Method and device for creating function curve of identified material

Abstract

A method and device for creating a function curve for identifying materials in a system for inspecting objects using forward scattered radiation is disclosed, the method comprising the steps of making direct radiation emitted by a radiation source and forward scattered radiation emitted by a scatterer different in thickness Known materials interact with each other, and detect the penetration value; match the penetration values ​​of the two energies to various materials of the same thickness, that is, calculate the ratio between the transparency under the two energies; group by different materials, according to the The above-mentioned ratios are used to fit the variation curves of various materials with the thickness as a function curve for identifying materials. The invention can be used in customs, ports and airports to inspect goods without opening the box, and can also be used in biological research or medical detection.

Description

[0001] This application is a divisional application of the invention patent application 200810106278.1 filed on May 9, 2008, entitled "Method and Device for Inspecting Objects Using Forward Scattered Radiation". technical field [0002] The invention relates to radiation inspection of objects, in particular to a method and equipment for inspection of materials in large and medium-sized objects such as shipping and air containers. Background technique [0003] In the existing field of X-ray radiation imaging, the main method used in the early stage is to let the single-energy ray interact with the object to be inspected, and then detect the ray after interacting with the object to be inspected to obtain an image. This method can reflect changes in the shape and mass thickness of the inspected object, but it cannot identify the material of the object. Later, the method of using the dual-energy method to identify the effective atomic number of a substance was proposed, and was ...

AI Technical Summary

Problems solved by technology

In Patent Document 3, the difference between the energy spectra of the two beams of X-rays obtained by the material absorption method is limited, resulting in a limited range of accurate material identification, and the method of alternately generating high and low energy rays with different energy spectrums by the accelerator has a great impact on Accelerator stability requirements are too stringent, making it difficult to apply the method

[0007]Patent Document 4 (US2007 / 0098142A1) proposed a method of simultaneously detecting backscattered radiation and forwardscattered radiation to increase the amount of information, but did not propose its application for substance identification

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