient for users to adjust the operating angle according to current operating needs, which is convenient for operation.

[0054] 2. Through the cooperation between the reference adjustment device and the contact adjustment device, the internal micrometer can be calibrated and tested for inner holes of any diameter without the need for dismantling and independent adjustment, and different test points can be set independently.

[0055] 3. The main precision rack plate and the auxiliary precision rack plate are meshed and contacted to improve the adjustment accuracy.

[0056] 4. The use of stretching bolts and stretching nuts in cooperation with each other can realize the convenient release and positioning of the main thrust block, reducing the difficulty of operation while meeting the operating accuracy.

[0057] 5. The overall structure is simple, easy to manufacture and use, and there is no need to customize the ring gauge assembly independently. The calibration and detection of the inner hole of any diameter of the inside micrometer can be realized, which reduces the cost of use.

[0058] In addition, the indicated orientations or positional relationships described in the present invention are all based on the orientations or positional relationships shown in the accompanying drawings and are only for the convenience of describing the present invention and simplifying the description. They do not indicate or imply that the device or structure referred to must have a specific orientation or be operated with a specific orientation structure. Therefore, they cannot be understood as limitations on the present invention.

[0059] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. It should be pointed out that a person skilled in the art can make several improvements and modifications without departing from the technical principles of the present invention, and these improvements and modifications should also be regarded as within the scope of protection of the present invention.

Claims

1. Apparatus for calibrating an internal micrometer, comprising a base, characterized in that: An angle adjustment device is installed on the base, a guide device is installed on the angle adjustment device, a reference adjustment device is installed at one end of the guide device, and an inner diameter micrometer is connected to the reference adjustment device; The guide device is located at the detection end of the internal diameter micrometer and is installed with a secondary thrust assembly, and the secondary thrust assembly is connected to a contact adjustment device; The guide device includes a crossbeam connected to the angle adjustment device, a main precision rack plate and a secondary precision rack plate are mirror-mounted and connected on the crossbeam, a clamping space is formed between the main precision rack plate and the secondary precision rack plate, and the contact adjustment device is installed in the clamping space; The main precision rack plate, the auxiliary precision rack plate and the crossbeam are suspended to form a guide groove, the contact adjustment device includes a sliding block movably buckled on the upper edge of the main precision rack plate and the auxiliary precision rack plate, the sliding block is connected to the main thrust block through the adjustment component, and the main thrust block is in contact with the guide groove and the crossbeam; Toothed positioning pointers are installed on both the left and right sides of the main thrust block, and the toothed positioning pointers are in meshing contact with the corresponding main precision rack plate and auxiliary precision rack plate.

2. The calibration device for an internal micrometer according to claim 1, characterized in that: The base is connected with a bracket by tightening bolts, and the bracket is connected to the bottom of the guide device.

3. The calibration device for an internal micrometer according to claim 1, characterized in that: The reference adjustment device includes a fixed block connected to the side of the beam, a second precision reference block is clamped between the fixed block and the inside diameter micrometer, and a first precision reference block and a third precision reference block are clamped on both sides of the second precision reference block, respectively. The first precision reference block and the third precision reference block are connected to the main precision rack plate and the auxiliary precision rack plate, respectively.

4. The calibration device for an internal micrometer according to claim 3, characterized in that: The first precision reference block and the third precision reference block are both provided with contact tooth surfaces, and the inner diameter micrometer is in contact with the contact tooth surfaces.

5. The calibration device for an internal micrometer according to claim 3, characterized in that: The front end of the fixed block is provided with a docking convex strip, and the first precision reference block and the third precision reference block are provided with embedding grooves at corresponding positions. The first precision reference block and the third precision reference block are plug-connected with the fixed block, and the bottom of the first precision reference block and the third precision reference block is provided with contact grooves.

6. The calibration device for an internal micrometer according to claim 1, characterized in that: The secondary thrust assembly includes a precision reference block in contact with the inner diameter micrometer, the precision reference block is provided with a secondary thrust block in the direction of the contact adjustment device, the secondary thrust block is connected with an adjustment screw, and the adjustment screw is connected to the main thrust block.

7. The calibration device for an internal micrometer according to claim 6, characterized in that: The upper end of the precision reference stopper is provided with a yielding inclined surface.

8. The calibration device for an internal micrometer according to claim 1, characterized in that: The adjusting assembly comprises a stretching bolt, the stretching bolt penetrates into the sliding block, the upper end of the stretching bolt is connected with a stretching nut, and the bottom of the stretching bolt is connected with the main thrust block.

Images