Trimming circuit and integrated circuit

A technology of trimming and tuning circuits, applied in the direction of adjusting electrical variables, testing electronic circuits, measuring electricity, etc., can solve the problem of lowering the yield rate of finished products in integrated circuits, reduce the number of pins, shorten the product development cycle, and improve the quality of finished products. The effect of yield

Pending Publication Date: 2021-12-14
深圳市迪浦电子有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The embodiment of the present application provides a trimming circuit and an integrated circuit, which solves the problem that the trimming method of the existing integrated circuit will reduce the yield rate of the finished product

Method used

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  • Trimming circuit and integrated circuit
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  • Trimming circuit and integrated circuit

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Experimental program
Comparison scheme
Effect test

Embodiment 1

[0035] refer to Figure 1-Figure 2 , the trimming circuit provided by the embodiment of the present application includes a bandgap reference module 10, the bandgap reference module 10 is used to generate an internal reference voltage; a comparator module 20, the positive input of the comparator module 20 is connected to the output of the bandgap reference module 10 Terminal, the negative input terminal of comparator module 20 inputs external standard voltage; Logic judgment module 30, logic judgment module 30 access test signal, and the output terminal of comparator module 20 connects logic judgment module 30; Logic judgment module 30 is used for according to The output result of the comparator module 20 judges whether the internal reference voltage of the current output of the bandgap reference module 10 is the target reference voltage, and outputs a logic control signal according to the judgment result; the trimming and programming module 40, the trimming and programming modu...

Embodiment 2

[0048] refer to Figure 5 , the logic judgment module 30 includes several shift registers 31 connected in series and an oscillator 32, the oscillator 32 is connected to the shift register 31; the test signal is connected to the oscillator 32, and the oscillator 32 is used to generate a clock signal CLK.

[0049] In the second embodiment, the oscillator 32 is set inside the logic judgment module 30, and the clock signal can be generated by the oscillator 32 itself, but an external test signal is required to trigger the oscillator 32. This test signal can be a voltage signal, here The test signal can be accessed from the multiplexed pins of the product, which greatly reduces the number of pins that need to be set, making the trimming circuit of the second embodiment more suitable for product applications with fewer pins.

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Abstract

The invention provides a trimming circuit and an integrated circuit, and the trimming circuit comprises a band-gap reference module which is used for generating an internal reference voltage; a comparator module of which the positive input end is connected with the output end of the band-gap reference module, andthe negative input end inputs anexternal standard voltage; a logical judgment module which is connected with a test signal, is connected with the output end of the comparator module, and is used for judging whether the internal reference voltage currently output by the band-gap reference module is the target reference voltage or not according to the output result of the comparator module, and outputting a logic control signal according to the judgment result; and a trimming burning module which is respectively connected with the output end of the logic judgment module and the band-gap reference module, and is used for generating a trimming signal according to the logic control signal so as to control the band-gap reference module to automatically adjust the currently output internal reference voltage. According to the present invention, the problem that the trimming mode of an existing integrated circuit can reduce the yield of finished products is solved.

Description

technical field [0001] The present application relates to the technical field of integrated circuits, in particular to a trimming circuit and an integrated circuit. Background technique [0002] In the production of integrated circuits, there is usually a problem of inter-chip deviation. In order to ensure the product yield, it is necessary to test and adjust the chip. At present, in the finished product test, two ports are usually required, one port is filled with a clock signal, and the other port is filled with a trimming signal. The trimming signal is calculated by comparing the test value with the actual demand value by testing the finished product parameters of the chip. Output the trimming logic value, then pour the trimming signal into the chip, and trim the chip through the internal trimming circuit. This test and trimming method can only be carried out when the product has not been packaged, which not only takes up the resources of the mid-test , and packaging aft...

Claims

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Application Information

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Patent Type & AuthorityApplications(China)
IPC IPC(8): G05F1/56G01R31/28
CPCG05F1/561G01R31/2851
Inventor李国勋刘圭黄英杰
Owner深圳市迪浦电子有限公司