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Novel method for detecting alignment of visual camera

A technology of alignment detection and detection method, which is applied in the direction of measuring devices, measuring instruments, surveying and navigation, etc., can solve the problems that the mechanical positioning accuracy cannot meet the requirements of customers, and achieve the effect of improving competitive advantage, convenient use and low cost

Inactive Publication Date: 2012-01-11
上海功源电子科技有限公司
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Problems solved by technology

However, with the continuous development of technology, higher requirements are put forward for marking technology in some high-tech and high-precision industries. The pure mechanical positioning accuracy can no longer meet the requirements of customers. The CCA detection system is for extremely small (micro) The application of laser marking of high-end packages came into being

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  • Novel method for detecting alignment of visual camera
  • Novel method for detecting alignment of visual camera
  • Novel method for detecting alignment of visual camera

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Embodiment Construction

[0025] The present invention will be described in detail below in conjunction with accompanying drawing and specific implementation

[0026] Application one:

[0027] A. After the laser marks a product, send it to the CCA inspection system;

[0028] B. The CCA detection system requires two CCD cameras as a group. The two CCD cameras are installed on both sides of the blank, and the two CCD cameras are aimed at the product at the same time, so that the two CCD cameras are on the same center line. , and ensure that the software compensation installation accuracy of the two CCD cameras is <+ / -1~3um. CCD-1 collects and detects the center point of the marking pattern from the front, and CCD-2 collects and detects the center point of the product from the back according to the pins.

[0029] C. The CCA system PC calculates the offset of the marking pattern by comparing the central point of the marking pattern collected by the CCD-1 and the central point of the material sheet collec...

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Abstract

The invention relates to a charge coupled device (CCD) calibration alignment (CCA) detection system, which belongs to an internationally and domestically original CCA detection method. In the system, the center of a CCD camera detection product and the center of a marked pattern are mainly used for transmitting detection data to a personal computer (PC); software of the CCA detection system is used for computing the potential difference between the detection product and the marked pattern and recording a corresponding detection result, so that the aim of position detection is fulfilled; and the system can be connected with a laser controller in an expandable way so as to automatically compensate and calibrate a marking potential difference. Compared with the conventional detection technology, the method has the advantages of low cost, convenience of use, high accuracy and the like; most lasers on the market are supported, and the competitive advantages of domestic lasers with oversea lasers can be greatly improved; and the system can be arranged on a common machine platform subsequently, so that possibilities of product upgrading and application upgrading are provided for customers.

Description

technical field [0001] The present invention is an application of a new type of CCD detection method. The name is CCA-assisted alignment detection system (CCD Calibration Alignment, hereinafter referred to as CCA). Integration in the detection technology field. [0002] It uses the CCD camera to correct the determined pattern and mark, compares the characteristic value of the pattern to be detected, and transmits the detection image result to the computer PC of the CCA detection system, and uses the CCA auxiliary alignment detection system software to calculate the position of the two patterns offset, and output in a confirmed data format. [0003] The open data format can be edited in multiple formats according to the characteristics of subsequent processing. For example: It can be output to the calibration of the marking position parameters of the laser semiconductor matrix strip, so that the laser can adjust a single marking position, and improve the quality and accuracy ...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/00G01B11/02G01C15/00
Inventor 卢冬青
Owner 上海功源电子科技有限公司