A test method for anti-irradiation index of star sensor lens
Patent Information
- Authority / Receiving Office
- CN Β· China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- SHANGHAI AEROSPACE CONTROL TECH INST
- Publication Date
- 2015-09-09
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Abstract
Description
technical field
[0001] The invention relates to a star sensor, in particular to a method for testing an anti-radiation index of a star sensor lens. Background technique
[0002] The emergence of CCD technology in the mid-1970s greatly improved the accuracy of star sensors, and at the same time greatly accelerated the development of star sensors. Because CCD has many advantages such as small size, light weight, low power consumption and high reliability, it is rapidly and widely used in the development of star sensors. The adoption of CCD technology and the autonomy of attitude measurement are the notable features that distinguish this generation of astrosensors from the previous generation. The star sensor developed by our country uses a commercial-grade CCD device. As the weak link in the anti-radiation of the star sensor, it is necessary to do a good anti-irradiation design for the optical lens in front of the CCD, so as to resist stronger space radiation. , the research...