A
system and method are disclosed for measuring
signal crosstalk in an
electronic circuit device or
Integrated Circuit (IC) device, correlating the results with modeled information, and accurately identifying one or more levels of
coupling noise in the device. For example, a
system is disclosed that provides data on levels of
crosstalk between conductive lines in a device. The
system uses programmable victim and aggressor lines, programmable drive capability, and programmable loading through one or more known
crosstalk structures to compare an output
signal with a reference
signal and accurately identify one or more levels of
coupling noise in the device. An
external reference signal can be used to detect upsets or crosstalk in the device. As such, using such programmability features of the system, numerous combinations of
coupling in a device can be measured at a time. For example, one or more lines in the device can be programmed to represent victim lines, while other lines in the device can be programmed to represent aggressor lines. An output signal of the system can be compared to a known signal. For example, a DC offset
voltage can be used to determine an exact level of upset or crosstalk that exists in the device. Alternatively, an AC clocking signal can be used to measure timing push-out or edge degradation in the device.