Rack and equipment for testing circuit board

Abstract

The utility model provides a rack and equipment for testing a circuit board, the rack is made of marble materials, the marble materials enable the rack to be high in hardness and large in mass, the stability of the rack in the circuit board testing process is guaranteed, vibration generated in the equipment operation process is prevented, meanwhile, the rack is large in density and low in water absorption, and the service life of the rack is prolonged. The circuit board testing device has the advantages that the circuit board testing device can adapt to the humid environment, the rack has heat conductivity and heat resistance, heat can be evenly dispersed, the situation that movement of an object to be tested and detection of the testing device are affected due to deformation caused by heating expansion or water absorption expansion of the rack is avoided, the circuit board testing precision is guaranteed, and the circuit board testing device is suitable for circuit board testing operation.

Description

Technical Field

[0001] The utility model relates to the field of circuit board testing, and more specifically to a rack and equipment used for circuit board testing. Background Art

[0002] In the field of circuit board testing, the rack is a frame structure that supports and connects machines and equipment, and its performance directly or indirectly affects the test results. Existing circuit board testing equipment usually uses castings to build the rack, but castings have poor stability and heat resistance, and are easily deformed by heat, moisture or vibration during circuit board testing, affecting the overall structural stability of the circuit board testing equipment, and thus affecting the test results of the circuit board. It is not suitable for high-precision circuit board testing operations. Utility Model Content

[0003] The purpose of the utility model is to overcome the defects of the prior art and provide a rack and equipment for circuit board testing to solve the technical problems of poor structural stability and inaccurate test results of the existing circuit board testing equipment.

[0004] In order to achieve the above purpose, the utility model adopts the following technical solutions:

[0005] In a first aspect, an embodiment of the present invention provides a rack for testing a circuit board, comprising:

[0006] A base, a column and an arch; the base is arranged horizontally, and the column is fixedly connected to the top of the base; the arch spans the column and is fixedly connected to the top of the base; the column is used to install and guide the fixture of the object to be tested to move under the arch or away from the arch, and the arch is used to install the test device; the base, the column and the arch are all made of marble.

[0007] Among them, the top and bottom of the base are set flat; the bottom of the column and the bottom of the arch are set flat; the connection surface between the column and the fixture of the object to be tested is set flat; the connection surface between the arch and the test device is set flat.

[0008] Among them, the flatness of the top and bottom of the base is 0.01mm; the flatness of the bottom of the column and the bottom of the arch is 0.01mm; the flatness of the connection surface between the column and the fixture of the object to be tested is 0.01mm; the flatness of the connection surface between the arch and the test device is 0.01mm.

[0009] Wherein, the arch comprises: a crossbeam and two side columns; the two side columns are respectively located on both sides of the column, and the two ends of the crossbeam are respectively fixedly connected to the two side columns.

[0010] Among them, a mounting hole is provided at the top of the side column, and a bonding hole corresponding to the mounting hole is provided at the bottom of the crossbeam. A stud is passed through the mounting hole, and both ends of the stud are respectively bonded to the mounting hole and the bonding hole; the inner walls of the mounting hole and the bonding hole are friction surfaces, and the friction surfaces are frosted surfaces or friction surfaces with a textured structure.

[0011] The columns and the arches are provided with a plurality of connection holes, the connection holes are used to install the fixture of the object to be tested and the test device, the inner wall of the connection hole is a friction surface, and the friction surface is a frosted surface or a friction surface with a texture structure.

[0012] There are two columns, which are symmetrically distributed along the horizontal center axis of the base, and are located between the arch and the base.

[0013] In a second aspect, an embodiment of the present invention provides an apparatus for testing a circuit board, comprising: a testing device, a fixture for an object to be tested, and the above-mentioned rack for testing a circuit board; the testing device is fixedly connected to the arch and is disposed between the arch and the base; the fixture for the object to be tested is connected to the column, and is used to clamp and drive the object to be tested to approach or move away from the testing device.

[0014] Wherein, the object to be tested fixture includes: an X-axis moving mechanism, a Y-axis moving mechanism and a clamping plate mechanism; the Y-axis moving mechanism extends from one end of the column away from the test device to the other end, and is fixedly connected to the top of the column; the X-axis moving mechanism is horizontally arranged, the X-axis moving mechanism is connected to the movable end of the Y-axis moving mechanism, and is arranged perpendicular to the Y-axis moving mechanism; the clamping plate mechanism is connected to the movable end of the X-axis moving mechanism; the X-axis moving mechanism is used to drive the clamping plate mechanism to move in the X-axis direction, and the Y-axis moving mechanism is used to drive the X-axis moving mechanism to move in the Y-axis direction, and the movement accuracy of the X-axis moving mechanism and the Y-axis moving mechanism is 1μm.

[0015] Among them, the testing device includes: an upper jig and a lower jig; the upper jig is connected to the arch, the lower jig is connected to the top of the base, and is arranged opposite to the upper jig; the upper jig and the lower jig are used to fix and detect the object to be tested, and the upper jig and / or the lower jig are provided with a probe.

[0016] Compared with the prior art, the utility model has the following beneficial effects: the frame of the utility model is made of marble material, and the marble material makes the frame high in hardness and large in mass, thereby ensuring the stability of the frame during circuit board testing and preventing vibration during equipment operation. At the same time, the frame has high density and low water absorption, and can adapt to humid environments. The frame also has thermal conductivity and heat resistance, and can evenly disperse heat, thereby avoiding deformation of the frame due to thermal expansion or water absorption expansion, which affects the movement of the object to be tested and the detection of the test device, thereby ensuring the accuracy of circuit board testing and making the circuit board testing equipment suitable for circuit board testing operations.

[0017] The above description is only an overview of the technical solution of the utility model. In order to more clearly understand the technical means of the utility model, it can be implemented in accordance with the contents of the specification. In order to make the above and other purposes, features and advantages of the utility model more obvious and easy to understand, the following preferred embodiments are specifically cited and described in detail as follows. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 A schematic diagram of the front structure of a device for testing a circuit board provided by the utility model;

[0019] Figure 2 A schematic diagram of the side structure of a device for testing a circuit board provided by the utility model;

[0020] Figure 3 A schematic diagram of the overall structure of a rack for circuit board testing provided by the utility model;

[0021] Figure 4 A schematic diagram of the structure of an arch of a rack for circuit board testing provided by the utility model;

[0022] Figure 5 A schematic diagram of an exploded structure of an arch of a rack for circuit board testing provided by the utility model;

[0023] Figure 6 A schematic diagram of the structure of a testing device for circuit board testing provided by the utility model;

[0024] Figure 7 A schematic diagram of the structure of an upper fixture of a device for testing a circuit board provided by the utility model;

[0025] Figure 8 A schematic diagram of the structure of a fixture for an object to be tested of a device for testing a circuit board provided by the utility model;

[0026] Fig. 9 for Figure 8 A schematic diagram of the structure at A;

[0027] Fig.10 A schematic diagram of the structure of a clamping mechanism of a device for testing a circuit board provided by the utility model;

[0028] Fig.11 A schematic diagram of an exploded structure of a clamping assembly of a device for testing a circuit board provided by the utility model;

[0029] Fig.12 A schematic diagram of the structure of a baffle of a device for testing a circuit board provided by the utility model;

[0030] Fig.13 The utility model provides a schematic structural diagram of a code scanning device for circuit board testing equipment.

[0031] Reference numerals:

[0032] 1. Frame; 11. Base; 12. Column; 13. Arch; 131. Beam; 1311. Horizontal part; 1312. Inclined part; 1313. Support part; 132. Side column; 1321. Vertical part; 1322. Step part; 14. Mounting hole; 15. Adhesive hole; 16. Ventilation hole; 17. Connecting hole;

[0033] 2. Upper fixture; 21. Upper fixed plate; 22. Adjustment mechanism; 221. Horizontal moving assembly; 2211. Horizontal driving member; 2212. Horizontal guide rail; 2213. Horizontal slider; 2214. Horizontal moving plate; 222. Horizontal fine-tuning assembly; 2221. Horizontal fine-tuning driving member; 2222. Horizontal fine-tuning plate; 223. Rotary fine-tuning assembly; 23. Adjustment plate; 24. Upper lifting mechanism; 25. Upper lifting plate; 26. Upper positioning plate; 27. Upper positioning drive cylinder;

[0034] 3. Lower fixture; 31. Lower fixing plate; 32. Rotary fine-tuning mechanism; 33. Lower lifting mechanism; 34. Lower lifting plate; 35. Lower positioning plate; 36. Lower positioning drive cylinder;

[0035] 4. X-axis moving mechanism; 41. X-axis guide rail; 42. X-axis slider; 43. X-axis driving member;

[0036] 5. Y-axis moving mechanism; 51. moving top plate; 52. Y-axis guide rail; 53. Y-axis slider; 54. Y-axis driving member;

[0037] 6. Clamping mechanism; 61. Bottom frame; 611. Material trough; 62. Driving assembly; 621. Clamping driving motor; 622. Double-headed screw; 623. Driving wheel; 624. Driven wheel; 625. Synchronous belt; 63. Clamping assembly; 631. Telescopic driving member; 632. Baffle; 633. Pressing plate; 634. Pad; 635. Clamping bottom plate; 636. Clamping top plate; 637. Protective cover; 638. Connecting ear; 639. Support block;

[0038] 7. Scanning device; 71. Bracket; 72. CCD detection component; 721. CCD detector; 722. LED light; 73. CCD code scanning component. DETAILED DESCRIPTION

[0039] In order to make the purpose, technical solution and advantages of the utility model clearer, the utility model is further described in detail in conjunction with the accompanying drawings and specific implementation methods. The technical solution in the embodiment of the utility model will be clearly and completely described in conjunction with the accompanying drawings in the embodiment of the utility model. Obviously, the described embodiment is a part of the embodiment of the utility model, not all of the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.

[0040] It should be understood that when used in this specification and the appended claims, the terms "include" and "comprises" indicate the presence of described features, integers, steps, operations, elements and / or components, but do not exclude the presence or addition of one or more other features, integers, steps, operations, elements, components and / or combinations thereof.

[0041] It should also be understood that the terms used in this utility model specification are only for the purpose of describing specific embodiments and are not intended to limit the utility model. As used in this utility model specification and the appended claims, unless the context clearly indicates otherwise, the singular forms "a", "an" and "the" are intended to include plural forms.

[0042] Example 1, see Figure 3-5 As shown, this embodiment discloses a rack 1 for circuit board testing, which includes: a base 11, a column 12 and an arch 13; the base 11 is horizontally arranged, and the column 12 is fixedly connected to the top of the base 11; the arch 13 spans the column 12 and is fixedly connected to the top of the base 11; the column 12 is used to install and guide the fixture of the object to be tested to move to the bottom of the arch 13 or away from the arch 13, and the arch 13 is used to install the test device; the base 11, the column 12 and the arch 13 are all made of marble.

[0043] Marble has rigidity, stability and vibration reduction properties, so that the rack 1 made of marble has high hardness and large mass, which ensures the stability of the rack 1 during the circuit board test and prevents vibration during the operation of the equipment; and marble has the characteristics of high density and low water absorption, so that the rack 1 can remain dry in a humid environment. At the same time, marble also has thermal conductivity and heat resistance, and can evenly disperse heat, avoiding the deformation of the rack 1 due to thermal expansion or water absorption expansion, which affects the movement of the object to be tested and the detection of the detection device, ensuring the accuracy of the circuit board test, and making the circuit board test equipment suitable for circuit board testing operations.

[0044] The object to be tested is a circuit board, and the rack 1 for circuit board testing is used in circuit board testing equipment.

[0045] In one embodiment, the top and bottom of the base 11 are flat; the bottom of the column 12 and the bottom of the arch 13 are flat; the connection surface between the column 12 and the fixture of the object to be tested is flat; and the connection surface between the arch 13 and the testing device is flat. The bottom and top of the base 11 are flat, which ensures the verticality and flatness of the column 12 and the arch 13. The connection surface between the column 12 and the fixture of the object to be tested can be one or more surfaces of the top and side walls of the column 12. The flat connection surface between the column 12 and the fixture of the object to be tested helps the fixture of the object to be tested to drive the object to be tested to move smoothly, which is conducive to the high-precision movement of the object to be tested; the connection surface between the arch 13 and the testing device can be one or more surfaces of the top and side walls of the arch 13. The flat connection surface between the arch 13 and the testing device helps the testing device to move smoothly, which is conducive to the high-precision detection of the object to be tested.

[0046] In one embodiment, the top and bottom of the base 11 have a flatness of 0.01 mm; the bottom of the column 12 and the bottom of the arch 13 have a flatness of 0.01 mm; the connection surface of the column 12 and the fixture of the object to be tested has a flatness of 0.01 mm; the connection surface of the arch 13 and the test device has a flatness of 0.01 mm. The flatness of the corresponding connection surface reaches 0.01 mm, making the marble surface smooth, which is conducive to high-precision detection of the object to be tested; and the marble is wear-resistant and is not prone to defects even after long-term use, which ensures the service life of the rack 1 and the test equipment.

[0047] In this embodiment, the outer surface of the arch 13 is flat, and the flatness of the outer surfaces of the base 11, the column 12 and the arch 13 is 0.01 mm. It is understandable that in other embodiments, according to actual needs, the surface other than the connection surface between the column 12 and the fixture of the object to be tested can be rough or textured, and the surface other than the connection surface between the arch 13 and the test device can be rough or textured.

[0048] In this embodiment, the base 11 and the column 12 are rectangular parallelepiped structures, and the outer surfaces of the base 11 and the column 12 are flat. The rectangular parallelepiped structure is symmetrical and balanced, and has greater stability; the rectangular parallelepiped structure is conducive to the layout of the column 12 and the arch 13, helps to improve space utilization, and is suitable for assembly line operations. In other embodiments, according to actual needs, a regular hexagon, a terrace or other structure can be used to replace the rectangular parallelepiped structure.

[0049] In this embodiment, the column 12 extends from one end of the base 11 to the bottom of the arch 13. It is convenient for the object to be tested to be loaded and unloaded from the end of the column 12 away from the arch 13, and to be tested under the arch 13, thereby improving the convenience of loading and unloading the object to be tested and the space utilization rate. It is understandable that in other embodiments, the end of the column 12 away from the arch 13 can be set in the middle of the base 11 or other positions.

[0050] In one embodiment, the top of the base 11 is provided with a plurality of mounting holes 14, and the bottoms of the columns 12 and the arches 13 are provided with bonding holes 15 corresponding to the mounting holes 14. Bolts are passed through the mounting holes 14, and one end of the bolts is bonded to the mounting holes 14 through marble adhesive, and the other end of the bolts is bonded to the bonding holes 15 through marble adhesive. By providing the mounting holes 14 on the base 11, and the bonding holes 15 on the columns 12 and the arches 13, the bolts are limited, and marble adhesive is added to the mounting holes 14 and the bonding holes 15, so that the marble adhesive is fully in contact with the bolts, the mounting holes 14 or the bonding holes 15, and after the marble adhesive is cured, the bolts are firmly connected to the mounting holes 14 and the bonding holes 15, thereby ensuring the stability of the connection between the columns 12 and the arches 13 and the base 11.

[0051] In one embodiment, a plurality of mounting grooves are provided on the top of the base 11, and the plurality of mounting grooves are symmetrically distributed along the horizontal central axis of the base 11. The provision of the mounting grooves facilitates storage of wires and installation of exhaust fans, while saving marble materials and reducing the production cost of the base 11. The symmetrically distributed plurality of mounting grooves ensures the balance of the base 11.

[0052] In one embodiment, the arch 13 includes: a crossbeam 131 and two side columns 132; the two side columns 132 are respectively located on both sides of the column 12, and the two ends of the crossbeam 131 are respectively fixedly connected to the two side columns 132. The crossbeam 131 and the side columns 132 are separately arranged, so that the crossbeam 131 and the side columns 132 can be manufactured, handled and transported separately, which greatly reduces the difficulty of manufacturing, handling and transportation, and the side columns 132 and the crossbeam 131 are independent of each other, which is convenient for disassembly and assembly of the arch 13, and replacement of the crossbeam 131 or the side columns 132.

[0053] In one embodiment, the top of the side column 132 is provided with a mounting hole 14, the bottom of the cross beam 131 is provided with a bonding hole 15 corresponding to the mounting hole 14, a stud is inserted into the mounting hole 14, and both ends of the stud are respectively bonded to the mounting hole 14 and the bonding hole 15. The mounting hole 14 and the bonding hole 15 limit the position of the bolt, and marble adhesive is added to the mounting hole 14 and the bonding hole 15 so that the marble adhesive is in full contact with the bolt, the mounting hole 14 or the bonding hole 15. After the marble adhesive is cured, the bolt is firmly connected with the mounting hole 14 and the bonding hole 15, thereby ensuring the stability of the side column 132 and the cross beam 131.

[0054] In one embodiment, the crossbeam 131 includes: a horizontal portion 1311, two inclined portions 1312 and two supporting portions 1313; the two supporting portions 1313 are respectively fixedly connected to the two side columns 132, the two inclined portions 1312 are respectively fixedly connected to the two supporting portions 1313, and the two ends of the horizontal portion 1311 are respectively fixedly connected to one end of the two inclined portions 1312 away from the supporting portions 1313; the two supporting portions 1313, the two inclined portions 1312 and the horizontal portion 1311 form an arch structure. When the arch structure is subjected to a load, the internal stress can be evenly distributed to enhance the stability of the arch 13 structure, thereby ensuring the service life of the arch 13 and the connection stability of the test device.

[0055] In one embodiment, the side column 132 includes: a vertical portion 1321 and two step portions 1322; the two step portions 1322 are symmetrically arranged in the vertical direction and are respectively fixedly connected to the top of the base 11 and the bottom of the beam 131, and the two ends of the vertical portion 1321 are respectively fixedly connected to the two step portions 1322. The vertical portion 1321 and the two step portions 1322 make the side column 132 evenly stressed, avoid the side column 132 from being broken or bent due to long-term use, and facilitate stable support of the beam 131.

[0056] In one embodiment, the side pillars 132 and the uprights 12 are both transversely penetrated with a plurality of ventilation holes 16. The provision of the ventilation holes 16 is conducive to reducing the material used for the side pillars 132 and the uprights 12, saving the production cost of the rack 1, while improving the ventilation and heat dissipation effect during the test process of the object under test.

[0057] In one embodiment, there are two columns 12, which are symmetrically distributed along the horizontal central axis of the base 11, and the two columns 12 are located between the arch 13 and the base 11; there are two fixtures for the object to be tested, which are mirror-imaged and respectively connected to the two columns 12. Both ends of the fixture for the object to be tested can be respectively connected to the two columns 12, so that it can slide smoothly under the support of the two columns 12; the two fixtures for the object to be tested can also be respectively installed on the two columns 12, so that when one fixture for the object to be tested is moved under the detection device for the object to be tested for detection, the loading and unloading operation of the object to be tested is performed on the other fixture for the object to be tested, which greatly improves the efficiency of the detection of the object to be tested.

[0058] In one embodiment, the column 12 and the arch 13 are provided with a plurality of connection holes 17, and the connection holes 17 are used to install the fixture of the object to be tested and the test device. In actual application, the threaded holes of the fixture of the object to be tested or the test device are aligned with the connection holes 17, and the connection holes 17 are filled with marble adhesive and screws are inserted to complete the installation of the fixture of the object to be tested or the test device.

[0059] In one embodiment, the inner walls of the mounting hole 14, the bonding hole 15 and the connecting hole 17 are all friction surfaces; the friction surface is a frosted surface or a friction surface with a texture structure. The frosted surface and the texture structure both have protrusions and grooves, which facilitate the marble adhesive to be embedded in the friction surface, increase the friction between the marble adhesive and the mounting hole 14, the bonding hole 15 or the connecting hole 17, and improve the bonding stability of the marble adhesive and the connecting hole 17.

[0060] For example 2, please refer to Figure 1-2 The equipment for high-precision testing of circuit boards in this embodiment includes: a test device, a fixture for the object to be tested, and a rack 1 for high-precision testing of circuit boards as described in Example 1; the test device is fixedly connected to the arch 13 and is arranged between the arch 13 and the base 11; the fixture for the object to be tested is connected to the column 12 and is used to drive the object to be tested to approach or move away from the test device. The test device is used to test the solder joints, capacitance, inductance, short circuit, open circuit and other problems of the circuit board to detect the function and quality of the circuit board. The test device and the fixture for the object to be tested are connected to the rack 1, so that the connection between the fixture for the object to be tested and the test device is more stable, and the movement of the object to be tested is more stable, thereby ensuring the accuracy of the test results.

[0061] See also Figure 8-12The fixture of the object to be tested includes: an X-axis moving mechanism 4, a Y-axis moving mechanism 5 and a clamping plate mechanism 6; the Y-axis moving mechanism 5 extends from one end of the column 12 away from the test device to the other end, and is fixedly connected to the top of the column 12; the X-axis moving mechanism 4 is horizontally arranged, the X-axis moving mechanism 4 is connected to the movable end of the Y-axis moving mechanism 5, and is arranged perpendicular to the Y-axis moving mechanism 5; the clamping plate mechanism 6 is connected to the movable end of the X-axis moving mechanism 4; the X-axis moving mechanism 4 is used to drive the clamping plate mechanism 6 to move in the X-axis direction, and the Y-axis moving mechanism 5 is used to drive the X-axis moving mechanism 4 to move in the Y-axis direction. The clamping plate mechanism 6 is used to clamp the object to be tested, and the transmission directions of the X-axis moving mechanism 4 and the Y-axis moving mechanism 5 are perpendicular to each other, so that the clamping plate mechanism 6 moves in the X-axis and Y-axis directions to move to the test device for circuit board testing, or leave the test device for loading and unloading operations.

[0062] In this embodiment, the number of the DUT fixtures corresponds to the number of the columns, and the DUT fixtures are arranged corresponding to the columns. Two DUT fixtures are respectively installed on two columns 12, so that when one DUT fixture is moved under the test device to test the circuit board, the other DUT fixture is used to load and unload the DUT, which greatly improves the efficiency of DUT detection.

[0063] In one embodiment, the movement accuracy of the X-axis moving mechanism 4 and the Y-axis moving mechanism 5 is 1 μm. The X-axis moving mechanism 4 and the Y-axis moving mechanism 5 enable the clamping mechanism 6 to move 1 μm each time, which greatly improves the movement accuracy of the object under test, thereby ensuring the accuracy of the test of the object under test.

[0064] In one embodiment, the Y-axis moving mechanism 5 includes: a moving top plate 51, a Y-axis guide rail 52, a Y-axis slider 53 and a Y-axis driving member 54; the Y-axis guide rail 52 extends from one end of the column 12 away from the test device to the other end, and is fixedly connected to the top of the column 12; the Y-axis slider 53 is slidably connected to the Y-axis guide rail 52; the moving top plate 51 is fixedly connected to the output end of the Y-axis slider 53 and the Y-axis driving member 54; the Y-axis driving member 54 is used to drive the moving top plate 51 to move along the Y-axis guide rail 52; the X-axis moving mechanism 4 includes: an X-axis guide rail 41, an X-axis slider 42 and an X-axis driving member 43; the X-axis guide rail 41 is fixedly connected to the moving top plate 51; the X-axis slider 42 is slidably connected to the X-axis guide rail 41; and the clamping mechanism 6 is fixedly connected to the output end of the X-axis slider 42 and the X-axis driving member 43. The X-axis moving mechanism 4 and the Y-axis moving mechanism 5 respectively horizontally position the clamping mechanism 6, so as to flexibly control the horizontal position of the clamping mechanism 6.

[0065] In the present embodiment, the number of the X-axis guide rails 41 and the Y-axis guide rails 52 are both two, the two X-axis guide rails 41 are parallel to each other and symmetrically arranged, and the two Y-axis guide rails 52 are parallel to each other and symmetrically arranged; the X-axis driving member 43 and the Y-axis driving member 54 are both linear motors, the X-axis driving member 43 is located between the two X-axis guide rails 41, and the Y-axis driving member 54 is located between the two Y-axis guide rails 52. The linear motor is small in size and thin in thickness, can directly drive the load, has high positioning accuracy, and does not require a mechanical transmission system, thereby improving the transmission efficiency, and can greatly reduce the noise and vibration during operation, thereby improving the stability of the circuit board testing equipment, and facilitating high-precision testing of the object to be tested. It can be understood that in other embodiments, the number of the X-axis guide rails 41 or the Y-axis guide rails 52 can be adjusted according to actual needs, and a cylinder or a motor screw combination can also be used to replace the linear motor.

[0066] In one embodiment, the clamping mechanism 6 includes: a bottom frame 61, a driving assembly 62 and two clamping assemblies 63; the bottom frame 61 is connected to the X-axis moving mechanism 4; the bottom frame 61 is provided with a material trough 611, and the material trough 611 is vertically arranged through the bottom frame 61; the two clamping assemblies 63 are symmetrically distributed along the horizontal central axis of the material trough 611, and are movably connected to the bottom frame 61; the driving assembly 62 is connected to the bottom frame 61, and is used to drive the two clamping assemblies 63 to move closer to or away from each other. The two clamping assemblies 63 clamp the two ends of the object to be tested respectively, and the material trough 611 facilitates the loading and unloading of the object to be tested, while avoiding blocking the upper surface or lower surface of the object to be tested, so that the upper surface and the lower surface of the object to be tested can be detected simultaneously.

[0067] In one embodiment, the driving assembly 62 includes: a splint driving motor 621, two double-ended screw rods 622, a driving wheel 623, a driven wheel 624 and a synchronous belt 625; the two double-ended screw rods 622 are arranged in a mirror image, the double-ended screw rods 622 and the clamping assembly 63 are arranged perpendicular to each other, and the two double-ended screw rods 622 and the two clamping assemblies 63 form a square structure; one end of a double-ended screw rod 622 is fixedly connected to the output end of the splint driving motor 621, the driving wheel 623 and the driven wheel 624 are correspondingly arranged, and are respectively sleeved and fixedly connected to the two double-ended screw rods 622; the synchronous belt 625 is sleeved on the driving wheel 623 and the driven wheel 624, and the driving wheel 623 and the driven wheel 624 are meshed with the synchronous belt 625; the two ends of the clamping assembly 63 are respectively connected to the two double-ended screw rods 622. The double-headed screw rod 622 is provided with two nuts which are distributed in a mirror image. The two nuts are respectively connected to the two clamping assemblies 63 , thereby ensuring the horizontality of the clamping assemblies 63 and improving the structural stability of the clamping mechanism 6 .

[0068] In one embodiment, the clamping assembly 63 includes: a telescopic driving member 631, a baffle 632, a pressure plate 633, a pad 634, a tension spring (not shown), and a clamping bottom plate 635; the clamping bottom plate 635 is located in the material trough 611 and is connected to the driving assembly 62; the pad 634 is fixedly connected to the top of the clamping bottom plate 635 on one side close to the horizontal central axis of the material trough 611; the baffle 632 and the pressure plate 633 are arranged perpendicular to each other, and the baffle 632 is located on the pad 634 close to the telescopic driving member 63 1 and is located at the top of the clamping base plate 635, the pressing plate 633 is fixedly connected to one end of the baffle 632 away from the clamping base plate 635, and a guiding inclined surface is formed between the baffle 632 and the pressing plate 633; ​​the telescopic driving member 631 is connected to the side of the top of the clamping base plate 635 away from the pad 634, and the baffle 632 is hinged to the output end of the telescopic driving member 631; one end of the tension spring is connected to the middle or top of the baffle 632, and the other end is connected to the side of the top of the clamping base plate 635 away from the pad 634. When the telescopic driving member 631 is in the retracted state, the tension spring pulls the baffle 632, causing the baffle 632 to tilt, and the pressure plate 633 is away from the pad 634 and is in a tilted state, which is convenient for the unloading device or the staff to take out the object to be tested from between the pressure plate 633 and the pad 634, and the object to be tested can also be placed between the pressure plate 633 and the pad through the loading device or the staff; when the telescopic driving member 631 is in the extended state, the baffle 632 is pushed to the top of the guiding slope and contacts the side wall of the pad 634. Under the continued push of the telescopic driving member 631, the guiding slope gradually climbs to the top of the pad 634 until the baffle 632 is vertical. At this time, the pressure plate 633 is in a horizontal state, pressing the object to be tested between the pressure plate 633 and the pad 634 to facilitate the movement and detection of the object to be tested.

[0069] In one embodiment, the clamping mechanism 6 further includes: a clamping top plate 636, a protective cover 637, two connecting ears 638 and a plurality of support blocks 639. The plurality of support blocks 639 are fixedly connected to the top of the supporting bottom plate, the clamping top plate 636 is fixedly connected to the top of the support block 639, and the protective cover 637 is fixedly connected to the top of the clamping top plate 636; the telescopic driving member 631, the baffle 632, the pressure plate 633, the pad 634 and the tension spring are all located between the clamping top plate 636 and the clamping bottom plate 635; the two ends of the clamping top plate 636 are respectively connected to the two double-headed screw rods 622 through the two connecting ears 638. The clamping bottom plate 635 is connected to the driving assembly 62 through the support block 639, the clamping top plate 636 and the connecting ears 638, and the two ends of the clamping top plate 636 are respectively connected to the two double-headed screw rods 622, so that the clamping mechanism 6 is more stable, which is convenient for the object to be measured to keep horizontal, and improves the clamping stability of the object to be measured. The protective cover 637 is used to prevent the structure between the clamping top plate 636 and the clamping bottom plate 635 from being damaged, thereby increasing the service life of the clamping mechanism 6.

[0070] See also Fig.13, and also includes: a scanning device 7; the scanning device 7 is fixedly connected to the frame 1; the scanning device 7 includes: a bracket 71, two groups of CCD detection components 72 and a CCD code scanning component 73; the bracket 71 and the arch 13 are arranged parallel to each other, located between the arch 13 and the end of the column 12 away from the test device, the bottom of the bracket 71 is fixedly connected to the top of the base 11, and the top of the bracket 71 is fixedly connected to the arch 13; the two groups of CCD detection components 72 are symmetrically arranged, and are respectively fixedly connected to the bracket 71 and the base 11; the CCD code scanning component 73 is fixedly connected to the bracket 71. The CCD detection component 72 is used to collect images of the object to be tested, so as to capture the number and position of the solder joints and components of the object to be tested, so as to facilitate the test device to adjust its position to perform contact detection on the solder joints or components; the CCD code scanning component 73 is used to scan and identify the barcode or QR code on the object to be tested, so as to obtain the sequence, batch, model and other information of the object to be tested.

[0071] In one embodiment, the CCD detection assembly 72 includes: two CCD detectors 721 and two LED lights 722; the two CCD detectors 721 are fixedly connected to the bracket 71 and are symmetrically arranged along the horizontal central axis of the base 11; the LED light 722 is arranged at one end of the CCD detector 721 close to the fixture of the object to be tested. The two CCD detectors 721 can detect the object to be tested at the same time, which greatly improves the detection efficiency.

[0072] See also Figure 6-7 , the test device includes: an upper fixture 2 and a lower fixture 3; the upper fixture 2 is connected to the arch 13, the lower fixture 3 is connected to the top of the base 11, and is arranged opposite to the upper fixture 2; the upper fixture 2 and the lower fixture 3 are respectively used to fix and detect the object to be tested, and the upper fixture 2 and / or the lower fixture 3 are provided with probes (not shown); the upper fixture 2 is fixedly connected to the bottom of the horizontal portion 1311. In actual application, after the object to be tested fixture drives the object to be tested to move between the upper fixture 2 and the lower fixture 3, the upper fixture 2 and the lower fixture 3 approach each other and press the clamping mechanism 6 from the upper and lower sides of the clamping mechanism 6 to fix the object to be tested, and contact the solder joints of the IC chip or circuit board components through the probe to test the IC chip or circuit board components. The setting of the upper fixture 2 and the lower fixture 3 can test the upper surface and the lower surface of the object to be tested at the same time, which greatly improves the test efficiency of the object to be tested.

[0073] In one embodiment, the upper fixture 2 includes: an upper fixed plate 21, an adjustment mechanism 22, an adjustment plate 23, an upper lifting mechanism 24 and an upper lifting plate 25; the upper fixed plate 21 is fixedly connected to the arch 13; the adjustment mechanism 22 is connected to the bottom of the upper fixed plate 21, and is used to drive the adjustment plate 23 to move horizontally; the top of the adjustment plate 23 is connected to the movable end of the adjustment mechanism 22; the upper lifting mechanism 24 is connected to the adjustment plate 23, and is used to drive the upper lifting plate 25 to rotate or move horizontally; the upper lifting plate 25 is connected to the movable end of the upper lifting mechanism 24, and is used to install and drive the probe to approach or move away from the lower fixture 3. The upper lifting plate 25 is used to install a probe that contacts the object to be tested. When the position angle of the probe needs to be adjusted, the adjustment mechanism 22 drives the adjustment plate 23 to move horizontally to adjust the horizontal position and angle, the adjustment plate 23 drives the upper lifting mechanism 24 to move, and the upper lifting mechanism 24 drives the upper lifting plate 25 to move, so as to ensure that the probe corresponds to the welding point of the object to be tested.

[0074] In one embodiment, the upper fixture 2 further includes: an upper positioning plate 26 and an upper positioning drive cylinder 27; the upper positioning drive cylinder 27 is connected to the upper lifting plate 25, and the upper positioning plate 26 is fixedly connected to the output end of the upper positioning drive cylinder 27 and is located at the bottom of the upper lifting plate 25. The upper positioning drive cylinder 27 is used to drive the upper positioning plate 26 away from or close to the lower fixture 3 to loosen or clamp the clamping assembly 63, thereby ensuring that the position of the object under test remains unchanged during the test process, thereby ensuring the accuracy of the test.

[0075] In one embodiment, the adjustment mechanism 22 includes: a horizontal moving component 221, a horizontal fine-tuning component 222 and a rotation fine-tuning component 223; the horizontal moving component 221 and the horizontal fine-tuning component 222 are perpendicular to each other, the transmission direction of the horizontal moving component 221 and the transmission direction of the horizontal fine-tuning component 222 are perpendicular to each other, and the transmission direction of the horizontal moving component 221 and the transmission direction of the X-axis moving mechanism 4 are parallel to each other; the horizontal moving component 221 includes: a horizontal driving member 2211, a horizontal guide rail 2212, a horizontal slider 2213 and a horizontal moving plate 2214; the horizontal guide rail 2212 is fixedly connected to the bottom of the upper fixed plate 21, and the horizontal slider 2213 is slidably connected On the horizontal guide rail 2212, the horizontal moving plate 2214 is fixedly connected to the horizontal slider 2213, and the horizontal driving member 2211 drives the horizontal moving plate 2214 to move along the horizontal guide rail 2212; the horizontal fine-tuning assembly 222 includes: a horizontal fine-tuning driving member 2221, a horizontal fine-tuning guide rail (not marked in the figure), a horizontal fine-tuning slider (not marked in the figure) and a horizontal fine-tuning plate 2222; the horizontal fine-tuning guide rail is fixedly connected to the bottom of the horizontal moving plate 2214, the horizontal fine-tuning slider is slidably connected to the horizontal fine-tuning guide rail, the horizontal fine-tuning plate 2222 is fixedly connected to the horizontal fine-tuning slider, and the horizontal fine-tuning driving member 2221 drives the horizontal fine-tuning plate 2222 to move along the horizontal fine-tuning guide rail. The lifting mechanism, the horizontal moving assembly 221, the horizontal fine-tuning assembly 222 and the rotating fine-tuning assembly 223 enable the upper plate to flexibly and accurately adjust the horizontal and vertical positions, so as to facilitate high-precision detection of the object to be tested.

[0076] In one embodiment, the movement accuracy of the horizontal moving component 221 and the horizontal fine adjustment component 222 is 1 μm. The horizontal moving component 221 and the horizontal fine adjustment component 222 enable the horizontal moving plate 2214 and the horizontal fine adjustment plate 2222 to move by 1 μm each time, which greatly improves the movement accuracy of the upper lifting mechanism 24, thereby ensuring the accuracy of the test of the object under test.

[0077] In one embodiment, the lower fixture 3 includes: a lower fixed plate 31, a rotation fine-tuning mechanism 32, a lower lifting mechanism 33 and a lower lifting plate 34; the lower fixed plate 31 is fixedly connected to the top of the base 11; the lower lifting mechanism 33 is connected to the lower fixed plate 31, and is used to drive the lower lifting plate 34 to perform a lifting action; the rotation fine-tuning mechanism 32 is fixedly connected to the lower fixed plate 31, and is used to drive the lower lifting mechanism 33 to rotate. The upper lifting mechanism 24, the lower lifting mechanism 33, the rotation fine-tuning mechanism 32, and the rotation fine-tuning assembly 223 are prior arts, so they are not described in detail here.

[0078] In one embodiment, the lower fixture 3 further includes: a lower positioning plate 35 and a lower positioning drive cylinder 36; the lower positioning drive cylinder 36 is connected to the lower lifting plate 34, and the lower positioning plate 35 is fixedly connected to the output end of the lower positioning drive cylinder 36 and is located on the top of the lower lifting plate 34. The lower positioning drive cylinder 36 is used to drive the lower positioning plate 35 away from or close to the upper fixture 2 to loosen or clamp the clamping assembly 63, thereby ensuring that the position of the object under test remains unchanged during the test process, thereby ensuring the accuracy of the test.

[0079] A rack and equipment for circuit board testing in the present embodiment are made of marble material. The marble material makes the rack hard and heavy, which ensures the stability of the rack during the circuit board testing process and prevents vibration during the operation of the equipment. At the same time, the rack has high density and low water absorption, which can adapt to humid environments. The rack has thermal conductivity and heat resistance, which can evenly disperse heat, and avoids deformation of the rack due to thermal expansion or water absorption expansion, which affects the movement of the object to be tested and the detection of the test device, ensures the accuracy of the circuit board testing, and makes the circuit board testing equipment suitable for circuit board testing operations. By arranging columns and arches on the base, the connection between the fixture of the object to be tested and the test device is more stable, and the movement of the object to be tested is more stable, which improves the accuracy of the detection result.

[0080] The above examples are only used to further illustrate the technical content of the utility model, so that readers can understand it more easily, but it does not mean that the implementation methods of the utility model are limited to this. Any technical extension or re-creation made based on the utility model is protected by the utility model. The protection scope of the utility model shall be based on the claims.

Claims

1. A rack for circuit board testing, characterized in that: include: bases, columns and arches; The base is arranged horizontally, and the column is fixedly connected to the top of the base; The arch spans across the column and is fixedly connected to the top of the base; the column is used to install and guide the fixture of the object to be tested to move under the arch or away from the arch, and the arch is used to install a testing device; the base, the column and the arch are all made of marble.

2. The rack for circuit board testing according to claim 1, characterized in that: The top and bottom of the base are flat; the bottom of the column and the bottom of the arch are flat; the connection surface between the column and the fixture of the object to be tested is flat; the connection surface between the arch and the test device is flat.

3. The rack for circuit board testing according to claim 2, characterized in that: The flatness of the top and bottom of the base is 0.01mm; the flatness of the bottom of the column and the bottom of the arch is 0.01mm; the flatness of the connection surface between the column and the fixture of the object to be tested is 0.01mm; the flatness of the connection surface between the arch and the test device is 0.01mm.

4. The rack for circuit board testing according to claim 1, characterized in that: The arch comprises: a crossbeam and two side columns; the two side columns are respectively located on both sides of the column, and the two ends of the crossbeam are respectively fixedly connected to the two side columns.

5. The rack for circuit board testing according to claim 4, characterized in that: A mounting hole is provided at the top of the side column, and a bonding hole corresponding to the mounting hole is provided at the bottom of the crossbeam. A stud is passed through the mounting hole, and both ends of the stud are respectively bonded to the mounting hole and the bonding hole; the inner walls of the mounting hole and the bonding hole are friction surfaces, and the friction surfaces are frosted surfaces or friction surfaces with a textured structure.

6. The rack for circuit board testing according to claim 1, characterized in that: The columns and the arches are provided with a plurality of connection holes, the connection holes are used to install the fixture of the object to be tested and the testing device, the inner wall of the connection hole is a friction surface, and the friction surface is a frosted surface or a friction surface with a texture structure.

7. The rack for circuit board testing according to claim 1, characterized in that: The number of the columns is two, and the two columns are symmetrically distributed along the horizontal central axis of the base, and the two columns are located between the arch and the base.

8. A device for testing a circuit board, characterized in that: include: A testing device, a fixture for an object to be tested, and a rack for testing a circuit board as claimed in any one of claims 1 to 7; The testing device is fixedly connected to the arch and is disposed between the arch and the base; the object-to-be-tested fixture is connected to the column and is used to clamp and drive the object-to-be-tested to approach or move away from the testing device.

9. The device for testing a circuit board according to claim 8, characterized in that: The object to be tested fixture comprises: an X-axis moving mechanism, a Y-axis moving mechanism and a clamping plate mechanism; the Y-axis moving mechanism extends from one end of the column away from the test device to the other end, and is fixedly connected to the top of the column; the X-axis moving mechanism is horizontally arranged, the X-axis moving mechanism is connected to the movable end of the Y-axis moving mechanism, and is arranged perpendicular to the Y-axis moving mechanism; the clamping plate mechanism is connected to the movable end of the X-axis moving mechanism; the X-axis moving mechanism is used to drive the clamping plate mechanism to move in the X-axis direction, and the Y-axis moving mechanism is used to drive the X-axis moving mechanism to move in the Y-axis direction, and the movement accuracy of the X-axis moving mechanism and the Y-axis moving mechanism is 1μm.

10. The device for testing a circuit board according to claim 8, characterized in that: The testing device comprises: an upper jig and a lower jig; the upper jig is connected to the arch, the lower jig is connected to the top of the base and is arranged opposite to the upper jig; the upper jig and the lower jig are used to fix and detect the object to be tested, and the upper jig and / or the lower jig are provided with a probe.

Images