Setting method of shared setting parameters between optical inspection machines
A technology of optical inspection machine and setting method, which is applied in the direction of optical testing for flaws/defects, material analysis through optical means, measuring devices, etc., and can solve problems such as time-consuming failure to detect standards, uniformity, and failure to maintain product quality.
Active Publication Date: 2017-11-28
MACHVISION INC
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However, once there are a large number of machines, whether it is in the stage of installation setting or in the stage of machine maintenance in the future, it is not only time-consuming to manually set and adjust one by one, but it is also impossible to make the detection standards of each machine uniform. Such a shortcoming It often causes the products that pass the test to be unable to maintain stable product quality
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[0024] For fully understanding purpose of the present invention, feature and technical effect, hereby by following specific embodiment, in conjunction with accompanying drawing, the present invention is described in detail, as follows:
[0025] First please refer to figure 1 , which is a schematic diagram of an optical detection machine in an embodiment of the present invention. The optical inspection machine for various circuit board inspections includes: at least one light source device ( figure 1 Shown are the first light source device 111 and the second light source device 112 ), the image capturing device 120 , the computing host 130 and the carrying platform 140 . The carrying platform 140 is used to place the target object 200 to be measured, and the target object 200 to be measured generates light such as reflected light or scattered light correspondingly through the light irradiation of the first light source device 111 and the second light source device 112 And the...
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The present invention provides a setting method for sharing a setting parameter between optical inspection devices. The setting method for sharing a setting parameter between optical inspection devices is to correspond a reference optical power setting value of a reference optical inspection device to other optical inspection device and transfer the reference optical power setting value. The setting method includes a reference gradation value obtaining step, a test gradation value obtaining step, a light source device adjusting step, and a light source device setting step. A standard piece is an adjustment target between multiple devices, so an actual radiation condition of the each device is automatically uniformized according to a rule between the devices. Thereby, the setting method enables an inspection standard of all optical inspection devices to be gradually harmonized so that an uniformized quality standard can be applied to all products passing inspection.
Description
technical field [0001] The invention relates to a setting method of optical detection machines, in particular to a setting method of shared setting parameters among optical detection machines. Background technique [0002] Automated optical inspection (AOI) plays a pivotal role in the inspection of flexible or rigid circuit boards. For example, in the manufacturing process of liquid crystal display, semiconductor integrated circuit chips and related circuits, precise automatic optical inspection is required. [0003] The automatic optical inspection is carried out by the optical inspection machine. During the inspection process, the light is irradiated onto the circuit board, and then the image of the circuit board is captured by the imaging device to judge the defect. Therefore, the optical inspection machine The quality of the light source provided by the lighting device on the stage has considerable influence on the inspection. Once the quality of the light source is not...
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IPC IPC(8): G01N21/88
CPCG01N21/01G01N21/88G01N2021/0162G01N2021/95638
Inventor汪光夏陈辉毓
OwnerMACHVISION INC