COC aging test device

Abstract

The utility model belongs to the technical field of chip detection devices, and particularly provides a COC aging test device which comprises a fixed assembly, a movable assembly, a spiral spring, a guide column, a mounting assembly and a plurality of groups of probes, the fixed assembly is provided with an abutting surface, and the spiral spring is connected to the movable assembly and the fixed assembly and can drive the movable assembly to move in the direction close to the abutting surface. A clamping space for clamping a COC is formed between the movable assembly and the abutting surface, the guide column is arranged on the fixed assembly, the mounting assembly is provided with a guide hole, the mounting assembly performs lifting motion through cooperation of the guide hole and the guide column, and the multiple groups of probes are all arranged on the mounting assembly. According to the COC aging test device, a metal plate elastic piece is not needed, the spiral spring is used for driving the movable assembly to move towards the abutting face to clamp and fix the COC, in addition, the installation assembly drives the multiple sets of probes to descend at the same time, multiple independent lifting mechanisms do not need to be arranged to drive the multiple sets of probes to ascend and descend, and therefore the manufacturing cost of the COC aging test device is reduced.

Description

Technical Field

[0001] The present application belongs to the technical field of chip detection devices, and in particular, relates to a COC aging test device. Background Art

[0002] COC (Chip On Carrier) needs to undergo a series of tests before packaging, including aging tests. The aging test of COC requires a special COC aging test device, which generally includes a positioning mechanism for positioning the COC and a lifting mechanism for driving the probe to rise and fall. The positioning mechanism generally includes a base plate and a sheet metal spring, and the COC is pressed against the base plate by the sheet metal spring. However, the processing of the sheet metal spring requires a special mold, which increases the production cost of the COC aging test device. In addition, the lifting mechanism is generally only used to drive the lifting of one group of probes. When multiple groups of probes need to be lifted and lowered at the same time, multiple independent lifting mechanisms need to be configured, which also increases the production cost of the COC aging test device. Utility Model Content

[0003] The purpose of the present application is to provide a COC aging test device, aiming to solve the technical problem of high manufacturing cost of aging test devices in the prior art.

[0004] To achieve the above-mentioned purpose, the technical solution adopted in the present application is: a COC aging test device, comprising a fixed component, a movable component, a coil spring, a guide column, an installation component and multiple groups of probes, the fixed component has a contact surface, the coil spring is connected to the movable component and the fixed component, and can drive the movable component to move in a direction close to the contact surface, and a clamping space for clamping the COC is formed between the movable component and the contact surface, the guide column is arranged on the fixed component, the installation component is provided with a guide hole, the installation component is lifted and lowered by the cooperation of the guide hole and the guide column, and multiple groups of probes are arranged on the installation component.

[0005] Furthermore, the COC aging test device also includes a circuit board, which is arranged on the top of the mounting assembly. The top of the probe is connected to the circuit board. A limiting hole is opened through the mounting assembly corresponding to the position of the probe. The probe passes through the limiting hole, and the bottom end of the probe extends out of the limiting hole.

[0006] Furthermore, a plurality of positioning protrusions are arranged on the abutting surface, the plurality of positioning protrusions are arranged at intervals, one end of the positioning protrusion has a positioning surface, the positioning surface cooperates with the abutting surface to form a stepped notch, and the plurality of stepped notches correspond one to one to the plurality of probe groups.

[0007] Furthermore, the top end of the guide column extends out of the guide hole, and the COC aging test device also includes a bracket, a threaded connector and a reset spring. The bracket is connected to the top end of the guide column, the bracket is provided with a threaded hole, the threaded connector is threadedly connected to the threaded hole, the bottom end of the threaded connector abuts against the top of the mounting assembly, and the two ends of the reset spring are respectively connected to the mounting assembly and the fixing assembly.

[0008] Furthermore, the number of the guide posts and the number of the guide holes are both two, the two guide posts are respectively provided with two guide holes, and the two ends of the bracket are respectively connected to the top ends of the two guide posts.

[0009] Furthermore, the COC aging test device also includes a circuit board, which is arranged on the top of the mounting assembly and connected to the probe. The circuit board is provided with an avoidance hole, and the threaded connector passes through the avoidance hole and abuts against the mounting assembly.

[0010] Furthermore, the mounting assembly includes a mounting plate and a guide sleeve, the probe passes through the mounting plate, the guide sleeve is arranged on the top of the mounting plate, a guide hole is formed in the guide sleeve, the mounting plate is provided with a connecting hole connected to the guide hole, the guide sleeve has an inner top wall arranged facing the fixed assembly, the return spring is sleeved on the guide column, and the end of the return spring away from the fixed assembly is connected to the inner top wall.

[0011] Furthermore, the fixed component includes a base and a positioning member, a slide groove is provided on the top of the base, the movable component is slidably connected to the slide groove, the coil spring is arranged in the slide groove, one end of the coil spring is connected to the side wall of the slide groove, the other end of the coil spring is connected to one end of the movable component, the other end of the movable component partially protrudes out of the slide groove to form a clamping portion, the positioning member is arranged on the base, and the side of the positioning member facing the clamping portion forms an abutment surface.

[0012] Furthermore, a connecting hole connected to the slide slot is provided on the peripheral side of the base, and the COC aging test device also includes a pressing piece, one end of which is located outside the base, and the other end of the pressing piece passes through the connecting hole and enters the slide slot, and is connected to one end of the movable component away from the coil spring.

[0013] Furthermore, there are multiple slide grooves, which are spaced apart along the length direction of the base, and the extension direction of the slide grooves is consistent with the width direction of the base. The movable component includes multiple sliders, and the number of sliders is consistent with the number of slide grooves. The multiple sliders are respectively arranged in the multiple slide grooves, and one end of each slider has a clamping portion, and the other end of each slider is connected to a coil spring.

[0014] Furthermore, there are two groups of slide grooves, the two groups of slide grooves are arranged at intervals along the width direction of the base, and the multiple slide grooves in each group of slide grooves are arranged at intervals along the length direction of the base.

[0015] Compared with the prior art, the COC aging test device provided by the present application has the following beneficial effects: when in operation, multiple COCs to be tested are placed in the clamping space between the abutting surfaces of the movable component and the fixed component, and the spiral spring is used to drive the movable component to move in the direction close to the abutting surface to clamp and fix the COC. There is no need to use sheet metal springs to press the COC, and there is no need for special modules to process sheet metal springs, thereby reducing the manufacturing cost of the COC aging test device; after the COC is clamped and fixed, the installation component is stably lowered through the cooperation of the guide column and the guide hole, and the installation component drives multiple groups of probes to descend at the same time, so that the multiple groups of probes contact and conduct electricity with multiple COCs one by one to perform aging tests on the COC. There is no need to configure multiple independent lifting mechanisms to drive the multiple groups of probes to rise and fall respectively, thereby simplifying the structure of the COC aging test device and reducing the manufacturing cost of the COC aging test device. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0017] Figure 1 A schematic diagram of the structure of a COC aging test device provided in an embodiment of the present application;

[0018] Figure 2 for Figure 1 An enlarged view of the COC aging test device at position A is shown;

[0019] Figure 3 for Figure 1 A cross-sectional view of the COC aging test apparatus shown;

[0020] Figure 4 for Figure 1 Partial structural breakdown of the COC aging test device shown Figure 1 ;

[0021] Figure 5 for Figure 4 A schematic diagram of the structure of the mounting parts shown;

[0022] Figure 6 for Figure 1 Partial structural breakdown of the COC aging test device shown Figure 2 ;

[0023] Figure 7 for Figure 6 The structural exploded view of the base, fixed cover and pressing member shown;

[0024] Figure 8 for Figure 7 A magnified view of the structure shown at B;

[0025] Fig. 9 A schematic diagram of the structure of a COC provided in an embodiment of the present application.

[0026] Among them, the reference numerals in the figure are:

[0027] 10. Fixed assembly; 11. Base; 111. First through hole; 112. Slide groove; 113. Connecting hole; 12. Positioning member; 121. Abutting surface; 122. Positioning protrusion; 123. Positioning surface; 124. Step-shaped notch; 13. Fixed cover plate; 14. Bottom plate; 20. Movable assembly; 21. Sliding block; 211. Pressing part; 30. Coil spring; 40. Guide column; 50. Mounting assembly; 51. Mounting plate; 511 , limiting hole; 512, connecting hole; 52, guide sleeve; 521, guide hole; 522, inner top wall; 60, probe; 70, clamping space; 80, first threaded fastener; 90, circuit board; 91, avoidance hole; 100, electrical connector; 110, bracket; 1101, threaded hole; 1102, second through hole; 120, threaded connector; 130, reset spring; 140, second threaded fastener; 150, pressing member;

[0028] 200, COC; 201, first electrode; 202, second electrode. DETAILED DESCRIPTION

[0029] The embodiments of the present application are described in detail below, and examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are intended to be used to explain the present application, and should not be construed as limiting the present application.

[0030] In the description of the present application, it should be understood that the terms "length", "width", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", etc., indicating the orientation or position relationship, are based on the orientation or position relationship shown in the accompanying drawings, and are only for the convenience of describing the present application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present application.

[0031] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of the features. In the description of this application, the meaning of "plurality" is two or more, unless otherwise clearly and specifically defined.

[0032] In this application, unless otherwise clearly specified and limited, the terms "installed", "connected", "connected", "fixed" and the like should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements. For ordinary technicians in this field, the specific meanings of the above terms in this application can be understood according to specific circumstances.

[0033] Please also read Figures 1 to 4 The embodiment of the present application provides a COC aging test device, including a fixed component 10, a movable component 20, a coil spring 30, a guide column 40, an installation component 50 and a plurality of probe groups 60. The fixed component 10 has a contact surface 121. The coil spring 30 is connected to the movable component 20 and the fixed component 10, and can drive the movable component 20 to move toward the direction close to the contact surface 121. A clamping space 70 for clamping COC 200 is formed between the movable component 20 and the contact surface 121. The guide column 40 is arranged on the fixed component 10. The installation component 50 is provided with a guide hole 521. The installation component 50 moves up and down through the cooperation of the guide hole 521 and the guide column 40. The plurality of probe groups 60 are all arranged on the installation component 50.

[0034] During operation, multiple COC200 to be tested are placed in the clamping space 70 between the abutting surface 121 of the movable component 20 and the fixed component 10, and the spiral spring 30 is used to drive the movable component 20 to move in the direction close to the abutting surface 121 to clamp and fix the COC200. There is no need to use sheet metal springs to press the COC200, and there is no need for a special module to process the sheet metal springs, thereby reducing the production cost of the COC aging test device; after the COC200 is clamped and fixed, the installation component 50 is stably lowered through the cooperation of the guide column 40 and the guide hole 521, and the installation component 50 drives the multiple groups of probes 60 to descend at the same time, so that the multiple groups of probes 60 are in one-to-one contact and conduction with the multiple COC200 to perform the aging test of the COC200. There is no need to configure multiple independent lifting mechanisms to drive the multiple groups of probes 60 to rise and fall respectively, thereby simplifying the structure of the COC aging test device and reducing the production cost of the COC aging test device.

[0035] Specifically, when the coil spring 30 is in a natural state, the distance between the movable component 20 and the abutment surface 121 is smaller than the length of the COC200. Before inserting the COC200, it is necessary to overcome the elastic force of the coil spring 30 and move the movable component 20 away from the abutment surface 121, so that the distance between the movable component 20 and the abutment surface 121 is greater than the length of the COC200. Then, the COC200 is placed between the movable component 20 and the abutment surface 121, and then the coil spring 30 is released. The coil spring 30 returns to its original state and drives the movable component 20 to move toward the abutment surface 121, thereby clamping and fixing the COC200. The coil spring 30 can be a compression spring or a tension spring, which is not limited here. After the aging test is completed, the installation assembly 50 is stably raised through the cooperation of the guide column 40 and the guide hole 521, and the installation assembly 50 drives the multiple groups of probes 60 to rise at the same time, overcoming the elastic force of the coil spring 30 to make the movable assembly 20 move in the direction away from the abutment surface 121 to release the COC200 that has completed the test, and then the next batch of COC200 to be tested can be replaced.

[0036] The aging test of COC200 specifically refers to supplying power to COC200 through the probe 60 to simulate the working conditions of COC200 in the actual circuit, and aging for several hours to dozens of hours at a high temperature of 80-150°C to accelerate the exposure of potential faults inside COC200, and then measuring electrical parameters to screen out COC200 that fails or has changed parameters.

[0037] like Fig. 9 As shown, COC 200 has a first electrode 201 and a second electrode 202 , and a group of probes 60 includes two probes 60 . During the aging test, the two probes 60 in the group of probes 60 are in contact with the first electrode 201 and the second electrode 202 of COC 200 , respectively, so as to supply power to COC 200 .

[0038] In one embodiment, in combination Figure 1 and Figure 6As shown, the fixing assembly 10 is provided with a first through hole 111, and the COC aging test device further includes a first threaded fastener 80, which is threadedly connected to one end of the guide column 40 after passing through the first through hole 111, and there is a gap between the first threaded fastener 80 and the first through hole 111. The first threaded fastener 80 is threadedly connected to the guide column 40 after passing through the first through hole 111, so as to achieve the fixing of the fixing assembly 10 and the guide column 40, and the structure is simple and easy to install. The position of the guide column 40 can be fine-tuned through the gap between the first threaded fastener 80 and the first through hole 111, so as to adjust the position of the mounting assembly 50 and the probe 60, and ensure that the probe 60 is accurately docked with the COC200. The lifting mechanism in the traditional COC aging test device is generally only used to drive the lifting of one group of probes 60, and multiple groups of probes 60 need to be configured with multiple independent lifting mechanisms. Before the aging test of COC200 is performed, the position of the lifting mechanism needs to be adjusted one by one to ensure that each group of probes 60 is aligned with the corresponding COC200, and the debugging process is complicated. In this embodiment, the multiple groups of probes 60 are all arranged on the mounting assembly 50, and the mounting assembly 50 drives the multiple groups of probes 60 to rise and fall simultaneously. Before the aging test of COC200 is performed, it is only necessary to adjust the position of the mounting assembly 50 once to achieve one-to-one alignment of the multiple groups of probes 60 with multiple COC200s, which greatly simplifies the debugging process.

[0039] In one embodiment, in combination Figure 3 and Figure 4 As shown, the COC aging test device also includes a circuit board 90, the circuit board 90 is arranged on the top of the mounting assembly 50, the top of the probe 60 is connected to the circuit board 90, and the mounting assembly 50 is provided with a limiting hole 511 corresponding to the position of the probe 60, the probe 60 is provided with the limiting hole 511, and the bottom end of the probe 60 extends out of the limiting hole 511. The bottom end of the probe 60 extends out of the limiting hole 511 for contacting the COC200, and the circuit board 90 and the COC200 can be electrically connected through the probe 60. By providing the limiting hole 511 in the mounting assembly 50 and allowing the probe 60 to pass through the limiting hole 511, the probe 60 can be limited in the circumferential direction, effectively preventing the probe 60 from shaking, thereby ensuring that the probe 60 is in stable contact with the COC200, ensuring that the aging test is carried out smoothly, and also protecting the probe 60, effectively preventing the probe 60 from bending. Specifically, the mounting assembly 50 is in the shape of a plate, so as to facilitate the installation and fixation of the circuit board 90, and the circuit board 90 can be fixed on the mounting assembly 50 by screws.

[0040] In one embodiment, Figure 4As shown, an electrical connector 100 is provided on the circuit board 90, and the electrical connector 100 is electrically connected to the circuit board 90. The electrical connector 100 is used for electrical connection to an external power source. When the COC 200 is subjected to an aging test, the external power source is connected to the electrical connector 100, and the current flows from the electrical connector 100, flows through the circuit board 90 and the probe 60 in sequence, and then flows to the COC 200. Specifically, the electrical connector 100 may be a socket with a pin.

[0041] In one embodiment, in combination Figure 1 and Figure 4 As shown, the top end of the guide column 40 extends out of the guide hole 521, and the COC aging test device also includes a bracket 110, a threaded connector 120 and a reset spring 130. The bracket 110 is connected to the top end of the guide column 40, the bracket 110 is provided with a threaded hole 1101, the threaded connector 120 is threadedly connected to the threaded hole 1101, the bottom end of the threaded connector 120 abuts against the top of the mounting assembly 50, and the two ends of the reset spring 130 are respectively connected to the mounting assembly 50 and the fixing assembly 10. When the aging test is performed on COC200, the threaded connector 120 is turned to move the threaded connector 120 downward, thereby pushing the mounting assembly 50 to overcome the elastic force of the return spring 130 and move downward. When the probe 60 on the mounting assembly 50 contacts the COC200, the threaded connector 120 is stopped from being turned to maintain the mounting assembly 50 at a fixed height, thereby ensuring that the probe 60 is in stable contact with the COC200. After the test is completed, the threaded connector 120 is turned in the opposite direction to move the threaded connector 120 upward, and the return spring 130 can restore its original state and push the mounting assembly 50 upward, thereby separating the probe 60 from the COC200. Specifically, the threaded connector 120 can be a knurled screw, and its head is provided with straight knurling, which plays a role in increasing friction and is convenient for hand-tightening operation.

[0042] In one embodiment, Figure 4 As shown, the circuit board 90 is provided with an avoidance hole 91, and the threaded connector 120 passes through the avoidance hole 91 and abuts against the top of the mounting assembly 50. By providing the avoidance hole 91 in the circuit board 90, the threaded connector 120 can pass through the avoidance hole 91 and abut against the top of the mounting assembly 50, thereby preventing the threaded connector 120 from squeezing the circuit board 90 and causing damage to the circuit board 90.

[0043] In one embodiment, in combination Figure 1 and Figure 4As shown, the number of guide posts 40 and guide holes 521 are both two, and two guide posts 40 are respectively provided with two guide holes 521, and the two ends of the bracket 110 are respectively connected to the top ends of the two guide posts 40. On the one hand, by providing two guide posts 40 and two guide holes 521, and two guide posts 40 are respectively provided with two guide holes 521, the guiding effect can be enhanced, and the stability of the mounting assembly 50 during lifting and lowering can be ensured, thereby ensuring the stable contact between the probe 60 and the COC200; on the other hand, by providing two guide posts 40, the top ends of the two guide posts 40 are respectively connected to the two ends of the bracket 110, thereby improving the stability of the overall structure.

[0044] In one embodiment, in combination Figure 1 and Figure 4 As shown, the bracket 110 is provided with a second through hole 1102, and the COC aging test device further includes a second threaded fastener 140, which passes through the second through hole 1102 and is threadedly connected to one end of the guide column 40. The second threaded fastener 140 passes through the second through hole 1102 and is threadedly connected to the guide column 40, thereby achieving the fixation of the bracket 110 and the guide column 40, with a simple structure and convenient installation.

[0045] In one embodiment, in combination Figure 1 , Figure 4 and Figure 5 As shown, the mounting assembly 50 includes a mounting plate 51 and a guide sleeve 52, the probe 60 passes through the mounting plate 51, the guide sleeve 52 is arranged on the top of the mounting plate 51, a guide hole 521 is formed in the guide sleeve 52, the mounting plate 51 is provided with a connecting hole 512 connected to the guide hole 521, the guide sleeve 52 has an inner top wall 522 arranged facing the fixing assembly 10, the return spring 130 is sleeved on the guide column 40, and one end of the return spring 130 away from the fixing assembly 10 is connected to the inner top wall 522. During installation, the return spring 130 is first sleeved on the guide column 40, and one end of the return spring 130 is connected to the fixing assembly 10, and then the mounting assembly 50 is sleeved on the guide column 40, so that the guide column 40 passes through the connecting hole 512 of the mounting plate 51 and the guide hole 521 of the guide sleeve 52 in sequence, and the end of the return spring 130 away from the fixing assembly 10 is connected to the inner top wall 522 of the guide sleeve 52. When the mounting assembly 50 is lowered, the return spring 130 is compressed by the inner top wall 522 of the guide sleeve 52, and when the return spring 130 is restored to its original state, it can drive the mounting assembly 50 to rise as a whole by pushing the inner top wall 522 of the guide sleeve 52. The guide sleeve 52 is arranged on the top of the mounting plate 51, which will not interfere with the docking of the probe 60 and the COC200. Specifically, the circuit board 90 is arranged on the top of the mounting plate 51, the limiting hole 511 is arranged on the mounting plate 51, and the bottom end of the threaded connector 120 is in contact with the top of the mounting plate 51.

[0046] In one embodiment, in combination Figure 3 and Figure 6 As shown, the fixed component 10 includes a base 11 and a positioning member 12, a slide groove 112 is provided on the top of the base 11, the movable component 20 is slidably connected to the slide groove 112, the coil spring 30 is arranged in the slide groove 112, one end of the coil spring 30 is connected to the side wall of the slide groove 112, the other end of the coil spring 30 is connected to one end of the movable component 20, and the other end of the movable component 20 partially protrudes out of the slide groove 112 to form a clamping portion 211, and the positioning member 12 is arranged on the base 11, and the side of the positioning member 12 facing the clamping portion 211 forms a contact surface 121. Specifically, when the coil spring 30 is in a natural state, the distance between the clamping portion 211 and the abutment surface 121 is smaller than the length of COC200. Before inserting COC200, it is necessary to overcome the elastic force of the coil spring 30 and make the movable component 20 slide in the slide groove 112 in the direction away from the abutment surface 121, so that the distance between the clamping portion 211 and the abutment surface 121 is greater than the length of COC200. Then, the COC200 to be tested is placed on the base 11 and leans against the abutment surface 121. Then, the coil spring 30 is released, and the coil spring 30 automatically pushes the movable component 20 to slide in the slide groove 112 in the direction close to the abutment surface 121, so that the clamping portion 211 squeezes the side of COC200 facing away from the abutment surface 121, thereby achieving clamping and fixing of COC200. Specifically, the positioning member 12 is plate-shaped and fixed to the base 11 by screws. The COC aging test device also includes a limit pin, which penetrates the positioning member 12 and the base 11. The guide column 40 is arranged on the base 11, and one end of the return spring 130 away from the mounting assembly 50 is connected to the base 11, and the first through hole 111 is opened in the base 11.

[0047] In one embodiment, in combination Figure 3 and Figure 7 As shown, the peripheral side of the base 11 is provided with a connection hole 113 connected to the slide groove 112, and the COC aging test device also includes a pressing member 150, one end of the pressing member 150 is located outside the base 11, and the other end of the pressing member 150 passes through the connection hole 113 and enters the slide groove 112, and is connected to the end of the movable component 20 away from the coil spring 30. The operator can press the end of the pressing member 150 located outside the base 11, so as to indirectly push the movable component 20 to slide in the direction away from the abutment surface 121 through the pressing member 150, and the operation is very convenient. Specifically, the pressing member 150 is a knurled screw, and the tail of the pressing member 150 is threadedly connected to the movable component 20 to ensure reliable connection. The head of the pressing member 150 is provided with straight knurling to increase friction.

[0048] In one embodiment, in combination Figure 3 and Figure 7As shown, the fixed assembly 10 further includes a fixed cover plate 13, which is disposed on the top of the base 11 and covers the portion of the coil spring 30 and the movable assembly 20 located in the slide groove 112. By arranging the fixed cover plate 13 on the base 11 to cover the portion of the coil spring 30 and the movable assembly 20 located in the slide groove 112, the coil spring 30 and the movable assembly 20 can be prevented from slipping out of the slide groove 112, thereby improving working reliability. Specifically, the fixed cover plate 13 can be fixed to the base 11 by screws.

[0049] In one embodiment, in combination Figure 3 and Figure 6 As shown, the fixing assembly 10 also includes a base plate 14, which is arranged at the bottom of the base 11. The first threaded fastener 80 passes through the base plate 14 and the first through hole 111 of the base 11 in turn and is threadedly connected to the first screw hole of the guide column 40, thereby achieving the fixation of the base plate 14, the base 11 and the guide column 40.

[0050] In one embodiment, Figure 7 As shown, there are multiple slide grooves 112, and the multiple slide grooves 112 are arranged at intervals along the length direction of the base 11. The extension direction of the slide grooves 112 is consistent with the width direction of the base 11. The movable component 20 includes multiple sliders 21, and the number of the sliders 21 is consistent with the number of the slide grooves 112. The multiple sliders 21 are respectively arranged in the multiple slide grooves 112. One end of each slider 21 has a pressing portion 211, and the other end of each slider 21 is connected to a coil spring 30. When the size of the base 11 is constant, the extension direction of the slide groove 112 is consistent with the width direction of the base 11, and the multiple slide grooves 112 are arranged at intervals along the length direction of the base 11, so that more slide grooves 112 can be opened, and a slider 21 can be placed in each slide groove 112, and each slider 21 can cooperate with the abutment surface 121 to clamp and fix the COC200, so that more COC200 can be tested for aging at the same time, thereby improving the efficiency of the test. In addition, the movable component 20 is divided into multiple independent sliders 21, each slider 21 corresponds to a COC200, which can ensure that each COC200 is clamped in place, and each slider 21 can slide independently in the corresponding slide groove 112. The sliders 21 do not affect each other, so different sliders 21 can be used to clamp and fix COC200 of the same size, and can also be used to clamp and fix COC200 of different sizes, with high versatility.

[0051] Specifically, there are multiple connecting holes 113 opened on the peripheral side of the base 11, and the number of the connecting holes 113 is consistent with the number of the slide grooves 112. The multiple connecting holes 113 are connected to the multiple slide grooves 112 in a one-to-one correspondence. There are also multiple pressing pieces 150, and the number of the pressing pieces 150 is consistent with the number of the connecting holes 113. The multiple pressing pieces 150 respectively pass through the multiple connecting holes 113 and enter the corresponding slide grooves 112, and are connected to the sliders 21 in the slide grooves 112.

[0052] In one embodiment, Figure 7 As shown, there are two groups of slide grooves 112, and the two groups of slide grooves 112 are arranged at intervals along the width direction of the base 11, and the multiple slide grooves 112 in each group of slide grooves 112 are arranged at intervals along the length direction of the base 11. Correspondingly, one side of the base 11 is provided with a group of pressing members 150, and the other side of the base 11 is also provided with a group of pressing members 150, and the two groups of pressing members 150 are respectively provided corresponding to the two groups of slide grooves 112.

[0053] In one embodiment, in combination Figure 7 and Figure 8 As shown, a plurality of positioning protrusions 122 are arranged on the abutting surface 121, and the plurality of positioning protrusions 122 are arranged at intervals. One end of the positioning protrusion 122 has a positioning surface 123, and the positioning surface 123 cooperates with the abutting surface 121 to form a stepped notch 124, and the plurality of stepped notches 124 correspond to the plurality of probe groups 60 one by one. According to the positions of the plurality of probe groups 60, a plurality of positioning protrusions 122 are arranged on the abutting surface 121, so that the plurality of stepped notches 124 formed by the plurality of positioning protrusions 122 and the abutting surface 121 correspond to the plurality of probe groups 60 one by one. By respectively clamping the plurality of COC200 in the plurality of stepped notches 124, it can be ensured that the plurality of COC200 corresponds to the plurality of probe groups 60 in the height direction one by one. In addition, the stepped notch 124 can adapt to COC200 of different sizes, and COC200 of different sizes can be clamped in the stepped notch 124 to achieve positioning, and the versatility is high. Of course, the width of COC 200 must be smaller than the distance between two adjacent positioning protrusions 122. Specifically, the shape of COC 200 is roughly a cuboid, and the positioning surface 123 and the abutting surface 121 are perpendicular to each other and can respectively fit with two adjacent surfaces of COC 200.

[0054] The above are only preferred embodiments of the present application and are not intended to limit the present application. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present application should be included in the protection scope of the present application.

Claims

1. A COC aging test device, characterized in that: It includes a fixed component, a movable component, a coil spring, a guide column, an installation component and multiple groups of probes, the fixed component has an abutment surface, the coil spring is connected to the movable component and the fixed component, and can drive the movable component to move in a direction close to the abutment surface, a clamping space for clamping COC is formed between the movable component and the abutment surface, the guide column is arranged on the fixed component, the installation component is provided with a guide hole, the installation component is lifted and lowered by the cooperation of the guide hole and the guide column, and multiple groups of probes are arranged on the installation component.

2. The COC aging test device according to claim 1, characterized in that: The COC aging test device also includes a circuit board, which is arranged on the top of the mounting assembly. The top end of the probe is connected to the circuit board. The mounting assembly is provided with a limiting hole corresponding to the position of the probe. The probe passes through the limiting hole, and the bottom end of the probe extends out of the limiting hole.

3. The COC aging test device according to claim 1, characterized in that: A plurality of positioning protrusions are arranged on the abutting surface, the plurality of positioning protrusions are arranged at intervals, one end of the positioning protrusion has a positioning surface, the positioning surface cooperates with the abutting surface to form a stepped notch, and the plurality of stepped notches correspond one to one with the plurality of groups of probes.

4. The COC aging test device according to claim 1, characterized in that: The top end of the guide column extends out of the guide hole. The COC aging test device also includes a bracket, a threaded connector and a reset spring. The bracket is connected to the top end of the guide column. The bracket is provided with a threaded hole. The threaded connector is threadedly connected to the threaded hole. The bottom end of the threaded connector abuts against the top of the mounting assembly. The two ends of the reset spring are respectively connected to the mounting assembly and the fixing assembly.

5. The COC aging test device according to claim 4, characterized in that: The number of the guide posts and the number of the guide holes are both two, and two guide posts are respectively provided with two guide holes, and the two ends of the bracket are respectively connected to the top ends of the two guide posts.

6. The COC aging test device according to claim 4, characterized in that: The COC aging test device further comprises a circuit board, which is arranged on the top of the mounting assembly and connected to the probe. The circuit board is provided with an avoidance hole, and the threaded connector passes through the avoidance hole and abuts against the mounting assembly.

7. The COC aging test device according to claim 4, characterized in that: The mounting assembly includes a mounting plate and a guide sleeve, the probe passes through the mounting plate, the guide sleeve is arranged on the top of the mounting plate, the guide hole is formed in the guide sleeve, the mounting plate is provided with a connecting hole connected to the guide hole, the guide sleeve has an inner top wall arranged facing the fixing assembly, the return spring is sleeved on the guide column, and the end of the return spring away from the fixing assembly is connected to the inner top wall.

8. The COC aging test device according to claim 1, characterized in that: The fixed component includes a base and a positioning member, a slide groove is provided on the top of the base, the movable component is slidably connected to the slide groove, the coil spring is arranged in the slide groove, one end of the coil spring is connected to the side wall of the slide groove, the other end of the coil spring is connected to one end of the movable component, the other end of the movable component partially protrudes out of the slide groove to form a clamping portion, the positioning member is arranged on the base, and the side of the positioning member facing the clamping portion forms the abutment surface.

9. The COC aging test device according to claim 8, characterized in that: A connecting hole connected to the slide slot is provided on the peripheral side of the base. The COC aging test device also includes a pressing piece, one end of which is located outside the base, and the other end of the pressing piece passes through the connecting hole and enters the slide slot, and is connected to one end of the movable component away from the coil spring.

10. The COC aging test device according to claim 8, characterized in that: There are multiple slide grooves, and the multiple slide grooves are arranged at intervals along the length direction of the base. The extension direction of the slide groove is consistent with the width direction of the base. The movable component includes multiple sliders, and the number of the sliders is consistent with the number of the slide grooves. The multiple sliders are respectively arranged in the multiple slide grooves, and one end of each of the sliders has the clamping portion, and the other end of each of the sliders is connected to the coil spring.

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