Three-dimensional model generation apparatus, three-dimensional model generation method, and program

A technology for 3D model and generation device, which is applied in 3D object recognition, 3D modeling, character and pattern recognition, etc., and can solve problems such as inability to generate 3D models.

Active Publication Date: 2015-04-29
HITACHI LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, in the technique described in Patent Document 1, a three-dimensional model cannot be generated from the measured data

Method used

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  • Three-dimensional model generation apparatus, three-dimensional model generation method, and program
  • Three-dimensional model generation apparatus, three-dimensional model generation method, and program
  • Three-dimensional model generation apparatus, three-dimensional model generation method, and program

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Embodiment Construction

[0037] Hereinafter, an embodiment of the present invention will be described in detail with reference to the drawings. In addition, in the following, the same code|symbol is attached|subjected to the part which has the same structure, and description is abbreviate|omitted.

[0038] figure 1 It is an example of a structural diagram of the three-dimensional model generation apparatus 100 of this embodiment. The three-dimensional model generation device 100 has a control unit 110, a storage unit 120, an input unit 130, an output unit 140, a communication unit 150, and the like.

[0039] The storage unit 120 has a three-dimensional model storage unit 121 , a three-dimensional measurement value storage unit 122 , a rule storage unit 123 , and the like. A three-dimensional model of a structure and the like are stored in the three-dimensional model storage unit 121 .

[0040] Here, an example of data stored in the three-dimensional model storage unit 121 will be described.

[004...

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Abstract

Provided is a technology capable of generating a three-dimensional model from measured data. A three-dimensional model generation apparatus includes: a storage unit which stores a three-dimensional model of a structure and a three-dimensional measurement value of the structure; a segment generation unit which generates a plurality of segments by dividing the three-dimensional model; a connection relationship specification unit which specifies a connection relationship of the generated plurality of segments; a shape characteristic specification unit which specifies, based on a part of the plurality of segments and other segments of the plurality of segments specified by the connection relationship and connected to the part of the plurality of segments, a shape characteristic of the three-dimensional model formed from the plurality of segments; a shape information specification unit which specifies shape information defining the specified shape characteristic; an orientation specification unit which specifies an orientation of the structure based on a distance between a structure matching the specified shape characteristic and the specified shape information, and the three-dimensional measurement value; and a model generation unit which generates a three-dimensional model based on the specified shape characteristic, the specified shape information, and the specified orientation.

Description

technical field [0001] The invention relates to a three-dimensional model generation technology. Background technique [0002] Patent Document 1 describes a method for recognizing a three-dimensional object in which, with respect to a feature quantity representing a local surface shape of an object, real data measured by a sensor capable of measuring a distance is compared with model data representing a three-dimensional shape of a target object. In this way, the three-dimensional position and posture of the object are detected, and when the model is configured as a candidate position and posture, it is calculated whether there is real data in the range that is blocked by the model and cannot be measured originally, and verified according to whether it is geometrically contradictory Whether to be a candidate for the position and pose of the model. [0003] The technique described in Patent Document 1 can detect a posture based on real data measured by a sensor capable of me...

Claims

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Application Information

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Patent Type & AuthorityApplications(China)
IPC IPC(8): G06T17/00
CPCG06T17/10G06T19/20G06T2219/2008G06T7/75G06T7/149G06T7/162G06V20/653
Inventor胜村义辉中野隆宏野中洋一加博尔·埃尔德什约瑟夫·万曹蒙诺什托里·拉西奥
OwnerHITACHI LTD