A device and method for measuring the uniformity of an infrared radiation surface

Abstract

The invention discloses a uniformity measurement device for an infrared radiation surface. The device comprises a high-resolution small light spot sampling and imaging optical system, an infrared detector, a preamplifier, a band-pass filter, a main amplifier and analogue / digital (A / D) conversion circuit, a two-dimensional precision electric control displacement system, a driving circuit for the two-dimensional precision electric control displacement system, a master control computer and a main interface circuit, wherein the high-resolution small light spot sampling and imaging optical system is used for focusing infrared radiation surface sampling points onto the infrared detector; the master control computer is used for transmitting a driving instruction to the two-dimensional precision electric control displacement system through the main interface circuit; and the infrared detector is used for converting a measured infrared radiation signal into an electrical signal, and transmitting the electrical signal to the master control computer to finish data processing through the preamplifier and the main amplifier and A / D conversion circuit. The uniformity measurement device for the infrared radiation surface is simple in structure, low in cost, high in test efficiency, speed and measurement accuracy, large in measuring point number and easy for tracing to the source.

Description

technical field [0001] The invention relates to the technical field of testing, in particular to a device for measuring the uniformity of an infrared radiation surface, and also to a method for measuring the uniformity of an infrared radiation surface. Background technique [0002] The uniformity of infrared radiation directly affects the reliability and accuracy of test and calibration systems. With the needs of modern industry and modern military, it is increasingly necessary to carry out precise measurement of infrared radiation uniformity. At present, there is no good measurement and testing method for the uniformity of the infrared radiation surface in China, and the measurement accuracy needs to be improved. [0003] At present, the measurement of the uniformity of the infrared radiation surface mainly adopts the method of contact temperature measurement and radiation calibration temperature measurement. Contact temperature measurement is costly and has a small numbe...

AI Technical Summary

Problems solved by technology

[0006] In order to solve the above problems, the present invention proposes a device for measuring the uniformity of the infrared radiation surface, which solves the problem of multi-point high-precision scanning in the entire area of ​​the large radiation surface, and realizes high-precision and rapid measurement of the uniformity of the infrared radiation surface. Provide reference basis for uniformity correction in the development of system and test instruments

Images