A method and system for predicting measurement errors of capacitive voltage transformers
A technology of voltage transformer and measurement error, which is applied in the field of prediction method and system of measurement error of capacitive voltage transformer, and can solve the problem of low accuracy rate and so on.
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Embodiment 2
[0056] refer to Figure 4 , the second aspect of the present invention provides a prediction system 1 for measurement errors of capacitive voltage transformers, including: an acquisition module 11 for acquiring a plurality of error data of the transformer to be tested; a stripping module 12 for Each of the error data is stripped into self-error and additional error, and a plurality of self-errors are processed as a time series; the prediction module 13 is used to input the time series into the trained LSTM model to obtain the tested The self-error prediction value of the transformer; the fusion module 14 is used to calculate the additional error prediction value of the transformer to be tested according to the temperature information and frequency information; the error prediction value and the additional error prediction value of the transformer to be tested are fused to obtain the mutual inductance to be measured final predictor value.
[0057] In some embodiments of the pr...
Embodiment 3
[0059] refer to Figure 5 , the third aspect of the present invention provides an electronic device, including: one or more processors; storage means for storing one or more programs, when the one or more programs are used by the one or more executed by one or more processors, such that the one or more processors implement the method of the first aspect of the present invention.
[0060] The electronic device 500 may include a processing device (such as a central processing unit, a graphics processing unit, etc.) 501, which may be loaded into a random access memory (RAM) 503 according to a program stored in a read-only memory (ROM) 502 or loaded from a storage device 508 Various appropriate actions and processing are performed by the program. In the RAM 503, various programs and data necessary for the operation of the electronic device 500 are also stored. The processing device 501 , ROM 502 and RAM 503 are connected to each other through a bus 504 . An input / output (I / O) i...
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