Specimen analyzing apparatus and specimen analyzing method

A technology for analyzing devices and specimens, which is applied in the directions of analyzing materials and instruments, and can solve problems such as undocumented responses.

Active Publication Date: 2010-06-09
SYSMEX CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, in U.S. Patent No. 5,587,129, there is no description of the necessary response to such an inspection.

Method used

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  • Specimen analyzing apparatus and specimen analyzing method
  • Specimen analyzing apparatus and specimen analyzing method
  • Specimen analyzing apparatus and specimen analyzing method

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Embodiment Construction

[0075] Hereinafter, preferred embodiments of the present invention will be described with reference to the drawings. The sample analyzer of the present embodiment is a blood coagulation measurement device that performs optical measurement and analysis of a sample using a clotting time method, a synthetic matrix method, an immunoturbidimetric method, and a platelet aggregation method. In addition, the blood coagulation measurement device described above is configured to continuously measure and analyze a plurality of samples for which a measurement order has been registered.

[0076] figure 1 It is a perspective view showing an overview of the sample analyzer 1 . like figure 1 As shown, a sample analysis device 1 includes: a measurement device 2 for optically measuring components contained in a sample (blood); and an information processing device 3 for analyzing the measurement results of the measurement device 2 .

[0077] figure 2 It is an overview diagram showing the co...

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PUM

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Abstract

A specimen analyzing apparatus capable of efficiently analyzing the specimen based on the detecting condition of the specimen, which comprises: a detector for detecting component information regarding a component in a specimen contained in each of analyzing containers, the analyzing containers comprising first and second analyzing containers; an analyzing part for analyzing the component information detected by the detector; a transporting device for transporting specimen containers each containing a specimen, the specimen containers comprising first and second specimen containers; an operation mode selecting means for selecting one of a first operation mode and a second operation mode; a first supplying device for supplying the specimen of a first amount; a second supplying device for supplying the specimen of a second amount grater than the first amount; and a supply controlling means for controlling the first and second supplying devices in accordance with an operation mode selected by the operation mode selecting means, is disclosed.

Description

technical field [0001] The present invention relates to a sample analyzer, and more particularly to a sample analyzer including a pipette for dispensing a sample contained in a sample container transported by a transport device to a cuvette arranged inside the device, and Specimen analysis method. Background technique [0002] Conventionally, there is known a sample analyzer that temporarily dispenses a sample contained in a sample container transported to a suction position by a transport device to one test tube disposed inside the device, and dispenses the sample in the one test tube. A part is dispensed to another test tube inside the device, and the sample in the other test tube is optically measured. [0003] As such a sample analyzer, for example, in U.S. Patent (Patent) No. 5,587,129, a sample analyzer is disclosed, which is provided with: a conveying device for conveying and holding racks containing sample containers; The working table holds the container; the firs...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N35/00G01N35/02G01N35/10
CPCG01N2035/00801G01N2035/00752G01N35/1081G01N35/1016G01N35/026G01N35/00722G01N35/0092G01N35/025G01N35/1079G01N2035/0403G01N2035/0444G01N2035/1086G01N35/1065
Inventor 福田和也小池洋毅胜见宏则山登隆司池田正行福崎刚今津雅范喜多川信宏中野大介
Owner SYSMEX CORP
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