Chip automatic testing system and chip testing method

Abstract

The present invention relates to the field of chip production technology, and specifically discloses a chip automatic testing system and a chip testing method, wherein the chip automatic testing system comprises a feeding unit, a transmission unit, at least one testing unit and a loading unit; the feeding unit is used to store a first container, and can transfer the chips contained in the first container to the transmission unit, the transmission unit transmits the chips to the testing unit, and the testing unit performs a testing operation on the chips; the loading unit loads the chips that have completed the testing operation into a second container. The above-mentioned setting realizes the fully automated production of chips, and by setting up multiple testing units, it is possible to realize the production of a single testing unit or the simultaneous production of multiple testing units, which greatly improves the production efficiency and meets the production requirements of printing consumable chips.

Description

Technical Field

[0001] The present invention relates to the technical field of chip production and processing, and in particular to a chip automatic testing system and a chip testing method. Background Art

[0002] Most current printers use detachable printing consumables, which are provided with printing consumable chips. Common printing consumable chips include ink cartridge chips, toner cartridge chips, and toner cartridge chips. When the printing consumables are loaded into the printer, the printing consumable chips are used to communicate with the printer to complete the assembly of the printing consumables and the printer.

[0003] Due to the large demand for printing consumables chips, large-scale production is required. The current production equipment has a low degree of automation and low production efficiency. Summary of the invention

[0004] The purpose of the present invention is to provide a chip automatic testing system and a chip testing method to improve the problems of low automation level and low production efficiency in the prior art of printing consumable chip production.

[0005] To achieve the above object, the present invention adopts the following technical solutions:

[0006] In one aspect, the present invention provides a chip automatic testing system, the chip automatic testing system comprising a support and a feeding unit, a transmission unit, at least one testing unit and a loading unit arranged on the support;

[0007] The feeding unit is used to store the first container and can transfer the chips contained in the first container to the transmission unit; the transmission unit transmits the chips to the testing unit, and the testing unit performs a test operation on the chips; the loading unit loads the chips that have completed the test operation into the second container.

[0008] As a preferred solution of a chip automatic testing system, the feeding unit includes a storage device, a transporter and a feeder; the storage device is used to store a first container, the transporter is used to take out the first container from the storage device and transfer it to a feeding position, and the feeder transfers the chip contained in the first container at the feeding position to the transmission unit.

[0009] As a preferred solution for a chip automatic testing system, the storage device includes a first storage rack and a second storage rack relatively arranged on the bracket, and the opposite surfaces of the first storage rack and the second storage rack are respectively provided with a first storage slot and a second storage slot extending along a first direction, and the bottom ends of the first storage rack and the second storage rack are both provided with a discharge port, and the two ends of the first container are respectively located in the first storage slot and the second storage slot, and can slide out from the discharge port along a second direction, and the second direction is perpendicular to the first direction.

[0010] As a preferred solution of a chip automatic testing system, the transporter includes a movable plate, the movable plate is provided with a first placement portion, the movable plate is slidably arranged on the bracket along the second direction, and the movable plate has a material picking position close to the storage and a feeding position close to the feeder; the storage also includes a discharge piece, the discharge piece is slidably arranged on the bracket along the first direction, and the discharge piece has a supporting position for supporting the first container above the discharge port and a discharge position for dropping the first container to the discharge port; when the discharge piece is located at the supporting position, the movable plate can move to the material picking position, and when the discharge piece is located at the discharge position, the first container is located at the first placement portion and is transferred to the feeding position by the movable plate.

[0011] As a preferred solution of a chip automatic testing system, the feeding unit also includes a collection area arranged on the bracket, the movable plate also includes a second placement portion, and the movable plate also has a discarding position close to the collection area. When the movable plate is located at the material picking position, the first container at the feeding position can be placed on the second placement portion, and when the movable plate moves to the discarding position, the first container can be placed in the collection area.

[0012] As a preferred solution of a chip automatic testing system, the feeder comprises:

[0013] A feeding frame, a support plate rotatably arranged on the bracket, having a receiving position for receiving the first container and a discharging position for tilting the first container, and the feeding frame is provided with a bearing portion;

[0014] The pressing block is slidably arranged on the feeding frame, and has a pressing position close to the bearing part to press the first container against the bearing part, and a releasing position away from the bearing part to release the first container.

[0015] As a preferred solution of the chip automatic testing system, the support includes a support plate, and the transmission unit includes a main channel component and a branch channel component located downstream of the main channel component;

[0016] The main channel assembly is arranged on the support plate, and the main channel assembly can accommodate multiple chips at the same time, and can release the chips one by one to the branch channel assembly; the branch channel assembly is used to selectively distribute the chips to the multiple test units.

[0017] As a preferred solution of a chip automatic testing system, a plurality of the testing units are arranged on the support plate at intervals along a second direction, and the dividing channel assembly can move along the second direction on the support plate; the dividing channel assembly can selectively distribute the chips to the plurality of the testing units.

[0018] As a preferred solution of a chip automatic test system, the test unit includes a write-read carrier plate, a write-read cover plate, a write-read code assembly and a first write-read stopper; the write-read carrier plate is arranged on the support plate of the bracket, the write-read cover plate is covered on the write-read carrier plate, a test channel is formed between the write-read carrier plate and the write-read cover plate, the first write-read stopper is used to block the chip to be written and read, and the write-read code assembly is used to write, read and verify data on the chip in the test channel; and / or

[0019] The test unit further comprises a performance detection component, and the performance detection component is used to perform performance detection on the chip in the test channel; and / or

[0020] The test unit further includes a marking component, and the marking component is used to mark the chip in the test channel; and / or

[0021] The test unit also includes a performance data rewriting component, and the data rewriting component is used to rewrite data of the chip that needs to be upgraded.

[0022] As a preferred solution of a chip automatic testing system, the loading unit includes a loading component and a fixing frame equipped with a plurality of second containers, the loading component and the fixing frame are both arranged on the support plate, and a plurality of second containers are arranged in parallel on the fixing frame, the code writing and reading component and / or the performance detection component and / or the marking component and / or the data rewriting component are respectively communicatively connected and / or electrically connected to the loading component, and the loading component can place the chips into different second containers according to the detection results of the performance detection component, and / or the verification results of the code writing and reading component, and / or the operation results of the marking component, and / or the test results of the data rewriting component.

[0023] On the other hand, the present invention provides a chip testing method, applicable to any of the above chip automatic testing systems, comprising the following steps:

[0024] S01, the feeding unit transfers the first container to the feeding position and sends the chip to the transmission unit;

[0025] S02, the chip is transferred to one or more test units by the transmission unit, and the test units perform performance testing and / or data writing and / or data verification and / or data rewriting and / or marking operations on the chip; and each test channel of the test unit can store at least one chip;

[0026] S03, testing the chips, and the loading unit loads the chips that have passed the test or failed the test into different second containers.

[0027] As a preferred solution of a chip testing method, the testing unit includes a code writing and reading component, and the code writing and reading component can write, read, and verify the chip; and / or

[0028] The test unit includes a performance detection component, and the performance detection component can perform performance detection on the chip; and / or

[0029] The testing unit includes a marking component, and the marking component can perform a marking operation on the chip; and / or

[0030] The test unit includes a data rewriting component, which can rewrite data on the chip that needs to be upgraded;

[0031] The loading unit includes a loading component, and the code writing and reading component and / or the performance detection component and / or the marking component and / or the data rewriting component are respectively communicatively connected and / or electrically connected to the loading component, and the loading component can place the chips into different second containers according to the detection results of the performance detection component, and / or the verification results of the code writing and reading component, and / or the operation results of the marking component, and / or the test results of the data rewriting component.

[0032] The beneficial effects of the present invention are:

[0033] The present invention provides a chip automatic testing system and a chip testing method, the chip automatic testing system comprises a bracket and a feeding unit, a transmission unit, at least one test unit and a loading unit arranged on the bracket; the transmission unit transfers the chip to the test unit, the test unit writes and reads codes on the chip; the loading unit loads the chip after the code writing and reading into a second container. The above arrangement realizes the fully automated production of the chip, and by setting up multiple test units, it is possible to realize the production of a single test unit or the simultaneous production of multiple test units, which greatly improves the production efficiency and meets the production demand of printing consumable chips. BRIEF DESCRIPTION OF THE DRAWINGS

[0034] Figure 1 A schematic diagram of the three-dimensional structure of a chip automatic testing system according to an embodiment of the present invention;

[0035] Figure 2 Schematic diagram of the three-dimensional structure of the feeding unit in an embodiment of the present invention;

[0036] Figure 3 It is a schematic diagram of the three-dimensional structure of a storage device in an embodiment of the present invention;

[0037] Figure 4 It is a schematic diagram of a partial structure of a transporter in an embodiment of the present invention;

[0038] Figure 5 The schematic diagram of the local structure of the feeder in the embodiment of the present invention is as follows Figure 1 ;

[0039] Figure 6 The schematic diagram of the local structure of the feeder in the embodiment of the present invention is as follows Figure 2 ;

[0040] Figure 7 Schematic diagram of the three-dimensional structure of the main material channel assembly in an embodiment of the present invention;

[0041] Figure 8 The local structure of the distribution channel assembly in the embodiment of the present invention is shown in FIG. Figure 1 ;

[0042] Fig. 9 The local structure of the distribution channel assembly in the embodiment of the present invention is shown in FIG. Figure 2 ;

[0043] Fig.10 It is a schematic diagram of the partial structure of the test unit at a first angle in an embodiment of the present invention;

[0044] Fig.11 is a schematic diagram of a partial structure of a test unit at a second angle in an embodiment of the present invention;

[0045] Fig.12 is a schematic diagram of a partial structure of a test unit at a third angle in an embodiment of the present invention;

[0046] Fig.13 It is a schematic diagram of the three-dimensional structure of the charging unit in an embodiment of the present invention;

[0047] Fig.14 A schematic diagram of control logic in an embodiment of the present invention;

[0048] Fig.15 Schematic diagram of the working process in the embodiment of the present invention.

[0049] In the figure:

[0050] 100, first container; 200, second container; 300, chip;

[0051] 400, bracket; 401, support plate;

[0052] 500. display unit;

[0053] 5. Auxiliary material distribution components;

[0054] 6. Feeding unit; 61. Storage device; 611. First storage rack; 6111. First storage tank; 6112. Discharging port; 612. Second storage rack; 6121. Second storage tank; 613. Ballast block; 614. Ballast stopper; 615. Discharging member; 62. Transporter; 621. Moving plate; 6211. First placement portion; 6212. Second placement portion; 622. Roller; 623. First push block; 624. Fixed drive member; 625. Push drive member; 626. Second push block; 627. Empty container lifting member; 63. Feeder; 631. Feeding rack; 6311. Bearing portion; 632. Rotating drive member; 633. Pressing block; 634. Pressing drive member; 635. Pushing drive member; 636. Pushing member; 64. Collection area;

[0055] 7. Transmission unit; 71. Main material channel assembly; 711. Main bearing plate; 712. Main cover plate; 713. First main crimping member; 714. Second main crimping member; 715. Main stopper; 716. First main detection member; 717. Second main detection member; 718. Third main detection member; 72. Material distribution channel assembly; 721. Sub-bearing plate; 722. Sub-cover plate; 723. Sub-stopper; 724. Material distribution transmission belt; 725. Material distribution transmission drive member; 726. Material distribution driving wheel; 727. Material distribution driven wheel;

[0056] 8. Test unit; 81. Write-read carrier plate; 82. Write-read cover plate; 83. Write-read code assembly; 84. First write-read stopper; 85. Second write-read stopper; 86. Third write-read stopper; 87. Write-read crimping member; 88. First write-read detection member; 89. Second write-read detection member;

[0057] 9. Loading unit; 91. Loading assembly; 911. Loading carrier plate; 912. Loading cover plate; 913. Loading stopper; 92. Fixed frame; 921. Container placement bottom plate; 922. Container placement cover plate; 923. Shrapnel; 93. Loading power assembly. DETAILED DESCRIPTION

[0058] The technical solution of the present invention will be described clearly and completely below in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0059] In the description of the present invention, it should be noted that the orientations or positional relationships indicated by the terms "center", "up", "down", "left", "right", "vertical", "horizontal", "inside", "outside", etc. are based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as limiting the present invention. In addition, the terms "first" and "second" are only used for descriptive purposes and cannot be understood as indicating or implying relative importance. Among them, the terms "first position" and "second position" are two different positions, and the first feature "above", "above" and "above" the second feature include the first feature being directly above and obliquely above the second feature, or simply indicates that the first feature is higher in level than the second feature. The first feature "below", "below" and "below" the second feature include the first feature being directly below and obliquely below the second feature, or simply indicates that the first feature is lower in level than the second feature.

[0060] In the description of the present invention, it should be noted that, unless otherwise clearly specified and limited, the terms "installed", "connected", and "connected" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be indirectly connected through an intermediate medium, or it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0061] Embodiments of the present invention are described in detail below, examples of which are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present invention, and cannot be understood as limiting the present invention.

[0062] Embodiment 1

[0063] like Figure 1-10As shown, this embodiment provides a chip automatic test system, which includes a bracket 400 and a feeding unit 6, a transmission unit 7, at least one test unit 8 and a loading unit 9 arranged on the bracket 400. Among them, the feeding unit 6 includes a storage 61, a transporter 62 and a feeder 63; the storage 61 is used to store the first container 100, the transporter 62 is used to take out the first container 100 in the storage 61 and transfer it to the feeding position, the feeder 63 transfers the chip 300 contained in the first container 100 located at the feeding position to the transmission unit 7, the transmission unit 7 transfers the chip 300 to the test unit 8, and the test unit 8 performs a test operation on the chip 300, wherein the test operation includes writing and reading codes, and / or performance testing, and / or data rewriting, and / or marking operations. The loading unit 9 loads the chip 300 that has completed the test operation into the second container 200. In this embodiment, for the convenience of explanation, the first container 100 can be a tubular structure, but in other embodiments, it can also be other structures, and is not limited to this.

[0064] In this embodiment, the above-mentioned setting realizes the fully automated production of chip 300, and by setting up multiple test units 8, it is possible to realize the production of a single test unit 8 or the simultaneous production of multiple test units 8, which greatly improves the production efficiency and meets the production requirements of chip 300 in printing consumables.

[0065] Combination Figure 2-3 As shown, in this embodiment, regarding the setting of the storage device 61, optionally, the storage device 61 includes two first storage racks 611 and second storage racks 612 that are relatively arranged on the bracket 400, and the opposite surfaces of the first storage rack 611 and the second storage rack 612 are respectively provided with a first storage slot 6111 and a second storage slot 6121 extending in the first direction, and the bottom ends of the first storage rack 611 and the second storage rack 612 are both provided with a discharge port 6112, and the two ends of the first container 100 are respectively located in the first storage slot 6111 and the second storage slot 6121, and can slide out from the discharge port 6112 along the second direction, and the second direction is perpendicular to the first direction. In this embodiment, the first direction is the vertical direction, and the second direction is the horizontal direction. This setting can realize the stacking and storage of multiple first containers 100, and multiple first containers 100 can fall one by one, thereby improving the degree of automation.

[0066] Preferably, the first storage rack 611 and the second storage rack 612 each include a storage vertical plate and two storage enclosures spaced apart from the storage vertical plate, a first storage slot 6111 is formed between the two storage enclosures of the first storage rack 611, and a second storage slot 6121 is formed between the two storage enclosures of the second storage rack 612.

[0067] Furthermore, the storage container 61 further includes a ballast block 613 ; both ends of the ballast block 613 are slidably disposed in the first storage groove 6111 and the second storage groove 6121 , so as to drive the first container 100 to move downward.

[0068] In addition, a certain gravity needs to be provided for the ballast block 613. Therefore, the size of the ballast block 613 in the first direction is larger than the size of the discharge port 6112 in the first direction. Therefore, when the ballast block 613 is mistakenly taken out as the first container 100, it will be stuck at the discharge port 6112, causing damage to the equipment.

[0069] To this end, in this embodiment, further, the storage 61 also includes a ballast stopper 614, one end of which is connected to the ballast block 613, and the other end can abut against the bracket 400. When the ballast stopper 614 abuts against the bracket 400, the ballast block 613 is located above the discharge port 6112. At this time, there is only one first container 100 below the ballast block 613, and the first container 100 can slide out of the discharge port 6112. This arrangement allows the ballast block 613 to be located above the discharge port 6112 when there is no first container 100 below the ballast block 613, thereby preventing the ballast block 613 from entering the discharge port 6112 area and being mistakenly taken out as the first container 100.

[0070] In other implementations of this embodiment, a mounting plate is provided at the bottom of the storage vertical plate, and the storage vertical plate is fixedly connected to the bracket 400 through the mounting plate, and the other end of the ballast stopper 614 can abut against the upper surface of the mounting plate. When the ballast stopper 614 abuts against the upper surface of the mounting plate, the ballast block 613 is located above the discharge port 6112.

[0071] In this embodiment, optionally, the conveyor 62 includes a movable plate 621, the movable plate 621 is provided with a first placement portion 6211, the movable plate 621 is slidably arranged on the bracket 400 along the second direction, and the movable plate 621 has a material picking position close to the storage 61 and a feeding position close to the feeder 63; the storage 61 also includes a discharge piece 615, the discharge piece 615 is slidably arranged on the bracket 400 along the first direction, and the discharge piece 615 has a supporting position for supporting the first container 100 above the discharge port 6112 and a discharging position for dropping the first container 100 to the discharge port 6112; when the discharge piece 615 is located at the supporting position, the movable plate 621 can move to the material picking position, and when the discharge piece 615 is located at the discharging position, the first container 100 is located at the first placement portion 6211 and is transferred to the feeding position by the movable plate 621. With the aid of the above structure, the first container 100 in the storage 61 can be taken out and transferred to the feeding position through the cooperation of the horizontal movement of the moving plate 621 and the up and down movement of the discharge member 615.

[0072] Specifically, the first placement portion 6211 includes a first placement groove provided on the moving plate 621. The transporter 62 also includes a transporter driver, which is provided on the bracket 400, and the moving plate 621 is connected to the output end of the transporter driver. Specifically, the transporter driver includes a drive motor, which is provided on the bracket 400, a lead screw is rotatably provided on the bracket 400, a nut is rotatably connected to the lead screw and fixed to the moving plate 621, and the moving plate 621 is slidably provided on the bracket 400 through a slide rail slider assembly.

[0073] Combination Figure 2 As shown, in order to avoid the first container 100 from being offset due to vibration during transportation and being unable to be sent to the feeding position, in this embodiment, the transporter 62 also includes a fixing assembly, which is used to fix the first container 100 located at the first placement portion 6211 of the moving plate 621. Specifically, the fixing assembly includes a first push block 623 and a fixed driving member 624, the fixed driving member 624 is arranged on the moving plate 621, the first push block 623 is slidably arranged on the moving plate 621 along the second direction, and is connected to the output end of the fixed driving member 624, and the first push block 623 has a clamping position close to the first container 100 and abuts against the side wall of the first placement groove for clamping, and a release position away from the first container 100 to release the first container 100. In other embodiments of this embodiment, the first push block 623 can be directly installed at the output end of the fixed driving member 624.

[0074] In addition, the feeding unit 6 also includes a collection area 64 arranged on the bracket 400, and the movable plate 621 also includes a second placement portion 6212. The movable plate 621 also has a discarding position close to the collection area 64. When the movable plate 621 is located at the material picking position, the first container 100 located at the feeding position can be placed on the second placement portion 6212. When the movable plate 621 moves to the discarding position, the first container 100 can be placed in the collection area 64.

[0075] In this embodiment, specifically, the transporter 62 further includes a pushing assembly, which can move relative to the moving plate 621 along the second direction, and is used to push the first container 100 located at the second placement portion 6212 to the collection area 64. Specifically, the pushing assembly includes a pushing driving member 625 and a second pushing block 626; the pushing driving member 625 is disposed on the bracket 400, and the second pushing block 626 is disposed at the output end of the pushing driving member 625.

[0076] The second placement portion 6212 includes a second placement groove that penetrates the movable plate 621 along the third direction, two empty container driving members are arranged at intervals on the bracket 400, and two empty container lifting members 627 are respectively arranged at the output ends of the two empty container lifting driving members. The empty container lifting driving member drives the empty container lifting member 627 to rise and fall along the first direction to lift the two ends of the first container 100 and eject the first container 100 from the second placement groove. At this time, the pushing component acts to push the first container 100 to the collection area 64. In this embodiment, the cross-section of the second placement groove can be formed to be rectangular. Of course, in other embodiments of this embodiment, the cross-section of the second placement groove can be formed to be arc-shaped or semicircular. In this embodiment, the empty container lifting member 627 and the empty container lifting driving member may not be provided, and the first container 100 can be directly pushed out of the second placement groove and placed in the collection area 64 by the pushing component. In addition, the pushing component can also be replaced by a blowing member, which can blow air toward the first container 100 so that the first container 100 is transferred from the second placement slot to the collection area 64, or the first container 100 is lifted up by the empty container lifting member 627 and then blown toward the collection area 64.

[0077] Combination Figure 5-6 As shown, in this embodiment, optionally, the feeder 63 includes a feeding frame 631 and a pressing block 633, wherein the feeding frame 631 is rotatably arranged on the bracket 400, the feeding frame 631 has a receiving position for receiving the first container 100 and a unloading position for tilting the first container 100, and the feeding frame 631 is provided with a bearing portion 6311; when the feeding frame 631 is located at the unloading position, the first container 100 can convey the chip 300 to the transmission unit 7. The pressing block 633 is slidably arranged on the feeding frame 631, and the pressing block 633 has a pressing position close to the bearing portion 6311 to press the first container 100 against the bearing portion 6311 and a releasing position away from the bearing portion 6311 to release the first container 100. Specifically, the feeder 63 further includes a rotating drive member 632 and a pressing drive member 634. The rotating drive member 632 is provided on the bracket 400. The feeding frame 631 is provided with a hinged portion, which is hinged to the output end of the rotating drive member 632. The pressing drive member 634 is provided on the feeding frame 631, and the pressing block 633 is provided at the output end of the pressing drive member 634. With the above arrangement, the first container 100 can be rotated from a horizontal position to an inclined position, so that the chips 300 contained in the first container 100 can slide out automatically, saving the power of transmitting the chips 300 and saving energy.

[0078] Combination Figure 2As shown, optionally, the feeder 63 further includes a push assembly for pushing the first container 100 located at the feeding position so that the first container 100 enters the preset position of the bearing portion 6311. This arrangement can ensure that when the first container 100 is located at the feeding position, it can enter the preset position of the bearing portion 6311. Specifically, the push assembly includes a push driving member 635 and a push member 636, wherein the push driving member 635 is disposed on the bracket 400, and the push member 636 is disposed at the output end of the push driving member 635.

[0079] Combination Figure 4 As shown, in this embodiment, further, the fixing assembly also includes a rolling member 622, and a plurality of rolling members 622 are arranged at intervals on the first push block 623 along the third direction, and the third direction is perpendicular to both the first direction and the second direction. Specifically, the rolling member 622 includes a deep groove ball bearing, and the axis of the deep groove ball bearing is parallel to the first direction. When the first push block 623 is in the clamping position, the first container 100 and the plurality of deep groove ball bearings are tangent. This arrangement makes the movement process of the first container 100 along the second direction and the rolling friction between the rolling members 622, thereby reducing the friction coefficient.

[0080] Combination Figure 7 As shown, in this embodiment, preferably, the support 400 includes a support plate 401, and the transmission unit 7 includes a main channel component 71 and a branch channel component 72 located downstream of the main channel component 71; the main channel component 71 is arranged on the support plate 401, and the main channel component 71 can accommodate multiple chips 300 at the same time, and can release the chips 300 one by one to the branch channel component 72; the branch channel component 72 is used to select and distribute the chips 300 to multiple test units 8. With the arrangement of the above structure, the chips 300 can be distributed one by one in an orderly manner.

[0081] In this embodiment, the support plate 401 is in an inclined state, and the angle range between the support plate 401 and the horizontal plane is a, where 45 degrees ≤ a < 90 degrees. This setting can realize the automatic sliding of the chip 300. Of course, in other embodiments, the support plate 401 can also be in a horizontal state. In this embodiment, a driving power component is set in each transmission part to drive the chip 300.

[0082] The main channel assembly 71 includes a main carrier plate 711, a main cover plate 712, a first main crimping member 713 and a main stopper 715. The main carrier plate 711 is arranged on the support plate 401, and the main cover plate 712 is covered on the main carrier plate 711. A main channel is formed between the main carrier plate 711 and the main cover plate 712. Multiple chips 300 can slide downward in the main channel at the same time. The first main crimping member 713 is used to press the chip 300 to prevent the chip 300 from continuing to slide down. The main stopper 715 can extend into the main channel to prevent The chip 300 continues to slide down, wherein the main stopper 715 is located downstream of the first main crimping member 713 and is separated by a distance of one chip 300, that is, the chip 300 blocked by the main stopper 715 is adjacent to the chip 300 pressed by the first main crimping member 713. When the main stopper 715 extends into the main channel, all the chips 300 in the main channel stop sliding down. When the first main crimping member 713 presses the chip 300 and the main stopper 715 is withdrawn from the main channel, the most downstream chip 300 slides out of the main channel. With this arrangement, the chips 300 in the main channel can be released one by one. Specifically, the main cover plate 712 is provided with a main cover through hole that passes through the main cover plate 712, and the first main crimping member 713 is provided on the support plate 401, which can pass through the main cover through hole and press the chip 300 to press the chip 300 to the main carrier plate 711; the main carrier plate 711 is provided with a main bearing hole that passes through the main carrier plate 711, and the main stopper 715 can pass through the main bearing hole and extend into the main channel. Further, the main material channel assembly 71 also includes a second main crimping member 714, which is located upstream of the first main crimping member 713, and there are multiple chips 300 between the first main crimping member 713 and the second main crimping member 714. Preferably, there are three chips 300 between the first main crimping member 713 and the second main crimping member 714. Among them, the main stopper 715 can be selected as a pneumatic float.

[0083] The first main crimping member 713 and the second main crimping member 714 have the same structure, and the first main crimping member 713 may include a telescopic rod and a crimping driver, the crimping driver is disposed on the support plate 401, one end of the telescopic rod is disposed at the output end of the crimping driver, and the other end can abut the chip 300. Furthermore, a buffer is provided at the abutting end of the telescopic rod and the chip 300, and the buffer is preferably a rubber rod.

[0084] Preferably, the entrance of the main channel is provided with a first main detection member 716. A second main detection member 717 is provided between the first main crimping member 713 and the second main crimping member 714. The second main detection member 717 is located downstream of the second main crimping member 714 and can be used to detect the adjacent chip 300 of the second main crimping member 714 crimping the chip 300. A third main detection member 718 is provided downstream of the main stopper 715.

[0085] Combination Figure 10-12As shown, in this embodiment, the bracket 400 includes a support plate 401, a plurality of test units 8 are arranged on the support plate 401 at intervals along the second direction, and the dividing channel assembly 72 can move on the support plate 401 along the second direction; the dividing channel assembly 72 can selectively distribute the chip 300 to the plurality of test units 8. Specifically, the test unit 8 includes a write-read carrier plate 81, a write-read cover plate 82, a write-read code assembly 83 and a first write-read stopper 84; the write-read carrier plate 81 is arranged on the support plate 401, the write-read cover plate 82 is covered on the write-read carrier plate 81, a test channel is formed between the write-read carrier plate 81 and the write-read cover plate 82, and the first write-read stopper 84 is used to block the chip 300 to be written and read, that is, to stop the chip 300 to be written and read at the write-read code position; the write-read code assembly 83 is used to write, read and verify data on the chip 300 in the test channel. The test unit 8 also includes a performance detection assembly, which is used to perform performance detection on the chip 300 in the test channel. Specifically, the performance detection component is generally used to detect whether the various performances of the chip 300 meet the requirements, such as whether the sensor parameters meet the requirements, whether the data writing speed meets the requirements, and so on. The test unit 8 also includes a marking component, which is used to mark the chip 300 in the test channel. The test unit 8 also includes a performance data rewriting component, which is used to rewrite data on the chip 300 that needs to be upgraded. This setting can realize the test operation of multiple chips 300 at the same time. Of course, in other embodiments, the test unit 8 may also include a combination of one or more of the code writing and reading component 83, the performance detection component, the marking component and the data rewriting component, which is not limited here.

[0086] For ease of understanding, the following description is mainly carried out by taking the code writing and reading component 83 as an example. Of course, in other embodiments, the code writing and reading component 83 can also be replaced by a performance detection component, a marking component or a data rewriting component.

[0087] Specifically, the positional relationship between the first write-read stopper 84 and the test channel is similar to the positional relationship between the main stopper 715 and the main channel. Specifically, the write-read carrier plate 81 is provided with a write-read carrier hole penetrating the write-read carrier plate 81, and the first write-read stopper 84 passes through the write-read carrier hole and then extends into the test channel to stop the code chip 300 to be written and read.

[0088] After the code writing and reading is completed, the chip 300 to be written and read needs to be added to the code writing and reading position. Since the distance of the test channel is long, the time for adding is long.

[0089] To this end, in this embodiment, further, the test unit 8 further includes a second write-read stopper 85, which is arranged upstream of the first write-read stopper 84 and is used to stop the chip 300 to be written and read. Preferably, the second write-read stopper 85 and the first write-read stopper 84 are separated by the position of one or two chips 300. This arrangement allows a chip 300 to be reserved in the test channel during the write-read process, so as to shorten the time for adding the next chip 300 to the write-read position.

[0090] Furthermore, the test unit 8 also includes a write-read crimping piece 87, which is located upstream of the second write-read stopper 85, and the chip 300 used for crimping is adjacent to the chip 300 stopped by the second write-read stopper 85. This arrangement enables a plurality of chips 300 to be written and read to be stored in the test channel. Preferably, 5 chips 300 to be written and read can be stored in the test channel. It should be noted that the second write-read stopper 85 has the same structure as the first write-read stopper 84, and the write-read crimping piece 87 has the same structure as the first main crimping piece 713, therefore, the structures of the second write-read stopper 85 and the write-read crimping piece 87 are not described in detail here. Among them, the first write-read stopper 84 and the second write-read stopper 85 can both be pneumatic floats.

[0091] Optionally, the entrance and exit of the test channel are respectively provided with a first write-read detection member 88 and a second write-read detection member 89. The first write-read detection member 88 is used to detect whether the chip 300 to be written and read enters the test channel, and the second write-read detection member 89 is used to detect whether the chip 300 that has completed the writing and reading of the code is released successfully.

[0092] Combination Figure 8-9 As shown, the branch channel assembly 72 includes a branch carrier plate 721, a branch cover plate 722 and a branch stopper 723. The branch carrier plate 721 is slidably disposed on the support plate 401 along the second direction, and the branch cover plate 722 is covered on the branch carrier plate 721. A branch channel is formed between the branch carrier plate 721 and the branch cover plate 722. The branch channel can accommodate a chip 300, and the branch stopper 723 can extend into the branch channel to stop the chip 300. Specifically, the branch cover plate 722 is provided with a branch cover through hole penetrating the branch cover plate 722, and the branch stopper 723 can pass through the branch cover through hole to enter the branch channel.

[0093] Optionally, the material distribution channel assembly 72 also includes a material distribution power assembly, which is arranged on the support plate 401, and the material distribution bearing plate 721 is arranged at the output end of the material distribution power assembly. Specifically, the material distribution power assembly includes a material distribution transmission belt 724, a material distribution driving wheel 726, a material distribution driven wheel 727 and a material distribution transmission driving member 725, the material distribution transmission driving member 725 is arranged on the support plate 401, the material distribution driving wheel 726 is arranged at the output end of the material distribution transmission driving member 725, the material distribution driven wheel 727 is rotatably arranged on the support plate 401, the material distribution transmission belt 724 is wound between the material distribution driving wheel 726 and the material distribution driven wheel 727; the material distribution bearing plate 721 is fixed to the material distribution transmission belt 724. The material distribution bearing plate 721 is slidably arranged on the support plate 401 through the slide rail slider assembly.

[0094] Preferably, the inlet of the sub-channel is provided with a first sub-detection element, and the outlet of the sub-channel is provided with a second sub-detection element.

[0095] Combination Fig.13 As shown, the loading unit 9 includes a loading component 91 and a fixing frame 92 equipped with a plurality of second containers 200, the loading component 91 and the fixing frame 92 are both arranged on the support plate 401, and the plurality of second containers 200 are arranged in parallel on the fixing frame 92; the code writing and reading component 83 and / or the performance detection component and / or the marking component and / or the data rewriting component are respectively communicated and / or electrically connected with the loading component 91, and the loading component 91 can place the chips 300 into different second containers 200 according to the detection results of the performance detection component, and / or the verification results of the code writing and reading component 83, and / or the operation results of the marking component, and / or the test results of the data rewriting component.

[0096] Specifically, the loading component 91 sends the chips 300 that fail the performance test into a second container 200, puts the chips 300 that are read by the code writing and reading component 83 and fail the data verification into another second container 200, and puts the chips 300 that pass the performance test and / or pass the data verification and / or complete the marking operation into yet another second container 200, thereby monitoring the production quality of the entire chip 300.

[0097] Regarding the structure of the charging assembly 91, in this embodiment, optionally, the charging assembly 91 includes a charging carrier plate 911, a charging cover plate 912 and a charging stopper 913, the charging carrier plate 911 is slidably arranged on the support plate 401 along the second direction, the charging cover plate 912 is covered on the charging carrier plate 911, a charging channel is formed between the charging carrier plate 911 and the charging cover plate 912, the charging channel can accommodate a chip 300, and the charging stopper 913 can extend into the charging channel to block the chip 300. Specifically, the charging cover plate 912 is provided with a charging through hole that penetrates the charging cover plate 912, and the charging stopper 913 can pass through the charging through hole to enter the charging channel. Optionally, the charging stopper 913 has the same structure as the first main crimping member 713, so its specific structure is not repeated here.

[0098] Optionally, the charging unit 9 further comprises a charging power assembly 93, the charging power assembly 93 is arranged on the support plate 401, and the charging bearing plate 911 is arranged at the output end of the charging power assembly 93. Specifically, the charging power assembly 93 and the material distribution power assembly have the same structure, so the structure of the charging power assembly 93 is not repeated here.

[0099] In this embodiment, the fixing frame 92 includes a container placement bottom plate 921 and a container placement cover plate 922. The container placement bottom plate 921 is provided with a plurality of container placement grooves that are spaced along the second direction and penetrate the container placement bottom plate 921. The container placement bottom plate 921 is provided on the support plate 401. The container placement cover plate 922 is covered on the container placement bottom plate 921. A plurality of container placement channels are formed between the container placement cover plate 922 and the container placement bottom plate 921. A plurality of second containers 200 are respectively arranged in the plurality of container placement channels. Further, a spring piece 923 is provided at the bottom of the container placement groove, and the spring piece 923 is used to press the second container 200 against the container placement cover plate 922. This arrangement improves the stability of the second container 200. Specifically, one end of the spring piece 923 is fixed to the bottom of the container placement groove, and the other end is inclined toward the container placement cover plate 922 along the direction from the outlet to the inlet of the container placement groove.

[0100] The loading component 91 needs to receive the chip 300 that has completed writing and reading codes between multiple test units 8. When the number of test units 8 is large enough, the loading component 91 cannot receive the chip 300 that has completed writing and reading codes in time, so that after the test unit 8 completes writing and reading codes of the chip 300, it cannot open the second writing and reading stopper 85. At this time, the writing and reading code component 83 needs to stop working, affecting the writing and reading code efficiency.

[0101] To this end, in this embodiment, further, the test unit 8 further includes a third write-read stopper 86, which is arranged downstream of the first write-read stopper 84 and is used to stop the chip 300 that has completed the code writing and reading. This arrangement allows the chip 300 that has completed the code writing and reading to be stopped by the third write-read stopper 86 after being released, and then can wait for the loading component 91 to receive it, without stopping the code writing and reading component 83, thereby improving the working efficiency of the code writing and reading component 83.

[0102] Optionally, at least one auxiliary material distribution component 5 is respectively provided at the entrance and the exit of the main channel, and the auxiliary material distribution component 5 is used to assist the chip 300 to slide down smoothly in the main channel. At least one auxiliary material distribution component 5 is respectively provided at the entrance and the exit of the test channel, and the auxiliary material distribution component 5 is used to assist the chip 300 to slide down smoothly in the test channel. Specifically, the auxiliary material distribution component 5 includes a blowing nozzle, and the blowing nozzle can blow air into the main channel or the test channel, so that the chip 300 with burrs or the chip 300 blocked by obstacles can continue to slide down.

[0103] It should be noted that the detection unit includes various detection components. The chip automatic test system also includes a controller and a display unit 500. The controller controls the operation of the feeding unit 6, the transmission unit 7, the test unit 8, the loading unit 9, etc. through the detection unit. The display unit 500 is used to display the device status and realize human-computer interaction. The controller is well known to those skilled in the art, so the structure and control principle of the controller will not be repeated again.

[0104] Embodiment 2

[0105] Combination Figure 14-15 As shown, this embodiment also provides a chip testing method, which is applicable to the chip automatic testing system in any of the above embodiments. The chip testing method includes the following steps:

[0106] S01 . The feeding unit 6 transfers the first container 100 to the feeding position and sends the chip 300 to the transmission unit 7 .

[0107] S02. The chip 300 is transmitted by the transmission unit 7 to one or more test units 8 respectively. The test unit 8 performs performance testing and / or data writing and / or data verification and / or data rewriting and / or marking operations on the chip 300; and at least one chip 300 can be stored in the test channel of each test unit 8; optionally, at least one chip 300 to be written and read can be stored in the test channel of each test unit 8; preferably, five chips 300 to be written and read can be stored in the test channel of each test unit 8.

[0108] S03, the chips 300 are tested, and the loading unit 9 loads the chips 300 that are successfully or unsuccessfully written into different second containers 200. The chips 300 that are successfully written into the second container 200 for accommodating the chips 300 that are successfully written into the second container 200, and the chips 300 that are unsuccessfully written into the second container 200 for accommodating the chips 300 that are NG.

[0109] Preferably, one of the plurality of second containers 200 is used to contain NG chips 300, which refers to chips that fail to write or read codes 300. Specifically, the write and read code component 83 is provided with a write and read result detection member, which can detect the write and read code result of the chip 300 that has completed the write and read code.

[0110] Furthermore, the transmission unit 7 includes a main channel component 71 and a branch channel component 72, and there are three test units 8. It takes 0.2-1 second to divide one chip 300 from the main channel component 71 to the branch channel component 72. The branch channel component 72 divides 5 chips 300 to the three test units 8 in one cycle. It takes 0.2-0.6 seconds to divide one chip 300 and return to the main channel component 71. Preferably, it takes 0.4 seconds to divide one chip 300 to the test units 8 on both sides and return to the main channel component 71; and it takes 0.2 seconds to divide one chip 300 to the middle test unit 8.

[0111] Optionally, during the process of writing and reading codes, first, the first write-read stopper 84 extends, and then, while the write-read crimping member 87 is crimping, the second write-read stopper 85 contracts, releasing a chip 300 to the write-read position and being stopped by the first write-read stopper 84, and the write-read code component 83 works. While the write-read code component 83 is working, the second write-read stopper 85 extends, the write-read crimping member 87 is released, and the chip 300 moves down to the second write-read stopper 85, and then the write-read crimping member 87 is crimping; after the write-read code component 83 completes its work, the third write-read stopper 86 extends, and then the first write-read stopper 84 contracts, releasing the chip 300 that has completed the write-read code and being stopped by the third write-read stopper 86; then the next cycle begins.

[0112] Optionally, in the test unit 8, it takes t1 seconds for the chip 300 stored in the test channel to enter the write-read code position, and it takes t2 seconds for the write-read code component 83 to write and read the chip 300. After the write-read code is completed, it takes t3 seconds for the chip 300 to slide out of the write-read code position, that is, it takes t3 seconds to empty the write-read code position. When t2 is greater than t1, the production time of each chip 300 is determined by the sum of t2 and t3 or by t2. When t2 is less than t1, the production time of each chip 300 is determined by the sum of t1 and t3 or by t1.

[0113] Optionally, after the chip 300 that has completed writing and reading codes is released by the third writing and reading stopper 86, it takes 0.2-1 seconds to enter the loading channel of the loading component 91. The loading component 91 places the chip 300 in the second container 200 and goes to another test unit 8 to wait for the chip 300 that has completed writing and reading codes. It takes 1-2 seconds. Specifically, the time of each link can be adjusted according to actual conditions, but is not limited to this. For example, when the number of test units 8 increases, the time for each chip 300 to be divided and returned to the main material channel component 71 needs to be reduced. Specifically, when the number of test units 8 is 8, it takes 0.2 seconds for each chip 300 to be divided to the test units 8 on both sides and return to the main material channel component 71;. It takes 0.1 seconds for each chip 300 to be divided to the middle test unit 8. Specifically, a blowing device that can accelerate the material division process is added.

[0114] In addition, the number of chips 300 distributed by the distribution channel assembly 72 to each test unit 8 in one cycle can be adjusted according to actual conditions, and is not limited thereto. For example, when the number of test units 8 increases, the number of chips 300 distributed by the distribution channel assembly 72 to each test unit 8 in one cycle increases. Specifically, when the number of test units 8 is 8, the number of chips 300 distributed by the distribution channel assembly 72 to each test unit 8 in one cycle can be 10.

[0115] The test unit 8 includes a code writing and reading component 83, which can write, read and verify data on the chip 300; and / or, the test unit 8 includes a performance detection component, which can perform performance detection on the chip 300 entering the test unit 8; and / or, the test unit 8 includes a marking component, which can perform marking operations on the chip 300; and / or, the test unit 8 includes a data rewriting component, which can rewrite data on the chip 300 that needs to be upgraded. The loading unit 9 includes a loading component 91, and the code writing and reading component 83 and / or the performance detection component and / or the marking component and / or the data rewriting component are respectively connected to the loading component 91 for communication and / or electrical connection. The loading component 91 can put the chips 300 into different second containers 200 according to the detection results of the performance detection component, and / or the verification results of the code writing and reading component 83, and / or the operation results of the marking component, and / or the test results of the data rewriting component.

[0116] Obviously, the above embodiments of the present invention are merely examples for clearly illustrating the present invention, and are not intended to limit the embodiments of the present invention. For those skilled in the art, other different forms of changes or modifications can be made based on the above description. It is not necessary and impossible to list all the embodiments here. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present invention should be included in the protection scope of the claims of the present invention.

Claims

1. A chip automatic testing system, characterized in that: It comprises a support (400), a feeding unit (6), a transmission unit (7), at least one testing unit (8) and a charging unit (9) arranged on the support (400); The feeding unit (6) can transfer the chip (300) contained in the first container (100) to the transmission unit (7); the transmission unit (7) transmits the chip (300) to the testing unit (8), and the testing unit (8) performs a testing operation on the chip (300); the loading unit (9) loads the chip (300) that has completed the testing operation into the second container (200); The feeding unit comprises a storage container (61), a transporter (62) and a feeder (63), wherein the storage container (61) is used to store a first container (100); the transporter (62) comprises a movable plate (621), the movable plate (621) is slidably disposed on the bracket (400) along a second direction, and the movable plate (621) has a material taking position close to the storage container (61) and a material feeding position close to the feeder (63); the feeder (63) comprises a feeding frame (631) and a rotating driving member (632), The feeder (63) can receive the first container (100) from the moving plate (621) at the feeding position, and the rotating drive member (632) can drive the feeding frame (631) to rotate the first container (100) at the feeding position to the inclined unloading position of the first container (100), so that the first container (100) is rotated from a horizontal position to an inclined position, and the chips (300) in the first container (100) are transferred to the transmission unit (7), and the second direction is a horizontal direction; The feeding rack (631) is provided with a bearing portion (6311); the feeder (63) further includes a pressing block (633), which is slidably arranged on the feeding rack (631) and has a pressing position close to the bearing portion (6311) to press the first container (100) against the bearing portion (6311) and a releasing position away from the bearing portion (6311) to release the first container (100).

2. The chip automatic testing system according to claim 1, characterized in that: The storage device (61) comprises a first storage rack (611) and a second storage rack (612) which are arranged opposite to the bracket (400); the first storage rack (611) and the second storage rack (612) are respectively provided with a first storage groove (6111) and a second storage groove (6121) extending along a first direction on the opposite surfaces of the first storage rack (611) and the second storage rack (612); the bottom ends of the first storage rack (611) and the second storage rack (612) are both provided with a discharge port (6112); the two ends of the first container (100) are respectively located in the first storage groove (6111) and the second storage groove (6121), and can slide out from the discharge port (6112) along a second direction; the second direction is perpendicular to the first direction, and the first direction is a vertical direction.

3. The chip automatic testing system according to claim 2, characterized in that: The movable plate (621) is provided with a first placement portion (6211), and the storage container (61) further comprises a discharge piece (615), wherein the discharge piece (615) is slidably arranged on the bracket (400) along the first direction, and the discharge piece (615) has a supporting position for supporting the first container (100) above the discharge port (6112) and a discharge position for dropping the first container (100) to the discharge port (6112); when the discharge piece (615) is located at the supporting position, the movable plate (621) can move to the material taking position, and when the discharge piece (615) is located at the discharge position, the first container (100) is located at the first placement portion (6211) and is transferred to the feeding position by the movable plate (621).

4. The chip automatic testing system according to claim 3, characterized in that: The feeding unit (6) further comprises a collecting area (64) arranged on the bracket (400); the movable plate (621) further comprises a second placement portion (6212); the movable plate (621) further comprises a discarding position close to the collecting area (64); when the movable plate (621) is located at the material taking position, the first container (100) at the feeding position can be placed on the second placement portion (6212); when the movable plate (621) moves to the discarding position, the first container (100) can be placed in the collecting area (64).

5. The chip automatic testing system according to claim 1, characterized in that: The support (400) comprises a support plate (401), and the transmission unit (7) comprises a main channel component (71) and a branch channel component (72) located downstream of the main channel component (71); The main channel component (71) is arranged on the support plate (401), and the main channel component (71) can accommodate multiple chips (300) at the same time, and can release the chips (300) one by one to the branch channel component (72); the branch channel component (72) is used to selectively distribute the chips (300) to multiple test units (8).

6. The chip automatic testing system according to claim 5, characterized in that: The plurality of test units (8) are arranged on the support plate (401) at intervals along a second direction, and the distribution channel component (72) can move on the support plate (401) along the second direction; the distribution channel component (72) can selectively distribute the chip (300) to the plurality of test units (8).

7. The chip automatic testing system according to any one of claims 1 to 6, characterized in that: The test unit (8) comprises a write-read carrier plate (81), a write-read cover plate (82), a write-read code assembly (83) and a first write-read stopper (84); the write-read carrier plate (81) is arranged on the support plate (401) of the bracket (400); the write-read cover plate (82) is arranged on the write-read carrier plate (81); a test channel is formed between the write-read carrier plate (81) and the write-read cover plate (82); the first write-read stopper (84) is used to block the chip (300) to be written and read; the write-read code assembly (83) is used to write, read and verify data on the chip (300) in the test channel; and / or The test unit (8) further comprises a performance detection component, wherein the performance detection component is used to perform performance detection on the chip (300) in the test channel; and / or The test unit (8) further comprises a marking component, wherein the marking component is used to perform a marking operation on the chip (300) in the test channel; and / or The test unit (8) also includes a performance data rewriting component, and the data rewriting component is used to rewrite data on the chip (300) that needs to be upgraded.

8. The chip automatic testing system according to claim 7, characterized in that: The loading unit (9) comprises a loading component (91) and a fixing frame (92) on which a plurality of second containers (200) are mounted. The loading component (91) and the fixing frame (92) are both arranged on the support plate (401). The plurality of second containers (200) are arranged in parallel on the fixing frame (92). The code writing and reading component (83) and / or the performance detection component and / or the marking component and / or the data rewriting component are respectively connected in communication and / or electrically connected to the loading component (91). The loading component (91) can place the chips (300) into different second containers (200) according to the detection result of the performance detection component and / or the verification result of the code writing and reading component (83) and / or the operation result of the marking component and / or the test result of the data rewriting component.

9. A chip testing method, applicable to the chip automatic testing system according to any one of claims 1 to 8, characterized in that: The following steps are involved: S01, the feeding unit (6) transfers the first container (100) to the feeding position, and sends the chip (300) to the transmission unit (7); S02, the chip (300) is transferred by the transmission unit (7) to one or more test units (8), and the test unit (8) performs performance testing and / or data writing and / or data verification and / or data rewriting and / or marking operations on the chip (300); and at least one chip (300) can be stored in the test channel of each test unit (8); S03, testing the chips (300), and the loading unit (9) loads the chips (300) that have passed the test or failed the test into different second containers (200).

10. The chip testing method according to claim 9, characterized in that: The test unit (8) comprises a code writing and reading component (83), and the code writing and reading component (83) is capable of writing, reading, and verifying the chip (300); and / or The test unit (8) comprises a performance detection component, and the performance detection component is capable of performing performance detection on the chip (300); and / or The testing unit (8) comprises a marking component, and the marking component is capable of performing a marking operation on the chip (300); and / or The test unit (8) includes a data rewriting component, and the data rewriting component can rewrite data on the chip (300) that needs to be upgraded; The loading unit (9) comprises a loading component (91), and the code writing and reading component (83) and / or the performance detection component and / or the marking component and / or the data rewriting component are respectively connected to the loading component (91) for communication and / or electrical connection, and the loading component (91) can place the chips (300) into different second containers (200) according to the detection result of the performance detection component, and / or the verification result of the code writing and reading component (83), and / or the operation result of the marking component, and / or the test result of the data rewriting component.

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