Full-power aging test method for current transformer

Abstract

The invention provides a full-power aging test method for a current transformer. The method is specially characterized in that: the power grid voltage is connected with the input end of a voltage regulator through an air switch; the output end of the voltage regulator is connected to a primary coil p of a transformer, and a secondary coil s1 of the transformer is connected to a current transformer to be tested and the input end of a debugging module; and the output end of the debugging module is connected with another secondary coil s2 of the transformer. The full-power aging test of the current transformer can be finished by adjusting the voltage regulator to simulate the change of the power grid voltage and through the changing harmonic wave and output current generated by the debugging module. With the full-power aging test method, the current transformers of a high-power uninterrupted power source UPS, an active power filter APF, a static var generator SVG and a photovoltaic inverter can be tested, debugged and aged; the cost in circuit reconstruction is reduced; and debugging aging is fed back to the power grid through a closed loop, thereby saving electric energy.

Description

technical field [0001] The invention relates to the technical field of power grids, in particular to a method for full power aging test of a converter. Background technique [0002] Various converters including (active power filter APF, static var generator SVG, uninterruptible power supply UPS, photovoltaic inverter) manufacturers need to test their various performances before their products leave the factory. The aging test is to simulate the electrical characteristics of the actual load and run at full load to test the inverter or drive circuit of the converter or frequency converter. Full power burn-in test is a very important part of converter reliability test, especially for high voltage and high power converters. [0003] 1) At present, most of the power of the nonlinear load generator in the APF test aging system is consumed by the resistor. The resistor generates serious heat. When the power is large, an additional heat sink needs to be added. When the APF full p...

AI Technical Summary

Problems solved by technology

Electricity is expensive

If the transformer at the input end of the existing manufacturer is small, the input grid needs to be transformed, and the transformation cost is expensive

[0004] 2) High-power UPS uses resistive as aging load, which is a waste of electricity. When testing aging at full power, the transformer at the input end of the manufacturer requires a larger capacity

[0005] 3) At present, the DC source input by the high-power photovoltaic inverter is very expensive (4-5 million). If a DC source is used, the investment will be very large, and the cost of high-power UPS electronic load equipment is relatively high. Aging load, more waste of electricity

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