Test unit for array substrates, array substrate and display device

Abstract

The invention discloses a test unit for array substrates, an array substrate and a display device and belongs to the technical field of displaying. The test unit for the array substrates comprises a test structure and two metal substrates, wherein the test structure comprises a connecting portion and two contact portions, the contact portions are located above the corresponding metal substrates and are in contact with the metal substrates, the connecting portion is connected with the two contact portions, and a connecting position of any contact portion with the connecting portion is located outside corresponding areas of the metal substrates. By means of the test unit for the array substrates, the array substrate and the display device, undesirable phenomena such as breaking of climbing positions of existing test structures can be prevented, and accuracy of the testing result can be guaranteed. The test unit for the array substrates, the array substrate and the display device can be used for display devices such as liquid crystal display televisions, liquid crystal displayers, mobile phones and tablet personal computers.

Description

technical field [0001] The present invention relates to the field of display technology, in particular to a test unit for an array substrate, an array substrate and a display device. Background technique [0002] A liquid crystal display (LCD for short) is a mainstream display device at present. A liquid crystal display is mainly composed of an array substrate, a color filter substrate, peripheral circuits, and a backlight assembly. Among them, the array substrate is a glass substrate with specific specifications, and a certain number of pixels are formed on the glass substrate through a series of processes such as coating, exposure, and etching. Each pixel includes three sub-pixels of different colors. A pixel is the smallest display component of an array substrate. The normal operation of each sub-pixel ensures that the liquid crystal display can display pictures normally. [0003] The production process of the liquid crystal display, especially the production process o...

AI Technical Summary

Problems solved by technology

[0004] The inventors found that in the prior art, the position of the test structure is lower than the position of the metal substrate, therefore, the contact between the test structure and the metal substrate needs to be realized by climbing the test structure

However, the climbing part of the test structure is prone to breakage and other poor contact phenomena, which will cause misjudgment of the test results and require a lot of manpower and material resources to clean up, which not only increases the preparation cost of the array substrate but also reduces the preparation efficiency.

Images