Loop bandwidth virtual testing method

Abstract

The invention belongs to the technical field of photoelectric tracking, and relates to a loop bandwidth virtual testing method which includes steps of outputting sine command signals with specific frequency, sending the sine command signals to a control loop of a to-be-tested digital control system to generate loop response signals, performing correlation operation to the loop response signals and the sine command signals; determining the maximum correlation amplitude and corresponding time thereof in the frequency according to the maximum value obtained from the correlation operation, and determining the amplitude and phase of the loop control signals in the frequency; changing frequency of the sine command signals and repeating the above steps, recording and saving the amplitude and phase changes of the loop response signals, and accordingly, drawing curves of amplitude frequency and phase frequency so as to determine loop bandwidth. By the loop bandwidth virtual testing method, the technical problem that testing efficiency is reduced due to difficulty in matching between a physical instrument and the digital control system in the process of testing the loop bandwidth of the digital control system by the physical instrument is solved, energy is saved and efficiency is improved by means of virtual testing.

Description

technical field [0001] The invention belongs to the technical field of photoelectric tracking, and in particular relates to a method for virtual testing of loop bandwidth. Background technique [0002] In the prior art, dynamic signal analyzers are generally used to test the bandwidth of control loops, and most dynamic signal analyzers have analog signal interfaces, and cannot be tested when the system to be tested is a digital control system. Even if the dynamic signal analyzer is equipped with a digital interface, it often cannot match the digital interface of the digital control system under test. It is necessary to convert the interface for a specific system, which increases unnecessary test steps and reduces test efficiency. Contents of the invention [0003] The technical problem to be solved by the present invention is: it is difficult to match the interface between the physical instrument and the digital control system in the process of testing the loop bandwidth o...

AI Technical Summary

Problems solved by technology

[0002] In the prior art, the method of testing the bandwidth of the control loop generally uses a dynamic signal analyzer, and most of the dynamic signal analyzers have an analog signal interface, and the test cannot be performed when the system to be tested is a digital control system

Even if the dynamic signal analyzer is equipped with a digital interface, it often cannot match the digital interface of the digital control system under test. It is necessary to convert the interface for a specific system, which increases unnecessary test steps and reduces test efficiency.

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