SoC chip test method, device and system and SoC chip test verification board

A technology of chip testing and verification board, which is applied in the direction of measuring devices, electronic circuit testing, measuring electricity, etc., can solve the problem of high cost of SoC chips, and achieve the effect of reducing costs, reducing manpower and time, and reducing costs and time

Active Publication Date: 2018-09-25
CHINA ELECTRONICS PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST
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Problems solved by technology

[0004] Based on this, it is necessary to provide a SoC chip test method, device, system and SoC chip test verification board that can solve the problem of high cost of the SoC chip in the test method for the above technical problems.

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  • SoC chip test method, device and system and SoC chip test verification board
  • SoC chip test method, device and system and SoC chip test verification board

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Embodiment Construction

[0050]In order to make the purpose, technical solution and advantages of the present application clearer, the present application will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present application, and are not intended to limit the present application.

[0051] The SoC chip test method that this application provides can be applied to such as figure 1 In the application environment shown, figure 1 It is an application environment diagram of the SoC chip testing method in one embodiment. Wherein, the SoC chip 10 to be tested is respectively connected with the development board 20, the host computer 30, the signal generator 40, the oscilloscope 50 and the DC power supply 60, the development board 20 can input signals to the SoC chip 10 to be tested, and the host computer 30 can pass through the serial Line and network port c...

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Abstract

The invention relates to a SoC chip test method, device and system and a SoC chip test verification board. The method comprises the steps that the chip architecture type of a SoC chip to be tested isacquired; a chip test program is generated according to the chip architecture type, a test program framework and a chip interface driving function database, wherein the test program framework is usedto complete test items of various chip architecture types, and the chip interface driving function database comprises interface driving functions for completing various test item; and the SoC chip tobe tested is tested according to the test program. The method can generate the test program suitable for the SoC chip to be tested according to the chip architecture type of the chip to be tested, thetest program framework and the chip interface driving function database, so as to test the SoC chip to be tested. The method can be commonly used for testing to-be-tested chips of various different chip architecture types, which avoids separate test program development for various SoC chips. Labor and time, which are consumed by separate test program development, can be reduced, and the SoC chiptest cost is reduced.

Description

technical field [0001] The present application relates to the technical field of chip testing, in particular to a SoC chip testing method, a SoC chip testing device, a SoC chip testing system and a SoC chip testing verification board. Background technique [0002] SoC (System-on-a-Chip) chip is an integrated circuit chip, which can effectively reduce the development cost of electronic or information system products, shorten the development cycle, and improve the competitiveness of products. The main product development method. [0003] The SoC chip needs to be tested during the production process of the SoC chip. In the traditional SoC chip testing method, a specific type of SoC chip is tested, and a corresponding test program is independently developed according to the architecture of the type of SoC chip, and the chip test verification is realized by loading the test program on the type of SoC chip. Under this test method, it is necessary to write a test program suitable...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28
CPCG01R31/2853G01R31/2884
Inventor 王小强王之哲罗军唐锐刘鹏
Owner CHINA ELECTRONICS PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST
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