Method and device for creating function curve of identified material

Abstract

The invention discloses a method and a device for creating a function curve of an identified material in a system for inspecting an object by utilizing forward scattering radiation. The method comprises the following steps: enabling direct radiation emitted by a radiation source and the forward scattering radiation emitted by a scattering body to interact with known materials with different thicknesses, and detecting to obtain penetration numbers; matching the penetration numbers of two kinds energy to various materials with the same thickness, and calculating a specific value between transparencies under the two kinds of energy; and grouping according to the different materials, and fitting out the variation curve of various materials along with the thickness according to the specific value, wherein the variation curve is used as the function curve of the identified material. The method and the device for creating the function curve of the identified material can be used for performing non-out of box audit on cargoes at customs, harbors and airports, and also can be used for biological studies or medical detection.

Description

[0001] This application is a divisional application of the invention patent application 200810106278.1 filed on May 9, 2008, entitled "Method and Device for Inspecting Objects Using Forward Scattered Radiation". technical field [0002] The invention relates to radiation inspection of objects, in particular to a method and equipment for inspection of materials in large and medium-sized objects such as shipping and air containers. Background technique [0003] In the existing field of X-ray radiation imaging, the main method used in the early stage is to let the single-energy ray interact with the object to be inspected, and then detect the ray after interacting with the object to be inspected to obtain an image. This method can reflect changes in the shape and mass thickness of the inspected object, but it cannot identify the material of the object. Later, the method of using the dual-energy method to identify the effective atomic number of a substance was proposed, and was ...

AI Technical Summary

Problems solved by technology

In Patent Document 3, the difference between the energy spectra of the two beams of X-rays obtained by the material absorption method is limited, resulting in a limited range of accurate material identification, and the method of alternately generating high and low energy rays with different energy spectrums by the accelerator has a great impact on Accelerator stability requirements are too stringent, making it difficult to apply the method

[0007] Patent Document 4 (US 2007 / 0098142A1) proposes a method of simultaneously detecting backscattered radiation and forwardscattered radiation to increase the amount of information, but does not propose to apply it to material identification

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