Chip batch testing device

Abstract

The utility model discloses a chip batch test device, comprising a main body assembly comprising a support plate, a spring column connected to a side edge of the support plate through a screw, and a first fixing block connected to an upper end of the spring column through a screw; the limiting assembly comprises a detection table plate placed above the supporting plate, an L-shaped limiting handle connected to the side edge of the detection table plate through a screw, a connecting shaft connected to the side edge of the first fixing block through a screw, a connecting rod rotationally connected to the middle of the connecting shaft, and a groove formed in the lower section of the connecting rod. The problems that multiple small detection platens are arranged, after testing is finished, limiting frames are pressed downwards, the detection platens and chips are exposed, then the chips are collected one by one, on one hand, only the chips of the specified number and size are detected, on the other hand, operation is complex, time and labor are wasted, the situation that the chips fall off easily occurs in the chip collecting process, and the chip collecting efficiency is high are solved. And loss is caused to enterprises.

Description

Technical Field

[0001] The utility model relates to the technical field of chip testing, in particular to a chip batch testing device. Background Art

[0002] Chip testing is a series of inspections performed after chip manufacturing is completed. The purpose is to ensure that each chip meets the design requirements in terms of functionality, meets the performance specifications, and has no manufacturing defects.

[0003] Now a Chinese patent is searched for a test device that can test chips in batches, with publication number CN 219957779U, which includes a base, a detection body is installed at the rear of the top of the base, and a detection probe is installed on the bottom of the detection body, two parallel longitudinal guide rails are installed on the top surface of the base close to the bottom of the detection body, and a screw rod 1 is installed inside the longitudinal guide rail, two parallel transverse guide rails are installed on the top of the two longitudinal guide rails, and a screw rod 2 is installed inside the transverse guide rail, and a detection structure is installed on the top of the two transverse guide rails, the detection structure includes a support plate, a plurality of support columns are equidistantly installed on the top surface of the support plate, and a detection table is fixedly connected to the top of the support column, and a limited position frame is arranged above the support plate; the utility model provides a test device that can test chips in batches, which can realize batch testing of chips and facilitate the removal of tested chips to reduce damage to the chips.

[0004] However, it still has the following disadvantages in actual use:

[0005] Set up multiple small test platforms. After the test, press down the limit frame to expose the test platform and chips, and collect the chips one by one. This setting, on the one hand, only tests the chips of specified quantity and size, and on the other hand, the operation is complicated, time-consuming and labor-intensive, and the chips are prone to drop during the collection process, causing losses to the company.

[0006] Therefore, a new chip batch testing device is proposed to solve the above problems. Utility Model Content

[0007] The purpose of the utility model is to provide a chip batch testing device to solve the problem proposed in the above-mentioned background technology that a plurality of small test platforms are set up. After the test, the test platforms and chips are exposed by pressing down the limit frame, and the chips are collected one by one. This setting, on the one hand, only tests chips of a specified number and size, and on the other hand, the operation is complicated, time-consuming and labor-intensive, and the chips are prone to falling during the process of collecting, causing losses to the enterprise.

[0008] In order to solve the above technical problems, the utility model is realized by the following technical solutions:

[0009] The utility model is a chip batch testing device, comprising:

[0010] A main body component, the main body component comprising a support plate, a spring column connected to the side of the support plate by screws, and a first fixing block connected to the upper end of the spring column by screws;

[0011] A limit assembly, the limit assembly comprising a detection table placed above the support plate, an L-shaped limit handle connected to the side of the detection table by screws, a connecting shaft connected to the side of the first fixed block by screws, a connecting rod rotatably connected to the middle of the connecting shaft, a groove provided in the lower section of the connecting rod, a second fixed block connected to the middle of the side of the support plate by screws, and a telescopic block movably connected to the bottom of the second fixed block;

[0012] The anti-leakage component includes embedded grooves arranged on four sides of the upper surface of the detection table.

[0013] Furthermore, the telescopic block is movably connected in the groove, and there are two groups of connecting rods and second fixing blocks, which are symmetrically located on both sides of the support plate.

[0014] Furthermore, the main body assembly also includes a partition frame connected to the side of the first fixing block by screws, and the internal partition of the partition frame is detachable.

[0015] Furthermore, the detection platform is located between the support plate and the partition frame, and the lower end of the L-shaped limit handle is attached to the side of the support plate.

[0016] Furthermore, the main body component also includes a base fixed on the external workbench, a detection body connected to the base by screws, and a detection probe movably connected to the middle of the top of the detection body.

[0017] Furthermore, the main body assembly also includes a first electric track connected to the base by screws, and a second electric track slidably connected above the first electric track.

[0018] Furthermore, the support plate is slidably connected above the second electric track and is located below the detection probe.

[0019] Furthermore, the anti-leakage component also includes a round spring connected to the embedded groove by screws, a limit frame connected to the upper end of the round spring by screws, and the limit frame is movably connected in the embedded groove.

[0020] Compared with the prior art, the advantages of the present invention are:

[0021] 1. The utility model designs the detection table as a whole piece through the setting of the limit assembly, and places it between the support plate and the partition frame. When the detection is completed, the telescopic card block is pressed to make the groove on the connecting rod disengage from the telescopic card block, and the connecting rod is rotated to disengage from the second fixed block. At this time, the spring column springs up, driving the partition frame on the first fixed block to rise, and the L-shaped limit handle can be pulled to move the detection table out as a whole, and the chips are collected uniformly.

[0022] 2. Based on the beneficial effect 1, the L-shaped limit handle can play a limiting role when the detection table is placed on the support plate. On the other hand, if it is necessary to detect chips of different sizes, the partitions in the partition frame can be taken out and replaced with corresponding partitions.

[0023] 3. The utility model provides a leak-proof component. When the partition frame is raised, the round spring in the embedded groove on the detection table drives the limit frame to rise, which can prevent the chip at the edge from falling when the detection table moves.

[0024] Of course, any product implementing the present invention does not necessarily need to achieve all of the advantages described above at the same time. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] In order to more clearly illustrate the technical solutions of the embodiments of the utility model, the drawings required for describing the embodiments are briefly introduced below. Obviously, the drawings described below are only some embodiments of the utility model. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0026] Figure 1 This is a schematic diagram of the structure of the partition frame of the utility model when it is raised;

[0027] Figure 2 This is a schematic diagram of the structure of the connecting rod and the second fixing block of the utility model when they are closed;

[0028] Figure 3 It is a partial structural schematic diagram of the limit assembly of the utility model;

[0029] Figure 4 It is a schematic diagram of the structure of the leak-proof component of the utility model.

[0030] In the accompanying drawings, the components represented by the reference numerals are listed as follows:

[0031] 10. Base; 11. Detection body; 12. Detection probe; 13. First electric track; 14. Second electric track; 15. Support plate; 16. Partition frame; 17. Spring column; 18. First fixed block; 20. Detection table; 21. L-shaped limit handle; 22. Connecting shaft; 23. Connecting rod; 24. Groove; 25. Second fixed block; 26. Telescopic block; 30. Embedded groove; 31. Round spring; 32. Limit frame. DETAILED DESCRIPTION

[0032] In order to make the above-mentioned objects, features and advantages of the present invention more obvious and understandable, the specific implementation methods of the present invention are described in detail below with reference to the accompanying drawings.

[0033] In the following description, many specific details are set forth to facilitate a full understanding of the present invention, but the present invention may also be implemented in other ways different from those described herein, and those skilled in the art may make similar generalizations without violating the connotation of the present invention. Therefore, the present invention is not limited to the specific implementation methods disclosed below.

[0034] In order to make the purpose, technical solution and advantages of the present invention more clear, the implementation mode of the present invention will be further described in detail below with reference to the accompanying drawings.

[0035] See also Figure 1-3 As shown, this embodiment is a chip batch testing device, comprising:

[0036] The main body assembly includes a support plate 15, a spring column 17 connected to the side of the support plate 15 by screws, and a first fixing block 18 connected to the upper end of the spring column 17 by screws;

[0037] The support plate 15 plays a supporting role, the spring column 17 can achieve position change, and the first fixing block 18 plays a connecting role;

[0038] The limit assembly includes a detection plate 20 placed above the support plate 15, an L-shaped limit handle 21 connected to the side of the detection plate 20 by screws, a connecting shaft 22 connected to the side of the first fixed block 18 by screws, a connecting rod 23 rotatably connected to the middle of the connecting shaft 22, a groove 24 provided in the lower section of the connecting rod 23, a second fixed block 25 connected to the middle of the side of the support plate 15 by screws, and a telescopic block 26 movably connected to the bottom of the second fixed block 25;

[0039] The testing table 20 is used to place the chip, the L-shaped limit handle 21 plays a limiting role and is convenient for hand picking, the connecting shaft 22 plays a connecting role and is convenient for the rotation of the connecting rod 23, the connecting rod 23 and the second fixing block 25 play a connecting role, and the groove 24 and the telescopic block 26 play a limiting role;

[0040] The telescopic block 26 is movably connected in the groove 24, and there are two groups of connecting rods 23 and second fixing blocks 25, which are symmetrically located on both sides of the support plate 15;

[0041] The main assembly also includes a partition frame 16 connected to the side of the first fixing block 18 by screws, and the internal partition of the partition frame 16 is detachable;

[0042] The partition frame 16 is divided into an external frame and an internal partition, and the partition is connected to the frame by plug-in connection. A suitable partition is selected according to the implementation situation;

[0043] The detection table 20 is located between the support plate 15 and the partition frame 16, and the lower end of the L-shaped limit handle 21 is attached to the side of the support plate 15;

[0044] The main assembly also includes a base 10 fixed on the external workbench, a detection body 11 connected to the base 10 by screws, and a detection probe 12 movably connected to the middle of the top of the detection body 11;

[0045] The detection body 11 is used to detect the chip, and the detection probe 12 is responsible for connecting the chip;

[0046] The main assembly also includes a first electric track 13 connected to the base 10 by screws, and a second electric track 14 slidably connected above the first electric track 13;

[0047] The first electric track 13 and the second electric track 14 can realize position change;

[0048] The support plate 15 is slidably connected above the second electric track 14 and is located below the detection probe 12 .

[0049] Working principle:

[0050] Hold the L-shaped limit handle 21 and insert the detection plate 20 between the support plate 15 and the partition frame 16. Stop when the L-shaped limit handle 21 fits the support plate 15 and adjust the positions of both sides of the detection plate 20.

[0051] Pull the connecting rod 23 downwards to insert the groove 24 below the connecting rod 23 into the telescopic block 26 under the second fixing block 25. At this time, the partition frame 16 just clamps the detection table 20 on the support plate 15.

[0052] Put the chip in the partition frame 16, start the equipment, the first electric track 13 controls the second electric track 14 to move, and the second electric track 14 controls the support plate 15 to move, so that the detection table 20 of the support plate 15 and the partition frame 16 also move accordingly, so that the detection probe 12 can detect the chips in the partition frame 16 one by one;

[0053] After the test is finished, the telescopic block 26 is pressed, and the connecting rod 23 is rotated around the connecting shaft 22, so that the connecting rod 23 is separated from the second fixing block 25. At this time, the spring column 17 is extended, driving the partition frame 16 on the first fixing block 18 to rise;

[0054] Pull the L-shaped limit handle 21 to move the detection platform 20 horizontally out of the support plate 15;

[0055] Pick out the unqualified chips at the corresponding position, and then collect the remaining qualified chips together;

[0056] On the other hand, if chips of different sizes need to be detected, the partitions in the partition frame 16 can be replaced with partitions of corresponding sizes, and the displacement distance of each time in the first electric track 13 and the second electric track 14 and the descending height of the detection probe 12 can be adjusted.

[0057] This step can collect the chips in a unified manner and also expand the chip detection range.

[0058] See also Figure 4 As shown, this embodiment is based on the above embodiment 1 and also includes:

[0059] The leak-proof component includes embedded grooves 30 provided on four sides of the upper surface of the detection table 20;

[0060] The embedded groove 30 acts as a limiter and provides space for movement;

[0061] The anti-leakage assembly further includes a round spring 31 connected to the embedded groove 30 by screws, a limit frame 32 connected to the upper end of the round spring 31 by screws, and the limit frame 32 is movably connected to the embedded groove 30;

[0062] The round spring 31 provides position change, and the limit frame 32 plays a limiting role.

[0063] Working principle:

[0064] When the partition frame 16 is raised, the limit frame 32 is raised from the embedded groove 30 under the action of the round spring 31, and the L-shaped limit handle 21 can be held to move out of the detection table 20;

[0065] During testing, the testing table 20 is placed on the supporting plate 15 , and the connecting rod 23 is pulled to drive the partition frame 16 to descend, so that the limiting frame 32 can be pressed into the embedded groove 30 .

[0066] This step can prevent edge chips from falling when the detection platform 20 is moved.

[0067] In the description of the present invention, it is also necessary to explain that, unless otherwise clearly specified and limited, the terms "set", "install", "connect", and "connect" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be indirectly connected through an intermediate medium, or it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0068] Finally, it should be noted that the above description is only a preferred embodiment of the utility model and is not intended to limit the utility model. Although the utility model is described in detail with reference to the above embodiments, those skilled in the art can still modify the technical solutions recorded in the above embodiments or replace some of the technical features therein by equivalents. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the utility model shall be included in the protection scope of the utility model.

Claims

1. A chip batch testing device, characterized in that: include: A main body component, the main body component comprising a support plate (15), a spring column (17) connected to the side of the support plate (15) by screws, and a first fixing block (18) connected to the upper end of the spring column (17) by screws; A limit assembly, the limit assembly comprising a detection platform (20) placed above the support plate (15), an L-shaped limit handle (21) connected to the side of the detection platform (20) by screws, a connecting shaft (22) connected to the side of the first fixed block (18) by screws, a connecting rod (23) rotatably connected to the middle of the connecting shaft (22), a groove (24) provided in the lower section of the connecting rod (23), a second fixed block (25) connected to the middle of the side of the support plate (15) by screws, and a telescopic block (26) movably connected to the bottom of the second fixed block (25); The leak-proof component comprises embedded grooves (30) provided on four sides of the upper surface of the detection platform (20).

2. A chip batch testing device according to claim 1, characterized in that: The telescopic block (26) is movably connected in the groove (24), and there are two groups of connecting rods (23) and second fixing blocks (25), which are symmetrically located on both sides of the support plate (15).

3. A chip batch testing device according to claim 1, characterized in that: The main body component also includes a partition frame (16) connected to the side of the first fixing block (18) by screws, and the internal partition of the partition frame (16) is detachable.

4. A chip batch testing device according to claim 1, characterized in that: The detection table (20) is located between the support plate (15) and the partition frame (16), and the lower end of the L-shaped limit handle (21) is attached to the side of the support plate (15).

5. The chip batch testing device according to claim 1, characterized in that: The main body component also includes a base (10) fixed on the external workbench, a detection body (11) connected to the base (10) by screws, and a detection probe (12) movably connected to the middle of the top of the detection body (11).

6. A chip batch testing device according to claim 5, characterized in that: The main body assembly also includes a first electric track (13) connected to the base (10) by screws, and a second electric track (14) slidably connected above the first electric track (13).

7. The chip batch testing device according to claim 1, characterized in that: The support plate (15) is slidably connected above the second electric track (14) and is located below the detection probe (12).

8. The chip batch testing device according to claim 1, characterized in that: The anti-leakage component further comprises a round spring (31) connected to the embedded groove (30) by means of screws, and a limit frame (32) connected to the upper end of the round spring (31) by means of screws, and the limit frame (32) is movably connected to the embedded groove (30).

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