Lamination test piece and photovoltaic module stripping test piece

Abstract

The utility model provides a lamination test piece and a photovoltaic module peeling test piece. Wherein the lamination test piece comprises an adhesion layer, an isolation layer and a stripping force test layer, the isolation layer is laminated between the adhesion layer and the stripping force test layer, and the stripping force test layer and the adhesion layer cover the isolation layer; the isolation layer is provided with a test channel penetrating through the isolation layer in the thickness direction, the closed end and the two side edges of the test channel are located in the isolation layer, and the stripping force test layer located in the test channel is adhered to the adhesion layer.

Description

Technical Field

[0001] The present disclosure relates to the technical field of adhesion testing, and in particular to a lamination test piece and a photovoltaic module peeling test piece. Background Art

[0002] Semiconductor devices usually need to be packaged before they are actually used to ensure stable performance during use. For example, in the production process of solar cells, solar cells need to be combined with the front panel, back film and back sheet and laminated to form photovoltaic modules. The back film can serve as an adhesive layer between the back sheet and the solar cell.

[0003] Component reliability is an important indicator for evaluating component quality, and the peeling force between the backplane and the adhesive layer is an important indicator for evaluating component reliability. In traditional technology, the following method can be used to test the peeling force between the backplane and the adhesive layer: first, a strip-shaped test sample is cut out on the backplane, and then the backplane and the adhesive layer are laminated together, and then the peeling force between the two is tested by lifting the backplane. This test method has the following problems: the adhesive layer will melt during the lamination process and stick the backplane together, causing the adhesive layer to break easily during the process of lifting the backplane and affecting the accuracy of the test results. Utility Model Content

[0004] Based on this, in order to ensure the integrity of the adhesive layer during the test process and thus improve the accuracy of the test results, it is necessary to provide a laminated test piece.

[0005] According to some embodiments of the present disclosure, there is provided a laminated test piece, comprising an adhesive layer, an isolation layer and a peeling force test layer, wherein the isolation layer is stacked between the adhesive layer and the peeling force test layer, and the peeling force test layer and the adhesive layer cover the isolation layer;

[0006] The isolation layer is provided with a long strip test channel penetrating the isolation layer in the thickness direction, the test channel extends along the plane where the isolation layer is located, and the test channel has a closed end enclosed in the isolation layer in its extension direction, and the peeling force test layer is adhered to the adhesive layer through the test channel.

[0007] In some embodiments of the present disclosure, the peeling force testing layer includes a testing portion arranged to adhere to the adhesion layer through the testing channel, the peeling force testing layer corresponds to an isolation area of ​​the isolation layer, the isolation area includes a force-bearing portion corresponding to the testing channel, the force-bearing portion is arranged on the isolation layer and on the outside of the closed end in the extension direction, the force-bearing portion is connected to the testing portion and can be separated from the isolation layer and drive the testing portion to separate from the adhesion layer.

[0008] In some embodiments of the present disclosure, the force-bearing portion is further provided with a test fixing hole penetrating through the test force-bearing portion.

[0009] In some embodiments of the present disclosure, a spacing slit penetrating the peeling force testing layer is provided on the isolation area, the spacing slit separates the force-bearing portion in the isolation area, and the force-bearing portion is located between the spacing slit and the closed end.

[0010] In some embodiments of the present disclosure, the spacing seam includes a bottom spacer seam and side spacer seams arranged on both sides of the bottom spacer seam, the side spacer seams are connected to the bottom spacer seam, the bottom spacer seam is spaced apart from the closed end, the side spacer seams are respectively arranged on both sides of the test channel, and at least part of the test channel is arranged between the two side spacer seams.

[0011] In some embodiments of the present disclosure, the isolation layer has a first edge and a second edge that are relatively arranged, the test channel has a channel opening opened on the first edge, the closed end is arranged between the channel opening and the second edge, and the peel force test layer and the adhesion layer are arranged on the side of the second edge away from the first edge.

[0012] In some embodiments of the present disclosure, the width of the test channel is 5 mm to 15 mm.

[0013] In some embodiments of the present disclosure, the length of the test channel is 80 mm to 130 mm.

[0014] In some embodiments of the present disclosure, a plurality of the test channels arranged side by side are provided in the isolation layer.

[0015] In some embodiments of the present disclosure, the isolation layer is paper, a release film or an adhesive tape.

[0016] Furthermore, the present disclosure also provides a photovoltaic module peeling test piece, which includes a front panel and a laminated test piece as described in any of the above embodiments, wherein the peeling force test layer is a back panel, the adhesive layer is a back film, the back panel and the back film are laminated on the front panel, and the back film is arranged between the back panel and the front panel.

[0017] In the laminated test piece provided by the present disclosure, an isolation layer is provided between the peeling force test layer and the adhesion layer, and the isolation layer is used to separate the adhesion layer and the peeling force test layer. The peeling force test layer and the adhesion layer can be adhered to each other through a test channel, and the adhered part can be used to perform a peeling force test. In addition, the test channel is enclosed in the isolation layer in its extension direction, and the outer side of the closed end and both sides of the test channel are provided with an isolation layer, which can separate the peeling force test layer and the adhesion layer, so that the peeling force test layer outside the test channel is easy to separate, thereby driving the peeling force test layer at the test channel to separate from the adhesion layer. By providing an isolation layer with a specific shape, the laminated test piece can ensure the integrity of the adhesion layer during the test process and improve the accuracy of the test results.

[0018] The above description is only an overview of the technical solution of the present disclosure. In order to more clearly understand the technical means of the present disclosure and implement it according to the contents of the specification, the following is a detailed description of the preferred embodiments of the present disclosure in conjunction with the accompanying drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] In order to more clearly illustrate the technical solutions of the embodiments of the present disclosure, the drawings required for use in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present disclosure. For ordinary technicians in this field, drawings of other embodiments can be obtained based on these drawings without creative work.

[0020] Figure 1 It is a schematic diagram of the structure of a laminated test piece;

[0021] Figure 2 for Figure 1 A schematic diagram of the top view structure of the peeling force test layer;

[0022] Figure 3 For the general Figure 1 A schematic diagram of the structure in which the force-applying portion in the laminated test piece is lifted;

[0023] Figure 4 for Figure 1 A schematic diagram of the top view of the isolation layer in the laminated test piece shown;

[0024] Figure 5 A schematic diagram of the structure of a photovoltaic module peeling test piece;

[0025] Figure 6 To fix the dynamometer to Figure 2 A schematic structural diagram of a force-applying portion in a laminated test piece;

[0026] The reference numerals and their meanings are as follows:

[0027] 110, adhesion layer; 120, isolation layer; 1201, first edge; 1202, second edge; 121, test channel; 1211, closed end; 1212, channel opening; 130, peeling force test layer; 1301, test part; 131, isolation area; 1311, force-bearing part; 1312, test fixing hole; 132, spacer seam; 1321, bottom spacer seam; 1322, side spacer seam; 140, front plate; 150, front film; 200, dynamometer. DETAILED DESCRIPTION

[0028] In order to facilitate understanding of the present disclosure, the present disclosure will be described more fully below with reference to the relevant drawings. The preferred embodiments of the present disclosure are shown in the drawings. However, the present disclosure can be implemented in many different forms and is not limited to the embodiments described herein. On the contrary, the purpose of providing these embodiments is to make the disclosure of the present disclosure more thorough and comprehensive.

[0029] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as those commonly understood by those skilled in the art of the present disclosure. The terms used herein in the specification of the present disclosure are only for the purpose of describing specific embodiments and are not intended to limit the present disclosure. The term "and / or" used herein includes any and all combinations of one or more related listed items.

[0030] It should be understood that when an element or layer is referred to as being "on, adjacent to, connected to or coupled to other elements or layers, it may be directly on, adjacent to, connected to or coupled to other elements or layers, or there may be intervening elements or layers. In contrast, when an element is referred to as being "directly on, directly adjacent to, directly connected to or directly coupled to other elements or layers, there may be no intervening elements or layers. It should be understood that, although the terms first, second, third, etc. may be used to describe various elements, components, regions, layers and / or parts, these elements, components, regions, layers and / or parts should not be limited by these terms. These terms are only used to distinguish one element, component, region, layer or part from another element, component, region, layer or part. Therefore, without departing from the teachings of the present disclosure, the first element, component, region, layer or part discussed below may be represented as a second element, component, region, layer or part.

[0031] Spatially relative terms such as "under," "below," "below," "under," "above," "above," etc., may be used herein for ease of description to describe the relationship of an element or feature shown in the figures to other elements or features. It should be understood that in addition to the orientations shown in the figures, the spatially relative terms are intended to include different orientations of the device in use and operation. For example, if the device in the accompanying drawings is flipped, then the elements or features described as "under other elements" or "under" or "under" will be oriented as "on" the other elements or features. Therefore, the exemplary terms "under" and "under" may include both upper and lower orientations. The device may be oriented otherwise (rotated 90 degrees or other orientations) and the spatial descriptors used herein are interpreted accordingly.

[0032] The purpose of the terms used herein is only to describe specific embodiments and is not intended to be a limitation of the present disclosure. When used herein, the singular forms "a", "an" and "the" are also intended to include plural forms, unless the context clearly indicates otherwise. It should also be understood that the terms "consisting of" and / or "comprising", when used in this specification, determine the presence of features, integers, steps, operations, elements and / or parts, but do not exclude the presence or addition of one or more other features, integers, steps, operations, elements, parts and / or groups. When used herein, the term "and / or" includes any and all combinations of the relevant listed items.

[0033] Reference Figure 1 As shown, the present disclosure provides a laminated test piece, which includes an adhesion layer 110, an isolation layer 120 and a peeling force test layer 130, wherein the isolation layer 120 is stacked between the adhesion layer 110 and the peeling force test layer 130, and the peeling force test layer 130 and the adhesion layer 110 cover the isolation layer 120; a long strip-shaped test channel 121 is provided on the isolation layer 120 and penetrates the isolation layer 120 in the thickness direction, the test channel 121 extends along the plane where the isolation layer 120 is located, and the test channel 121 has a closed end 1211 enclosed in the isolation layer 120 in its extension direction, and the peeling force test layer 130 is adhered to the adhesion layer 110 through the test channel 121.

[0034] Understandably, Figure 11 , the adhesive layer 110, the isolation layer 120 and the peeling force test layer 130 in the laminated test piece are shown separately to facilitate understanding of the structures of the adhesive layer 110, the isolation layer 120 and the peeling force test layer 130, but in the laminated test piece, the adhesive layer 110, the isolation layer 120 and the peeling force test layer 130 are sequentially stacked and contacted. Among them, the adhesive layer 110 and the peeling force test layer 130 can be laminated and combined, and the isolation layer 120 is arranged between the adhesive layer 110 and the peeling force test layer 130, and is used to separate the adhesive layer 110 and the peeling force test layer 130. It can be understood that the peeling force between the peeling force test layer 130 and the isolation layer 120 is less than the peeling force between the peeling force test layer 130 and the adhesive layer 110, so that the peeling force test layer 130 and the isolation layer 120 are easier to separate.

[0035] In the laminated test piece provided by the present disclosure, an isolation layer 120 is provided between the peeling force test layer 130 and the adhesive layer 110, and the isolation layer 120 is used to separate the adhesive layer 110 and the peeling force test layer 130. The peeling force test layer 130 and the adhesive layer 110 can be adhered to each other through the test channel 121, and the adhered part can be used for peeling force testing. In addition, the test channel 121 is closed in the isolation layer 120 in its extension direction, and the outer side of the closed end 1211 and the two sides of the test channel 121 are provided with isolation layers 120, which can separate the peeling force test layer 130 and the adhesive layer 110, so that the peeling force test layer 130 outside the test channel 121 is easy to separate, thereby driving the peeling force test layer 130 at the test channel 121 to separate from the adhesive layer 110. By providing an isolation layer 120 with a specific shape, the laminated test piece can ensure the integrity of the adhesive layer 110 during the test and improve the accuracy of the test results.

[0036] Figure 2 For the general Figure 1 The schematic diagram of the structure of the laminated test piece shown in the figure is the lamination and pressing of the layers. Figure 2 As shown, in some examples of this embodiment, the peeling force testing layer 130 includes a testing portion 1301 disposed on the adhesive layer 110 through the testing channel 121, and the peeling force testing layer 130 also includes an isolation area 131 disposed corresponding to the isolation layer 120. Figure 2 The dotted line in the figure represents the isolation area 131. It can be understood that the isolation area 131 is located in the peeling force testing layer 130, and the isolation area 131 is arranged corresponding to the isolation layer 120, that is, due to the blocking of the isolation layer 120, the isolation area 131 of the peeling force testing layer 130 can directly contact the isolation layer 120 but not directly contact the adhesive layer 110, so that the isolation area 131 is not adhered by the adhesive layer 110 and is thus easy to separate.

[0037] The isolation area 131 is provided with a force-bearing portion 1311 corresponding to the test channel 121. The force-bearing portion 1311 is provided on the isolation layer 120 and is provided outside the closed end 1211 in the extension direction. The force-bearing portion 1311 and the peeling force adhesive layer 110 outside the force-bearing portion 1311 can be partially connected and partially separated. The force-bearing portion 1311 is connected to the test portion 1301 and can be separated from the isolation layer 120 and drive the test portion 1301 to separate from the adhesive layer 110. Figure 2 As shown, the force-bearing portion 1311 is lifted up to be separated from the isolation layer 120, and it can be understood that by providing the force-bearing portion 1311 connected to the test portion 1301, it is convenient to connect the dynamometer 200 with the force-bearing portion 1311, and the force-bearing portion 1311 can be pulled along the extension direction of the test channel 121, thereby driving the test portion 1301 to be separated from the adhesion layer 110, and completing the test.

[0038] Reference Figure 2 As shown, in some examples of this embodiment, a test fixing hole 1312 penetrating the peeling force testing layer 130 is further provided on the force receiving portion 1311. In the actual testing process, the tensile gauge 200 can be used to test the peeling force between the peeling force testing layer 130 and the adhesive layer 110, and the test fixing hole 1312 can be used for the hook of the tensile gauge 200 to be fixed.

[0039] Figure 3 for Figure 2 Schematic diagram of the top view of the peeling force test layer 130. Figure 3 As shown, a spacing slit 132 penetrating the peeling force testing layer 130 is provided on the isolation region 131, and the spacing slit 132 separates a force-bearing portion 1311 in the isolation region 131, and the force-bearing portion 1311 is located between the spacing slit 132 and the closed end 1211. It can be understood that the spacing slit 132 can be formed by cutting the peeling force testing layer 130.

[0040] Further, refer to Figure 3As shown, in some examples of this embodiment, the spacing seam 132 may include a bottom spacing seam 1321 and side spacing seams 1322 arranged on both sides of the bottom spacing seam 1321. The side spacing seams 1322 may be connected to the bottom spacing seam 1321, and the bottom spacing seam 1321 is spaced from the closed end 1211, and the side spacing seams 1322 are respectively arranged on both sides of the test part 1301, and at least part of the test part 1301 is arranged between the two side spacing seams 1322. Through the connected bottom spacing seam 1321 and the side spacing seam 1322, a force-bearing part 1311 that can be lifted can be defined on the peeling force test layer 130, and the force-bearing part 1311 is located on the isolation layer 120 and can be connected to the tensile gauge 200. When the tensile gauge 200 is connected to the force-bearing part 1311, it can drive the test part 1301 to peel off from the adhesive layer 110, thereby realizing the test of the peeling force.

[0041] Reference Figure 2 and Figure 3 As shown, in some examples of this embodiment, the two side spacer slits 1322 can be arranged in parallel. Further, the side spacer slits 1322 and the bottom spacer slits 1321 can be arranged vertically.

[0042] Reference Figure 2 and Figure 3 As shown, in some examples of this embodiment, the slot width of the test channel 121 is smaller than the spacing between the two side spacer slots 1322, and the two side spacer slots 1322 are respectively located outside the two side edges. By arranging the two side spacer slots 1322 to be respectively located outside the two side edges, it is possible to further avoid the situation where the adhesive layer 110 is damaged when the side spacer slots 1322 are formed.

[0043] It can be understood that in some other examples, the projections of the two side spacer slits 1322 on the isolation layer 120 can coincide with the two side edges of the test channel 121 respectively.

[0044] Further, in some examples of this embodiment, a portion of the test portion 1301 close to the force-bearing portion 1311 may be disposed between two side spacer seams 1322. With the side spacer seams 1322 on both sides of the test portion 1301, when peeling the test portion 1301, there is no need to separate the peeling force test layer 130 on both sides of the test portion 1301, which can ensure the accuracy of the test result.

[0045] Figure 4 for Figure 1 FIG. 1 is a schematic diagram of a top view of the isolation layer 120 in the laminated test piece. Figure 4As shown, in some examples of this embodiment, the test channel 121 may be in the shape of a long strip. Further, two sides of the test channel 121 may be arranged in parallel, for example, the test channel 121 may be in the shape of a rectangle.

[0046] Reference Figure 4 As shown, in some examples of this embodiment, the width of the test channel 121 can be 5 mm to 15 mm. For example, the width of the test channel 121 can be 5 mm, 7 mm, 9 mm, 10 mm, 12 mm or 15 mm, or the width of the test channel 121 can also be within the range between any two of the above widths.

[0047] Reference Figure 4 As shown, in some examples of this embodiment, the length of the test channel 121 can be 80 mm to 130 mm. For example, the length of the test channel 121 can be 80 mm, 90 mm, 100 mm, 110 mm, 120 mm or 130 mm, or the width of the test channel 121 can also be within the range between any two of the above widths.

[0048] Reference Figure 4 As shown, in some examples of this embodiment, a plurality of test channels 121 arranged side by side may be provided in the isolation layer 120. Each test channel 121 may be used for performing a peeling force test, so as to perform multiple peeling force tests on the same laminate test piece to ensure the accuracy of the test results.

[0049] Reference Figure 4 As shown, in some examples of this embodiment, a plurality of test channels 121 may be arranged in parallel.

[0050] Further, in some examples of this embodiment, the spacing between two adjacent test channels 121 may be 10 mm to 20 mm. For example, the spacing between two adjacent test channels 121 may be 10 mm, 12 mm, 14 mm, 15 mm, 16 mm, 18 mm or 20 mm, or the spacing between two adjacent test channels 121 may also be within the range between any two of the above spacings.

[0051] Reference Figure 4 As shown, in some examples of this embodiment, the isolation layer 120 has a first edge 1201 and a second edge 1202 that are relatively arranged, the test channel 121 has a channel opening 1212 opened on the first edge 1201, and the closed end 1211 is arranged between the channel opening 1212 and the second edge 1202.

[0052] Furthermore, combined with Figure 2 and Figure 4As shown, a peeling force testing layer 130 and an adhesive layer 110 are also provided on the side of the second edge 1202 away from the first edge 1201. The peeling force testing layer 130 and the adhesive layer 110 provided on the side of the second edge 1202 away from the first edge 1201 can ensure the relative stability between the peeling force testing layer 130 and the adhesive layer 110 during the peeling force test process.

[0053] In this embodiment, the role of the isolation layer 120 is to separate the adhesive layer 110 and the peeling force testing layer 130 to prevent the peeling force testing layer 130 from directly adhering to the adhesive layer 110. Further, in some examples of this embodiment, the peeling force between the isolation layer 120 and the peeling force testing layer 130 may be smaller than the peeling force between the adhesive layer 110 and the peeling force testing layer 130. Further, the isolation layer 120 and the peeling force testing layer 130 are non-adhesive.

[0054] In some examples of this embodiment, the isolation layer 120 may be paper, a release film, or a tape. Further, the isolation layer 120 may be paper or a tape, wherein the tape refers to a tape that can withstand 200°C. When the isolation layer 120 is a tape, the tape may have an adhesive surface and a release surface that are relatively arranged, the adhesive surface may be adhered to the adhesive layer 110, and the release surface may contact the peeling force test layer 130. By using paper or a high temperature resistant tape, the isolation layer 120 can be adhered to the adhesive layer 110 to fix the position, and there is no adhesion between the isolation layer 120 and the peeling force test layer 130, thereby avoiding the measurement error caused by the separation of the peeling force test layer 130 from the isolation layer 120.

[0055] Furthermore, the present disclosure also provides a photovoltaic module peeling test piece, Figure 5 This is a schematic diagram of the structure of the photovoltaic module peeling test piece. Figure 5 As shown, the photovoltaic module peeling test piece includes a front plate 140 and a laminated test piece as in the above embodiment, wherein the peeling force test layer 130 is a back plate, and the adhesive layer 110 is a back film. The back plate and the back film are laminated on the front plate 140, and the back film is arranged between the back plate and the front plate 140.

[0056] The back sheet may be a back sheet in a photovoltaic module, and the material of the back sheet may be a polymer back sheet, such as a plastic back sheet or a rubber back sheet. The back film may be a hot melt back film, which melts and adheres to the back sheet during the lamination process.

[0057] In some examples of this embodiment, the front plate 140 may be glass.

[0058] Reference Figure 5As shown, in some examples of this embodiment, the photovoltaic module peeling test piece may further include a front film 150, which is disposed between the back film and the front plate 140, and is used to adhere the back film and the front plate 140. Further, the front film 150 may also be a hot melt adhesive film.

[0059] It can be understood that a photovoltaic module generally includes a front panel 140, a battery cell, a back film and a back panel. Figure 3 The component shown is used as a photovoltaic module peeling test piece, which is closer to the actual photovoltaic module and is more conducive to characterizing the peeling performance of the actual photovoltaic module.

[0060] Furthermore, the present disclosure also provides a method for testing peeling force, and the method for testing peeling force includes the following steps.

[0061] Step S1, providing Figure 1 Laminated test piece shown.

[0062] Step S2, the tensile gauge 200 is fixedly connected to the force applying part of the laminated test piece.

[0063] in, Figure 6 To fix the tension gauge 200 to Figure 2 Schematic diagram of the structure of the force-applying part in the laminated test piece, refer to Figure 6 As shown, the tension gauge 200 has a hook, and the hook of the tension gauge 200 can pass through the test fixing hole 1312 to be fixedly connected to the force applying part.

[0064] Step S3 , driving the tensile meter 200 to peel the peeling force test layer 130 in the test channel 121 off the adhesive layer 110 , and recording the value measured by the tensile meter 200 .

[0065] Reference Figure 6 As shown, the tensile gauge 200 is driven at a constant speed in a direction away from the closed end 1211 , so that the peeling force test layer 130 in the test channel 121 is peeled off from the adhesive layer 110 .

[0066] Understandably, Figure 1 The laminate test pieces shown can be Figure 6 The peel force test is performed in the manner shown. Similarly, Figure 5 The photovoltaic module peel test piece shown can also be used as follows Figure 6 The peel force test was performed in the manner shown.

[0067] Please note that the above embodiments are for illustrative purposes only and are not meant to limit the present disclosure.

[0068] It should be understood that, unless otherwise specified herein, there is no strict order restriction for the execution of the steps, and the steps may be executed in other orders. Moreover, at least a portion of the steps in the preparation process may include multiple sub-steps or multiple stages, and these sub-steps or stages are not necessarily executed at the same time, but may be executed at different times, and the execution order of these sub-steps or stages is not necessarily sequential, but may be executed in turn or alternately with other steps or at least a portion of the sub-steps or stages of other steps.

[0069] The various embodiments in this specification are described in a progressive manner, and each embodiment focuses on the differences from other embodiments. The same or similar parts between the various embodiments can be referenced to each other.

[0070] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

Claims

1. A laminated test piece, characterized in that: The invention comprises an adhesive layer (110), an isolation layer (120) and a peeling force testing layer (130), wherein the isolation layer (120) is stacked between the adhesive layer (110) and the peeling force testing layer (130), and the peeling force testing layer (130) and the adhesive layer (110) cover the isolation layer (120); The isolation layer (120) is provided with a long strip-shaped test channel (121) penetrating the isolation layer (120) in the thickness direction; the test channel (121) extends along the plane where the isolation layer (120) is located; and the test channel (121) has a closed end (1211) enclosed in the isolation layer (120) in its extension direction; the peeling force test layer (130) is adhered to the adhesive layer (110) through the test channel (121).

2. The laminate test piece according to claim 1, characterized in that: The peeling force testing layer (130) comprises a testing portion (1301) arranged to adhere to the adhesive layer (110) through the testing channel (121); the peeling force testing layer (130) further comprises an isolation area (131) corresponding to the isolation layer (120); a force-bearing portion (1311) corresponding to the testing channel (121) is arranged in the isolation area (131); the force-bearing portion (1311) is arranged on the isolation layer (120) and is arranged on the outer side of the closed end (1211) in the extension direction; the force-bearing portion (1311) is connected to the testing portion (1301) and can be separated from the isolation layer (120) and drive the testing portion (1301) to be separated from the adhesive layer (110).

3. The laminate test piece according to claim 2, characterized in that: The force-bearing portion (1311) is also provided with a test fixing hole (1312) penetrating the test force-bearing portion (1311).

4. The laminated test piece according to claim 2, characterized in that: The isolation area (131) is provided with a spacing slit (132) penetrating the peeling force testing layer (130), the spacing slit (132) separates the force-bearing portion (1311) in the isolation area (131), and the force-bearing portion (1311) is located between the spacing slit (132) and the closed end (1211).

5. The laminated test piece according to claim 4, characterized in that: The spacing slit (132) comprises a bottom spacing slit (1321) and side spacing slits (1322) arranged on both sides of the bottom spacing slit (1321), the side spacing slits (1322) are connected to the bottom spacing slit (1321), the bottom spacing slit (1321) is arranged at intervals from the closed end (1211), the side spacing slits (1322) are respectively arranged on both sides of the test part (1301), and at least part of the test part (1301) is arranged between the two side spacing slits (1322).

6. The laminated test piece according to any one of claims 1 to 5, characterized in that: The isolation layer (120) has a first edge (1201) and a second edge (1202) that are arranged opposite to each other, the test channel (121) has a channel opening (1212) opened on the first edge (1201), the closed end (1211) is arranged between the channel opening (1212) and the second edge (1202), and the peeling force testing layer (130) and the adhesive layer (110) are also arranged on the side of the second edge (1202) away from the first edge (1201).

7. The laminated test piece according to any one of claims 1 to 5, characterized in that: The width of the test channel (121) is 5 mm to 15 mm; and / or, The length of the test channel (121) is 80 mm to 130 mm.

8. The laminated test piece according to any one of claims 1 to 5, characterized in that: The isolation layer (120) is provided with a plurality of test channels (121) arranged side by side.

9. The laminated test piece according to any one of claims 1 to 5, characterized in that: The isolation layer (120) is paper, a release film or an adhesive tape.

10. A photovoltaic module peeling test piece, characterized in that: It comprises a front plate (140) and a laminated test piece as claimed in any one of claims 1 to 9, wherein the peeling force test layer (130) is a back plate, the adhesive layer (110) is a back film, the back plate and the back film are laminated on the front plate (140), and the back film is arranged between the back plate and the front plate (140).

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