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142results about How to "Reduce poor contact" patented technology

Organic electroluminescent device, manufacturing method thereof and display device

The invention discloses a manufacturing method of an organic electroluminescent device. The method includes the steps that an auxiliary electrode is formed on a resin layer of an organic electroluminescent substrate; a gas generation layer is formed on the auxiliary electrode; an organic electroluminescent layer is formed on the gas generation layer; an accepter substrate is arranged on the organic electroluminescent layer; an auxiliary electrode area is scanned through laser, so that the gas generation layer is decomposed under laser radiation and releases gas, and accordingly the organic electroluminescent layer of the auxiliary electrode area is transferred to the accepter substrate; the accepter substrate is removed; a cathode is formed on the auxiliary electrode. By means of the new top-emitting OLED device auxiliary electrode manufacturing technology, bad contact between the auxiliary electrode and the cathode can be effectively reduced, the pixel defect caused due to the fact that residues generated after an organic material or the cathode is sintered and melted through laser are transferred to a pixel area in following processes is avoided, quality of the electroluminescent device is improved, and the yield is improved.
Owner:BOE TECH GRP CO LTD

Light path coupling device and fluorescence temperature sensing optical system

The invention provides a light path coupling device and a fluorescence temperature sensing optical system. The light path coupling device comprises an optical fiber splice, a fluorescence exciting light source, a fluorescence detector and a filter. The fluorescence exciting light source and the fluorescence detector are arranged on the same surface of the same circuit board. The fluorescence detector and the filter are arranged oppositely. Coupling lenses are arranged on a light path of the filter and a light path of the optical fiber splice. The filter and the coupling lenses are located on the light paths between the fluorescence exciting light source and the optical fiber splice. The light path coupling device further comprises a box. An optical mirror groove is formed in the box. The filter is located in the optical mirror groove. A through hole is formed in the box. The optical fiber splice and the coupling lenses are located in the through hole. The system comprises a fluorescence optical fiber temperature detecting probe, a light source drive circuit, a fluorescence signal probing circuit, a signal demodulation processing circuit, a display device and the light path coupling device. The fluorescence temperature sensing optical system is convenient to install, and high in stability and measurement precision.
Owner:ZHUHAI OUSENSI TECH CO LTD

Three-dimensional ultrasonic imaging area array probe wiring method and three-dimensional ultrasonic imaging device

The invention discloses a three-dimensional ultrasonic imaging area array probe wiring method and a three-dimensional ultrasonic imaging device. The three-dimensional ultrasonic imaging area array probe wiring method and the three-dimensional ultrasonic imaging device aim to solve the problems that according to an existing three-dimensional ultrasonic imaging area array probe wiring method, the defective rate is high and wiring is not firm. According to the three-dimensional ultrasonic imaging area array probe wiring method and the three-dimensional ultrasonic imaging device, a wiring hole is firstly drilled in a wiring position of a three-dimensional ultrasonic imaging area array probe, then the conductive part of a signal line is inserted into the wiring hole, conductive adhesive is then poured into the wiring hole treated in last step, and finally wiring is achieved after the conductive adhesive is solidified. The three-dimensional ultrasonic imaging device is formed by connection of the three-dimensional ultrasonic imaging area array probe and a corresponding switching circuit and computer with the wiring method. The three-dimensional ultrasonic imaging area array probe wiring method and the three-dimensional ultrasonic imaging device have the advantages that the signal line can be connected firmly, the conduction performance is good, requirements of mechanical cutting accuracy can be met, and the defective rate is low during production. The three-dimensional ultrasonic imaging area array probe wiring method and the three-dimensional ultrasonic imaging device are applicable to micron-sized three-dimensional ultrasonic imaging area array probes.
Owner:HUAZHONG UNIV OF SCI & TECH

Non-contact cleaning device for surfaces of PCBs

The invention provides a non-contact cleaning device for surfaces of PCBs, and relates to the technical field of PCB testing and processing. The device comprises a No.1 assembly line rack and a No.2 assembly line rack arranged on the side edge of the No.1 assembly line rack in parallel, wherein the top end face of the No.1 assembly line rack is a horizontal plane, the middle of the top end of the No.1 assembly line rack is of a hollow structure, No.1 conveying belts are symmetrically arranged on the front side and the rear side of the top end of the No.1 assembly line rack, a supporting plate is placed at the top end of the No.1 assembly line rack, and a plurality of PCBs are arranged at the top end of the supporting plate at equal intervals in a matrix mode. According to the non-contact cleaning device for the surfaces of the PCBs, the PCBs can be effectively prevented from floating when a blowing device I and a blowing device II blow typhoon to the surfaces of the PCBs, and dust blown out by the blowing device I and the blowing device II enters an explosion-proof filtering system through an air suction pipeline. The explosion-proof filtering system filters the dust cleaned from the PCBs, so that the toxicity of the dust adsorbed on the surfaces of the PCBs is reduced. The non-contact cleaning of the PCBs is realized.
Owner:苏州凌创科技发展有限公司

Semiconductor device testing device

The invention discloses a semiconductor device testing device in the technical field of semiconductor devices. The testing device comprises a testing machine which is used for testing the performanceof a semiconductor device; a probe fixing unit which is used for fixing a probe of the testing machine and driving the probe to move in the vertical direction; a bearing unit which is located under the probe fixing unit, and used for bearing the semiconductor device and driving the semiconductor device to move in the horizontal direction; and a PLC which is electrically connected with the testingmachine, the probe fixing unit and the bearing unit and controls the testing machine, the probe fixing unit and the bearing unit to work. According to the semiconductor device testing device, the testing machine is controlled by the PLC to test the semiconductor devices passing through the lower parts of the probes one by one; automatic testing of multiple packaged semiconductor devices on a largescale is achieved, the assembling and disassembling time during testing of the semiconductor devices is saved, the testing efficiency of the semiconductor devices on a large scale is improved, the labor cost is reduced, and the company operation cost is reduced.
Owner:YANGZHOU HY TECH DEV

Measuring point switching device used for voltage withstanding test of low-voltage switch appliance

The invention relates to a measuring point switching device used for a voltage withstanding test of a low-voltage switch appliance. The measuring point switching device comprises a voltage withstanding tester, a connection contact, a first high-voltage relay, a second high-voltage relay, a PLC (programmable logic controller), a triggering switch and a clamp, electrode claws used for fixing an input end and an output end of a to-be-tested switch appliance are arranged on the clamp, a voltage output end of the voltage withstanding tester is connected with a first contact input end of the first high-voltage relay, a first contact output end of the first high-voltage relay is connected with the electrode claw fixing the input end of the to-be-tested switch appliance, a first contact input end of the second high-voltage relay is connected with the electrode claw fixing the output end of the to-be-tested switch appliance, an output end of the second high-voltage relay is connected with a testing end of the voltage withstanding tester, and one end of the triggering switch is connected with the PLC while the other end of the same is connected with a coil of the first high-voltage relay and a coil of the second high-voltage relay. Compared with the prior art, the measuring point switching device has the advantages of high switching speed, short switching time and the like.
Owner:SHANGHAI UNIV OF ENG SCI

Vibration reduction type industrial personal computer with dustproof function for software testing

The invention relates to a vibration reduction type industrial personal computer with a dustproof function for software testing. The industrial personal computer comprises a case, the industrial personal computer further comprises a buffer mechanism and a dustproof mechanism, the buffer mechanism comprises a mounting plate and at least two buffer components; each buffer component comprises a guiderail, a second spring, a lifting sleeve, a first permanent magnet, a second permanent magnet and an electric push rod; the dustproof mechanism comprises a dustproof cover, a second air bag, an air delivery pipe, two connecting assemblies, at least two threading pipes and at least two first air bags. Each connecting assembly comprises a sliding rod, a connecting sleeve and a first spring. In the vibration reduction type industrial personal computer with a dustproof function for software testing, under the buffering effect of the buffer mechanism, the probability of looseness of all parts in the industrial personal computer is reduced, the probability of failure of the industrial personal computer is reduced, the accumulated dust on interfaces of the industrial personal computer is reducedthrough the dustproof mechanism, the probability of poor contact of the industrial personal computer is reduced, and the reliability of the industrial personal computer is improved.
Owner:北京珞安科技有限责任公司

Shockproof dustproof electrical cabinet

The present invention relates to a shockproof dustproof electrical cabinet. The electrical cabinet comprises a cabinet body. The cabinet body is provided with a cabinet door. The lower part of the cabinet body is fixedly connected with a base. A damping apparatus is disposed below the base. The cabinet body is provided with an air inlet. The air inlet is connected with an air inlet tube. Along the direction in which air enters the cabinet body, the air inlet tube is sequentially provided with a dedusting filtering net and a drying agent. The cabinet body is further provided with a temperature sensor for detecting the temperature inside the cabinet body. The base is internally provided with a controller and an air outlet tube communicated with an air outlet at the bottom of the cabinet body. The air outlet of the air outlet tube is communicated with an air inlet of a fan. An air inlet of the fan is connected with an air exhaust tube and a recoiling tube. The recoiling tube is communicated with the air inlet tube. The communicated position of the recoiling tube and the air inlet tube is between the air inlet and the dedusting filtering net. The air exhaust tube is provided with a valve II. The recoiling tube is provided with a valve III. The temperature sensor and the fan are each electrically connected with the controller.
Owner:国网山东省电力公司惠民县供电公司

Multimeter with stable plugging and convenient use

The invention relates to a multimeter with stable plugging and convenient use. The multimeter comprises a main body, two meter pens, three plugging ports and three plugging connectors, and further comprises a switching mechanism and three reinforcing mechanisms, wherein the switching mechanism comprises a connecting block, a driving assembly, a sliding rod, a moving block, a cable, an elastic piece, a sliding groove, two sliding blocks, two first springs and two metal contacts; each reinforcing mechanism comprises a limiting rod, an air conveying pipe, an air storage box, a thin film, a push rod, an annular air bag and two supporting assemblies; each supporting assembly comprises a guide rail, a second spring and a sliding sleeve; and each driving assembly comprises a screw rod and a turntable. According to the multimeter with stable plugging and convenient use, direct switching of one meter pen between a voltage measurement interface and a current measurement interface is realized bymeans of the switching mechanism, so that an operator does not need to frequently plug and unplug the plugging connectors, the use convenience of the multimeter is improved, the plugging connectors can be reinforced by means of the reinforcing mechanisms, and the connection firmness of the plugging connectors and the plugging ports is improved.
Owner:广州市欧伊若科技有限公司

Binding structure of integrated circuit chip and display device

The embodiment of the invention provides a binding structure of an integrated circuit chip and a display device, and relates to the technical field of display. The problem can be solved that the contact of signal lines is poor and the display effect is influenced because rolling-up and other deformation occur easily when an existing integrated circuit chip is bound with a substrate panel. The binding structure comprises a substrate and circuit-unit convex blocks, wherein the substrate is provided with a functional area and a virtual area located around the functional area; the circuit-unit convex blocks are distributed on the functional area of the substrate and used for connecting signal lines and transmitting signals. In the process of heating the binding structure of the integrated circuit chip and the display panel or binding the binding structure of the integrated circuit chip and the display panel in a pressurized mode, the virtual area arranged around the functional area can serve as a bound buffering part, rolling-up deformation defects which easily occur at the edge of the binding structure of the integrated circuit chip is limited in the virtual area, and therefore the situation is avoided that the contact of the signal lines is poor because rolling-up deformation defects occur easily to the metal convex blocks of the functional area, and the reliability of the display device is improved.
Owner:BOE TECH GRP CO LTD +1

Formation clamp device for lithium ion polymer power battery

The invention discloses a formation clamp device for a lithium ion polymer power battery. The formation clamp device comprises a plurality of battery clamp components in contact with a lithium ion polymer power battery lug and a battery clamp stop piece fixing component for guiding the lithium ion polymer power battery lug, wherein the battery clamp component comprises a battery clamp body, a battery clamp left voltage pin, a battery clamp right current pin and a battery clamp fixing plate; one end of each of the battery clamp left voltage pin and the battery clamp right current pin is a mounting end, and the other end is turned over to one side to form a contact end face in contact with the battery lug; and the battery clamp stop piece fixing component comprises a battery clamp stop piecefixing plate for connecting with an external position adjusting device and at least two battery clamp stop pieces for guiding the battery lug. The formation clamp device provided by the invention hasthe following beneficial effects: the device is simple and convenient to replace; the battery clamp left voltage pin and the battery clamp right current pin can reduce the contact resistance by adopting a multi-piece structure, and the contact is good; and the battery lug is guided to facilitate automatic production.
Owner:ZHEJIANG HANGKE TECH

Electronic cigarette control method and electronic cigarette

The invention discloses an electronic cigarette control method and an electronic cigarette, and the electronic cigarette control method comprises the steps: providing a cigarette rod and a cigarette cartridge, setting a first voltage and a second voltage in a first control chip of the cigarette rod in advance, wherein the first voltage is smaller than the second voltage, loading the cigarette cartridge into the cigarette rod, starting the cigarette rod, by the cigarette rod, outputting a first voltage, by the first control chip, controlling the sensor to detect the smoking state of the cigarette cartridge, if the cigarette cartridge is smoked, by the first control chip, controlling the cigarette rod to output a second voltage, by a second control chip in the cigarette cartridge, continuously detecting the voltage of the cigarette rod, when it is detected that the voltage of the cigarette rod is the first voltage, disconnecting the second control chip with a power control device, so that the cigarette cartridge is in a standby state, when it is detected that the voltage of the cigarette rod is the second voltage, by the second control chip, electrically connecting with the power control device, and by the power control device, controlling the heating body to heat tobacco tar in the cigarette cartridge, so that the cigarette cartridge is in a heating state. The electronic cigarette control method is simple to operate.
Owner:SHENZHEN OKK ELECTRONIC TECH CO LTD
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