Six-freedom-degree electronic microscope support

Abstract

The invention relates to an electronic microscope support, in particular to a six-freedom-degree electronic microscope support. The six-freedom-degree electronic microscope support is characterized by being provided with an observation table for a whole electronic microscope support plane to be installed, the lower plane of the observation table is arranged on an operating table, columns are fixedly installed on the upper plane of the observation table, a first guide rod capable of vertically moving along the columns is arranged between the columns, a connecting block capable of moving along the axis of the first guide rod is arranged on the first guide rod, a second guide rod is installed on the connecting block and can move on the connecting block along the axis of the second guide rod, a microscope clamp is installed at one end of the second guide rod, and a microscope is arranged on the microscope clamp. The six-freedom-degree electronic microscope support is scientific and reasonable in structure and enables the microscope to be capable of producing a clear image at the required height through mutual matching of the columns, the guide rods and an adjusting mechanism. In addition, the electronic microscope can perform translation on a horizontal plane along two coordinate axes to ensure that the distance between an objective lens and an observed object is invariant, achieve the effect of continuously observing a high-definition image on the surface of the object and facilitate photographing and video recording. Furthermore, the six-freedom-degree electronic microscope support is good in stability and convenient to operate.

Description

technical field [0001] The invention relates to an electron microscope support, in particular to a six-degree-of-freedom electron microscope support. Background technique [0002] Electron microscopes are cheap, high-definition, light in weight, and widely used. They are essential equipment for scientific experiments and analysis. Most of the microscope supports currently used are 3-degree-of-freedom types, and one type is a three-rail type. In the direction of the three coordinate axes, the electron microscope moves on the guide rail. Since one end of the guide rail is suspended in the air, its mechanical properties are not good, and its stability is not good. It will shake during use and affect image acquisition; This kind of link, if the electron microscope needs to translate to observe the object, the operation is troublesome, and if you are not careful, the image will be blurred and so on. Contents of the invention [0003] The object of the present invention is to s...

AI Technical Summary

Problems solved by technology

[0003] The purpose of the present invention is to solve the problems of poor stability of the existing electron microscope stand, easy to shake, troublesome operation, and easy to blur the image, and to provide a six-degree-of-freedom electron microscope stand with good stability, no shake, and easy operation

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