Method, device and equipment for testing socket of navigation chip and storage medium

Abstract

The invention relates to a socket test method, device and equipment for a navigation chip and a storage medium, and the method comprises the following steps: carrying out the multi-band signal injection of a pin in a socket of a target navigation chip, and obtaining an initial response signal; performing frequency domain analysis on the initial response signal to obtain a frequency domain characteristic curve; performing performance evaluation on the electromagnetic compatibility of the socket based on the frequency domain characteristic curve to obtain an EMC performance score; judging whether the EMC performance score is within a preset performance score range or not, and if not, performing multi-dimensional judgment on the electromagnetic compatibility of the socket through a preset EMC performance index to obtain a multi-dimensional judgment result; performing fault factor identification on the socket based on the multi-dimensional judgment result to obtain a fault factor report; and formulating a socket repair scheme of the target navigation chip based on the fault factor report, thereby solving the technical problem that the stable operation of the whole system is affected due to the fact that the working environment is complex and changeable and the interface of the navigation chip is easy to fail.

Description

Technical Field

[0001] The present invention relates to the technical field of navigation chips, and in particular to a socket testing method, device, equipment and storage medium for a navigation chip. Background Art

[0002] With the rapid development of electronic information technology, navigation systems are an indispensable part of modern transportation, military, aviation and other fields. Their performance and reliability directly affect the safety and efficiency of related applications. As the core component of the navigation system, the navigation chip undertakes the important tasks of signal reception, processing and output. However, in practical applications, due to the complex and changeable working environment, such as severe electromagnetic interference and large temperature changes, the interface of the navigation chip is prone to failure, affecting the stable operation of the entire system. Therefore, it is particularly important to develop a method that can effectively detect and evaluate the performance of the navigation chip interface.

[0003] At present, the testing of navigation chip interfaces mainly relies on traditional functional testing methods, which can only perform simple verification of chip functions under specific conditions and cannot comprehensively evaluate the performance of the interface in the actual use environment, especially electromagnetic compatibility (EMC). Electromagnetic compatibility is a measure of the ability of electronic equipment to work normally in an electromagnetic environment. It is of great significance to ensure that navigation chips can work stably and reliably in various complex electromagnetic environments. Existing testing methods often find it difficult to accurately simulate complex electromagnetic environments, resulting in large deviations between test results and actual conditions, thus affecting the accuracy of fault diagnosis and the effectiveness of subsequent repair measures.

[0004] In view of the above problems, a new test method for navigation chip sockets is proposed, which aims to accurately evaluate its electromagnetic compatibility by injecting multi-band signals into the pins in the target navigation chip socket and combining frequency domain analysis technology. This method can not only provide detailed EMC performance scores, but also discover potential fault factors through multi-dimensional evaluation, providing a scientific basis for subsequent troubleshooting and performance optimization. The introduction of this method is expected to significantly improve the test efficiency and accuracy of the navigation chip interface, thereby promoting the performance improvement and safe and stable operation of the entire navigation system. Summary of the invention

[0005] The main purpose of the present invention is to provide a socket testing method, device, equipment and storage medium for a navigation chip, which solves the technical problem that the interface of the navigation chip is prone to failure due to complex and changeable working environment, such as severe electromagnetic interference, large temperature changes, etc., affecting the stable operation of the entire system.

[0006] To achieve the above object, the present invention provides a socket testing method for a navigation chip, comprising the following steps: Inject multi-band signals into the pins in the socket of the target navigation chip to obtain an initial response signal; Performing frequency domain analysis on the initial response signal to obtain a frequency domain characteristic curve; Performing a performance evaluation on the electromagnetic compatibility of the socket based on the frequency domain characteristic curve to obtain an EMC performance score; Determine whether the EMC performance score is within a preset performance score range. If not, perform a multi-dimensional evaluation on the electromagnetic compatibility of the socket using preset EMC performance indicators to obtain a multi-dimensional evaluation result. Based on the multi-dimensional evaluation results, fault factors of the socket are identified to obtain a fault factor report; A socket repair plan for the target navigation chip is formulated based on the fault factor report.

[0007] Furthermore, the multi-band signal is injected into the pins in the socket of the target navigation chip to obtain the initial response signal, including: Dynamically scanning the working frequency band of the target navigation chip through a preset adaptive spectrum analyzer to obtain a multi-band characteristic spectrum; Using a spectrum clustering algorithm, the multi-band characteristic spectrum is divided into frequency bands based on the multi-band characteristic spectrum to obtain a plurality of frequency band interval signals; wherein the plurality of frequency band interval signals include a high frequency band interval signal, a mid-frequency band interval signal and a low frequency band interval signal; The preset multi-frequency excitation signal generator performs signal excitation on each of the frequency band interval signals to obtain a multi-frequency excitation signal; Preprocessing the multi-frequency excitation signal to obtain a focused multi-frequency excitation signal; The focused multi-frequency excitation signal is positioned and injected into the pins in the socket of the target navigation chip by using a near-field probe array, and the signal of the pins in the socket is captured to obtain an initial response signal.

[0008] Furthermore, the performing frequency domain analysis on the initial response signal to obtain a frequency domain characteristic curve includes: Performing a time-frequency joint analysis on the initial response signal by using a preset adaptive wavelet transform technology to obtain a time-frequency distribution diagram; Extracting the instantaneous frequency of the initial response signal based on the time-frequency distribution diagram to obtain an instantaneous frequency sequence; Performing multi-resolution singular spectrum analysis on the instantaneous frequency sequence to obtain a frequency component decomposition result; Probabilistic modeling is performed on the frequency distribution of the frequency component decomposition result by an adaptive kernel density estimation method to obtain a frequency probability density function; Performing multi-scale decomposition on the frequency probability density function to obtain a frequency domain feature vector; Extracting key feature points from the frequency domain feature vector to obtain key feature points; A frequency domain characteristic curve is drawn based on the key feature points; wherein the X-axis of the frequency domain characteristic curve represents the frequency, and the Y-axis of the frequency domain characteristic curve represents the amplitude.

[0009] Further, the electromagnetic compatibility of the socket is evaluated based on the frequency domain characteristic curve to obtain an EMC performance score, including: The nonlinear features of the frequency domain characteristic curve are extracted by wavelet entropy analysis technology to obtain an entropy feature vector; wherein the entropy feature vector includes a Shannon entropy vector, a Tsallis entropy vector and a Rényi entropy vector; Performing characteristic analysis on the initial response signal based on the entropy feature vector to obtain a fractal dimension sequence of the initial response signal; Using a multi-scale permutation entropy method, the fractal dimension sequence is quantified at multiple levels to obtain a multi-scale entropy value sequence; Recursive quantization analysis technology is used to reconstruct dynamic characteristics based on the multi-scale entropy value sequence to obtain phase space reconstruction parameters; wherein the phase space reconstruction parameters include embedding dimension, time delay and recursive threshold; Using the Lyapunov exponent calculation method, the socket is subjected to stability analysis based on the phase space reconstruction parameter to obtain a socket stability index; Through a fuzzy comprehensive evaluation method, a multi-criteria decision-making evaluation is performed on the electromagnetic compatibility of the socket based on the socket stability index to obtain an initial EMC performance index; wherein the initial EMC performance index includes an electromagnetic interference intensity index, an electromagnetic sensitivity index, an electromagnetic radiation level index and an electromagnetic immunity index; Performing nonlinear mapping on the initial EMC performance index to obtain a normalized EMC performance score; The normalized EMC performance score is weighted by a multi-objective optimization algorithm to obtain an EMC performance score.

[0010] Furthermore, the electromagnetic compatibility of the socket is evaluated in multiple dimensions by using preset EMC performance indicators to obtain a multi-dimensional evaluation result, including: Performing a preliminary evaluation on the electromagnetic compatibility of the socket by using the preset EMC performance index to obtain a preliminary evaluation result; wherein the preliminary evaluation result includes a normal position of the socket and an abnormal position of the socket; By using a high-order statistical analysis method, abnormal data mining is performed on the abnormal position of the socket to obtain abnormal statistical characteristic parameters; wherein the abnormal statistical characteristic parameters include mean, variance, skewness and kurtosis; Classify the abnormal statistical characteristic parameters to obtain cluster centers and category labels corresponding to the cluster centers; wherein the category labels include medium risk of electromagnetic compatibility and high risk of electromagnetic compatibility; Based on the cluster center and the category label corresponding to the cluster center, the fault coupling path of the socket is identified to obtain the fault coupling path; Performing a probability inference of a fault feature based on the fault coupling path to obtain a fault feature and a probability distribution corresponding to the fault feature; wherein the fault feature includes distortion of the initial response signal, loss of socket receiving data, and socket communication error; The fault characteristics and the probability distribution corresponding to the fault characteristics are visualized in multiple dimensions to obtain a multi-dimensional evaluation result; wherein the multi-dimensional evaluation result includes a spatial distribution map of the fault mode and a thermal map of the fault severity.

[0011] Further, the fault factor identification of the socket based on the multi-dimensional evaluation result to obtain a fault factor report includes: Using a support vector machine algorithm, based on the multi-dimensional evaluation results, fault features of the socket are extracted to obtain socket fault features; Classifying the socket fault characteristics to obtain a fault characteristic classification result; Performing dimensionality reduction processing on the fault feature classification result to obtain a principal component feature vector; Performing fault sequence analysis on the principal component eigenvector to obtain a fault sequence mode; wherein the fault sequence mode includes a time sequence of fault occurrence, a frequency of fault occurrence, a duration of the fault, and a time period of a fault interval; By using Markov random fields, fault factor identification and causal inference are performed based on the fault time series pattern to obtain the fault factor; Based on the fault factors, a fault factor report is obtained.

[0012] Further, formulating a socket repair plan for the target navigation chip based on the fault factor report includes: Performing data mining on the fault factor report to obtain statistical characteristics of the fault factor; wherein the statistical characteristics of the fault factor are the occurrence frequency and distribution characteristics of the fault factor; Performing cluster analysis on the fault factors based on the statistical characteristics to obtain a category distribution diagram of the fault factors; wherein the category distribution diagram includes fault classification factors and associated features of the fault classification factors; Based on the category distribution diagram of the fault factors, the socket of the target navigation chip is optimized and analyzed to obtain an optimized design scheme; wherein the optimized design scheme includes circuit layout adjustment of the target navigation chip and selection suggestions for components of the target navigation chip; A socket repair plan for the target navigation chip is formulated based on the optimized design plan.

[0013] The present invention also provides a socket testing device for a navigation chip, comprising: An injection module is used to inject multi-band signals into the pins in the socket of the target navigation chip to obtain an initial response signal; An analysis module, used for performing frequency domain analysis on the initial response signal to obtain a frequency domain characteristic curve; An evaluation module, used to perform a performance evaluation on the electromagnetic compatibility of the socket based on the frequency domain characteristic curve to obtain an EMC performance score; An evaluation module is used to determine whether the EMC performance score is within a preset performance score range. If not, a multi-dimensional evaluation is performed on the electromagnetic compatibility of the socket through preset EMC performance indicators to obtain a multi-dimensional evaluation result. An identification module, used to identify the fault factor of the socket based on the multi-dimensional evaluation result and obtain a fault factor report; A repair module is used to formulate a socket repair plan for the target navigation chip based on the fault factor report.

[0014] The present invention also provides a computer device, comprising a memory and a processor, wherein the memory stores a computer program, and the processor implements the steps of any one of the above methods when executing the computer program.

[0015] The present invention also provides a computer-readable storage medium on which a computer program is stored. When the computer program is executed by a processor, the steps of any of the above-mentioned methods are implemented.

[0016] The socket testing method of the navigation chip provided by the present invention comprises the following steps: injecting a multi-band signal into the pins in the socket of the target navigation chip to obtain an initial response signal; performing frequency domain analysis on the initial response signal to obtain a frequency domain characteristic curve; performing performance evaluation on the electromagnetic compatibility of the socket based on the frequency domain characteristic curve to obtain an EMC performance score; judging whether the EMC performance score is within a preset performance score range, and if not, performing a multi-dimensional evaluation on the electromagnetic compatibility of the socket through preset EMC performance indicators to obtain a multi-dimensional evaluation result; performing fault factor identification on the socket based on the multi-dimensional evaluation result to obtain a fault factor report; formulating the target based on the fault factor report. The socket repair solution for the navigation chip solves the technical problem that the interface of the navigation chip is prone to failure due to complex and changeable working environment, such as severe electromagnetic interference, large temperature changes, etc., which affects the stable operation of the entire system through the above-mentioned technical means. It realizes the application of multi-band signal injection and frequency domain analysis technology, which can more accurately capture the response characteristics of the navigation chip socket at different frequencies, improve the accuracy of the test, ensure the accuracy of the electromagnetic compatibility (EMC) performance evaluation and the customized repair solution based on the fault factor report, which can solve the existing problems in a targeted manner, avoid the blind repair caused by the lack of specific fault information in the traditional method, and improve the success rate and efficiency of the repair. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 It is a schematic diagram of the steps of a socket testing method of a navigation chip in one embodiment of the present invention; Figure 2 It is a structural block diagram of a socket test device for a navigation chip in one embodiment of the present invention; Figure 3 It is a schematic block diagram of the structure of a computer device according to an embodiment of the present invention.

[0018] The realization of the purpose, functional features and advantages of the present invention will be further explained in conjunction with embodiments and with reference to the accompanying drawings. DETAILED DESCRIPTION

[0019] In order to make the purpose, technical solution and advantages of the present invention more clearly understood, the present invention is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not intended to limit the present invention.

[0020] like Figure 1 As shown, Figure 1 It is a schematic diagram of the steps of a socket testing method of a navigation chip in one embodiment of the present invention; In one embodiment of the present invention, a method for testing a socket of a navigation chip is provided, comprising the following steps: Step S1, injecting a multi-band signal into the pins in the socket of the target navigation chip to obtain an initial response signal.

[0021] Specifically, the step of injecting a multi-band signal into the pins in the socket of the target navigation chip to obtain an initial response signal means that during the test, it is first necessary to select a suitable multi-band signal source that can generate stable signals in different frequency ranges to cover the various working conditions encountered by the navigation chip. For example, in actual operation, a signal generator can be used to generate multi-band signals ranging from low frequency to high frequency, and these signals are injected into the pins in the socket of the navigation chip in sequence or simultaneously. When these multi-band signals pass through the pins in the socket, they will be affected by the internal structure and material of the socket, resulting in different degrees of attenuation, reflection or distortion of the signal, which are ultimately reflected in the initial response signal received from the pins of the socket. By comparing the difference between the injection signal and the response signal, the working state of the socket and its transmission characteristics in different frequency bands can be preliminarily determined. For example, in a typical navigation system, if it is found that when testing a navigation chip for vehicle positioning services, the strength of the response signal is significantly lower than that of other frequency bands in certain specific frequency bands, this means that there is a problem with the signal transmission in this frequency band, which is caused by defects in the socket design or poor contact during the manufacturing process. This testing method can help engineers quickly locate problems and provide a basis for further analysis and improvement.

[0022] Step S2, performing frequency domain analysis on the initial response signal to obtain a frequency domain characteristic curve.

[0023] Specifically, the process of performing frequency domain analysis on the initial response signal to obtain the frequency domain characteristic curve is to further use professional spectrum analysis tools or software to convert the collected initial response signal into a frequency domain representation after completing the multi-band signal injection, so as to obtain the frequency domain characteristic curve. Specifically, in the navigation chip socket test, when the multi-band signal passes through the socket, a series of response signals will be generated, which contain the transmission characteristics and performance of the socket at different frequencies. In order to more intuitively understand the information carried by these response signals, it is necessary to use equipment such as spectrum analyzers or digital signal processors to perform Fourier transform on the response signals and convert them from the time domain to the frequency domain, so that the signal strength, phase change and other parameters at each frequency point can be clearly seen. For example, when testing a chip socket for a car navigation system, technicians can input the collected response signal into the spectrum analysis software, and the software will automatically calculate and generate one or more frequency domain characteristic curves, which clearly show the amplitude and phase characteristics of the signal at different frequencies. By observing the frequency domain characteristic curve, it is easy to find which frequency regions have more serious signal attenuation or whether there is obvious noise interference, which is crucial for evaluating the electromagnetic compatibility (EMC) performance of the socket. In addition, the frequency domain characteristic curve can also help engineers identify potential design defects or manufacturing process problems, providing important data support for subsequent fault diagnosis and performance optimization.

[0024] Step S3, performing a performance evaluation on the electromagnetic compatibility of the socket based on the frequency domain characteristic curve to obtain an EMC performance score.

[0025] Specifically, the electromagnetic compatibility of the socket is evaluated based on the frequency domain characteristic curve to obtain an EMC performance score. This means that after obtaining the frequency domain characteristic curve, the detailed information provided by these curves is used in combination with the pre-set evaluation criteria and algorithms to comprehensively and quantitatively evaluate the electromagnetic compatibility of the navigation chip socket. In this process, the evaluation system will compare and analyze the key parameters such as signal strength, phase change, noise level, etc. reflected in the frequency domain characteristic curve with the ideal value or industry standard to determine the electromagnetic compatibility performance of the socket in different frequency ranges. For example, in the test scenario of the car navigation system, the technician can input the frequency domain characteristic curve into a special evaluation software, which has a built-in EMC performance evaluation model for the car navigation chip socket. By comparing the actual measured frequency domain characteristic curve with the preset standard curve, the software can automatically calculate the performance deviation at each frequency point, and then comprehensively consider the performance of all frequency points to give an overall EMC performance score. This score not only reflects the anti-interference ability and self-radiation level of the socket in the electromagnetic interference environment, but also reveals the deficiencies in the design and manufacturing process of the socket. If the score is lower than the preset qualified line, the system will further analyze which frequency bands have poor performance and provide specific improvement suggestions, such as adjusting the circuit layout, adding shielding measures or optimizing material selection, to improve the overall electromagnetic compatibility of the socket. In this way, it can not only ensure that the navigation chip has good electromagnetic compatibility in actual applications, but also promote the continuous optimization and improvement of product design.

[0026] Step S4, determining whether the EMC performance score is within a preset performance score range, and if not, performing a multi-dimensional evaluation on the electromagnetic compatibility of the socket using preset EMC performance indicators to obtain a multi-dimensional evaluation result.

[0027] Specifically, it is determined whether the EMC performance score is within the preset performance score range. If not, the electromagnetic compatibility of the socket is evaluated in multiple dimensions by using the preset EMC performance indicators to obtain the multi-dimensional evaluation results. This process is a key step to further ensure that the performance of the navigation chip socket meets the strict requirements after the preliminary electromagnetic compatibility evaluation of the navigation chip socket. Specifically, after obtaining the EMC performance score, the evaluation system will compare the score with the preset qualified score range. This preset range is usually based on industry standards, customer requirements, and product design specifications, covering the range from the lowest acceptable level to the optimal performance. If the evaluation results show that the EMC performance score of the socket falls within the qualified range, it can be considered that the socket has met the expected standards in terms of electromagnetic compatibility and can directly enter the next step of testing or production process. However, if the score is lower than the preset minimum qualified line, this indicates that there are certain problems with the electromagnetic compatibility of the socket and it cannot meet the use requirements. In this case, a more detailed multi-dimensional evaluation mechanism needs to be initiated. Multi-dimensional evaluation involves a more in-depth and comprehensive analysis of the electromagnetic compatibility of the socket. It is not just an evaluation of a single score, but an examination of the performance of the socket from multiple angles. For example, in a car navigation system, technicians will focus on the signal attenuation, anti-interference ability, radiation level and other aspects of the socket at different operating frequencies. The evaluation system will judge the electromagnetic compatibility of the socket one by one according to the preset EMC performance indicators, such as signal integrity, anti-interference threshold, radiation limit, etc. Each evaluation indicator corresponds to a specific test item and qualification standard. Through the test results of these items, a multi-dimensional evaluation result report can be formed. This report not only contains the specific score of each evaluation indicator, but also points out which aspects perform well, which aspects are insufficient, and the reasons for these deficiencies, such as design defects, improper material selection, and manufacturing process problems. Through this multi-dimensional evaluation method, more specific and targeted guidance can be provided for subsequent fault diagnosis and performance optimization. For example, if it is found during the evaluation process that the anti-interference ability of the socket is weak at a certain frequency, the technician can specifically check the design and manufacturing process of the frequency band, find the source of the problem, and take corresponding improvement measures, such as optimizing the circuit layout, using better shielding materials or adjusting the production process. In this way, not only can the current problems be effectively solved, but similar problems in the future can also be prevented, thereby comprehensively improving the electromagnetic compatibility of the navigation chip socket and ensuring its stability and reliability in complex electromagnetic environments.

[0028] Step S5, identifying the fault factors of the socket based on the multi-dimensional evaluation results to obtain a fault factor report.

[0029] Specifically, the fault factor of the socket is identified based on the multi-dimensional evaluation results to obtain a fault factor report. This process is to further analyze in depth after completing the multi-dimensional evaluation to determine the specific reasons for the poor electromagnetic compatibility of the socket. In the multi-dimensional evaluation stage, the performance of the socket has been evaluated in detail from multiple angles, including signal integrity, anti-interference ability, radiation level and other aspects, and the specific score and performance of each evaluation indicator have been obtained. Next, based on these evaluation results, it is possible to identify which factors have a negative impact on the electromagnetic compatibility of the socket. For example, in a car navigation system, assuming that the multi-dimensional evaluation shows that the anti-interference ability of the socket is weak at a certain frequency, the technician will further analyze the signal path, circuit layout, material selection, etc. of the frequency band to find out the specific problem. The reasons include: unreasonable signal path design, resulting in large attenuation during signal transmission; too dense wiring on the circuit board, which is easy to cause electromagnetic interference; the conductivity or shielding performance of the materials used is poor, and the external electromagnetic interference cannot be effectively isolated. By checking these potential fault factors one by one, the scope of the problem can be gradually narrowed, and the specific reasons for the performance degradation can be finally determined. After the fault factor is identified, a detailed fault factor report will be generated. This report not only lists the specific performance and impact of each fault factor, but also provides corresponding evidence and data support. For example, the report will include the changing trend of the frequency domain characteristic curve, the comparison chart of the signal strength, the material test results, etc., which can help engineers more intuitively understand the impact of the fault factor on the performance of the socket. In addition, the report will also recommend improvement measures, such as redesigning the signal path, optimizing the circuit layout, replacing materials, etc., to provide clear guidance for subsequent repair work. In this way, not only can the root cause of the electromagnetic compatibility problem of the socket be accurately identified, but also a scientific basis can be provided for subsequent performance optimization. For example, in a car navigation system, if the fault factor report indicates that the signal attenuation of the socket in the high frequency band is serious, mainly because the wiring on the circuit board is too dense, then the technician can consider redesigning the circuit layout, increasing the spacing between the signal lines, and reducing electromagnetic interference. Such improvement measures can significantly improve the electromagnetic compatibility of the socket and ensure the stability and reliability of the navigation chip in a complex electromagnetic environment.

[0030] Step S6: formulating a socket repair plan for the target navigation chip based on the fault factor report.

[0031] Specifically, a socket repair plan for the target navigation chip is formulated based on the fault factor report. This process first performs data mining on the fault factor report to obtain the statistical characteristics of the fault factors, including the frequency of occurrence and distribution characteristics. For example, in a car navigation system, data mining reveals that the socket has a higher frequency of signal distortion in the high-frequency band. Next, a cluster analysis is performed based on the statistical characteristics to obtain a category distribution map of fault factors, such as signal distortion and data loss. Then, an optimization analysis is performed based on the category distribution map, and suggestions for circuit layout adjustments and component selection are proposed, such as adding a shielding layer and optimizing the signal path. Finally, a detailed repair plan is formulated, including implementation steps, required tools, and expected results, to ensure that the electromagnetic compatibility of the navigation chip socket is improved.

[0032] In a specific embodiment, injecting a multi-band signal into a pin in a socket of a target navigation chip to obtain an initial response signal includes: Dynamically scanning the working frequency band of the target navigation chip through a preset adaptive spectrum analyzer to obtain a multi-band characteristic spectrum; Using a spectrum clustering algorithm, the multi-band characteristic spectrum is divided into frequency bands based on the multi-band characteristic spectrum to obtain a plurality of frequency band interval signals; wherein the plurality of frequency band interval signals include a high frequency band interval signal, a mid-frequency band interval signal and a low frequency band interval signal; The preset multi-frequency excitation signal generator performs signal excitation on each of the frequency band interval signals to obtain a multi-frequency excitation signal; Preprocessing the multi-frequency excitation signal to obtain a focused multi-frequency excitation signal; The focused multi-frequency excitation signal is positioned and injected into the pins in the socket of the target navigation chip by using a near-field probe array, and the signal of the pins in the socket is captured to obtain an initial response signal.

[0033] Specifically, first, the working frequency band of the target navigation chip is dynamically scanned by a preset adaptive spectrum analyzer, so as to fully understand the response characteristics of the chip at different frequencies. The adaptive spectrum analyzer is a device that can automatically adjust the scanning parameters according to the test requirements. It can quickly and accurately capture the signal changes of the chip in the entire working frequency band and generate a multi-band characteristic spectrum. For example, in the car navigation system, the navigation chip usually needs to work in multiple frequency bands of satellite navigation systems such as GPS and GLONASS. The adaptive spectrum analyzer can cover these frequency bands to ensure the comprehensiveness and accuracy of the test. Next, the multi-band characteristic spectrum is divided into frequency bands using the spectrum clustering algorithm to obtain multiple frequency band interval signals. The spectrum clustering algorithm is a classification method based on the similarity of signal characteristics. It can automatically divide the spectrum data into several sub-intervals according to the frequency interval, such as high frequency band interval signals, medium frequency band interval signals and low frequency band interval signals. This division method not only simplifies the subsequent signal processing steps, but also ensures that the signal characteristics in each frequency band interval are relatively consistent, which is convenient for more detailed analysis. For example, in a car navigation system, the high-frequency band interval signal corresponds to the GPS L1 band, the mid-frequency band interval signal corresponds to the GLONASS G1 band, and the low-frequency band interval signal corresponds to the auxiliary navigation signal band. Through this division, each frequency band interval can be tested in a targeted manner to improve the test efficiency and accuracy. Subsequently, the preset multi-frequency excitation signal generator excites each frequency band interval signal to generate a multi-frequency excitation signal. The multi-frequency excitation signal generator is a device that can generate multiple frequency signals. It can generate corresponding high-frequency band, mid-frequency band and low-frequency band excitation signals according to the division results of the frequency band interval. These excitation signals are carefully designed to cover the key frequency points in each frequency band interval to ensure the comprehensiveness and representativeness of the test signals. For example, in a car navigation system, the multi-frequency excitation signal generator will generate excitation signals covering the GPS L1, GLONASS G1 and auxiliary navigation signal bands, which will be injected into the pins in the socket of the navigation chip to test the response characteristics of the socket under these frequency bands. After generating the multi-frequency excitation signals, these signals need to be preprocessed to obtain focused multi-frequency excitation signals. The preprocessing step usually includes filtering, amplification, and modulation, with the goal of ensuring that the injected signal has sufficient strength and stability while reducing unnecessary interference. Focused multi-frequency excitation signals are preprocessed signals that have more concentrated energy in a specific frequency band and can more effectively stimulate the response of the socket. For example, in a car navigation system, the preprocessing step includes using a bandpass filter to remove noise from the signal, using a power amplifier to enhance the signal strength, and using modulation technology to optimize the signal waveform. Through these preprocessing operations, it can be ensured that the injected signal can accurately reflect the performance of the socket in different frequency bands.Finally, the near-field probe array is used to locate the focused multi-frequency excitation signal and inject it into the pins in the socket of the target navigation chip, and the signal of the pins in the socket is captured to obtain the initial response signal. The near-field probe array is a high-precision signal injection and capture device that can accurately apply and detect signals in a small space. Through the near-field probe array, the focused multi-frequency excitation signal can be accurately injected into each pin of the socket, and the response of the socket can be monitored in real time. For example, in the car navigation system, the near-field probe array can accurately locate each pin of the navigation chip socket, ensure that each pin can receive the predetermined excitation signal, and record the response signal of each pin. These initial response signals contain the transmission characteristics of the socket in different frequency bands, providing basic data for subsequent frequency domain analysis and performance evaluation. In summary, by injecting multi-band signals into the pins in the socket of the target navigation chip, the electromagnetic compatibility of the socket at different frequencies can be comprehensively and accurately evaluated. This process can not only reveal the performance of the socket in a specific frequency band, but also provide a scientific basis for subsequent fault diagnosis and performance optimization. For example, in a car navigation system, this series of test steps can ensure the stability and reliability of the navigation chip in a complex electromagnetic environment, providing users with more accurate and reliable navigation services.

[0034] In a specific embodiment, performing frequency domain analysis on the initial response signal to obtain a frequency domain characteristic curve includes: Performing a time-frequency joint analysis on the initial response signal by using a preset adaptive wavelet transform technology to obtain a time-frequency distribution diagram; Extracting the instantaneous frequency of the initial response signal based on the time-frequency distribution diagram to obtain an instantaneous frequency sequence; Performing multi-resolution singular spectrum analysis on the instantaneous frequency sequence to obtain a frequency component decomposition result; Probabilistic modeling is performed on the frequency distribution of the frequency component decomposition result by an adaptive kernel density estimation method to obtain a frequency probability density function; Performing multi-scale decomposition on the frequency probability density function to obtain a frequency domain feature vector; Extracting key feature points from the frequency domain feature vector to obtain key feature points; A frequency domain characteristic curve is drawn based on the key feature points; wherein the X-axis of the frequency domain characteristic curve represents the frequency, and the Y-axis of the frequency domain characteristic curve represents the amplitude.

[0035] Specifically, first, the initial response signal is subjected to a time-frequency joint analysis by a preset adaptive wavelet transform technology to obtain a time-frequency distribution diagram. Adaptive wavelet transform technology is a method that can simultaneously analyze the time domain and frequency domain characteristics of a signal. It can automatically adjust the wavelet basis function according to the characteristics of different frequency components, thereby more accurately capturing the time-frequency characteristics of the signal. In the car navigation system, the initial response signal of the navigation chip socket contains multiple frequency components. The adaptive wavelet transform technology can clearly display these components on the time-frequency plane to form a time-frequency distribution diagram. This diagram not only shows the frequency distribution of the signal at different time points, but also reveals the time-varying characteristics of the signal, providing a basis for subsequent analysis. Next, the instantaneous frequency of the initial response signal is extracted based on the time-frequency distribution diagram to obtain an instantaneous frequency sequence. Instantaneous frequency extraction is to extract the instantaneous frequency at each time point by analyzing the change of the frequency components in the time-frequency distribution diagram over time. The instantaneous frequency sequence can more intuitively display the frequency change of the signal at different time points, which helps to discover the non-stationary characteristics in the signal. For example, in a car navigation system, instantaneous frequency extraction can help identify the frequency response changes of the socket in different time periods, so as to judge the performance of the socket in a dynamic electromagnetic environment. Then, the instantaneous frequency sequence is subjected to multi-resolution singular spectrum analysis to obtain the frequency component decomposition result. Multi-resolution singular spectrum analysis is a method that can decompose the frequency components of a signal from multiple scales, which can reveal the energy distribution of the signal in different frequency ranges. Through multi-resolution singular spectrum analysis, the instantaneous frequency sequence can be decomposed into multiple frequency components, each component corresponding to a different frequency range. For example, in a car navigation system, multi-resolution singular spectrum analysis can decompose the response signal of the socket into low-frequency, medium-frequency and high-frequency components, so as to understand the performance of the socket in different frequency ranges in more detail. Then, the frequency distribution of the frequency component decomposition result is probabilistically modeled by an adaptive kernel density estimation method to obtain a frequency probability density function. The adaptive kernel density estimation method is a non-parametric probability density estimation method that can automatically adjust the width of the kernel function according to the distribution of the frequency components, so as to more accurately estimate the probability density of the frequency distribution. The frequency probability density function can intuitively display the distribution of the signal at different frequencies, providing a basis for subsequent feature extraction. For example, in a car navigation system, the frequency probability density function can show the distribution of the response strength of the socket at different frequencies, helping to identify which frequency ranges have stronger or weaker responses. Subsequently, the frequency probability density function is subjected to multi-scale decomposition to obtain a frequency domain feature vector. Multi-scale decomposition is a method that can extract signal features from different scales. It can decompose the frequency probability density function into feature vectors at multiple scales. These feature vectors contain the key features of the signal in different frequency ranges and can more comprehensively describe the frequency domain characteristics of the signal.For example, in a car navigation system, multi-scale decomposition can extract the feature vectors of the socket in the low frequency, medium frequency and high frequency ranges, so as to more comprehensively evaluate the electromagnetic compatibility of the socket. Finally, the frequency domain feature vector is subjected to key feature point extraction to obtain key feature points; these key feature points include but are not limited to peak points, valley points, inflection points and zero crossing points; the extraction methods include local maximum method, global maximum method and threshold method; and the frequency domain characteristic curve is drawn based on the key feature points. Key feature point extraction is to select the most representative feature points from the frequency domain feature vector, which can reflect the main characteristics of the signal at different frequencies. Through these key feature points, a frequency domain characteristic curve can be drawn, the X axis of which represents the frequency and the Y axis represents the amplitude. The frequency domain characteristic curve can intuitively show the response strength of the socket at different frequencies, providing an important basis for subsequent performance evaluation and fault diagnosis. For example, in a car navigation system, the frequency domain characteristic curve can clearly show the response of the socket in frequency bands such as GPS L1 and GLONASS G1, helping engineers quickly identify which frequency ranges have poor performance and take corresponding improvement measures. In summary, by performing frequency domain analysis on the initial response signal and obtaining the frequency domain characteristic curve, not only can the electromagnetic compatibility of the navigation chip socket at different frequencies be comprehensively and accurately evaluated, but also a scientific basis can be provided for subsequent performance optimization and fault diagnosis. The application of this method in the car navigation system can ensure the stability and reliability of the navigation chip in a complex electromagnetic environment, and provide users with more accurate and reliable navigation services.

[0036] In a specific embodiment, the electromagnetic compatibility of the socket is evaluated based on the frequency domain characteristic curve to obtain an EMC performance score, including: The nonlinear features of the frequency domain characteristic curve are extracted by wavelet entropy analysis technology to obtain an entropy feature vector; wherein the entropy feature vector includes a Shannon entropy vector, a Tsallis entropy vector and a Rényi entropy vector; Performing characteristic analysis on the initial response signal based on the entropy feature vector to obtain a fractal dimension sequence of the initial response signal; Using a multi-scale permutation entropy method, the fractal dimension sequence is quantified at multiple levels to obtain a multi-scale entropy value sequence; Recursive quantization analysis technology is used to reconstruct dynamic characteristics based on the multi-scale entropy value sequence to obtain phase space reconstruction parameters; wherein the phase space reconstruction parameters include embedding dimension, time delay and recursive threshold; Using the Lyapunov exponent calculation method, the socket is subjected to stability analysis based on the phase space reconstruction parameter to obtain a socket stability index; Through a fuzzy comprehensive evaluation method, a multi-criteria decision-making evaluation is performed on the electromagnetic compatibility of the socket based on the socket stability index to obtain an initial EMC performance index; wherein the initial EMC performance index includes an electromagnetic interference intensity index, an electromagnetic sensitivity index, an electromagnetic radiation level index and an electromagnetic immunity index; Performing nonlinear mapping on the initial EMC performance index to obtain a normalized EMC performance score; The normalized EMC performance score is weighted by a multi-objective optimization algorithm to obtain an EMC performance score.

[0037] Specifically, first, the nonlinear features of the frequency domain characteristic curve are extracted by wavelet entropy analysis technology to obtain an entropy feature vector. Wavelet entropy analysis technology is a method that can extract nonlinear features from a frequency domain characteristic curve, which can reveal the complexity of the signal at different frequencies. Entropy feature vectors include Shannon entropy vectors, Tsallis entropy vectors and Renyi entropy vectors, which can describe the uncertainty of the signal from multiple angles. For example, in a car navigation system, the nonlinear features of the socket at different frequencies can be extracted from the frequency domain characteristic curve by wavelet entropy analysis technology, providing a basis for subsequent characteristic analysis. Next, the initial response signal is characterized by analysis based on the entropy feature vector to obtain a fractal dimension sequence of the initial response signal. Fractal dimension is a parameter that describes the complexity of a signal. By analyzing the entropy feature vector, the fractal dimension of the initial response signal at different frequencies can be calculated. The fractal dimension sequence can reflect the self-similarity and complexity of the signal, and help to further understand the intrinsic characteristics of the signal. For example, in a car navigation system, the fractal dimension sequence can reveal the signal complexity of the socket at different frequencies, and help identify which frequency ranges have more complex signal changes. Then, a multi-scale permutation entropy method is used to perform multi-level characteristic quantization on the fractal dimension sequence to obtain a multi-scale entropy value sequence. The multi-scale permutation entropy method is a method that can quantify signal complexity from multiple scales, and it can reveal the dynamic characteristics of the signal at different time scales. Through the multi-scale permutation entropy method, the fractal dimension sequence can be decomposed into entropy values ​​at multiple scales, and each entropy value corresponds to a different time scale. For example, in a car navigation system, a multi-scale entropy value sequence can show the signal complexity of the socket at different time scales, and help identify which time scales have more significant signal changes. Subsequently, a recursive quantization analysis technique is used to reconstruct the dynamic characteristics based on the multi-scale entropy value sequence to obtain a phase space reconstruction parameter. Recursive quantization analysis technology is a method that can extract dynamic characteristics from a time series, and it can reveal the autocorrelation and periodicity of the signal. The phase space reconstruction parameters include embedding dimension, time delay and recursive threshold, which can describe the dynamic behavior of the signal in the phase space. For example, in a car navigation system, through recursive quantization analysis technology, the dynamic characteristics of the socket can be extracted from the multi-scale entropy value sequence, and the behavior pattern of the socket at different time scales can be identified. Next, the socket is analyzed for stability based on the phase space reconstruction parameters using the Lyapunov exponent calculation method to obtain a socket stability index. The Lyapunov exponent is a parameter that describes the stability of a system. By calculating the Lyapunov exponent, the stability of the socket at different frequencies and time scales can be evaluated. The socket stability index can reflect the anti-interference ability and stability of the socket in a complex electromagnetic environment.For example, in a car navigation system, the socket stability index can reveal the anti-interference ability and stability of the socket at different frequencies, and help evaluate the performance of the socket in practical applications. Then, through the fuzzy comprehensive evaluation method, the electromagnetic compatibility of the socket is evaluated by multi-criteria decision-making based on the socket stability index to obtain the initial EMC performance index. The fuzzy comprehensive evaluation method is a method that can comprehensively evaluate the performance of the system from multiple perspectives, and it can integrate multiple performance indicators into an overall evaluation result. The initial EMC performance indicators include electromagnetic interference intensity indicators, electromagnetic sensitivity indicators, electromagnetic radiation level indicators, and electromagnetic immunity indicators, which can comprehensively describe the performance of the socket in terms of electromagnetic compatibility. For example, in a car navigation system, through the fuzzy comprehensive evaluation method, the performance of the socket in terms of electromagnetic interference intensity, electromagnetic sensitivity, electromagnetic radiation level, and electromagnetic immunity can be comprehensively evaluated to obtain an overall initial EMC performance index. Next, the initial EMC performance index is nonlinearly mapped to obtain a normalized EMC performance score. Nonlinear mapping is a method that can convert multiple performance indicators into a unified score, which can eliminate the dimensional differences between different indicators and make the scores more comparable. The normalized EMC performance score can convert the initial EMC performance index into a value between 0 and 1, which is convenient for subsequent performance comparison and evaluation. For example, in a car navigation system, the initial EMC performance index can be converted into a normalized score through nonlinear mapping, which is convenient for engineers to quickly understand the electromagnetic compatibility performance of the socket. Finally, the normalized EMC performance score is weighted by a multi-objective optimization algorithm to obtain an EMC performance score. The multi-objective optimization algorithm is a method that can balance multiple performance indicators. It can weight different indicators according to actual needs to obtain a comprehensive performance score. The EMC performance score can fully reflect the comprehensive performance of the socket in electromagnetic compatibility and provide a basis for subsequent performance optimization and fault diagnosis. For example, in a car navigation system, through a multi-objective optimization algorithm, multiple indicators such as electromagnetic interference intensity, electromagnetic sensitivity, electromagnetic radiation level and electromagnetic immunity can be comprehensively considered to obtain a final EMC performance score, which helps engineers comprehensively evaluate the electromagnetic compatibility of the socket and take corresponding improvement measures. In summary, by performing multi-level performance evaluation on the frequency domain characteristic curve and obtaining the EMC performance score, not only can the electromagnetic compatibility of the navigation chip socket be evaluated comprehensively and accurately, but also a scientific basis can be provided for subsequent performance optimization and fault diagnosis. The application of this method in the car navigation system can ensure the stability and reliability of the navigation chip in a complex electromagnetic environment, and provide users with more accurate and reliable navigation services.

[0038] In a specific embodiment, the electromagnetic compatibility of the socket is evaluated in multiple dimensions by using preset EMC performance indicators to obtain a multi-dimensional evaluation result, including: Performing a preliminary evaluation on the electromagnetic compatibility of the socket by using the preset EMC performance index to obtain a preliminary evaluation result; wherein the preliminary evaluation result includes a normal position of the socket and an abnormal position of the socket; By using a high-order statistical analysis method, abnormal data mining is performed on the abnormal position of the socket to obtain abnormal statistical characteristic parameters; wherein the abnormal statistical characteristic parameters include mean, variance, skewness and kurtosis; Classify the abnormal statistical characteristic parameters to obtain cluster centers and category labels corresponding to the cluster centers; wherein the category labels include medium risk of electromagnetic compatibility and high risk of electromagnetic compatibility; Based on the cluster center and the category label corresponding to the cluster center, the fault coupling path of the socket is identified to obtain the fault coupling path; Performing a probability inference of a fault feature based on the fault coupling path to obtain a fault feature and a probability distribution corresponding to the fault feature; wherein the fault feature includes distortion of the initial response signal, loss of socket receiving data, and socket communication error; The fault characteristics and the probability distribution corresponding to the fault characteristics are visualized in multiple dimensions to obtain a multi-dimensional evaluation result; wherein the multi-dimensional evaluation result includes a spatial distribution map of the fault mode and a thermal map of the fault severity.

[0039] Specifically, first, the electromagnetic compatibility of the socket is preliminarily judged by the preset EMC performance index to obtain a preliminary judgment result. The preset EMC performance index includes electromagnetic interference intensity, electromagnetic sensitivity, electromagnetic radiation level and electromagnetic immunity, etc. These indicators can evaluate the electromagnetic compatibility of the socket from multiple angles. The preliminary judgment result divides the position of the socket into a normal position and an abnormal position. The normal position indicates that the electromagnetic compatibility of the socket at this position meets the standard, and the abnormal position indicates that the electromagnetic compatibility of the socket at this position has potential problems. For example, in a car navigation system, it can be determined through preliminary judgment which socket positions have good electromagnetic compatibility performance and which positions have potential risks. Next, through a high-order statistical analysis method, abnormal data mining is performed on the abnormal position of the socket to obtain abnormal statistical feature parameters. The high-order statistical analysis method can extract deeper statistical features from the response signal of the abnormal position. These feature parameters include mean, variance, skewness and kurtosis. The mean reflects the average value of the signal, the variance reflects the degree of fluctuation of the signal, the skewness reflects the asymmetry of the signal, and the kurtosis reflects the sharpness of the signal. Through these statistical characteristic parameters, the signal characteristics of the abnormal position can be described more accurately. For example, in the car navigation system, the high-order statistical analysis method can reveal the signal fluctuation and asymmetry of the socket at the abnormal position, helping to identify the potential source of faults. Then, the abnormal statistical characteristic parameters are classified into categories to obtain cluster centers and category labels corresponding to the cluster centers. Category classification is to divide the abnormal statistical characteristic parameters into different categories through clustering algorithms, and each category corresponds to a cluster center. The cluster center is a typical representative of the characteristic parameters in the category, and the category label describes the risk level of the category, including medium risk and high risk of electromagnetic compatibility. For example, in the car navigation system, the sockets at the abnormal position can be divided into medium risk and high risk categories through cluster analysis. The medium risk means that the electromagnetic compatibility of the socket has a certain degree of problem, but it has not reached a serious level; the high risk means that the electromagnetic compatibility of the socket has a serious problem and immediate measures need to be taken. Subsequently, the fault coupling path of the socket is identified based on the cluster center and the category label corresponding to the cluster center to obtain the fault coupling path. Fault coupling path identification is to determine how the fault propagates in the system by analyzing the relationship between the sockets at different positions. For example, in a car navigation system, if there is a high risk of electromagnetic compatibility in a certain socket, the fault coupling path identification can determine whether the fault of the socket will affect other sockets or system components, thereby helping engineers to fully understand the scope of the fault. Next, the fault feature probability inference is performed based on the fault coupling path to obtain the fault feature and the probability distribution corresponding to the fault feature. Fault feature probability inference is to predict the specific fault type and probability of occurrence of the socket through statistical methods. Fault features include distortion of the initial response signal, loss of socket received data, and socket communication errors.Through the probability distribution, we can understand the probability of occurrence of each fault, and provide a basis for subsequent fault diagnosis and repair. For example, in a car navigation system, if the probability of distortion of the initial response signal of a certain socket is high, the signal path and material selection of the socket can be checked first to solve the problem. Finally, the fault characteristics and the probability distribution corresponding to the fault characteristics are visualized in multiple dimensions to obtain multi-dimensional evaluation results. Multi-dimensional visualization is to intuitively display the fault characteristics and their probability distribution in the form of charts, helping engineers to quickly understand the fault situation. The multi-dimensional evaluation results include the spatial distribution map of the fault mode and the fault severity heat map. The spatial distribution map of the fault mode shows the fault type and distribution of the sockets at different locations, and the fault severity heat map indicates the severity of the fault by the depth of color. For example, in a car navigation system, the spatial distribution map of the fault mode can intuitively see which sockets have signal distortion problems, and the fault severity heat map can quickly identify high-risk areas, thereby providing clear guidance for subsequent fault repair. In summary, the process of performing multi-dimensional evaluation on the electromagnetic compatibility of the socket by presetting the EMC performance index and obtaining the multi-dimensional evaluation results can not only comprehensively and accurately evaluate the electromagnetic compatibility of the socket, but also identify specific fault factors, providing a scientific basis for subsequent fault diagnosis and performance optimization. The application of this method in the car navigation system can ensure the stability and reliability of the navigation chip in a complex electromagnetic environment, and provide users with more accurate and reliable navigation services.

[0040] In a specific embodiment, the identifying of the fault factor of the socket based on the multi-dimensional evaluation result to obtain a fault factor report includes: Using a support vector machine algorithm, based on the multi-dimensional evaluation results, fault features of the socket are extracted to obtain socket fault features; Classifying the socket fault characteristics to obtain a fault characteristic classification result; Performing dimensionality reduction processing on the fault feature classification result to obtain a principal component feature vector; Performing fault sequence analysis on the principal component eigenvector to obtain a fault sequence mode; wherein the fault sequence mode includes a time sequence of fault occurrence, a frequency of fault occurrence, a duration of the fault, and a time period of a fault interval; By using Markov random fields, fault factor identification and causal inference are performed based on the fault time series pattern to obtain the fault factor; Based on the fault factors, a fault factor report is obtained.

[0041] Specifically, first, the support vector machine algorithm is used to extract the fault features of the socket based on the multi-dimensional evaluation results to obtain the socket fault features. Support vector machine (SVM) is an efficient machine learning algorithm that can find the best classification boundary in high-dimensional data. Based on the multi-dimensional evaluation results, the support vector machine algorithm can extract key fault features from a large amount of fault data, and these features can reflect the abnormal performance of the socket at different positions and times. For example, in a car navigation system, the support vector machine algorithm can extract electromagnetic compatibility problems of the socket at different positions, such as signal distortion, data loss, etc., to form the socket fault features. Next, the socket fault features are classified to obtain fault feature classification results. Classification is to classify the extracted fault features according to different types for subsequent analysis and processing. The fault feature classification results can distinguish different types of fault features, providing a basis for subsequent dimensionality reduction processing and timing analysis. For example, in a car navigation system, the fault feature classification results can classify the fault features of the socket into different types such as signal distortion, data loss, and communication errors, and each type corresponds to different fault manifestations. Then, the fault feature classification result is subjected to dimensionality reduction processing to obtain the principal component feature vector. Dimensionality reduction processing is to reduce the high-dimensional fault feature data to a low-dimensional space through methods such as principal component analysis (PCA) to retain the most important feature information. The principal component feature vector can more concisely describe the main components of the fault feature, reduce data redundancy, and improve analysis efficiency. For example, in a car navigation system, the fault feature of the socket can be reduced to several principal components through principal component analysis, and each principal component represents a main fault feature direction, such as signal strength, data integrity, etc. Subsequently, the principal component feature vector is subjected to fault timing analysis to obtain a fault timing pattern. Fault timing analysis is to study the temporal variation law of fault features through time series analysis methods. Fault timing patterns include the time series of fault occurrence, the frequency of fault occurrence, the duration of fault, and the time period of fault interval. These timing patterns can reveal the dynamic characteristics of faults and help identify the occurrence law of faults. For example, in a car navigation system, fault timing analysis can reveal the fault performance of the socket in different time periods, such as frequent signal distortion in a certain time period and more data loss in another time period. Next, the Markov random field is used to identify the fault factors and perform causal inference based on the fault sequence pattern to obtain the fault factor. Markov random field (MRF) is a graphical model that can model the relationship between the various parts of a complex system. Through the Markov random field, the specific factors that cause the fault can be identified based on the fault sequence pattern, and causal inference can be performed to determine which factors are the root cause of the fault.For example, in a car navigation system, the Markov random field can reveal the failure mode of the socket in different time periods, such as signal distortion in a certain time period is caused by external electromagnetic interference, and data loss in another time period is caused by poor internal contact of the socket. Finally, based on the fault factor, a fault factor report is obtained. The fault factor report records in detail the specific causes of the socket failure, including the name, type, occurrence time and impact range of the fault factor. The fault factor report can not only help engineers quickly locate the source of the fault, but also provide a scientific basis for subsequent fault repair and performance optimization. For example, in a car navigation system, the fault factor report can point out that the signal distortion of a certain socket in the high frequency band is caused by external electromagnetic interference, and it is recommended to take additional shielding measures; the data loss of another socket is due to poor internal contact, and it is recommended to redesign the socket structure or replace the material. In summary, the process of identifying the fault factor of the socket based on the multi-dimensional evaluation results and obtaining the fault factor report can not only extract specific fault characteristics from multi-dimensional data, but also identify the root cause of the fault through advanced data analysis technology. The application of this method in the car navigation system can ensure the stability and reliability of the navigation chip in a complex electromagnetic environment, providing users with more accurate and reliable navigation services. Through this systematic fault factor identification method, the electromagnetic compatibility of the navigation chip socket can be significantly improved, ensuring the long-term stable operation of the navigation system.

[0042] In a specific embodiment, formulating a socket repair plan for the target navigation chip based on the fault factor report includes: Performing data mining on the fault factor report to obtain statistical characteristics of the fault factor; wherein the statistical characteristics of the fault factor are the occurrence frequency and distribution characteristics of the fault factor; Performing cluster analysis on the fault factors based on the statistical characteristics to obtain a category distribution diagram of the fault factors; wherein the category distribution diagram includes fault classification factors and associated features of the fault classification factors; Based on the category distribution diagram of the fault factors, the socket of the target navigation chip is optimized and analyzed to obtain an optimized design scheme; wherein the optimized design scheme includes circuit layout adjustment of the target navigation chip and selection suggestions for components of the target navigation chip; A socket repair plan for the target navigation chip is formulated based on the optimized design plan.

[0043] Specifically, first, data mining is performed on the fault factor report to obtain the statistical characteristics of the fault factor. Data mining technology can extract useful information from a large number of fault factor reports, including the frequency and distribution characteristics of the fault factors. Through data mining, it is possible to understand which fault factors occur more frequently and which fault factors are more common in a specific location or time period. For example, in a car navigation system, data mining can reveal that the frequency of signal distortion of the socket in the high frequency band is higher, while the data loss in the low frequency band is less. Next, cluster analysis is performed on the fault factors based on the statistical characteristics to obtain a category distribution map of the fault factors. Cluster analysis is a method that can classify similar fault factors into the same category. Through cluster analysis, a category distribution map of the fault factors can be obtained. The category distribution map not only shows the fault factors of different categories, but also reveals the associated characteristics of these fault factors. For example, in a car navigation system, cluster analysis can classify the fault factors of the socket into three categories: signal distortion, data loss, and communication error. The associated characteristics of each type of fault factor include external electromagnetic interference, poor internal contact, and circuit design defects. Then, the socket of the target navigation chip is optimized and analyzed based on the category distribution diagram of the fault factors to obtain an optimized design scheme. The optimization analysis is to propose specific optimization measures by comprehensively considering the influence of various fault factors. The optimized design scheme includes the circuit layout adjustment of the target navigation chip and the selection suggestions of components. The circuit layout adjustment involves measures such as redesigning the signal path, adding a shielding layer, and optimizing the wiring to reduce electromagnetic interference and signal attenuation. The selection suggestions of components include selecting higher performance materials, replacing more stable components, etc. to improve the electromagnetic compatibility of the socket. For example, in a car navigation system, the optimized design scheme can suggest adding a shielding layer in the high frequency band to reduce external electromagnetic interference; optimizing the signal path in the low frequency band to reduce signal attenuation. Finally, a socket repair scheme for the target navigation chip is formulated based on the optimized design scheme. The repair scheme is to concretize the optimized design scheme and form a set of detailed implementation steps and suggestions. The repair scheme should not only include specific circuit layout adjustments and component selection suggestions, but also include the order of implementation, required tools and materials, and expected improvement effects. For example, in a car navigation system, the repair plan can detail how to add a shielding layer in the high frequency band, including the materials used, installation methods, and expected anti-interference effects; how to optimize the signal path in the low frequency band, including specific wiring adjustments and expected signal improvement effects. In summary, the process of formulating a socket repair plan for the target navigation chip based on the fault factor report can not only extract key information from the fault factor report, but also formulate a specific repair plan through data analysis and optimized design to ensure that the electromagnetic compatibility of the navigation chip socket meets the expected standards.The application of this method in the car navigation system can ensure the stability and reliability of the navigation chip in a complex electromagnetic environment, providing users with more accurate and reliable navigation services. Through this systematic repair plan formulation method, the electromagnetic compatibility of the navigation chip socket can be significantly improved, ensuring the long-term stable operation of the navigation system.

[0044] The above describes the socket test method of the navigation chip in the embodiment of the present invention. The following describes the socket test system of the navigation chip in the embodiment of the present invention. Figure 2 , an embodiment of the socket test system of the navigation chip in the embodiment of the present invention includes: The injection module 21 is used to inject a multi-band signal into the pins in the socket of the target navigation chip to obtain an initial response signal; An analysis module 22, configured to perform frequency domain analysis on the initial response signal to obtain a frequency domain characteristic curve; An evaluation module 23, configured to perform a performance evaluation on the electromagnetic compatibility of the socket based on the frequency domain characteristic curve to obtain an EMC performance score; The judging module 24 is used to judge whether the EMC performance score is within a preset performance score range. If not, a multi-dimensional judgment is performed on the electromagnetic compatibility of the socket by using preset EMC performance indicators to obtain a multi-dimensional judgment result. An identification module 25, configured to identify the fault factor of the socket based on the multi-dimensional evaluation result and obtain a fault factor report; The repair module 26 is used to formulate a socket repair plan for the target navigation chip based on the fault factor report.

[0045] In this embodiment, for the specific implementation of each unit in the above system embodiment, please refer to the above method embodiment, which will not be repeated here.

[0046] Reference Figure 3 The present invention also provides a computer device in an embodiment, wherein the internal structure of the computer device can be as follows: Figure 3 As shown. The computer device includes a processor, a memory, a display screen, an input device, a network interface and a database connected through a system bus. Among them, the processor designed by the computer is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program and a database. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The database of the computer device is used to store the corresponding data in this embodiment. The network interface of the computer device is used to communicate with an external terminal through a network connection. When the computer program is executed by the processor, the above method is implemented.

[0047] Those skilled in the art will understand that Figure 3 The structure shown in the figure is merely a block diagram of a portion of the structure related to the solution of the present invention, and does not constitute a limitation on the computer device to which the solution of the present invention is applied.

[0048] An embodiment of the present invention further provides a computer-readable storage medium on which a computer program is stored, and when the computer program is executed by a processor, the above method is implemented. It can be understood that the computer-readable storage medium in this embodiment can be a volatile readable storage medium or a non-volatile readable storage medium.

[0049] Those skilled in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be completed by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to memory, storage, database or other media provided by the present invention and used in the embodiments may include non-volatile and / or volatile memory. Non-volatile memory may include read-only memory (ROM), programmable ROM (PROM), electrically programmable ROM (EPROM), electrically erasable programmable ROM (EEPROM) or flash memory. Volatile memory may include random access memory (RAM) or external cache memory. As an illustration and not limitation, RAM is available in a variety of forms, such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), double-speed data rate SDRAM (SSRSDRAM), enhanced SDRAM (ESDRAM), synchronous link (Synchlink) DRAM (SLDRAM), memory bus (Rambus) direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and memory bus dynamic RAM.

[0050] It should be noted that, in this article, the terms "include", "comprises" or any other variations thereof are intended to cover non-exclusive inclusion, so that a process, device, article or method including a series of elements includes not only those elements, but also includes other elements not explicitly listed, or also includes elements inherent to such process, device, article or method. In the absence of further restrictions, an element defined by the sentence "includes a ..." does not exclude the presence of other identical elements in the process, device, article or method including the element.

[0051] The above description is only a preferred embodiment of the present invention, and does not limit the patent scope of the present invention. Any equivalent structure or equivalent process transformation made by using the contents of the present invention specification and drawings, or directly or indirectly applied in other related technical fields, are also included in the patent protection scope of the present invention.

Claims

1. A socket testing method for a navigation chip, characterized in that: The following steps are involved: Inject multi-band signals into the pins in the socket of the target navigation chip to obtain an initial response signal; Performing frequency domain analysis on the initial response signal to obtain a frequency domain characteristic curve; Performing a performance evaluation on the electromagnetic compatibility of the socket based on the frequency domain characteristic curve to obtain an EMC performance score; Determine whether the EMC performance score is within a preset performance score range. If not, perform a multi-dimensional evaluation on the electromagnetic compatibility of the socket using preset EMC performance indicators to obtain a multi-dimensional evaluation result. Based on the multi-dimensional evaluation results, fault factors of the socket are identified to obtain a fault factor report; A socket repair plan for the target navigation chip is formulated based on the fault factor report.

2. The socket testing method of the navigation chip according to claim 1, characterized in that: The step of injecting a multi-band signal into the pins in the socket of the target navigation chip to obtain an initial response signal includes: Dynamically scanning the working frequency band of the target navigation chip through a preset adaptive spectrum analyzer to obtain a multi-band characteristic spectrum; Using a spectrum clustering algorithm, the multi-band characteristic spectrum is divided into frequency bands based on the multi-band characteristic spectrum to obtain a plurality of frequency band interval signals; wherein the plurality of frequency band interval signals include a high frequency band interval signal, a mid-frequency band interval signal and a low frequency band interval signal; The preset multi-frequency excitation signal generator performs signal excitation on each of the frequency band interval signals to obtain a multi-frequency excitation signal; Preprocessing the multi-frequency excitation signal to obtain a focused multi-frequency excitation signal; The focused multi-frequency excitation signal is located and injected into the pins in the socket of the target navigation chip by using a near-field probe array, and the signal of the pins in the socket is captured to obtain an initial response signal.

3. The socket testing method of the navigation chip according to claim 1, characterized in that: The performing frequency domain analysis on the initial response signal to obtain a frequency domain characteristic curve includes: Performing a time-frequency joint analysis on the initial response signal by using a preset adaptive wavelet transform technology to obtain a time-frequency distribution diagram; Extracting the instantaneous frequency of the initial response signal based on the time-frequency distribution diagram to obtain an instantaneous frequency sequence; Performing multi-resolution singular spectrum analysis on the instantaneous frequency sequence to obtain a frequency component decomposition result; Probabilistic modeling is performed on the frequency distribution of the frequency component decomposition result by an adaptive kernel density estimation method to obtain a frequency probability density function; Performing multi-scale decomposition on the frequency probability density function to obtain a frequency domain feature vector; Extracting key feature points from the frequency domain feature vector to obtain key feature points; A frequency domain characteristic curve is drawn based on the key feature points; wherein the X-axis of the frequency domain characteristic curve represents the frequency, and the Y-axis of the frequency domain characteristic curve represents the amplitude.

4. The socket testing method of the navigation chip according to claim 1, characterized in that: The electromagnetic compatibility of the socket is evaluated based on the frequency domain characteristic curve to obtain an EMC performance score, including: The nonlinear features of the frequency domain characteristic curve are extracted by wavelet entropy analysis technology to obtain an entropy feature vector; wherein the entropy feature vector includes a Shannon entropy vector, a Tsallis entropy vector and a Rényi entropy vector; Performing characteristic analysis on the initial response signal based on the entropy feature vector to obtain a fractal dimension sequence of the initial response signal; Using a multi-scale permutation entropy method, the fractal dimension sequence is quantified at multiple levels to obtain a multi-scale entropy value sequence; Reconstructing dynamic characteristics based on the multi-scale entropy value sequence through recursive quantization analysis technology to obtain phase space reconstruction parameters; wherein the phase space reconstruction parameters include embedding dimension, time delay and recursive threshold; Using the Lyapunov exponent calculation method, the socket is subjected to stability analysis based on the phase space reconstruction parameter to obtain a socket stability index; Through a fuzzy comprehensive evaluation method, a multi-criteria decision-making evaluation is performed on the electromagnetic compatibility of the socket based on the socket stability index to obtain an initial EMC performance index; wherein the initial EMC performance index includes an electromagnetic interference intensity index, an electromagnetic sensitivity index, an electromagnetic radiation level index and an electromagnetic immunity index; Performing nonlinear mapping on the initial EMC performance index to obtain a normalized EMC performance score; The normalized EMC performance score is weighted by a multi-objective optimization algorithm to obtain an EMC performance score.

5. The socket testing method of the navigation chip according to claim 1, characterized in that: The electromagnetic compatibility of the socket is evaluated in multiple dimensions by using preset EMC performance indicators to obtain a multi-dimensional evaluation result, including: Performing a preliminary evaluation on the electromagnetic compatibility of the socket by using the preset EMC performance index to obtain a preliminary evaluation result; wherein the preliminary evaluation result includes a normal position of the socket and an abnormal position of the socket; By using a high-order statistical analysis method, abnormal data mining is performed on the abnormal position of the socket to obtain abnormal statistical characteristic parameters; wherein the abnormal statistical characteristic parameters include mean, variance, skewness and kurtosis; Classify the abnormal statistical characteristic parameters to obtain cluster centers and category labels corresponding to the cluster centers; wherein the category labels include medium risk of electromagnetic compatibility and high risk of electromagnetic compatibility; Based on the cluster center and the category label corresponding to the cluster center, the fault coupling path of the socket is identified to obtain the fault coupling path; Performing a fault feature probability inference based on the fault coupling path to obtain a fault feature and a probability distribution corresponding to the fault feature; wherein the fault feature includes a distortion of the initial response signal, a loss of socket receiving data, and a socket communication error; The fault characteristics and the probability distribution corresponding to the fault characteristics are visualized in multiple dimensions to obtain a multi-dimensional evaluation result; wherein the multi-dimensional evaluation result includes a spatial distribution map of the fault mode and a thermal map of the fault severity.

6. The socket testing method of the navigation chip according to claim 5, characterized in that: The step of identifying the fault factor of the socket based on the multi-dimensional evaluation result to obtain a fault factor report includes: Using a support vector machine algorithm, based on the multi-dimensional evaluation results, fault features of the socket are extracted to obtain socket fault features; Classifying the socket fault characteristics to obtain a fault characteristic classification result; Performing dimensionality reduction processing on the fault feature classification result to obtain a principal component feature vector; Performing fault sequence analysis on the principal component eigenvector to obtain a fault sequence mode; wherein the fault sequence mode includes a time sequence of fault occurrence, a frequency of fault occurrence, a duration of the fault, and a time period of a fault interval; By using Markov random fields, fault factor identification and causal inference are performed based on the fault time series pattern to obtain the fault factor; Based on the fault factors, a fault factor report is obtained.

7. The socket testing method of the navigation chip according to claim 1, characterized in that: Formulate a socket repair plan for the target navigation chip based on the fault factor report, including: Performing data mining on the fault factor report to obtain statistical characteristics of the fault factor; wherein the statistical characteristics of the fault factor are the occurrence frequency and distribution characteristics of the fault factor; Performing cluster analysis on the fault factors based on the statistical characteristics to obtain a category distribution diagram of the fault factors; wherein the category distribution diagram includes fault classification factors and associated features of the fault classification factors; Based on the category distribution diagram of the fault factors, the socket of the target navigation chip is optimized and analyzed to obtain an optimized design scheme; wherein the optimized design scheme includes circuit layout adjustment of the target navigation chip and selection suggestions for components of the target navigation chip; A socket repair plan for the target navigation chip is formulated based on the optimized design plan.

8. A socket test device for a navigation chip, characterized in that: include: An injection module is used to inject multi-band signals into the pins in the socket of the target navigation chip to obtain an initial response signal; An analysis module, used for performing frequency domain analysis on the initial response signal to obtain a frequency domain characteristic curve; An evaluation module, used to perform a performance evaluation on the electromagnetic compatibility of the socket based on the frequency domain characteristic curve to obtain an EMC performance score; An evaluation module is used to determine whether the EMC performance score is within a preset performance score range. If not, a multi-dimensional evaluation is performed on the electromagnetic compatibility of the socket through preset EMC performance indicators to obtain a multi-dimensional evaluation result. An identification module, used to identify the fault factor of the socket based on the multi-dimensional evaluation result and obtain a fault factor report; A repair module is used to formulate a socket repair plan for the target navigation chip based on the fault factor report.

9. A computer device comprising a memory and a processor, wherein a computer program is stored in the memory, wherein: When the processor executes the computer program, the steps of the method according to any one of claims 1 to 7 are implemented.

10. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 7 are implemented.

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