1results about How to "Rich environment" patented technology

The application provides a kind of fast recovery diode operating reliability test method and system, it is related to circuit test technical field, the method comprises: fast recovery diode is set on experiment table, setting test environment parameter, and setting the frequency data of test power supply;Further setting test power supply, and the test voltage data of test resistance both ends is acquired, further determines reliability variation index, and determines reliability test result according to the reliability variation index of multiple test periods.According to the application, the test authenticity and accuracy can be improved by simulating complex working conditions through periodically changing test environment parameters, and the reference value of test results can be improved.Based on the dynamic adjustment of test environment, the workload of fast recovery diode is improved, and the test accuracy is improved.The reliability variation index of each test period can also be calculated to accurately know the performance change and reliability decline range of fast recovery diode, which provides an important basis for determining the reliability of fast recovery diode.