Testing circuit, testing device and testing method of Bluetooth earphone Don and Doff function

Abstract

The invention provides a testing circuit, a testing device and a testing method of a Bluetooth earphone Don and Doff function. The testing circuit comprises at least one testing electrode and a same-direction voltage following circuit which is connected with the testing electrode; the same-direction voltage following circuit comprises a variable capacitance diode and an excitation signal generator; and one of the variable capacitance diode is connected with the testing electrode, and the other end of the variable capacitance diode is connected with the excitation signal generator. According to the testing circuit of the Bluetooth earphone Don and Doff function, provided by the invention, an inductive curve of each earphone can be determined by matching corresponding testing software, sample curves and limit can be formulated according to batch testing data, a volume production earphone curve is set between limit curves, and thus the consistency requirements are considered to be met, and the testing method is direct and simple and is convenient to implement.

Description

technical field [0001] The present invention relates to the technical field of bluetooth earphones, more specifically, to a bluetooth earphone Don&Doff function test circuit, a test device and a test method thereof. Background technique [0002] Bluetooth is a short-range wireless communication technology with low cost and low power consumption. In recent years, with the popularization of Bluetooth products and wireless technology applications, Bluetooth headsets have become the most widely used Bluetooth technology in daily life. Through Bluetooth headsets, mobile phone users can realize wireless hands-free functions without having to start from the head like now. Hang a cord to the phone. [0003] At present, the Don / Doff function of Bluetooth headsets (that is, the headset automatically detects whether it is worn on the ear, enters the standby state when it is worn, and enters a low power consumption state after it is taken off) is becoming more and more common, which ca...

AI Technical Summary

Problems solved by technology

[0004] The introduction of the new function of Don / Doff makes the Bluetooth headset need to increase the test of this function before leaving the factory, but the existing test method uses metal tooling and other methods, and when the headset is close to the tooling, it is judged whether the headset responds to confirm whether the Don / Doff function Available, but not measurable for sensitivity, consistency, etc. of this feature

This test method, which can only simply test the presence or absence of the Don / Doff function and cannot guarantee the consistency of this function, is far from meeting the needs of manufacturers for the Don / Doff function test of Bluetooth headsets.

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