Switch test load cabinet

A technology of switch testing and load cabinet, which is applied in the direction of circuit breaker testing, measuring devices, measuring device casings, etc. It can solve the problems of high cost of switch testing, inability to simulate ambient temperature and humidity, and inability to test the impact of switch performance. The effect of accurate data and saving test cost

Pending Publication Date: 2022-04-01
惠州市尚均电子有限公司
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  • Abstract
  • Description
  • Claims
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AI Technical Summary

Problems solved by technology

[0003] Existing switch test load cabinets can only test the same type of switches, and different switch test load cabinets are required for testing different types of switches, which leads to high testing costs for switches
Moreover, most of the existing switch test load cabinets cannot simulate the temperature and humidity of the environment, and thus cannot test the influence of ambient temperature and humidity on the performance of the switch. The measured reliability data of the switch is not accurate enough, and there are test errors

Method used

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  • Switch test load cabinet
  • Switch test load cabinet
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Embodiment Construction

[0020] It should be noted that, in the case of no conflict, the embodiments of the present invention and the features in the embodiments can be combined with each other. The technical solutions of the present invention will be further described below in conjunction with the accompanying drawings of the embodiments of the present invention, and the present invention is not limited to the following specific embodiments.

[0021] It should be understood that the same or similar symbols in the drawings of the embodiments correspond to the same or similar components. In describing the present invention, it is to be understood that if the terms "upper", "lower", "front", "rear", "left", "right", "top", "bottom" etc. indicate an orientation Or the positional relationship is based on the orientation or positional relationship shown in the drawings, which is only for the convenience of describing the present invention and simplifying the description, and does not indicate or imply that...

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Abstract

The invention relates to a switch test load cabinet which comprises a cabinet body, a power box, a load box, a switch test mechanism, a temperature control mechanism and a humidity control mechanism. A test cavity is formed in the cabinet body, and the switch test mechanism is arranged in the test cavity; the power box is electrically connected with the switch testing mechanism, the temperature control mechanism and the humidity control mechanism. The load box comprises a current load box and a voltage load box, the current load box and the voltage load box are electrically connected with the switch test mechanism respectively, and the current load box and the voltage load box are electrically connected with the power box respectively; the switch testing mechanism comprises a key switch testing assembly, a ship-shaped switch testing assembly, a toggle switch testing assembly and a touch switch testing assembly; the temperature control mechanism and the humidity control mechanism are arranged on the outer side of the test cavity. Through the switch test load cabinet provided by the invention, various different types of switches can be tested, and the temperature and humidity of the test environment can be regulated and controlled, so that test data is more accurate.

Description

technical field [0001] The invention relates to the technical field of switch testing, in particular to a switch testing load cabinet. Background technique [0002] At present, in order to improve the performance of various electrical products, various functional switches are installed on different electrical products. The reliability of these functional switches will directly affect the reliability of electrical appliances. sex test. [0003] Existing switch test load cabinets can only test switches of the same type, and different switch test load cabinets need to be used for testing different types of switches, which leads to high testing costs for switches. Moreover, most of the existing switch test load cabinets cannot simulate the temperature and humidity of the environment, and thus cannot test the influence of the environment temperature and humidity on the performance of the switch. The measured reliability data of the switch is not accurate enough, and there are te...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/327G01R1/04G01D21/02
Inventor 谢华康陈佛全骆敏张永艳陈欣慧
Owner 惠州市尚均电子有限公司
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